Title: Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
Authors: Ewelina Gacka, Piotr Kunicki, Andrzej Sikora, Robert Bogdanowicz, Mateusz Ficek, Teodor Gotszalk, Ivo W. Rangelow, Krzysztof Kwoka
Journal: Measurement, Wydawca:Elsevier
Publication type: article
DOI: 10.1016/j.measurement.2021.110373