yusuke1997/dblp-id-title huggingface dataset:
On the impact of Ag doping on performance and reliability of GeS2-based Conductive Bridge Memories
Excursion prevention and increasing device performance using mask correction for intrafield CD and Overlay improvement
A Calibration-Free In-Memory True Random Number Generator Using Voltage-Controlled MRAM
Multibranch mobility characterization: Evidence of carrier mobility enhancement by back-gate biasing in FD-SOI MOSFET
Replacing Si to SiC: Opportunities and challenges
Impact of layout and channel processing on CMOS low frequency noise variability
Impact of crystallographic orientation and impurity scattering in Graphene-Base Heterojunction Transistors for Terahertz Operation
Low Profile Open MEMS and ASIC Packages manufactured by Flexible Hybrid Integration in a Roll-to-Roll compatible process
A novel HfO2-GeS2-Ag based conductive bridge RAM for reconfigurable logic applications
3-D electrothermal device/circuit simulation of DC-DC converter module in multi-die IC
TCAD predictions of hot-electron injection in p-type LDMOS transistors
Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits
OLED-on-Silicon Microdisplays: Technology, Devices, Applications
Compact MEMS modeling to design full adder in Capacitive Adiabatic Logic
Circuit-Based Hydrodynamic Modeling of AlGaN/GaN HEMTs
Investigation of gate material ductility enables flexible a-IGZO TFTs bendable to a radius of 1.7 mm
5G wireless communication beyond 2020
Impact of Gold Interconnect Microstructure on Electromigration Failure Time Statistics
7.5nJ/inference CMOS Echo State Network for Coronary Heart Disease prediction
Statistical Ab Initio Analysis of Electron Trapping Oxide Defects in the Si/SiO2 Network
Avalanche compact model featuring SiGe HBTs characteristics up to BVcbo
Methodology for extracting the characteristic capacitances of a power MOSFET transistor, using conventional on-wafer testing techniques
Metal gate VT modulation using PLAD N2 implants for Ge p-FinFET applications
A 6.7 MHz nanoelectromechanical ring oscillator using curved cantilever switches coated with amorphous carbon
Ferroelectric Tunnel Junctions based on Ferroelectric-Dielectric Hf0.5Zr0.5.O2/ A12O3Capacitor Stacks
Graphene quantum capacitors for high-Q tunable LC-tanks for RF ICs
Comprehensive Modeling of Advanced Composite Magnetoresistive Devices
Low-Overhead Implementation of Binarized Neural Networks Employing Robust 2T2R Resistive RAM Bridges
Performance Evaluation of Silicon Based Thermoelectric Generators Interest of Coupling Low Thermal Conductivity Thin Films and a Planar Architecture
A 9.8 μm sample and hold time to amplitude converter CMOS SPAD pixel
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells
Impact of impurities, interface traps and contacts on MoS2 MOSFETs: Modelling and experiments
A new method for junctionless transistors parameters extraction
Fast acquisition of activation energy maps using temperature ramps for lifetime modeling of BTI
A full-quantum simulation study of InGaAs NW MOSFETs including interface traps
High temperature behaviour of GaN-on-Si high power MISHEMT devices
Physical modeling of the hysteresis in M0S2 transistors
Thermal Sensing Performances of Thin-Film Lateral PiN Diodes at 80 K and 300 K
Polarization switching and AC small-signal capacitance in Ferroelectric Tunnel Junctions
Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory
Geometry based resistance model for phase change memory
GaN based HEMT technology for Power and RF applications
Graphene-channel FETs for photonic frequency double-mixing conversion over the sub-THz band
A manufacturable process for single electron charge detection, a step towards quantum computing
22FDX ® Device Optimization for mmW PA
The Module of Gain-controllable Amplifier Readout Circuits based on Si Nanowire ISFET for Biochips for Optimization of Dynamic Range, Linearity, and Resolution
Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime
Freeform and flexible electronics manufacturing using R2R printing and hybrid integration techniques
Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk
Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities
Modelling, design and characterization of Schottky diodes in 28nm bulk CMOS for 850/1310/1550nm fully integrated optical receivers
A high-sensitivity 135GHz millimeter-wave imager by differential transmission-line loaded split-ring-resonator in 65nm CMOS
First and Second Order Piezoresistive Characteristics of CMOS FETs: Weak through Strong Inversion
How chips helped discover the Higgs boson at CERN
Modeling circuits with spins and magnets for all-spin logic
