Study of the effect of tunneling through the traps inside the insulator on small-signal admittance on the MOS structure
Authors: J. Jasiński, A. Mazurak, B. Majkusiak
Published in: 18th Conference on Insulating Films on Semiconductor - INFOS'2013(), Wydawca:Eds. L. Łukasiak, J. Grabowski - Oficyna Wydawnicza PW
Publication type: conference