Patent SG-11201907121W-A (SG)
Title: Probe card for high-frequency applications
Inventor: FELICI STEFANO
IPC: G01R31/28
Filed: 2018-02-14
Abstract: H26 21' 24A 20 26 5B 25B 25 28 25A FIG. 2A 21 29 1-1 N cc 00 O O (12) INTERNATIONAL APPLICATION PUBLISHED UNDER THE PATENT COOPERATION TREATY (PCT) (19) World Intellectual Property Organization International Bureau (43) International Publication Date 23 August 2018 (23.08.2018) WIPO I PCT onion °nolo olomin mo Holum° oimIE (10) International Publication Number WO 2018/149847 Al (51) International Patent Classification: G01R 1/073 (2006.01) G01R 1/067 (2006.01) GO1R 31/28 (2006.01) (21) International Application Number: PCT/EP2018/053615 (22) International Filing Date: 14 February 2018 (14.02.2018) (25) Filing Language: English (26) Publication Language: English (30) Priority Data: 102017000017037 15 February 2017 (15.02.2017) IT (71) Applicant: TECHNOPROBE S.P.A. [IT/IT]; Via Cava- lieri di Vittorio Veneto, 2, 23870 Cernusco Lombardone (Lecco) (IT). (72) Inventor: FELICI, Stefano; c/o TECHNOPROBE S.p.A., Via Cavalieri di Vittorio Veneto, 2, 23870 Cernusco Lom- bardone (Lecco) (IT). (74) Agent: FERRARI, Barbara; BOTTI & FERRARI S.r.1., Via Cappellini, 11, 20124 Milano (IT). (81) Designated States (unless otherwise indicated, for every kind of national protection available): AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. (54) Title: PROBE CARD FOR HIGH-FREQUENCY APPLICATIONS (57) : A probe card (20) of a testing apparatus of electronic devices comprises a testing head (21), which houses a plurality of contact elements (22) extending along a longitudinal axis (H-H) between a first end portion (24A) and a second end portion (24B), a support plate (23), onto which said first end portion (24A) is adapted to abut, and a flexible membrane (25). Suitably, the testing head (21) is arranged between the support plate (23) and a first portion (25A) of the flexible membrane (25), which is connected to the support plate (23) through a second portion (25B) thereof, the probe card (20) further comprising a plurality of contact tips (27) arranged on a first face (F1) of the flexible membrane (25) at the first portion (25A) thereof, the second end portion (24B) of each contact element (22) being apt to abut onto a second face (F2) of the flexible membrane (25), opposite to the first face (F1), the number and distribution of the contact elements (22) being different to the number and distribution of the contact tips (27). [Continued on next page] WO 2018/149847 Al MIDEDIMOMMIDIREEMOMMEHHEMOHMEHOIS (84) Designated States (unless otherwise indicated, for every kind of regional protection available): ARIPO (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW), Eurasian (AM, AZ, BY, KG, KZ, RU, TJ, TM), European (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR), OAPI (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG). Declarations under Rule 4.17: — of inventorship (Rule 4.17(iv)) Published: — with international search report (Art. 21(3))