Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metals
Authors: W. Szuszkiewicz, M. Jouanne, J.F. Morhange, M. Kanehisa, E. Dynowska, K. Gas, E. Janik, G. Karczewski, R. Kuna, T. Wojtowicz
Published in: Physica Status Solidi B
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q3