Multireflection grazing incidence diffraction used for stress measurements in surface layers
Authors: M. Marciszko, A. Baczmański, M. Wróbel, W. Seiler, C. Braham, J. Donges, M. Śniechowski, K. Wierzbanowski
Published in: Thin Solid Films
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q2