yusuke1997/dblp-id-title huggingface dataset:
Quantitative Information Security Risk Estimation Using Probabilistic Attack Graphs
Design Decisions in the Development of a Graphical Language for Risk-Driven Security Testing
Fast and Optimal Countermeasure Selection for Attack Defence Trees
Risk Assessment and Risk-Driven Quality Assurance - 4th International Workshop, RISK 2016, Held in Conjunction with ICTSS 2016, Graz, Austria, October 18, 2016, Revised Selected Papers
Gaining Certainty About Uncertainty - Testing Cyber-Physical Systems in the Presence of Uncertainties at the Application Level
Risk Assessment and Security Testing of Large Scale Networked Systems with RACOMAT
Supporting Risk Assessment with the Systematic Identification, Merging, and Validation of Security Goals
Risk-Driven Vulnerability Testing: Results from eHealth Experiments Using Patterns and Model-Based Approach
Business Driven ICT Risk Management in the Banking Domain with RACOMAT
CyVar: Extending Var-At-Risk to ICT
Towards Transparent Real-Time Privacy Risk Assessment of Intelligent Transport Systems
Risk Management During Software Development: Results of a Survey in Software Houses from Germany, Austria and Switzerland
Development of Device-and Service-Profiles for a Safe and Secure Interconnection of Medical Devices in the Integrated Open OR
Risk Assessment and Risk-Driven Testing - Third International Workshop, RISK 2015, Berlin, Germany, June 15, 2015. Revised Selected Papers
Check Your Blind Spot: A New Cyber-Security Metric for Measuring Incident Response Readiness
Combining Security Risk Assessment and Security Testing Based on Standards
IBDL: A Language for Interface Behavior Specification and Testing
Proceedings of the USENIX Conference on Object-Oriented Technologies, COOTS'95, Monterey, California, USA, June 26-29, 1995
Toba: Java for Applications - A Way Ahead of Time (WAT) Compiler
JMAS: A Java-Based Mobile Actor System for Distributed Parallel Computation
Krakatoa: Decompilation in Java (Does Bytecode Reveal Source?)
Embedded Programming with C++
Pattern Languages for Handing C++ Resources in an Exception-Safe Way
Supporting Synchronous Groupware with Peer Object-Groups
Integration of Concurrency Control in a Language with Subtyping and Subclassing
Adaptation and Specialization for High Performance Mobile Agents
Metis: A Thin-Client Application Framework
Object Caching in a CORBA Compliant System
Dynamic Insertion of Object Services
The Design and Performance of Meta-Programming Mechanisms for Object Request Broker Middleware
A Framework for Higher-Order Functions in C++
Reliability with CORBA Event Channels
Resource Access Control for an Internet User Agent
Pickling State in the Java(tm) System
Dynamic Resource Management and Automatic Configuration of Distributed Component Systems
Adding Group Communication and Fault-Tolerance to CORBA
TORBA: Trading Contracts for CORBA
Smart Messages: An Object-Oriented Communication Mechanism
Debugging Storage Management Problems in Garbage-Collected Environments
Exploiting the Internet Inter-ORB Protocol Interface to Provide CORBA with Fault Tolerance
Composing Special Memory Allocators in C++
Quality of Service--Aware Distributed Object Systems
Interactive-Group Object-Replication Fault Tolerance for CORBA
A Distributed Object Model for the Java System
Extending a Traditional OS Using Object-Oriented Techniques
Automating Three Modes of Evolution for Object-Oriented Software Architectures
Filterfresh: Hot Replication of Java RMI Server Objects
The Design and Performance of MedJava
Quality of Service Specification in Distributed Object Systems Design
Content-Based Publish/Subscribe with Structural Reflection
Montana Smart Pointers: They're Smart, and They're Pointers
The Spring Object Model
Proceedings of the USENIX Conference on Object-Oriented Technologies, COOTS'96, Toronto, Ontario, Canada, June 17-21, 1996
Compile Time Symbolic Derivation with C++ Templates
Object-Oriented Components for High-speed Network Programming
Programming Network Components Using NetPebbles: An Early Report
Extending the Standard Template Library for Parallelism in Coir<Futures>
Proceedings of the 5th USENIX Conference on Object-Oriented Technologies & Systems, May 3-7, 1999, The Town & Country Resort Hotel, San Diego, California, USA
Using the Strategy Design Pattern to Compose Reliable Distributed Protocols
Making CORBA Objects Persistent: the Object Database Adapter Approach
Bean Markup Language: A Composition Language for JavaBeans Components
Dynamic Management of CORBA Trader Federation
The Interception Approach to Reliable Distributed CORBA Objects
Compiler Optimization of C++ Virtual Function Calls
