Title: XPS method as a useful tool for studies of quantum well epitaxial materials: Chemical composition and thermal stability of InGaN/GaN multilayers
Authors: W. Lisowski, E. Grzanka, J. W. Sobczak, M. Krawczyk, A. Jabłoński, R. Czernecki, M. Leszczyński, T. Suski
Journal: Journal of Alloys and Compounds
Publication type: article
DOI: 10.1016/j.jallcom.2014.02.007