Patent SG-11201901443S-A (SG)
Title: Method for automated unsupervised ontological investigation of structural appearances in electron micrographs
Inventor: RYNER MARTIN
IPC: G06K9/62
Filed: 2018-07-02
Abstract: 134 130 \, k 128 , 122 136 138 144 '4-152 148 154 150 126 FIG. 4 140 155 628' 132' 134' 136' 636' 624' 626' 130 . 622' 620' 634' 138' 630' 140' 154' 152' Second Scale 146' 148' 638' 144' 128' 600 122' 606 124' 602 608 142' 604 610 150' 126' First Scale (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 31 January 2019 (31.01.2019) WIPO I PCT Iiiimmoilloiollmomioloomolomomiolonnomom (10) International Publication Number WO 2019/022925 Al (51) International Patent Classification: G06K 9/62 (2006.01) G02B 21/10 (2006.01) (21) International Application Number: PCT/US2018/040625 (22) International Filing Date: 02 July 2018 (02.07.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 62/535,851 22 July 2017 (22.07.2017) US (71) Applicant: INTELLIGENT VIRUS IMAGING INC. [US/US]; 26 Pinecrest Plaza, Suite 2, Southern Pines, North Carolina 28387 (US). (72) Inventor: RYNER, Martin; Glasbarsvagen 16, SE 141 68 Huddinge (SE). (74) Agent: FASTH, Rolf; FASTH LAW OFFICES, 1206 Stan- ridge Drive, Raleigh, North Carolina 27613 (US). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, = (54) Title: METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEAR- ANCES IN ELECTRON MICROGRAPHS O O O (57) : The method is for dividing dark objects (102, 122, 123, 126), substructures and background of an image from an electron microscope (304) into segments (128, 142, 150) by analysing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments (128', 142', 150') are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other. [Continued on next page] WO 2019/022925 Al MIDEDIMOHNOIROMOINNIMOICHOHOMEHOIS MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Published: — with international search report (Art. 21(3)) with amended claims (Art. 19(1))