Title: Characterization of high resolution CMOS monolithic active pixel detector in SOI technology
Authors: M.I. Ahmed, Y. Arai, S. Glab, M. Idzik, P. Kapusta, T. Miyoshi, A. Takeda and M. Turala
Journal: Journal of Instrumentation
Publication type: article
DOI: 10.1088/1748-0221/10/05/P05010