Title: Directly characterizing the relative strength and momentum dependence of electron-phonon coupling using resonant inelastic x-ray scattering
Authors: T.P. Devereaux, A.M. Shvaika, K.Wu, K. Wohlfeld, C.J. Jia, Y. Wang, B. Moritz, L. Chaix, W.-S. Lee, Z.-X. Shen, G. Ghiringhelli, L. Braicovich
Journal: Physical Review X
Publication type: article
DOI: 10.1103/PhysRevX.6.041019