Title: Active calibration reference of minimized height for characterization of scanning thermal microscopy systems
Authors: Paweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, Maciej Rudek, Teodor Gotszalk
Journal: Ultramicroscopy(), Wydawca:Elsevier
Publication type: article
DOI: 10.1016/j.ultramic.2020.113188