Title: High-resolution X-ray diffraction to probe quantum dot asymmetry
Authors: J. Serafińczuk, W. Rudno-Rudziński, M. Gawełczyk, P. Podemski, K. Parzyszek, A. Piejko, V. Sichkovskyi, J.P. Reithmaier, G. Sęk
Journal: Measurement(), Wydawca:Elsevier
Publication type: article
DOI: 10.1016/j.measurement.2023.113451