Assertion: electron microscope | /r/HasProperty | tems
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Source sentences:
text: Unlike transmission electron microscopes (TEMs), which detect electrons that pass through a very thin specimen, SEMs use the electrons that are reflected or knocked off the near-surface region of a sample to create an image.
text: Reflection electron microscope (REM) [ edit ]
text: There are several different types of electron microscopes, including the transmission electron microscope (TEM), scanning electron microscope (SEM), and reflection electron microscope (REM.)
text: The three most familiar types are called transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), and scanning tunneling microscopes (STMs).
text: Transmission electron microscopes (TEMs)
text: The two major types of electron microscopes are transmission electron microscopes (TEMs) and scanning electron microscopes (SEMs).
text: There are two general kinds of electron microscopes—transmission electron microscopes (TEMs) and scanning electron microscopes (SEMs).
text: Transmission electron microscopes (TEMs) use a beam of electrons to examine the structures of molecules and materials at the atomic scale.
text: In the reflection electron microscope (REM) as in the TEM, an electron beam is incident on a surface but instead of using the transmission (TEM) or secondary electrons (SEM), the reflected beam of elastically scattered electrons is detected.
text: Reflection electron microscope (REM)
text: Reflection Electron Microscope (REM) [ change | change source ]
text: There are four types of this microscopes, the first two being the most common: the transmission electron microscope (TEM), scanning electron microscope (SEM), reflection electron microscope (REM), and the scanning transmission electron microscope (STEM).