Spreadsheet: 849491d1699958077-sorting-data-and-labelling-data-and-preserving-the-labelling-for-other-data-sets-example-for-forum-jean_sibelius-_extended
Sheet: Selection of DATA

 | [NAME]: = UNIQUE(DATA!C2:G12) |  |  |  |  |  | Requested outcome
 |  |  |  |  |  |  | Copy & Paste the five columns manually below each other |  |  | Copy and paste column H to column K and then apply ("Remove all duplicates")
 |  | An apparatus | A metrology tool | A lithographic apparatus | A litho cell |  | An apparatus |  |  | An apparatus
 | A reticle stage | A lithographic apparatus | A lithographic system | A method of operating an EUV lithographic apparatus |  |  | A reticle stage |  |  | A reticle stage
 | A method for improving a nuisance rate | A system | A non-transitory computer readable medium storing … |  |  |  | A method for improving a nuisance rate in image inspection data |  |  | A method for improving a nuisance rate
 | A height measurement sensor | A lithographic apparatus | An assessment system | A metrology system | A method for determining a focus plane |  | A height measurement sensor |  |  | A height measurement sensor
 | A method for cleaning | A system | A system |  |  |  | A method for cleaning |  |  | A method for cleaning
 | A membrane | A membrane | A pellicle | A patterning device and pellicle assembly | A lithographic apparatus |  | A membrane |  |  | A membrane
 |  |  |  |  |  |  | A charge regulator |  |  | A charge regulator
 |  |  |  |  |  |  | A charged particle-optical device |  |  | A charged particle-optical device
 |  |  |  |  |  |  | An apparatus |  |  | An apparatus
 | Question: HOW to remove all the duplicates from cells B3:[NAME]? |  |  |  |  |  | A lithographic apparatus |  |  | A lithographic apparatus
 |  |  |  |  |  |  | A system |  |  | A system
 |  |  |  |  |  |  | A lithographic apparatus
Column1 | Column2 | Column3 | Column4 | Column5 | Column6 |  | A system |  |  | A metrology tool
Publication 9 | An optical component | A broadband light source device | A metrology device | A method for configuring an optical component |  |  | A membrane |  |  | A lithographic system
Publication 10 | An optical component | A broadband light source device | A metrology device | A method for configuring an optical component |  |  |  |  |  | A non-transitory computer readable medium storing …
Publication 11 | An optical component | A broadband radiation source device | A metrology device | A method for configuring an optical component | An optical component |  |  |  |  | An assessment system
Publication 12 |  | A source device | A metrology device | A method for configuring a source arrangement | A method for configuring a source arrangement |  | A metrology tool |  |  | A pellicle
Publication 13 | An optical component | A broadband light source device | A metrology device | A method for configuring an optical component |  |  | A lithographic system |  |  | 0
Publication 14 | A radiation source | An apparatus | A method |  |  |  | A non-transitory computer readable medium storing … |  |  | A method of operating an EUV lithographic apparatus
Publication 15 | A radiation source | An apparatus | A method |  |  |  | An assessment system |  |  | A metrology system
Publication 16 | A charged-particle multi-beam column | A charged-particle multi-beam column array | An inspection method |  |  |  | A system |  |  | A patterning device and pellicle assembly
 |  |  |  |  |  |  | A pellicle |  |  | A litho cell
 |  |  |  |  |  |  |  |  |  | A method for determining a focus plane
 |  |  |  |  |  |  | 0 |  |  | A lithographic apparatus
 |  |  |  |  |  |  | A lithographic apparatus
 |  |  |  |  |  |  | A method of operating an EUV lithographic apparatus
 |  |  |  |  |  |  | A metrology system
 |  |  |  |  |  |  | A patterning device and pellicle assembly
 |  |  |  |  |  |  | A litho cell
 |  |  |  |  |  |  | A method for determining a focus plane
 |  |  |  |  |  |  | A lithographic apparatus
 |  |  |  |  |  |  | 0