Title: Investigation of defects origin in p-type Si for solar applications
Authors: K. Gwozdz, E. Placzek-Popko, M. Mikosza, E. Zielony, R. Pietruszka, K. Kopalko, M. Godlewski
Journal: J. of Electronic Materials
Publication type: article
DOI: 10.1007/s11664-017-5444-6