Thermal properties and degradation mechanisms of InGaN - based diode lasers investigated by thermoreflectance spectroscopy and focused ion beam etching
Authors: D. Pierścińska, K. Pierściński, M. Płuska, Ł. Marona, P. Wiśniewski, P. Perlin and M. Bugajski
Published in: 7th Workshop on Physics and Technology of Semiconductor Lasers Kraków, Wydawca:7th Workshop on Physics and Technology of Semiconductor Lasers Kraków
Publication type: conference