52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022
Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide
Si tunneling transistors with high on-currents and slopes of 50 mV/dec using segregation doped Nisi2 tunnel junctions
SPICE modeling of light induced current in silicon with 'Generalized' lumped devices
51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021
Complementary III-V heterostructure tunnel FETs
Electrical and Noise Characteristics of Fin-Shaped GaN/AlGaN Devices for High Frequency Operation
Compact Modelling of 22nm FDSOI CMOS Semiconductor Quantum Dot Cryogenic I-V Characteristics
Analysis of the effect of cell parameters on the maximum RRAM array size considering both read and write
A Novel 4H-SiC UV Photo-transistor based on a Shallow Mesa Structure
Analog SiPM in planar CMOS technology
Advances in steep-slope tunnel FETs
The exploitation of magnetization orientation encoded spin-transfer torque for an ultra dense non-volatile magnetic shift register
Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs
Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors
Experimental characterization of the static noise margins of strained silicon complementary tunnel-FET SRAM
Low-Noise Single Photon Avalanche Diodes in a 110nm CIS Technology
BEoL integrated hafnium zirconium oxide varactors for tunable mmWave applications
MOSFET degradation under DC and RF Fowler-Nordheim stress
4-Terminal Ferroelectric Schottky Barrier Field Effect Transistors as Artificial Synapses
Investigation of electrically gate-all-around hexagonal nanowire FET (HexFET) architecture for 5 nm node logic and SRAM applications
RF MEMS power sensors for ultra-low power wake-up circuit applications
Low-noise and large-area CMOS SPADs with timing response free from slow tails
600 V, low-leakage AlGaN/GaN MIS-HEMT on bulk GaN substrates
Effect of substrate bias on frequency dependence of MOSFET noise intensity
One-Pulse-Programmable Multi-Level PCM/Selector Cross-Point Memory for 20 nm Half Pitch and Beyond
On the fly characterization of charge trapping phenomena at GaN/dielectric and GaN/AlGaN/dielectric interfaces using impedance measurements
Advantage of TiN Schottky gate over conventional Ni for improved electrical characteristics in AlGaN/GaN HEMT
Characterization and Modeling of BTI in SiC MOSFETs
New fast distributed thermal model for analysis of GaN based power devices
Quantum dot devices: Technology vehicles for nanoscale physics and paths for future applications
Contact resistance Study of "edge-contacted" metal-graphene interfaces
Engineering of a TiN\Al2O3\(Hf, Al)O2\Ta2O5\Hf RRAM cell for fast operation at low current
A semiconductor memory development and manufacturing perspective
Cyborg insects, neural dust and other things: Building interfaces between the synthetic and the multicellular
Smart Connected Sensors - Enablers for the IoT
Circuit Model for the Efficient Co-Simulation of Spin Qubits and their Control & Readout Circuitry
Strain effect on mobility in nanowire MOSFETs down to 10nm width: Geometrical effects and piezoresistive model
22% Higher performance, 2x SCM write endurance heterogeneous storage with dual storage class memory and NAND flash
Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern
Stability and performance optimization of InGaAs-OI and GeOI hetero-channel SRAM cells
Filter-less color sensor in standard CMOS technology
Eliminating Charge Sharing in Clocked Logic Gates on the Device Level Employing Transistors with Multiple Independent Inputs
Multi-level Operation of FeFETs Memristors: the Crucial Role of Three Dimensional Effects
Magnetic Domain Wall Memory: A DTCO study for Memory Applications
Mobility enhancement by integration of TmSiO IL in 0.65nm EOT high-k/metal gate MOSFETs
Nanostructure devices for logic and memory and beyond
Floating gate memory based on MoS2 channel and iCVD polymer tunneling dielectric
Suspended Antenna-Coupled Nanothermocouple Array for Long-Wave Infrared Detection
Energy harvesting with on-chip solar cells and integrated DC/DC converter
A novel depletion mode p-GaN island HEMT and its use in a monolithically integrated start-up circuit
Characterization and Modeling of High Voltage MOS Robustness During Recirculation in Smart Power technologies
Compact heterodyne NEMS oscillator for sensing applications
CMOS interface with biological molecules and cells : Invited review paper
Fast high power capacitive RF-MEMS switch for X-Band applications
Ink-jet printed 2D crystal heterostructures
TCAD modeling of encapsulation layer in high-voltage, high-temperature operation regime
Doped GeSe materials for selector applications
