DFT simulation of stacking faults defects in 4H-SiC
Authors: Janusz Wozny, Andrii Kovalchuk, Zbigniew Lisik, Jacek Podgorski, Piotr Bugalski, Andrzej Kubiak, Lukasz Ruta
Published in: XIV-th International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH)
Publication type: conference