Synergistic Effect of BTI and Process Variations on Impact and Monitoring of Combination Circuit With the technology node scaling down, aging effect and process variations have become the most critical reliability issues for integrated circuit. In this paper, the influence of BTI effect and process variation on threshold voltage is analyzed. Then, the delay of logic gate and the change of subthreshold current are deduced from the change of threshold voltage. Finally, the logic gate and ISCAS85 circuit are simulated by HSPICE in PTM 45nm model. Simulation results show the relationship between delay and subthreshold current with aging time, which can be used to predict the degradation of circuit parameters. The change of circuit delay can be quickly monitored by measuring subthreshold current.

FinFET Variability and Nearthreshold operation: Impact on Full Adders design using XOR Blocks Near threshold operation reaches good results to energy critical applications. However, it introduces a considerable degradation on delay. Moreover, considering nanoeffects, circuits operating at nearthreshold are more sensitive to process variability. This paper analysis 9 full adders built with internal blocks that contain different combinations of 3 XOR logic circuits operating with nominal and nearthreshold voltages under process variability effects. The experiments adopt the 7nm FinFET ASAP technology. The nearthreshold operation can reduce on 97% the maximum power consumption and 65% the total energy, with an impact of about 10 times on delay. Considering process variability impact on energy and delay, the nearthreshold operation turns the circuits about 1.6 and 4 times more sensitive in the critical cases, respectively. Compared with traditional full adders, the proposed circuits can improve around 15% of the delay with similar power results. The results provide valuable data and show how the impact of variability and nearthreshold operation are important factors that must be analyzed to design more robust and low power circuits.