Title: 2-D nanometer thickness mapping applying a reduced bias soft X-ray NEXAFS approach
Authors: PRZEMYSŁAW WACHULAK, TOMASZ FOK, KAROL JANULEWICZ, JERZY KOSTECKI, ANDRZEJ BARTNIK, ŁUKASZ WEGRZYNSKI , AND HENRYK FIEDOROWICZ
Journal: Optics Express
Publication type: article
DOI: 10.1364/OE.397808