Quantitative imaging of electrospun fibers by PeakForce Quantitative NanoMechanics atomic force microscopy using etched scanning probes
Authors: Adrian Chlanda, Janusz Rebis, Ewa Kijeńska, Michal J. Wozniak, Krzysztof Rozniatowski, Wojciech Swieszkowski, Krzysztof J. Kurzydlowski
Published in: Micron
Publication type: article
Subject areas: Biochemistry, Genetics and Molecular Biology; Materials Science; Physics and Astronomy
SJR best quartile: Q2