High-resolution X-ray diffraction to probe quantum dot asymmetry
Authors: J. Serafińczuk, W. Rudno-Rudziński, M. Gawełczyk, P. Podemski, K. Parzyszek, A. Piejko, V. Sichkovskyi, J.P. Reithmaier, G. Sęk
Published in: Measurement(), Wydawca:Elsevier
Publication type: article
Subject areas: Engineering; Mathematics; Physics and Astronomy; Social Sciences
SJR best quartile: Q1