An approach to automated characterization of out-of-plane and in-plane local defect resonances
Authors: Paweł Zdziebko, Mateusz Krzemiński, Maciej Okoń, Gabriela Loi, Francesco Aymerich, Łukasz Pieczonka, Andrzej Klepka
Published in: Materials
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q2