Title: Long-term degradation of InGaN-based laser diodes: Role of defects
Authors: D. Monti, M. Meneghini, C. De Santi, G. Meneghesso, E. Zanoni, A. Bojarska, P. Perlin
Journal: Microelectronics Reliability
Publication type: article
DOI: 10.1016/j.microrel.2017.06.043