A radiation resistant library based on DICE and faulttolerant delay filtering techniques in CMOS 0.18xcexbcm technology A radiation resistant standard cell library is completed based on SMIC 0.18 xcexbcm technology in this paper. Standard cell library includes combinatorial logic cells and sequential logic cells. SET (Single Event Transient) effect always occurs in combinatorial logic cells, and SEU (Single Event Upset) effect always occurs in sequential logic cells. SEL(Single Event Latchup) and TID(Total Ionizing Dose) effects affect all logic cells. According to radiation effects, logic cells in the standard cell library are designed with harden methods at the circuit level and the layout level. Combination logic cells adopt faulttolerant delay filtering method in circuit level, and sequential logic cells use DICE structure in circuit design. A guard ring has been added to the layout design for the SEL and TID effects. Then physical information and timing information are extracted for all cells, and the library building process is completed. Finally we use EDA tools to verify the availability of the antiradiation library.

Novel Radiation Hardened Latch Design with CostEffectiveness for SafetyCritical Terrestrial Applications To meet the requirements of both costeffectiveness and high reliability for safetycritical terrestrial applications, this paper proposes a novel radiation hardened latch design, namely HLCRT. The HLCRT latch mainly consists of a singlenodeupset selfrecoverable cell, a 3input Celement, and an inverter. If any two inputs of the Celement suffer from a doublenodeupset (DNU), or if one node inside the cell together with another node outside the cell suffer from a DNU, the latch still has correct values on its output node, i.e., the latch is effectively DNU hardened. Simulation results demonstrate the DNU tolerance of the proposed latch. Moreover, due to the use of fewer transistors, clock gating technologies, and a highspeed path, the proposed latch saves about 444.80% delay, 150.50% power, 72.66% area, and 2029.63% delaypowerarea product on average, compared with stateoftheart DNU hardened latch designs.