Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy
Authors: Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo W. Rangelow, Teodor Gotszalk
Published in: Measurement, Wydawca:Elsevier
Publication type: article
Subject areas: Engineering; Mathematics; Physics and Astronomy; Social Sciences
SJR best quartile: Q1