Comprehensive Profiling Support in the Java Virtual Machine
Tuning Branch Predictors to Support Virtual Method Invocation in Java
Implementing Causal Logging Using OrbixWeb Interception
An Object-Oriented Framework for Distributed Computational Simulation of Aerospace Propulsion Systems
Design and Performance of an Object-Oriented Framework for High-Performance Electronic Medical Imaging
MiSFIT: A Tool for Constructing Safe Extensible C++ Systems
Program Explorer: A Program Visualizer for C++
Phantom: An Interpreted Language for Distributed Programming
Using Meta-Objects to Support Optimisation in the Apertos Operating System
Java Transactions for the Internet
A Measure of Testing Effort
Kava - Using Byte code Rewriting to add Behavioural Reflection to Java
Implementing Optimized Distributed Data Sharing Using Scoped Behavior and a Class Library
Service Configurator: A Pattern for Dynamic Configuration of Services
Obtuse, a Scripting Language for Migratory Applications
Supporting Automatic Configuration of Component-Based Distributed Systems
Asynchonrous Notifications Among Distributed Objects
Building Independent Black Box Components in C++
The Any Framework: A Pragmatic Approach to Flexibility
6th USENIX Conference on Object-Oriented Technologies and Systems, January 29 - February 2, 2001, San Antonio, Texas, USA
Generic Containers for a Distributed Object Store
Harissa: A Flexible and Efficient Java Environment Mixing Bytecode and Compiled Code
4th USENIX Conference on Object-Oriented Technologies and Systems (COOTS), April 27-30, 1998, Eldorado Hotel, Santa Fe, New Mexico, USA
Highly Concurrent Distributed Knowledge Objects
The Object Group Design Pattern
PSTL-A C++ Persistent Standard Template Library
The Architecture of a Distributed Virtual Worlds System
Intercepting and Instrumenting COM Applications
Efficient Implementation of Java Remote Method Invocation (RMI)
Lingua-Franca: An IDL for Structural Subtyping Distributed Object Systems
The Application of Object-Oriented Design Techniques to the Evolution of the Architecture of a Large Legacy Software System
Design Patterns for Generic Programming in C++
Performance Patterns: Automated Scenario-Based ORB Performance Evaluation
Objects and Concurrency in Triveni: A Telecommunication Case Study in Java
Distributed Garbage Collection for Wide Area Replicated Memory
Making Java Applications Mobile or Persistent
Proceedings of the Third USENIX Conference on Object-Oriented Technologies (COOTS), June 16-20, 1997, Portland, Oregon, USA
Object-Oriented Pattern-Based Parallel Programming with Automatically Generated Frameworks
COBEA: A CORBA-Based Event Architecture
Execution Patterns in Object-Oriented Visualization
Media-Independent Interfaces in a Media-Dependent World
Interlanguage Object Sharing with SOM
HBench: JGC-An Application-Specific Benchmark Suite for Evaluating JVM Garbage Collector Performance
Applying Optimization Principle Patterns to Design Real-Time ORBs
Multi-Dispatch in the Java Virtual Machine: Design and Implementation
Class Relationships and User Extensibility in Solid Geometric Modeling
Software Composition with Extended Entity-Relationship Diagrams
The Design and Implementation of Guaraná
Simple Activation for Distributed Objects
COMERA: COM Extensible Remoting Architecture
An Adaptive Data Object Service for Pervasive Computing Environments
Address Translation Strategies in the Texas Persistent Store
Secure Delegation for Distributed Object Environments
Frigate: An Object-Oriented File System for Ordinary Users
Design Patterns for Dealing with Dual Inheritance Hierarchies in C++
Filters as a Language Support for Design Patterns in Object-Oriented Scripting Languages
Resource Control for Java Database Extensions
Gold Rush: Mobile Transaction Middleware with Java-Object Replication
Preliminary Design of ADL/C++ -- A Specification Language for C++
Building a Scalable and Efficient Component Oriented System using CORBA - Active Badge System Case Study
Mobile Objects and Agents (MOA)
Using Accessory Functions to Generalize Dynamic Dispatch in Single-Dispatch Object-Oriented Languages
Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire transistor
Interface Engineering of Trench-Ox for Modern DRAM Devices
Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs
Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge
Radiation-Resilient Amorphous Indium Oxide FEFETs for Embedded Nonvolatile Memory
Self-Heating Effect of Device-Circuit with Back-side Power Delivery Network beyond 3nm Node
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs
High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs
The physics of NBTI: What do we really know?
