INVESTIGATION OF REFLECTIVITY OF DIFFERENT TI/AU METALIZATIONS FOR APPLICATION IN QC VCSEL
Authors: D. Radziewicz, B. Ściana, W. Dawidowski, M. Janczak, T. Czyszanowski, M. Mikulicz, M. Rygała, T. Smołka, M. Motyka
Published in: PROCEEDINGS OF ADEPT(tom: 10th International Conference on ADVANCES IN ELECTRONIC AND PHOTONIC TECHNOLOGIES, strony: 39-42), Wydawca:University of Žilina in EDIS-Publishing Centre
Publication type: conference