Modified Baseline for Light Field Stitching In traditional 2D image stitching, the baseline method usually means global homography via Direct Linear Transformation (DLT) on inliers. In this paper, a modified baseline method for light field (LF) stitching is proposed to stitch two LFs. The depth map and the center subaperture image (SAI) are used to filter the feature points of the entire LF. The global 4D homography is then calculated by DLT to align all SAIs corresponding to the same angular domain coordinates of two LFs. Finally, the improved Markov Random Field (MRF) energy considering the global LF is used to find the seam of 2D SAIs instead of computational 4D graph cut. Experimental results show that the proposed method can effectively stitch the 4D LFs, and preserve the consistency of the angular and spatial domains of the stitched LF compared with implementing 2D image stitching to the corresponding SAIs. Moreover, the method proposed in this paper can easily extend all advanced 2D image stitching methods to 4D LF, so that the acquired LF can have larger field of view and wider applications.

A New Stitching Method for DarkField Surface Defects Inspection Based on Simplified TargetTracking and Path Correction A camerabased darkfield imaging system can effectively detect defects of microns on large optics by scanning and stitching subapertures with a small field of view. However, conventional stitching methods encounter problems of mismatches and location deviations, since few defects exist on the tested fine surface. In this paper, a highly efficient stitching method is proposed, based on a simplified targettracking and adaptive scanning path correction. By increasing the number of subapertures and switching to camera perspective, the defects can be regarded as moving targets. A targettracking procedure is firstly performed to obtain the marked targets. Then, the scanning path is corrected by minimizing the sum of deviations. The final stitching results are updated by reusing the targettracking method. An experiment was carried out on an inspection of our specially designed testing sample. Subsequently, 118 defects were identified out of 120 truly existing defects, without stitching mismatches. The experiment results show that this method can help to reduce mismatches and location deviations of defects, and it was also effective in increasing the detectability for weak defects.