Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions
Authors: Zembrzycki K., Kowalewski T.A., Pawłowska S., Chrzanowska-Giżyńska J., Nowak M., Walczak M., Pierini F.
Published in: SPIE Optics + Photonics
Publication type: conference