yusuke1997/dblp-id-title huggingface dataset:
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)
Critical charge dependence of correlation of different neutron sources for soft error testing
Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays
Defect Dynamics and Flicker Noise in Ferroelectric Field Effect Transistors at Cryogenic Temperatures
Conductance variations and their impact on the precision of in-memory computing with resistive switching memory (RRAM)
Low-Frequency Noise Reduction in 22FDX®: Impact of Device Geometry and Back Bias
Utilizing Transformer Deep Learning Based Outlier Detection to Screen Out Reliability Weak ICs
Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics
Application-based Modeling of I/O Reliability
Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics
Electromigration characteristics of power grid like structures
Impact of Combinational Logic Delay for Single Event Upset on Flip Flops in a 65 nm FDSOI Process
Characterization and reliability of III-V gate-all-around MOSFETs
Ultra-fast CV methods (< 10µs) for interface trap spectroscopy and BTI reliability characterization using MOS capacitors
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs
A New Clustering-Function-Based Formulation of Temporal and Spatial Clustering Model Involving Area Scaling and its Application to Parameter Extraction
Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs
High-density fan-out technology for advanced SiP and 3D heterogeneous integration
Predicting Neutron SERs from Alpha-Ray Test Results Through SEU Physics Parameter Extraction
Reliability challenges in advance packaging
Improved Layout Style on Diode- Trigger SCR for Low-C ESD Protection
Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing
Stress Induced Voiding Behavior of Electroplated Copper Thin Films in Highly Scaled Cu/low-k interconnects
Localized Layout Effect Related Reliability Approach in 8nm FinFETs Technology: From Transistor to Circuit
Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors
A systematic study of gate dielectric TDDB in FinFET technology
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC
Comparative Study on the Energy Distribution of Defects under HCD and NBTI in Short Channel p-FinFETs
Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm
Effects of Wiring Density and Pillar Structure on Chip Package Interaction for Advanced Cu Low-k Chips
Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability
Impact of Lightly Doped Drain on Hot Carrier Degradation Variability in N-FETs and SRAM Cells
Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices
A Novel Methodology to Predict Process-Induced Warpage in Advanced BEOL Interconnects
Impact of Gate Metal Work Function on 1/f Noise in RMG MOSFETs
Threading dislocations in III-V semiconductors: Analysis of electrical conduction
Analysis of advanced circuits for SET measurement
On the origin of the leakage current in p-gate AlGaN/GaN HEMTs
A Comparison of Environmental Stressing Data and Simulation at the Corner of a Test Chip in a FC-BGA Package
Impact of Barrier Metal Thickness on SRAM Reliability
Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
Finding Suitable Gate Insulators for Reliable 2D FETs
Fast Neutron Irradiation Effects on Multiple Gallium Nitride (GaN) Device Reliability in Presence of Ambient Variations
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures
"Pinch to Detect": A Method to Increase the Number of Detectable RTN Traps in Nano-scale MOSFETs
Characterization of Critical Peak Current and General Model of Interconnect Systems Under Short Pulse-Width Conditions
Reliability of Non-Volatile Memory Devices for Neuromorphic Applications: A Modeling Perspective (Invited)
Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework
Latch-up in FinFET technologies
NBTI in Si0.5Ge0.5 RMG gate stacks - Effect of high-k nitridation
Impact of Hot-Carrier Degradation on Flicker Noise (1/f) in 45-nm PD-SOI Floating-Body NFETs
A Full Transient ElectroThermal - Elastoplastic Mechanical and Metallurgical 2D FEM of SiC MOSFET for Gate-Region Stress Investigation under Short-Pulse Short-Circuit (Invited)
Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications
Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects using high statistical sampling
Intra- and inter-chip electrical interconnection formed by directed self assembly of nanocomposite containing diblock copolymer and nanometal
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors
A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures
HV-CV Analysis Trapping Behavior in 650V pGaN HEMT with Field Plates for High-Voltage Power Applications
Reliability Modeling of Middle-Of-Line Interconnect Dielectrics in Advanced process nodes
Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications
Robust avalanche in GaN leading to record performance in avalanche photodiode
Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses
New Insights into TDDB in FinFET Based on Strain Analysis at the Atomistic Scale
Optimized CDM-ESD Protection for 100+ Gbps Wireline IO in 16-nm CMOS
Program Disturb Mechanism in Embedded SuperFlash ® Technology
Accelerated BTI degradation under stochastic TDDB effect
Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment
Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards Cache Application
Suppression of endurance-stressed data-retention failures of 40nm TaOx-based ReRAM
A new technique for evaluating stacked nanosheet inner spacer TDDB reliability
Electromigration Early Failures for Cu Pillar Interconnections with an ENEPIG Pad Finish and its Suppression
TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection
High voltage robustness of mold compounds under different environmental conditions
Analysis of Transient HTRB Leakage in a SiC Field Ring Termination
Numerical and Thermal Analysis of Reverse Leakage Current of Pseudo-Vertical GaN p-n Diodes Grown with Selective Area Growth
Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons
Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs
A Systematic Study of Temperature, Polarity, Thickness, and Ramp Rate Dependencies of Ramp-Voltage Stress for SiO2 and its Comparison with 2D Gate Dielectrics
Electrostatic Shielding of NAND Flash Memory from Ionizing Radiation
A Comprehensive Study of Read-After-Write-Delay for Ferroelectric VNAND
A new S-parameter Deep Level Transient Spectroscopy (S-DLTS) Method: Development and Qualification
Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects
New Developments in SiGe HBT Reliability for RF Through mmW Circuits
Backside Failure Analysis of IGBT power devices assembled in STPAK
Dynamic Reverse Bias Reliability Testing of SiC MOSFETs
Accelerating the Recovery of p-Gate GaN HEMTs after Overvoltage Stresses
The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics
Leakage and TDDB Mechanisms in 18 nm Pitch Direct Metal Etch Ru Interconnects with Airgaps
Universal Hot Carrier Degradation Model under DC and AC Stresses
Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs
Correlation between Access Polarization and High Endurance (~ 10 12 cycling) of Ferroelectric and Anti-Ferroelectric HfZrO2
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications
Evidence of Carbon Doping Effect on VTH Drift and Dynamic-RON of 100V p-GaN Gate AlGaN/GaN HEMTs
Neuromorphic Computing with Phase Change, Device Reliability, and Variability Challenges
A New Implementation Approach for Reliability Design Rules against Plasma Induced Charging Damage from Well Configurations of Complex ICs
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation
Analysis of the interactions of HCD under "On" and "Off" state modes for 28nm FDSOI AC RF modelling
Read Voltage Dependency of Random Telegraph Noise in the Intermediate State of TaOx-based ReRAM
Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages
Transient Investigation of Metal-oxide based, CMOS-compatible ECRAM
Gate Stability and Robustness of In-Situ Oxide GaN Interlayer Based Vertical Trench MOSFETs (OG-FETs)
TSV/FET proximity study using dense addressable transistor arrays
Proton irradiation-induced traps causing VT instabilities and RF degradation in GaN HEMTs
An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias
Design-Technology-Reliability Co-Optimization for MRAM-OTP Integration - A Methodological Approach
Embedded Deep-Nwell Collector Used to Improve Latch-Up Immunity of Multi-Functional I/O Buffer with Indirect Power-Connected N-Well
Reliability perspective of resistive synaptic devices on the neuromorphic system performance
Workload-dependent BTI analysis in a processor core at high level
PHM of state-of-charge for flexible power sources in wearable electronics with EKF
Improved GGSCR layout for overshoot reduction
The relationship between border traps characterized by AC admittance and BTI in III-V MOS devices
Impact of Mechanical Stress on IGZO TFTs: Enhancing PBTI Degradation
Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET
Thermal Performance Evaluation of Multi-Core SOCs Using Power-Thermal Co-Simulation
3 Factor Accelerated Lifetime Testing in Lateral GaN Power HEMTs: A Tutorial
Enhanced Fail Rate Projections Using Negative Design Assist in Automotive Grade SRAMs
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention
Diagnostic electromigration reliability evaluation with a local sensing structure
Reliability of CMOS Integrated Memristive HfO2 Arrays with Respect to Neuromorphic Computing
Cost-Effective Assessment of Neutron-Induced SER Using Single Proton Irradiation Test with Fixed Correlation Factor
Investigating Read-After-Write Delay in Ferroelectric FET with Gate-Side Injection
Trap Density Modulation for IO FinFET NBTI Improvement
Electromigration Assessment in Power Grids with Account of Non-Uniform Temperature Distribution
Front-plane and Back-plane Bias Temperature Instability of 22 nm Gate-last FDSOI MOSFETs
Non-poissonian behavior of hot carrier degradation induced variability in MOSFETs
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper)
Multilevel Variability and Epistemic Uncertainty Analysis of Reliability Physics Models Through Hierarchical Probabilistic Modelling
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM
Memory update characteristics of carbon nanotube memristors (NRAM ® ) under circuitry-relevant operation conditions
