Title: Radiation Damage in Transistors Fabricated with Lapis Semiconductor 200 nm FD-SOI Technology
Authors: S. Glab, Y. Arai, M. Baszczyk, Sz. Bugiel, R. Dasgupta, P. Dorosz, M. Idzik, P. Kapusta, W. Kucewicz, G. Mierzwinska, L. Mik, T. Miyoshi, M. Ptaszkiewicz, M. Rydygier, M. Sapor, J. Swakon, A. Takeda
Journal: 2014 IEEE Nuclear Science Symposium & Medical Imaging Conference
Publication type: conference