Patent AT-E446500-T1 (AT)
Inventor: HAENDLER ERICH
Filed: 2007-09-10
Granted: 2009-11-15
Abstract: The method for evaluating an immunological test element (1) by an optical scanning, in which evaluation areas of the test element, which are loaded with immobilized optically active substances, are evaluated with a measuring light beam exiting respective measuring light intensity by a detecting device (4), comprises alternatively adjusting first and second light quantities of the measuring light beam incident on the detecting device and an operating zone of the detecting device, in which a scanning parameter is selected according to first and second sets of scanning parameters. The method for evaluating an immunological test element (1) by an optical scanning, in which evaluation areas of the test element, which are loaded with immobilized optically active substances, are evaluated with a measuring light beam exiting respective measuring light intensity by a detecting device (4), comprises alternatively adjusting first and second light quantities of the measuring light beam incident on the detecting device and an operating zone of the detecting device, in which a scanning parameter is selected according to first and second sets of scanning parameters, during optical scanning of first and second evaluation areas that exit the measuring light beam with first and second measuring light intensities. The second measuring light intensity differentiates itself from the first measuring light intensity. The second set of the scanning parameters differentiates itself from the first set of the scanning parameters. Correcting variables selected from the group of correcting variables are adjusted as scanning parameter, where the group of the correcting variables is a scanning speed, an exposure time, a test light intensity and a gain factor of the detecting device and an impingement of the evaluation area with electrical energy. The scanning parameter for the first and second sets of the scanning parameters is held constant. A change of the scanning parameter in accordance with the first set of scanning parameters to the scanning parameter in accordance with the second set of scanning parameters is carried out in the progress of a continuous scanning process for the test element and in depending upon the actual measured informations, which are derived from actual measured values during optical scanning of the test element and derived before carrying out the pre-scanning process. The scanning parameter in accordance with the first set of scanning parameter and the scanning parameter in accordance with the second set of scanning parameters are changed during optical scanning of the test element. The first evaluation area is newly optically scanned with the scanning parameter in accordance with the second set of scanning parameters after the optical scanning with the scanning parameter in accordance with the first set of scanning parameters. Test light beam regions assigning the evaluation areas are not overlappedly formed during optical scanning of the evaluation areas. The first and second light quantities in first and second sub-regions of the operating zone are respectively selected. The second sub-region differentiates itself from the first sub-region. Several homogenous evaluation areas are optically scanned and evaluated in a scanning position in a surface-resolved manner. An independent claim is included for a device for evaluating an immunological test element by an optical scanning.