Title: Raman scattering as a tool to characterize semiconductor crystals, thin layers, and low-dimensional structures containing transition metals
Authors: W. Szuszkiewicz, M. Jouanne, J.F. Morhange, M. Kanehisa, E. Dynowska, K. Gas, E. Janik, G. Karczewski, R. Kuna, T. Wojtowicz
Journal: Physica Status Solidi B
Publication type: article
DOI: 10.1002/pssb.201350142