Title: Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions
Authors: M. Janicki, T. Torzewicz, A. Samson, T. Raszkowski, A. Sobczak, M. Zubert, A. Napieralski
Journal: Microelectronics Reliability
Publication type: article
DOI: 10.1016/j.microrel.2017.05.008