Performance Comparison of SRAM Designs Implemented with Silicon-On-Insulator Nanosheet Transistors and Bulk FinFETs
High performance WTe2-MoS2in-plane heterojunction Tunnel Field Effect Transistors
Transport in amorphous materials with applications to phase-change memories
Kink effect characterization in AlGaN/GaN HEMTs by DC and drain current transient measurements
Current gain and low-frequency noise of symmetric lateral bipolar junction transistors on SOI
Steep slope transistors: Tunnel FETs and beyond
Threshold voltage and on-current Variability related to interface traps spatial distribution
Role of Conductive-Metal-Oxide to HfOx, Interfacial Layer on the Switching Properties of Bilayer TaOx/HfOx ReRAM
WS2 transistors on 300 mm wafers with BEOL compatibility
Wide Bandgap power devices and applications; the U.S. initiative
SPICE Model of SPAD Transient Intrinsic Response Validated using Mixed-Mode TCAD Simulations
Si MOS technology for spin-based quantum computing
Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation
Carrier lifetime evaluation in FD-SOI layers
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design
UTBB FDSOI: Evolution and opportunities
Electrical and thermoelectrical properties of gated InAs nanowires
Resistive switching memory using titanium-oxide nanoparticle films
Evolution of oxygen vacancies under electrical characterization for HfOx-based ReRAMs
A Study of the Variability and Design Considerations of Ferroelectric VNAND Memories With Polycrystalline Films Using An Experimentally Validated TCAD Model
22FDX ® fMAX Optimization through Parasitics Reduction and GM Boost
Charge transfer speed analysis in pinned photodiode CMOS image sensors based on a pulsed storage-gate method
Thermal-aware CMOS: Challenges for future technology and design evolutions
Towards IC-based quantum sensing - recent achievements and future research trends
A 0.5 mm 2 0.31 V/0.39 V 28 nW/144 nW 65 nm CMOS Solar Cell-Powered Biofuel Cell-Input Biosensing System with PIM/PDM LED Driving for Stand-Alone RF-Less Continuous Glucose Monitoring Contact Lens
On the voltage scaling potential of SONOS non-volatile memory transistors
Computational electronics for the 21 st century: Reflections on the past, present, and future
High performance printed N and P-type OTFTs for complementary circuits on plastic substrate
Study of strained effects in nanoscale GAA nanowire FETs using 3D Monte Carlo simulations
Compact model for parametric instability under arbitrary stress waveform
The Factory Integration Roadmap in Semiconductor manufacturing
Management of parasitic bipolars in modular high power LDMOS technology
Analog performance of strained SOI nanowires down to 10K
The effect of the surface fixed charge and donor traps on the C(V) and transfer characteristics of a GaN MISFET - Experiment and TCAD simulations
From FinFET to nanowire ISFET
Compact modeling of STT-MTJ for SPICE simulation
Performance limit of parallel electric field tunnel FET and improvement by modified gate and channel configurations
Impact of Channel Length on Characteristics of 600V 4H-SiC Inversion-channel Planar MOSFETs
Low power finfet ph-sensor with high-sensitivity voltage readout
Toward effective passivation of graphene to humidity sensing effects
Large Scale MoS2/Si Photodiodes with Graphene Transparent Electrodes
Complementary Two-Dimensional (2-D) MoS2 FET Technology
Experimental evidences and simulations of trap generation along a percolation path
Modelling and simulation of nanomagnetic logic with cadence virtuoso using Verilog-A
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS
FD-SOI integration solutions for analog, RF and Millimeter-wave applications
Multilevel SOT-MRAM cell with a novel sensing scheme for high-density memory applications
High performance low A/R poly PN diode for 20nm node PCRAM cell switch
Wafer-scale fabrication of biologically sensitive Si nanowire FET: from pH sensing to electrical detection of DNA hybridization
Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic Temperatures
Systematic comparison of metal contacts on CVD graphene
CMOS-compatible SOI micro-hotplate-based oxygen sensor
mmWand high speed solutions enabled by FD-SOI
FDSOI molecular flash cell with reduced variability for low power flash applications
Co-integration Process Compatible Input/Output (I/O) Device Options for GAA Nanosheet Technology
Comprehensive modeling and characterization of Photon Detection Efficiency and Jitter in advanced SPAD devices
A self-sustaining Single Photon Avalanche Diode Model
Manufacturing aspects of an ultra-thin chip technology
Performance study of strained III-V materials for ultra-thin body transistor applications
