A multireflection and multiwavelength residual stress determination method using energy dispersive diffraction
Authors: M. Marciszko, A. Baczmański, M. Klaus, Ch. Genzel, A. Oponowicz, S. Wroński, M. Wróbel, C. Braham, H. Sidhom, R.Wawszczak
Published in: Journal of Applied Crystallography
Publication type: article
Subject areas: Biochemistry, Genetics and Molecular Biology
SJR best quartile: Q1