Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions
Authors: M. Janicki, T. Torzewicz, A. Samson, T. Raszkowski, A. Sobczak, M. Zubert, A. Napieralski
Published in: Microelectronics Reliability
Publication type: article
Subject areas: Engineering; Materials Science; Physics and Astronomy
SJR best quartile: Q2