The electromigration behavior of copper pillars for different current directions and pillar shapes
Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology
Impact of TSV on TDDB Performance of Neighboring FinFET with HK/IL Gate Stacking
HCI Improvement on 14nm FinFET IO Device by Optimization of 3D Junction Profile
Trapping characteristics and parametric shifts in lateral GaN HEMTs with SiO2/AlGaN gate stacks
Design Optimization of MV-NMOS for ESD Self-protection in 28nm CMOS technology
Impact of specific failure mechanisms on endurance improvement for HfO2-based ferroelectric tunnel junction memory
Influence of Gate Length on pBTI in GaN-on-Si E-Mode MOSc-HEMT
MBU-Calc: A compact model for Multi-Bit Upset (MBU) SER estimation
Evolution of Defect in AlGaN-based Deep Ultraviolet Light Emitting Diodes During Electrical Stress
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate
Enhanced Memory Performance in Ferroelectric NAND Applications: The Role of Tunnel Dielectric Position for Robust 10-Year Retention
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory
Evaluation of High Holding Voltage SCR Protection Capability in EOS and Overvoltage Regimes
A Novel Induced Offset Voltage Sensor for Separable Wear-Out Mechanism Characterization in a 12nm FinFET Process
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices
Impact of Hydrogen Incorporation on Performance and PBS Instability in Ultrathin ALD-InOxFETs
Degradation mechanisms in Germanium Electro-Absorption Modulators
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs
Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification
Reliability evaluation of defect accounted time-dependent dielectric breakdown with competing-mixture distribution
Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs
Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction
Effect of HCI degradation on the variability of MOSFETS
Reliability Assesement of Ferroelectric nvCAP for Small-Signal Capacitive Read-Out
A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation
Fundamental Understanding of Oxide Defects in HfO2 and Y2O3 on GaAs(001) with High Thermal Stability
Blocking Oxide Material Engineering to Improve Retention Loss in 3D NAND: a Modeling Process Optimization Study
Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs
Multi-finger turn-on: A potential cause of premature failure in Drain Extended HV Nanosheet Devices
Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation
Printed-circuit board (PCB) charge induced product yield-loss during the final test
Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress
Enhancing reliability of a strong physical unclonable function (PUF) solution based on virgin-state phase change memory (PCM)
Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors
Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy (TDIS)
Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs
Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance
Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM
System-level design for ESD protection on multiple IO interfaces
A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS
A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation
A Novel D2 Plasma Treatment for Defect Passivation: From Modeling to Process Optimization
Reliability of Memristive Devices for High-Performance Neuromorphic Computing: (Invited Paper)
NBTI Improvement of HfO2/TiN Gated pMOSFET by Low-Temperature Remote Hydrogen Plasma Treatment
Characterization and Mitigation of Relaxation Effects on Multi-level RRAM based In-Memory Computing
Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET
Impact of Multilevel Retention Characteristics on RRAM based DNN Inference Engine
Comparative Study on the Energy Profile of NBTI-Related Defects in Si and Ferroelectric p-FinFETs
Mechanisms of Contact Formation and Electromigration Reliability in Wirebond Packages
Classification of Commercial SiC-MOSFETs Based on Time-Dependent Gate-current Characteristics
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits
Effects of copper CMP and post clean process on VRDB and TDDB at 28nm and advanced technology node
Reliability Challenges from 2.5D to 3DIC in Advanced Package Development
A Study on the Origin of MOSFET Random Telegraph Noise Under Strong Inversion at Cryogenic Temperatures
Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity
BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing
Electromigration limits of copper nano-interconnects
Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified
Physical failure analysis methods for wide band gap semiconductor devices
Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in DRAM
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
Current Crowding Impact on Electromigration in Al Interconnects
Robust ESD self-protected LDNMOSFET by an enhanced displacement-current triggering
Impact of package on neutron induced single event upset in 20 nm SRAM
Comprehensive Study of Non-Conducting Stress Characteristics in Ultra-Scaled FinFET
Evaluation of silicon, organic, and perovskite solar cell reliability with low-frequency noise spectroscopy
Machine Learning-based Condition Monitoring from Power Cycling Data for Silicon Carbide Power Inverter Modules
Impact of Phase-Change Memory Drift on Energy Efficiency and Accuracy of Analog Compute-in-Memory Deep Learning Inference (Invited)
Effect of TSV - Keep Out Zone on BEOL Reliability of HBM3E
Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode
Mechanical reliability assessment of 28nm Back End of Line (BEoL) stack using finite element analysis and validation
Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory
Thermal Analysis of High-Performance Server SoCs from FinFET to Nanosheet Technologies
Process Variation of Pixel Definition and Effects of Flexible OLED Luminance Degradation
RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications
Comprehensive Analysis of Data-Retention and Endurance Trade-Off of 40nm TaOx-based ReRAM
Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS
Is there a perfect SiC MosFETs Device on an imperfect crystal?
