Title: Characterization of raw materials and self-organized Bi2O3–Ag eutectic by X-ray diffraction, scanning electron microscopy, and X-ray photoelectron spectroscopy
Authors: M. Szubka, E. Talik, K. Sadecka, D. A. Pawlak, A. Guzik, P. Zajdel
Journal: Crystal Research and Technology
Publication type: article
DOI: 10.1002/crat.201700044