Patent application 14505589 (US), filed 2014-10-03
Publication number: US20150024520A1
Title: SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND MANUFACTURING DEVICE FOR MARKING A CRYSTAL DEFECT
CPC codes: H10P  74/203
H10W  46/00
H10D  62/8503
H10D  62/8325
H10W  46/501
H10W  46/301
H10P  72/0614
H10W  46/101
H10P  72/0616
H10W  46/401
G01N  21/9501
Office action: rejection, dated 2015-10-15
Rejection reasons: obviousness_103
Prior art cited: ref_id: 6320655
ref_type: patent
severity: obviousness
ref_id: 4958373
ref_type: patent
severity: obviousness
ref_id: 5877035
ref_type: patent
severity: obviousness
ref_id: 6559457
ref_type: patent
severity: obviousness
ref_id: 5699153
ref_type: patent
severity: obviousness
ref_id: 6122562
ref_type: patent
severity: obviousness
Final disposition: pending (2015-10-15)