Title: Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy
Authors: Elżbieta Świętek, Kacper Pilarczyk, Justyna Derdzińska, Konrad Szaciłowski, Wojciech Macyk
Journal: Physical Chemistry Chemical Physics
Publication type: article
DOI: 10.1039/C3CP52129J