Title: A multireflection and multiwavelength residualstress determination method using energydispersive diffraction
Authors: Marianna Marciszko, Andrzej Baczmański, Manuela Klaus, Christoph Genzel, Adrian Oponowicz, Sebastian Wroński, Mirosław Wróbel, Chedly Braham, Habib Sidhom, Roman Wawszczak
Journal: Journal of Applied Crystallography
Publication type: article
DOI: 10.1107/S1600576718004193