Characterization of high resolution CMOS monolithic active pixel detector in SOI technology
Authors: M.I. Ahmed, Y. Arai, S. Glab, M. Idzik, P. Kapusta, T. Miyoshi, A. Takeda and M. Turala
Published in: Journal of Instrumentation
Publication type: article
Subject areas: Mathematics; Physics and Astronomy
SJR best quartile: Q3