A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors
Authors: M. Kłosowski, J. Jakusz, W. Jendernalik , G. Blakiewicz, S. Szczepański, and S. Kozieł,
Published in: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Publication type: article
Subject areas: Engineering; Physics and Astronomy
SJR best quartile: Q1