Title: A High-Efficient Measurement System With Optimization Feature for Prototype CMOS Image Sensors
Authors: Kłosowski, M., Jakusz, J., Jendernalik, W., Blakiewicz, G., Szczepański, S., Kozieł, S.
Journal: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Publication type: article
DOI: 10.1109/TIM.2018.2814118