Re-consideration of Correlation between Interface and Bulk Trap Generations using Cryogenic Measurement
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress
Degradation mechanisms of dye-sensitized solar cells: Light, bias and temperature effects
Investigation of the Time-Dependent BTI-induced Degradation Distribution for Ring Oscillators in Ultra-Long-Term Stress Conditions
Platform qualification methodology: Face recognition
Copper Damascene Based Heterogeneous Integration of GaN with CMOS on 200 mm Si Substrates (Invited)
Dynamic vs Static Burn-in for 16nm Production
Superior Endurance Performance of 22-nm Embedded MRAM Technology
Deep level effects and degradation of 0.15 μm RF AlGaN/GaN HEMTs with Mono-layer and Bi-layer AlGaN backbarrier
Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs
A Comprehensive Wafer Level Reliability Study on 65nm Silicon Interposer
Fundamental understanding of NBTI degradation mechanism in IGZO channel devices
3D Approaches to Engineer Holding Voltage of SCR
Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs
Reliability aspects of ferroelectric hafnium oxide for application in non-volatile memories
Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET
A Novel Data Recovery Technique for 3D TLC NAND Flash Memory Using Intercell Program
Data retention statistics and modelling in HfO2 resistive switching memories
Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors
A new mechanism of signal path charging damage across separated power domain deep N-Well interface
HCI Temperature sense effect from 180nm to 28nm nodes
$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extraction in Hard-Switched E-mode GaN HEMTs: Impact of Passivation and Layout
Reliability, Availability, and Serviceability Challenges for Heterogeneous System Design
Effect of OTS Selector Reliabilities on NVM Crossbar-based Neuromorphic Training
Thermomechanical behaviour of inverse diode in SiC MOSFETs under surge current stress
Coupled accelerated stress tests for comprehensive field reliability - Synergistic effects of moisture and temperature cycling
Designing soft-error-aware circuits with power and speed optimization
Stress-induced instabilities of shunt paths in high efficiency MWT solar cells
Stochastic and topologically aware electromigration analysis for clock skew
Successive breakdown mode of time-dependent dielectric breakdown for Cu interconnects and lifetime enhancement under dynamic bias stress
Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients
Charge Trapping and Stability of E-Mode p-gate GaN HEMTs Under Soft- and Hard- Switching Conditions
Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics: Insights from a multi-scale modeling approach
Analysis of TDDB lifetime projection in low thermal budget HfO2/SiO2 stacks for sequential 3D integrations
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs
Physics of Degradation in SiC MOSFETs Stressed by Overvoltage and Overcurrent Switching
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory
Interplay Between Charge Defects and Ferroelectric Reliability: From Wake-Up, Imprint, Fatigue to Breakdown
Evaluation of the system-level SER performance of gigabit ethernet transceiver devices
Method to evaluate off-state breakdown in scaled Tri-gate technologies
Reliability characterization of advanced CMOS image sensor (CIS) with 3D stack and in-pixel DTI
Challenges of Gate Stack TDDB in Gate-All-Around Nanosheet Towards Further Scaling
Exploring the Reliability Limits for the Z-Pitch Scaling of Molybdenum Inter-Word Line Oxides in 3D NAND
Embracing the Unreliability of Memory Devices for Neuromorphic Computing
Robustness Assessment Through 77GHz Operating Life Test of Power Amplifier for Radar Applications in 28nm FD-SOI CMOS
Device reliability for CMOS image sensors with backside through-silicon vias
Tristate Resistive Switching in Heterogenous Van Der Waals Dielectric Structures
At-Speed Defect Localization by Combining Laser Scanning Microscopy and Power Spectrum Analysis
NBTI Impact of Surface Orientation in Stacked Gate-All-Around Nanosheet Transistor
Systematic Study of Process Impact on FinFET Reliability
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices
ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution
V-Ramp test and gate oxide screening under the "lucky" defect model
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics
Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper
Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers
Modified transformerless dual buck inverter with improved lifetime for PV applications
Oxide breakdown path for optical sensing at the nanoscale level
Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under high temperature storage tests
No Trouble Found (NTF) Customer Return Analysis
Modeling of Post-Cycling Retention Bake in 3-D CTF TLC NAND Arrays
The impact of inverter-like transitions on device TDDB and ring oscillators
Novel Weight Mapping Method for Reliable NVM based Neural Network
Aging models for n- and p-type LDMOS covering low, medium and high VGS operation
Reliability of optoelectronic module An Introduction
Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs
Exploring Fault Injection Attack Resilience of Secure IC Chips : Invited Paper
