Title: Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions
Authors: Marcin Janicki, Tomasz Torzewicz, Agnieszka Samson, Tomasz Raszkowski, Artur Sobczak, Mariusz Zubert, Andrzej Napieralski
Journal: Microelectronics Reliability
Publication type: article
DOI: 10.1016/j.microrel.2017.05.008