Adaptive automatic data analysis in full-field fringe-pattern-based optical metrology (Invited Paper)
Authors: Maciej Trusiak, Krzysztof Patorski, Łukasz Służewski, Krzysztof Pokorski i Zofia Sunderland
Published in: 20th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Publication type: conference