Numerical Analysis of Mode Discrimination by Intracavity Patterning in Long-Wavelength Wafer-Fused Vertical-Cavity Surface-Emitting Lasers
Authors: Tomasz Czyszanowski, Nicolas Volet, Jarosław Walczak, Maciej Dems, Robert P. Sarzała, Vladimir Iakovlev, Alexei Sirbu, Alexandru Mereuta, Andrei Caliman, Eli Kapon
Published in: IEEE JOURNAL OF QUANTUM ELECTRONICS
Publication type: article
Subject areas: Engineering; Physics and Astronomy
SJR best quartile: Q2