Title: Design of Prototype Readout Integrated Circuit for Time-ofArrival and Time-over-Threshold Measurement for Hybrid Pixel X-ray Detectors in 28 nm CMOS
Authors: Ł. Kadłubowski, P. Kmon
Journal: Przegląd Elektrotechniczny
Publication type: article
DOI: 10.15199/48.2022.02.23