Quantitative thermal wave phase imaging of an IR semi-transparent GaAs wafer using IR lock-in thermography
Authors: M. Pawlak, M.Streza, C.Morari, K.Strzałkowski, M. Depriester, M. Chirtoc
Published in: Measurement Science and Technology
Publication type: article
Subject areas: Engineering; Mathematics; Physics and Astronomy
SJR best quartile: Q2