A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/ AC NBTI Stress/Recovery Condition in Si p-FinFETs
Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects
Vertical GaN Fin JFET: A Power Device with Short Circuit Robustness at Avalanche Breakdown Voltage
First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects
SiC power MOSFET gate oxide breakdown reliability - Current status
Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {V G , V D } bias space
Observation of Self-heating Process in STT-MRAM and Its Implication in Device Operations
Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET
Reliability of Mo as Word Line Metal in 3D NAND
Estimation of Product Lifetime with Highly Varying Die Temperature
Stress Migration of Aluminum Backside Interconnect in Xtacking®
Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors
Low Voltage Transient RESET Kinetic Modeling of OxRRAM for Neuromorphic Applications
A Valid Experimental Design of the Lifetime Prediction for NAND Cell Oxide
Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation
On the Correlation of Laser-induced and High-Energy Proton Beam-induced Single Event Latchup
Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations
First Observations and Physical Insights of the Dynamic Breakdown Voltage and Overvoltage Margin Under Pulsed Conditions in β-Ga2O3Based Devices
Sub-pJ consumption and short latency time in RRAM arrays for high endurance applications
Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications
On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale
Improvement of oxide reliability in NAND flash memories using tight endurance cycling with shorter idling period
Intrinsic Reliability of BEOL interlayer dielectric
Putting AI to Work: A Practical and Simple Application to Improve 3D X-ray FA
Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress
CpK approach for the qualification of ECC-designs with single bit failures
On-Chip Characterization of Random Telegraph Signal Noise in Bulk 90 nm CMOS
Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
De-Coupling Thermo-Migration from Electromigration Using a Dedicated Test Structure
A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures
Physics-informed machine learning to analyze oxide defect-induced RTN in gate leakage current
Refined High Resistance Baking Approaches for Optimal Interconnect Reliability
Analysis of Intermittent Single-bit Failure on 10-nm node generation DRAM Devices
Making the connection between physics of failure and system-level reliability for medical devices
PBTI and HCI degradations of ultrathin body InGaAs-On-Insulator nMOSFETs fabricated by wafer bonding
Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited)
Guidelines for Space Qualification of GaN HEMTs and MMICs
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology
Towards Chip-Package-System Co-optimization of Thermally-limited System-On-Chips (SOCs)
New insight on TDDB area scaling methodology of non-Poisson systems
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction
Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications
Off-State TDDB Degradation of RC-Features and Threshold Voltage on Advanced FinFETs from RF Measurements for 5G Applications
Study on the Guard Rings for Latchup Prevention between HV-PMOS and LV-PMOS in a 0.15-µm BCD Process
Introduction of Non-Volatile Computing In Memory (nvCIM) by 3D NAND Flash for Inference Accelerator of Deep Neural Network (DNN) and the Read Disturb Reliability Evaluation : (Invited Paper)
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors
Impact of Trapped Charge Vertical Loss and Lateral Migration on Lifetime Estimation of 3-D NAND Flash Memories
TCAD Simulation on FinFET n-type Power Device HCI Reliability Improvement
Reliability Qualification of 1250V Lateral GaN HEMTs for High Reliability Industrial Applications (Invited)
New Burnout Failure at the Chip Edge: Analysis and Preventive Design by a Novel Experimental Approach
Transistor reliability characterization and modeling of the 22FFL FinFET technology
The first observation of p-type electromigration failure in full ruthenium interconnects
UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities
Bias Temperature Instability Reliability in Stacked Gate-All-Around Nanosheet Transistor
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling
Enhanced CDM-robustness for the packaged IC with the extra bonding wire to the die-attach plate
A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level
IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024
Protection Schemes for Plasma Induced Damage from Well-Side Antennas
Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures
Reliability Impacts of Tapered Nanosheets and Localized Layout Effects in MBCFETs Fabricated with 2NM Logic Technology Featuring GAA
Comprehensive Study of Saturation Current Impact on LDMOS Reliability
Modeling Dynamic Interplay Between Charge Traps and Polarization for Memory Window Enhancement in Gate Injection Layers
Soft Error Induced System Errors in Image Inference Applications with Glow-Compiled CNNs on MCUs
Recent Updates to Transistor Level Reliability Analysis
Investigation of Screening Methods for 1.2 kV 4H-SiC MOSFETs Using High Gate Voltage Pulses and Unclampled Inductive Switching
Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications
The Impact of Silicon Concentration on the Reliability of Tungsten Silicide
Positive Bias Temperature Instability in Polysilicon/SiO2 PMOS Transistors for Analog High Precision Applications
Comprehensive understanding of hot carrier degradation in multiple-fin SOI FinFETs
Managing electrical reliability in consumer systems for improved energy efficiency
IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022
The Role of Defects and Interface Degradation on Ferroelectric HZO Capacitors Aging