Patent EP-3799384-A1 (EP)
Inventor: ALFARANO MARCO
IPC: H04L29/06
Filed: 2020-09-15
Abstract: Method for introducing personalization data in non volatile memories of a plurality of integrated circuits, comprisingwriting in the non volatile memory (61) of a given integrated circuit a static data image (SI), corresponding to an invariant part of non volatile memory common to said plurality of integrated circuits (60) including an operating system, and personalization data images (DI) representing data specific of the given integrated circuit,said personalization data pertaining a given integrated circuit being arranged in a set of personalization data fields,wherein said method includes a procedure of generation (205-235) of test data images (I<sub>j</sub>) to be stored in said non volatile memory comprisingfor each data field (T<sub>j</sub>) in said set of personalization data fields (T<sub>1</sub>...T<sub>m</sub>) performing an iterative procedure comprising at each iteration the operations of:erasing (210) a non volatile memory (61) of a test integrated circuit (60') corresponding to said plurality of integrated circuits,storing (220) said operating system in said non volatile memory,storing (230) test personalization data in said non volatile memory,said storing (230) comprisinggenerating (232) instances (TPD<sub>1</sub>...TPD<sub>m</sub>) of said test personalization data (TPD) on the basis of a provided (231) reference version (U1) of test personalization data (TPD) arranged in said set of data fields (T<sub>1</sub>...T<sub>m</sub>),the first instance (TPD<sub>1</sub>) at the first iteration corresponding to said provided reference version (U1) and the following instances (TPD<sub>2</sub>...TPD<sub>m</sub>) in following iterations corresponding to the reference version (U1 subject to an alteration applied on a different data field (T<sub>1</sub>...T<sub>m</sub>) for each iteration,dumping (234) an image (I<sub>j</sub>) of the non volatile memory (61) corresponding to the current test instance (TPD<sub>j</sub>),performing (235) iteratively said procedure of generation till the last data field in the set of data fields personalization obtaining a corresponding set of test dumped images (I<sub>1</sub>...I<sub>m</sub>) one for each data field (T<sub>j</sub>) in said set of personalization data fields (T<sub>1</sub>...T<sub>m</sub>),comparing (240) each test dumped image (I<sub>1</sub>...I<sub>m</sub>) with the test dumped image (I<sub>1</sub>) obtained from the reference version (U1) extracting respective location information (LM<sub>j</sub>) regarding the memory area in the non volatile memory (61)at which said test dumped image (I<sub>1</sub>...I<sub>m</sub>) differs from the test dumped image (I<sub>1</sub>) obtained from the reference version,processing (250) said location information to identify a static memory image (SI) containing only invariant memory slices and a dynamic memory image (DMI) associated to a substitution table (ST) indicating the location of memory area corresponding to each data field (T<sub>j</sub>),writing (270) in an integrated circuit (60) of said plurality of integrated circuits said static image (SI) and a dynamic personalized image (PMI) obtained filling at corresponding locations of memory area in the dynamic memory image (DMI) obtained from the substitution table (ST) the content of respective data fields (T<sub>j</sub>) in personalization data (PD) to be specifically associated to said integrated circuit (60).