Title: Quantitative Imaging of Defect Distributions in CdZnTe Wafers Using Combined Deep-Level Photothermal Spectroscopy, Photocarrier Radiometry, and Lock-In Carrierography
Authors: A. Mielnikov, A.Mandelis, A.Soral, C. Zavalo-Lugo, M. Pawlak
Journal: ACS APPLIED ELECTRONIC MATERIALS
Publication type: article
DOI: 10.1021/acsaelm.1c00100