A pixel readout chip in 40 nm CMOS process for high count rate imaging systems with minimization of charge sharing effects
Authors: Maj, P. ; Grybos, P. ; Szczygiel, R. ; Kmon, P. ; Drozd, A. ; Deptuch, G.
Published in: 2014 IEEE NSS/MIC: Nuclear Science Symposium & Medical Imaging Conference, Seul, Korea
Publication type: conference