Active calibration reference of minimized height for characterization of scanning thermal microscopy systems
Authors: Paweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, Maciej Rudek, Teodor Gotszalk
Published in: Ultramicroscopy(), Wydawca:Elsevier
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q2