Title: Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy
Authors: Ewelina Gacka, Bartosz Pruchnik, Magdalena Tamulewicz-Szwajkowska, Dominik Badura, Ivo W. Rangelow, Teodor Gotszalk
Journal: Measurement, Wydawca:Elsevier
Publication type: article
DOI: 10.1016/j.measurement.2024.114815