Title: Mismatch Analysis of DTCs With an Improved BIST-TDC in 28-nm CMOS
Authors: Peng Chen, Jun Yin, Feifei Zhang, Pui-In Mak, Rui P. Martins, and Robert Bogdan Staszewski
Journal: IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS—I: REGULAR PAPERS,
Publication type: article
DOI: 10.1109/TCSI.2021.3105451