Title: Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
Authors: W. Wierzchowski, K. Wieteska, D. Klinger, R. Sobierajski, J.B. Pelka, D. Żymierska, T. Balcer, J. Chalupský, J. Gaudin, V. Hájková, T. Burian, A.J. Gleeson, L. Juha, H. Sinn, D. Sobota, K. Tiedtke, S. Toleikis, T. Tschentscher, L. Vyšín, H. Wabnitz, C. Paulmann
Journal: Radiation Physics and Chemistry
Publication type: article
DOI: 10.1016/j.radphyschem.2013.04.025