Spatially resolved strain analysis in GaN/AlxGa1-xN nanowires — cathodoluminescence and X-ray diffraction studies (abstract)
Authors: A. Reszka, A. Wierzbicka, K. Sobczak, A.V. Kuchuk, J. Domagala, A. Pieniążek, M. Sobanska, K. Klosek, Z.R. Zytkiewicz, B.J. Kowalski
Published in: 45th International School & Conference on the Physics of Semiconductors
Publication type: conference