Title: Analysis of electrical properties of forward-to-open (Ti,Cu)Ox memristor rectifier with elemental gradient distribution prepared using (multi) magnetron co-sputtering process
Authors: Jarosław Domaradzki, Artur Wiatrowski, Tomasz Kotwica, Michał Mazur
Journal: Materials Science in Semiconductor Processing
Publication type: article
DOI: 10.1016/j.mssp.2019.01.034