Structural and optical characterization of the high quality Be-doped InAs epitaxial layer grown on GaAs substrate
Authors: J. Wróbel, K. Grodecki, D. Benyahia, K. Murawski, K. Michalczewski, J. Grzonka, J. Boguski, K. Gorczyca, G.A. Umana-Membreno, Ł. Kubiszyn, A. Kębłowski, P.P.Michałowski, E. Gomółka, P. Martyniuk, J. Piotrowski, A. Rogalski
Published in: 13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Publication type: conference