Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy
Authors: Ł. Ciura, A. Kolek, A. Kębłowski, D. Stanaszek, A. Piotrowski, W. Gawron, J. Piotrowski
Published in: Semiconductor Science and Technology
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2