Post-Silicon Validation of Static Lockstep Mode on Intel ® Xeon ® Processor E-Core Architecture
Performance and Reliability of Nanosheet Oxide Semiconductor FETs with ALD-Grown InGaO for 3D Integration (Invited)
Universal Impacts of Local Electric Fields on the Projected Dielectric Lifetime
Reliability and Integration Challenges Underlying New Material Introduction into Memory Technology (Invited)
Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS
Device Design and Reliability of GAA MBCFET
The impact and implication of BTI/HCI decoupling on ring oscillator
PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors
PBTI evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with Al2O3 and LaAlO3 gate dielectrics
Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays
Robust RRAM-based In-Memory Computing in Light of Model Stability
Electromigration in Gold: Challenges and Possibilities (Invited)
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel
Characterization of Early Breakdown of SiC MOSFET Gate Oxide by Voltage Ramp Tests
Semi-empirical stress/energy-based acceleration of temperature cycling failure
Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection
Aging Challenges in On-chip Voltage Regulator Design
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs
Study of the Walk-Out Effect of Junction Breakdown Instability of the High-Voltage Depletion-Mode N-Channel MOSFET for NAND Flash Peripheral Device and an Efficient Layout Solution
Towards a Robust Approach to Threshold Voltage Characterization and High Temperature Gate Bias Qualification
Self-heating and its implications on hot carrier reliability evaluations
Investigation on Temperature-Dependent Resistance States of 40nm MLC-RRAM Macro
Threshold voltage shift and interface/border trapping mechanism in Al2O3/AlGaN/GaN MOS-HEMTs
A moisture-related breakdown mechanism in low-k dielectrics using a multiple I-V ramp test
AI-Powered Analytics Using Empirical Data from In-Field Measurements and Reliability Qualification
Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications
Compact MEOL OxRAM with 14 Conductance Levels for Dense Embedded Inference Computing
An Evaluation of X-Ray Irradiation Induced Dynamic Refresh Characterization in DRAM
Methodology to improve Safety Critical SoC based platform: a case study
Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI
Drastic reliability improvement using H2O2/UV treatment of HfO2 for heterogeneous integration
On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN/GaN HEMTs
Bidirectional Threshold Voltage Shift After Positive Bias Temperature Instability of p-GaN HEMTs at Cryogenic Temperature
A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path
Effect of Non-identical Annealing on the Breakdown Characteristics of Sputtered IGZO Films
Local Electric Field-Aware 3D TDDB Model for BEOL Reliability Predictions
A World First QLC RRAM: Highly Reliable Resistive-Gate Flash with Record 10 8 Endurance and Excellent Retention
Demonstration on Warpage Estimation Approach Utilized in Fan-Out Panel-Level Packaging Enabled by Multi-Scale Process-Oriented Simulation
Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory
Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
Effect of High Temperature RF Stress on the Trapping Behavior of Carbon Doped AlN/GaN/AlGaN HEMTs
Influence of Starting Material on Final Device in SiC Power Technologies
A BSIM-Based Predictive Hot-Carrier Aging Compact Model
6G Roadmap for Semiconductor Technologies: Challenges and Advances
Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs
Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG
An Abnormal Negative Temperature Dependence of Erasestate Vt Retention Shift in 3-D NAND Flash Memories
Measurement of the Pre-Breakdown Characteristics in Silicon Carbide Power Devices by the Use of Radioactive Gamma Sources
A novel GaN HEMT degradation mechanism observed during HTST test
Investigation of reliability of NO nitrided SiC(1100) MOS devices
Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs
Fe-Traps Influence on Time-dependent Breakdown Voltage in 0.1-μm GaN HEMTs for 5G Applications
Low-Frequency Noise Measurements to Characterize Cu-Electromigration Down to 44nm Metal Pitch
Estimation of Oxide Breakdown Voltage During a CDM Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements
The Optimal Shape of MEMS Beam Under High-G Shock Based on a Probabilistic Fracture Model
RTS noise reduction of 1Y-nm floating gate NAND flash memory using process optimization
Reliability Limiting Defects in MOS Gate Oxides: Mechanisms and Modeling Implications
Extended Analysis of Power Cycling Behavior of TO-Packaged SiC Power MOSFETs
Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability
MTJ degradation in multi-pillar SOT-MRAM with selective writing
A Realistic Modeling Approach To Explain the Physical Mechanism of TDDB For Automotive Grade-Zero Applications
Peculiar Current Instabilities & Failure Mechanism in Vertically Stacked Nanosheet ggN-FET
Recent US West Coast Wildfire Disasters: Impact on the Reliability Assessment of Optical Transceivers
Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation