Title: Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy
Authors: Elżbieta Świętek, Kacper Pilarczyk, Justyna Derdzińska, Konrad Szaciłowski, Wojciech Macyk
Journal: Phys. Chem. Chem. Phys.
Publication type: article
DOI: 10.1039/c3cp52129j