ARMScope – THE VERSATILE PLATFORM FOR SCANNING PROBE MICROSCOPY SYSTEMS
Authors: Bartosz Świadkowski, Tomasz Piasecki, Maciej Rudek, Michał Świątkowski, Krzysztof Gajewski, Wojciech Majstrzyk, Michał Babij, Andrzej Dzierka, Teodor Gotszalk
Published in: METROLOGY AND MEASUREMENT SYSTEMS
Publication type: article
Subject areas: Engineering; Physics and Astronomy
SJR best quartile: Q3