Examination of thermal properties and degradation of InGaN - based diode lasers by thermoreflectance spectroscopy and focused ion beam etching
Authors: Dorota Pierścińska, Kamil Pierściński, Mariusz Płuska, Łucja Marona,Przemysław Wiśniewski, Piotr Perlin and Maciej Bugajski
Published in: AIP ADVANCES
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q3