Fourier analysis of scratches generated on m-GaN substrates during polishing
Authors: Jaroslaw Serafinczuk, Grzegorz Jóźwiak , Piotr Pałetko , Robert Kudrawiec , Robert Kucharski , Marcin Zajac , Teodor Gotszalk
Published in: Crystal Research & Technology
Publication type: article
Subject areas: Chemistry; Materials Science; Physics and Astronomy
SJR best quartile: Q3