Title: Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrast
Authors: A. Sulyok, A. L. Toth, L. Zommer, M. Menyhard, A. Jablonski
Journal: Ultramicroscopy(), Wydawca:Elsevier
Publication type: article
DOI: 10.1016/j.ultramic.2012.08.004