Characterization of raw materials and selforganized Bi2O3–Ag eutectic by X-ray diffraction, scanning electron microscopy, and X-ray photoelectron spectroscopy
Authors: M. Szubka, E. Talik, K. Sadecka, D. A. Pawlak, A. Guzik, P. Zajdel
Published in: Crystal Research & Technology
Publication type: article
Subject areas: Chemistry; Materials Science; Physics and Astronomy
SJR best quartile: Q3