Title: Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure
Authors: D. Pierścińska, K. Pierściński, G. Sobczak, P. Gutowski, M. Płuska, M. Bugajski
Journal: Microelectronics Reliability
Publication type: article
DOI: 10.1016/j.microrel.2019.06.003