Deep-level defects in n-type GaAsBi alloys grown by molecular beam epitaxy at low temperature and their influence on optical properties
Authors: Ł. Gelczuk, J. Kopaczek, T. B. O. Rockett, R. D. Richards, R. Kudrawiec
Published in: Scientific Reports
Publication type: article
Subject areas: Multidisciplinary
SJR best quartile: Q1