Low-frequency noise in bare SOI wafers: Experiments and model
Two dimensional quantum mechanical simulation of low dimensional tunneling devices
Ultrathin lateral unidirectional bipolar-type insulated-gate transistor as pH sensor
Highly Sensitive p-GaAsSb/n-InAs Nanowire Backward Diodes for Low-Power Microwaves
Mechanically flexible double gate a-IGZO TFTs
Scaling ferroelectric HZO thickness for low power Ge MFS-FTJ memories
Improving Ge-rich GST ePCM reliability through BEOL engineering
Low-Noise and High-Efficiency Near-IR SPADs in 110nm CIS Technology
FDSOI bottom MOSFETs stability versus top transistor thermal budget featuring 3D monolithic integration
Organic complementary circuits - Scaling towards low voltage and submicron channel length
Static and low frequency noise characterization of densely packed CNT-TFTs
Reduction of momentum and spin relaxation rate in strained thin silicon films
Advanced 3-D device and circuit electrothermal simulations of power integrated circuit
Impact of Random Telegraph Signals on 6T high-density SRAM in 28nm UTBB FD-SOI
Current-voltage characteristics of vertical diodes for next generation memories
Study of error repeatability and recovery in 40nm TaOx ReRAM
Influence of Metal on Schottky Barrier Inhomogeneity in Ga2O3 Schottky Barrier Diodes
Ge/III-V MOS device technologies for low power integrated systems
Highly-uniform multi-layer ReRAM crossbar circuits
Fabrication of high performance AlGaN/GaN FinFET by utilizing anisotropic wet etching in TMAH solution
Proceedings of the European Solid-State Device Research Conference, ESSDERC 2013, Bucharest, Romania, September 16-20, 2013
On the ballistic ratio in 14nm-Node FinFETs
Temperature dependence of threshold voltage fluctuations in CMOS transistors incorporating halo implant
MOSFET Characterization with Reduced Supply Voltage at Low Temperatures for Power Efficiency Maximization
Implementation of a DC compact model for double-gate Tunnel-FET based on 2D calculations and application in circuit simulation
Time multiplexed active neural probe with 678 parallel recording sites
Strain and layout management in dual channel (sSOI substrate, SiGe channel) planar FDSOI MOSFETs
Investigations on current filamentation in PIN diodes using TLP measurements and TCAD simulations
A Charge-Domain Computation-In-Memory Macro with Versatile All-Around-Wire-Capacitor for Variable-Precision Computation and Array-Embedded DA/AD Conversions
PDMS-supported graphene transfer using intermediary polymer layers
Lowering forming voltage and forming-free behavior of Ta2O5 ReRAM devices
Modeling and characterization of hot-carrier stress degradation in power MOSFETs (invited)
Temperature dependence of contact resistance for gold-graphene contacts
Tin nanowire field effect transistor
Guidelines for symmetric threshold voltage in tunnel FinFETs with single and dual metal gate electrodes
A novel approach to analyze the reliability of GaN power HEMTs operating in a DC-DC Buck converter
Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model
Principles and trends in quantum nano-electronics and nano-magnetics for beyond-CMOS computing
Qualitative assessment of epitaxial graphene FETs on SiC substrates via pulsed measurements and temperature variation
Power Packages Interconnections for High Reliability Automotive Applications
Nature as microelectronic fab: Bioelectronics: Materials, transistors and circuits
Silicon LEDs in FinFET technology
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory
Reconfigurable nanowire electronics - Device principles and circuit prospects
Statistical analysis of dynamic variability in 28nm FD-SOI MOSFETs
Improving the resistive switching uniformity of forming-free TiO2-x based devices by embedded Pt nanocrystals
Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment
Si-based Spin Metal-Oxide-Semiconductor Field-Effect Transistors with an Inversion Channel
Ultrahigh-voltage SiC devices for future power infrastructure
Influence of fluorine-based dry etching on electrical parameters of AlGaN/GaN-on-Si High Electron Mobility Transistors
Advanced TCAD for predictive FinFETs Vth mismatch using full 3D process/device simulation
Mechanical Band Gap Formation in Anisotropic CMOS Back-End-of-Line Stacks for Monolithic High-Q MEMS Resonator Confinement
Negative capacitance field effect transistors; capacitance matching and non-hysteretic operation
Low-temperature transport characteristics in SOI and sSOI nanowires down to 8nm width: Evidence of IDS and mobility oscillations
Towards high performance sub-10nm finW bulk FinFET technology
Dynamics of Polarization Switching in Mixed Phase Ferroelectric-Antiferroelectric HZO Thin Films
