Title: Impacts of thermal stress and doping on intrinsic point defect properties and clustering during single crystal silicon and germanium growth from a melt
Authors: J. Vanhellemont, E. Kamiyama, K. Nakamura, P. Śpiewak and K. Sueoka
Journal: Journal of Crystal Growth
Publication type: article
DOI: 10.1016/j.jcrysgro.2016.12.077