Title: Characterizing the Metal-SAM Interface in Tunneling Junction
Authors: Bowers, C. M.; Liao, K-C.; Zaba, T.; Rappoport, D.; Baghbanzadeh, M.; Breiten, B.; Krzykawska, A.; Cyganik, P.; Whitesides*, G.
Journal: ACS Nano
Publication type: article
DOI: 10.1021/nn5059216