Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs
Authors: Mariusz Zubert, Tomasz Raszkowski, Agnieszka Samson, Piotr Zając
Published in: Microelectronics Reliability
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2