Congressos e Periódicos de meu interesse
Autor: Jardel Silveira | Publicado: 2010-10-06T10:05:00-03:00

Congressos:- SBCCI/SFORUM- WSCAD- LATW: http://www.ee.pucrs.br/~sisc/LATW/2011.html  Deadline: 7 de Novembro- ISQUED: http://www.isqed.org/English/Conference/Call_for_Papers.html Deadeline: 14 de Outubro-  ISCAS: http://www.iscas2011.org/papers.htm  Deadline: 6 de Outubro-  DAC: http://www2.dac.com/deadlines.aspx Deadline: 18 de Novembro-  ICBSEC: http://www.inct-sec.org/cbsec2011/?q=node/2 Deadline: 4 de Fevereiro-  NEWCAS: http://www.newcas2011.org/ Deadline: 18 de Fevereiro-  IBERCHIP 2011: http://www.iberchipxvii.org/important_datesiber.html Deadline: 7 de Novembro- International Workshop on Java Technologies for Real-Time and Embedded Systems (JTRES)- IFIP Workshop on Software Technologies for Future Embedded and Ubiquitous Systems- ACM Symposium on Applied Computing (SAC)- International Conference on Real-Time and Embedded Computing Systems and Applications (RTCSA)- International Conference on Field-Programmable Logic and its Applications (FPL)- IEEE Reconfigurable Architecture Workshop (RAW2005)- ACM Symposium on Applied Computing- IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS)- IEEE Symposium on Industrial Embedded Systems (SIES)-First International Workshop on Software Technologies for Future Dependable Distributed Systems (STFSSD)- IEEE International Conference on Computer Design-  Workshop on Embedded Systems Education (WESE)-  VTS - VLSI Test Symposium-  IEEE European Test Symposium- ETS-         IOLTS: IEEE International On-Line Test Symposium- RADECS- 10th European Conference on Radiation and Its Effects on Components and Systems-  IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems-         IFIP/IEEE VLSI-SoC- IEEE NORCHIP conference- DECIDE- Second International Workshop onn Dependable Circuit Design- ACM/IEEE International Symposium on Physical Design-         IEEE Computer Society Annual Symposium on VLSI-         IEEE Microelectronics Systems Education,- iEEE ICECS - International Conference on Electronics, Circuits and Systems-        ICCDCS: IEEE International Caribbean Conference on Devices, Circuits and Systems- ASPDAC: Asian South-Pacific Design Automation Conference-        ISSCS: IEEE 6th International Symposium on Signals Circuits and Systems- EEE International Midwest Symposium on Circuits &amp; SystemsPeriódicos:- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (A1)- IEEE Design and Test of Computers. FI 1.798- IET Communications. FI 0.751- Journal of Parallel and Distributed Computing - FI 1.135- Elsevier Microelectronics Reliability. FI 1.117.  http://www.elsevier.com/locate/microrel- Elsevier Microprocessors and Microsystems. FI 0.516. http://www.elsevier.com/locate/micpro- Elsevier Integration, the VLSI Journal. FI 0.659. http:://www.elsevier.com/locate/vlsi-            Elsevier Journal of Systems Architecture. FI 0.722 http://www.elsevier.com/locate/sysarc- Microelectronics Journal. FI JCR 2010 0.778. http://www.elsevier.com/locate/mejo-  IEEE Transactions on Very Large Scale Integration Systems. FI JCR 2009 1.01-  IEEE Transactions on Industrial Electronics. FI JCR 2009 4.678  -  Design Automation for Embedded Systems. FI JCR 2009 0.333- Journal of Electronic Testing. FI JCR 2009 0.473-  Journal of Integrated Circuits and Systems. FI JCR 2009 1.42-   IEEE Design and Test of Computers. FI JCR 2009 1.798- Lecture Notes in Computer Science. FI JCR 2009 0.513- ACM Transactions on Design Automation of Electronic System. FI JCR 2009 0.848- Future Generation Computer Systems. FI JCR 2009 2.229 -  Electronic Letters. FI JCR 2009 0.97- Revista de Informática Teórica e Aplicada- Journal of the Brazilian Computer Society-  Ieee Journal Of Solid State Circuits- International Journal of Parallel Programming- IEEE Micro: http://www.computer.org/portal/web/micro/home- International Journal of Reconfigurable Computing- Revista da Sociedade Brasileira de Computação- IEEE Transactions on Education: http://ieeexplore.ieee.org/xpl/tocresult.jsp?isnumber=5536896- Journal of Electronic Testing: Theory and Applications (JETTA), Springer Science+Business Media.- EURASIP Journal on Embedded Systems- ACM Trans. Embed. Comput. Syst. http://portal.acm.org/TECS/- Springer Real-Time Systems: http://www.springerlink.com/content/l4033013g3480427/-  Wiley Software Practice and Experience:  http://onlinelibrary.wiley.com/doi/10.1002/spe.968/abstract;jsessionid=A6A1CC2C4738C538ECEE880FF67F4D93.d02t02