Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy
Authors: Elżbieta Świętek, Kacper Pilarczyk, Justyna Derdzińska, Konrad Szaciłowski, Wojciech Macyk
Published in: Phys. Chem. Chem. Phys.
Publication type: article
Subject areas: Chemistry; Physics and Astronomy
SJR best quartile: Q2