Corrigendum to Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy.
Authors: Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow c, Krzysztof Kwoka a
Published in: Measurement, Wydawca:Elsevier
Publication type: article
Subject areas: Engineering; Mathematics; Physics and Astronomy; Social Sciences
SJR best quartile: Q1