信号完整性

信号完整性（）是对于电子信号品質的一系列度量标准。在数字电路中，一串二进制的信号流是通过电压（或电流）的波形来表示。然而，自然界的信号实际上都是模拟的，而非数字的，所有的信号都受噪音、扭曲和损失影响。在短距离、低比特率的情况里，一个简单的导体可以忠实地传输信号。而长距离、高比特率的信号如果通过几种不同的导体，多种效应可以降低信号的可信度，这样系统或设备不能正常工作。信号完整性工程是分析和缓解上述负面效应的一项任务，在所有水平的电子封装和组装，例如集成电路的内部连接、集成电路封装、印制电路板等工艺过程中，都是一项十分重要的活动。

信号完整性考虑的问题主要有振铃（）、串扰（）、接地反弹、扭曲（）、信号损失和电源供应中的噪音。

相關條目
眼圖
電源完整性

参考文献 
 Advanced-level reference text for experienced digital designers who want to press their designs to the upper limits of speed and distance.
 From the backcover: Draws from author's industrial experience and his work teaching more than five thousand engineers.

 Textbook on the problems of building digital systems, including signal integrity.
 This book approaches electrical engineering and signal integrity principles from a basic level, assuming little prior understanding.

 Using realistic case studies and downloadable software examples, two leading experts demonstrate today's best techniques for designing and modeling interconnects to efficiently distribute power and minimize noise. The authors carefully introduce the core concepts of power distribution design, systematically present and compare leading techniques for modeling noise, and link these techniques to specific applications. Their many examples range from the simplest (using analytical equations to compute power supply noise) through complex system-level applications.
 Altera Signal Integrity Center
 Basic Principles of Signal Integrity 
 Agilent EEsof EDA - Signal Integrity Analysis Resources
 "Design tip: Model instruments to improve signal integrity simulation", EETimes, John Olah, 2007-October-25
 Topics in signal integrity were discussed at DesignCon 2008 February 4, 2008 to February 7, 2008
 "Understanding Signal Integrity - Signal integrity is becoming a more significant problem as clock frequencies increase" by Eric Bogatin, GigaTest Labs, Agilent Application Note 5988-5978EN, April 2002, 8 pages, PDF, 0.9MB
 "Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR" (Agilent Application Note 5989-5763EN, February 2007, 72 pages, PDF, 5.2MB) 
 "Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS" (Agilent Application Note 5989-5764EN, February 2007, 56 pages, PDF, 3.6MB) 
 "Signal Integrity Analysis Series Part 3: The ABC's of De-Embedding" (Agilent Application Note 5989-5765EN, July 2007, 48 pages, PDF, 2.5MB)

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