Patent application 13680407 (US), filed 2012-11-19
Publication number: US20140143600A1
Title: DEBUGGING IN A SEMICONDUCTOR DEVICE TEST ENVIRONMENT
CPC codes: G06F  11/2733
G01R  31/31705
G01R  31/31707
G01R  31/319
G06F  11/2294
G06F  11/263
G06F  11/362
Office action: rejection, dated 2015-10-16
Rejection reasons: anticipation_102
obviousness_103
Prior art cited: ref_id: 8639981
ref_type: patent
severity: novelty_destroying
ref_id: 20100312516
ref_type: patent
severity: novelty_destroying
ref_id: 7085980
ref_type: patent
severity: novelty_destroying
ref_id: 20060212760
ref_type: patent
severity: novelty_destroying
ref_id: 8639981
ref_type: patent
severity: novelty_destroying
ref_id: 6973607
ref_type: patent
severity: novelty_destroying
ref_id: 6941504
ref_type: patent
severity: novelty_destroying
Final disposition: granted (2015-10-16)