XPS method as a useful tool for studies of quantum well epitaxial materials: Chemical composition and thermal stability of InGaN/GaN multilayers
Authors: W. Lisowski, E. Grzanka, J. W. Sobczak, M. Krawczyk, A. Jabłoński, R. Czernecki, M. Leszczyński, T. Suski
Published in: Journal of Alloys and Compounds
Publication type: article
Subject areas: Engineering; Materials Science
SJR best quartile: Q1