A multireflection and multiwavelength residualstress determination method using energydispersive diffraction
Authors: Marianna Marciszko, Andrzej Baczmański, Manuela Klaus, Christoph Genzel, Adrian Oponowicz, Sebastian Wroński, Mirosław Wróbel, Chedly Braham, Habib Sidhom, Roman Wawszczak
Published in: Journal of Applied Crystallography
Publication type: article
Subject areas: Biochemistry, Genetics and Molecular Biology
SJR best quartile: Q1