Assertion: single event upset | /r/HasProperty | seu
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Source sentences:
text: A single-event upset (SEU) is a change of state caused by one single ionizing particle (ions, electrons, photons...) striking a sensitive node in a micro-electronic device, such as in a microprocessor, semiconductor memory, or power transistors.
text: Scientists Dr. Edward C. Smith, Al Holman, and Dr. Dan Binder explained the anomaly as a single-event upset (SEU) and published the first SEU paper in the IEEE Transactions on Nuclear Science journal in 1975.