Occupation: Semiconductor Processors
Task: Inspect materials, components, or products for surface defects and measure circuitry, using electronic test equipment, precision measuring instruments, microscope, and standard procedures.

Scale: Frequency of Task (Categories 1-7)
Category: 1
Value: 0 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 2
Value: 0.06 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 3
Value: 0.03 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 4
Value: 4.89 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 5
Value: 25.86 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 6
Value: 16.96 (N=73)
Source: Incumbent, 12/2006

Scale: Frequency of Task (Categories 1-7)
Category: 7
Value: 52.2 (N=73)
Source: Incumbent, 12/2006

Scale: Importance
Value: 4.43 (N=76)
Source: Incumbent, 12/2006

Scale: Relevance of Task
Value: 84.01 (N=90)
Source: Incumbent, 12/2006