Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast
Authors: A. Sulyok, A. L. Toth, L. Zommer, M. Menyhard, A. Jablonski
Published in: Ultramicroscopy(), Wydawca:Elsevier
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q2