XPS depth profiling of organic photodetectors with the gas cluster ion beam
Authors: J. Haberko, M. M. Marzec, A. Bernasik, W. Łużny, P. Lienhard, A. Pereira, J. Faure-Vincentand, D. Djurado, A. Revaux
Published in: Journal of Vacuum Science & Technology B(), Wydawca:American Vacuum Society
Publication type: article
Subject areas: Chemical Engineering; Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q3