Compositionally Graded AlGaN Nanostructures: Strain Distribution and X‑ray Diffraction Reciprocal Space Mapping
Authors: H. Stanchu, M. Auf der Maur, A. V. Kuchuk, Yu. I. Mazur, M. Sobanska, Z. R. Zytkiewicz, S. Wu, Z. Wang, and G. Salamo
Published in: Crystal Growth & Design
Publication type: article
Subject areas: Chemistry; Materials Science; Physics and Astronomy
SJR best quartile: Q2