Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure
Authors: D. Pierścińska, K. Pierściński, G. Sobczak, P. Gutowski, M. Płuska, M. Bugajski
Published in: Microelectronics Reliability
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2