Title: Investigation of trap levels in HgCdTe IR detectors through low frequency noise spectroscopy
Authors: Ł. Ciura, A. Kolek, A. Kębłowski, D. Stanaszek, A. Piotrowski, W. Gawron, J. Piotrowski
Journal: Semiconductor Science and Technology
Publication type: article
DOI: 10.1088/0268-1242/31/3/035004