DFT Simulation of Stacking Faults Defects in 4H-SiC
Authors: Wozny, Janusz and Kovalchuk, Andrii and Lisik, Zbigniew and Podgorski, Jacek and Bugalski, Piotr and Kubiak, Andrzej and Ruta, Lukasz
Published in: 2018 Xivth International Conference on Perspective Technologies and Methods in Mems Design (Memstech)(tom: -na-, strony: 65-68), Wydawca:IEEE
Publication type: book