Data on step-by-step atomic force microscopy monitoring of changes occurring in single melanoma cells undergoing ToF SIMS specialized sample preparation protocol
Authors: J.Bobrowska, J.Pabijan, J.Wiltowska-Zuber, B.R.Jany, F.Krok, K.Awsiuk, J.Rysz, A.Budkowski, M.Lekka
Published in: Data in Brief
Publication type: article
Subject areas: Multidisciplinary; Social Sciences
SJR best quartile: Q3