A new physics-based compact model for Bilayer Graphene Field-Effect Transistors
Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI
High performance high reliability AlN/GaN DHFET
First Foundry Platform Demonstration of Hybrid Tunnel FET and MOSFET Circuits Based on a Novel Laminated Well Isolation Technology
Identifying failure mechanisms in LDMOS transistors by analytical stability analysis
Near-IR response of highly-strained Si photodetector linking first principles and TCAD
Complementary black phosphorous FETs by workfunction engineering of pre-patterned Au and Ag embedded electrodes
Integration and Reliability Aspects of Low-Temperature and Au-free Ta/Al-based Ohmic Contacts for AlGaN/GaN MIS-HEMTs
Electron delay analysis and image charge effect in AlGaN/GaN HEMT on silicon substrate
Weibull analysis of the kinetics of resistive switches based on tantalum oxide thin films
Contact resistance extraction methods for CNTFETs
Design challenges for nano-scale devices
Localization and analysis of surface charges trapped in AlGaN/GaN HEMTs using multiple secondary MIS gates
Scaling of InAlN/GaN power transistors
TCAD degradation modeling for LDMOS transistors
Flexible platinum nanoparticle strain sensors
Porous Si dielectric parameter extraction for use in RF passive device integration: Measurements and simulations
Impact of device geometry of the fin Electron-Hole Bilayer Tunnel FET
Shunt capacitive switches based on VO2 metal insulator transition for RF phase shifter applications
4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits
DC-110 GHz Characterization of 22FDX ® FDSOI Transistors for 5G Transmitter Front-End
Novel AlInN/GaN integrated circuits operating up to 500 °C
A 40nm RRAM Compute-in-Memory Macro Featuring On-Chip Write-Verify and Offset-Cancelling ADC References
Material and device innovation impact on reliability for scaled CMOS technologies
Random telegraph signal noise in tunneling field-effect transistors with S below 60 mV/decade
Novel AlGaN/GaN omega-FinFETs with excellent device performances
High-Conductance, Ohmic-like HfZrO4 Ferroelectric Memristor
Automotive electronics: Application & technology megatrends
TiTe/Ge2Sb2Te5Bi-layer-based Phase-Change Memory Targeting Storage Class Memory
Analysis of substrate currents propagation in HVCMOS technology
Optimization of writing scheme on 1T1R RRAM to achieve both high speed and good uniformity
53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023
NPN Si/SiGe memory selector with non-linearity>10 5 and ON-current>6MA/cm 2
CMOS compatible ALD high-k double slot grating couplers for on-chip optical interconnects
Extended Temperature Modeling of InGaAs/InP SPADs
Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs
Reliability aspects of TiSi-Schottky barrier diodes in a SiGe BiCMOS technology
On the forming-free operation of HfOx based RRAM devices: Experiments and ab initio calculations
28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications
ESD diodes with Si/SiGe superlattice I/O finFET architecture in a vertically stacked horizontal nanowire technology
Low dark count rate and low timing jitter InGaAs/InP Single-Photon Avalanche Diode
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
Low-power DRAM-compatible Replacement Gate High-k/Metal Gate stacks
Magnetoresistance measurements and unusual mobilitiy behavior in FD MOSFETs
RF performance of Standard, High-Resistivity and Trap-Rich Silicon substrates down to cryogenic temperature
Ultra low power NO2 gas sensors based on suspended CNFETs
Self-consistent Automated Parameter Extraction of RRAM Physics-Based Compact Model
Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage
Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps
Investigation of SRAM using BTI-aware statistical compact models
Joule Heating in SiOx RRAM Device Studied by an Integrated Micro-Thermal Stage
Overcoming the Data Deluge Challenges with Greener Electronics
Dark Count Rate in Single-Photon Avalanche Diodes: Characterization and Modeling study
Nanometer-scale InGaAs field-effect transistors for THz and CMOS technologies
Investigation of partially gated Si tunnel FETs for low power integrated optical sensing
High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications
FDSOI devices: Issues and innovative solutions
H2 annealing for metallic contaminant reduction in BCD-SOI process: Benefits and drawbacks
Characterization of n-channel MOSFETs: Electrical measurements and simulation analysis
Comprehensive compact electro-thermal GaN HEMT model
Diamond electronics
Current dependence of the piezoresistive coefficients of CMOS FETs on (100) silicon
On-wafer graphene diodes for high-frequency applications