Stability Enhancing SRAM cell for low power LUT Design Abstract   Field Programmable Gate Array (FPGA) is the most recently used platform for real time applications such as security and multimedia processing. In FPGA mapping, there is some energy overhead due to the usage of programmable interconnects. To mitigate these limitations an energy efficient six input Look Up Tablexc2xa0(LUT) is designed using Stability Enhancing Static RandomAccess Memory (SESRAM) cell requiring only seven transistors. The proposed SESRAM cell reduces the area, power consumption, energy consumption, delay and increases the read stability, write stability by minimizing the size of read access transistor as 2xc2xa0xe2x80x8bnm and maximizing the size of write access transistor as 3xc2xa0xe2x80x8bnm. The proposed SE7T reduces the write xe2x80x980xe2x80x99 delay and write xe2x80x991xe2x80x99 delay by 62.5%, 57.14%, 50%, 40%, 25% and 70%, 62.5%, 57.14%, 50%, 40% respectively at 0.4xc2xa0xe2x80x8bV when compared with previous SRAM designs such as C6T, D2AP8T, LP8T, ST10T and PFC10T. LUT using SE7T reduces the Write xe2x80x980xe2x80x99 power by 93.4%, 68%, 21.21% and Write xe2x80x981xe2x80x99 power by 2%, 50.16%, 10.13% when compared with LUT design using ST10T, D2AP8T and PFC10T.

Weak and Strong SRAM cells analysis in embedded memories for PUF applications The deployment of IoT platforms for SmartCity applications is demanding solutions to assure security and integrity levels. In this context, physical unclonable functions (PUF) may overcome the security drawbacks of storing the security key in a nonvolatile memory. The existence of SRAM in embedded systems has driven the implementation of PUF solutions using memory circuit as entropy sources. The use of a nonspecific memory design requires the need of identify the adequate cells useful for PUF applications. This work proposes a new methodology to distinguish the adequate cells based on mismatch factor calculation. The mismatch analysis using physical and performance parameters shows the viability of the selection methodology and computes the robustness of the responses in terms of probability of error in the startup value.