Relative Reflection Difference as a Method for Measuring the Thickness of the Exfoliated MoSe2 Layers
Authors: K. Łempicka, K. Norowski, M. Grzeszczyk, M. Król, K. Lekenta, A. Babiński, B. Piętka, J. Szczytko
Published in: ACTA PHYSICA POLONICA A
Publication type: article
Subject areas: Physics and Astronomy
SJR best quartile: Q4