Long-term degradation of InGaN-based laser diodes: Role of defects
Authors: D. Monti, M. Meneghini, C. De Santi, G. Meneghesso, E. Zanoni, A. Bojarska, P. Perlin
Published in: Microelectronics Reliability
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2