2-D nanometer thickness mapping applying a reduced bias soft X-ray NEXAFS approach
Authors: PRZEMYSŁAW WACHULAK, TOMASZ FOK, KAROL JANULEWICZ, JERZY KOSTECKI, ANDRZEJ BARTNIK, ŁUKASZ WEGRZYNSKI , AND HENRYK FIEDOROWICZ
Published in: Optics Express
Publication type: article
Subject areas: Physics and Astronomy
SJR best quartile: Q1