Multifrequency Nanoscale Impedance Microscopy (m-NIM): A novel approach towards detection of selective and subtle modifications on the surface of polycrystalline boron-doped diamond electrodes
Authors: A. Zielinski, M. Cieslik, M. Sobaszek, R. Bogdanowicz, K. Darowicki, J. Ryl
Published in: Ultramicroscopy
Publication type: article
Subject areas: Materials Science; Physics and Astronomy
SJR best quartile: Q2