Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions
Authors: Marcin Janicki, Tomasz Torzewicz, Agnieszka Samson, Tomasz Raszkowski, Artur Sobczak, Mariusz Zubert, Andrzej Napieralski
Published in: Microelectronics Reliability
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2