Patent application 14400341 (US), filed 2014-11-11
Publication number: US20150139531A1
Title: DEFECT ANALYSIS ASSISTANCE DEVICE, PROGRAM EXECUTED BY DEFECT ANALYSIS ASSISTANCE DEVICE, AND DEFECT ANALYSIS SYSTEM
CPC codes: H10P  74/203
H10P  74/00
G06T   7/001
G01N  21/9501
G01N  21/95607
G01N  23/2251
G01N2223/6116
G01N2223/646
G06T   7/0006
G06T2207/10061
G06T2207/30148
Office action: rejection, dated 2015-10-15
Rejection reasons: anticipation_102
subject_matter_101
indefiniteness_112
Prior art cited: ref_id: 20090180680
ref_type: patent
severity: novelty_destroying
Final disposition: pending (2015-10-15)