白崎博公
主な研究論文

白崎博公, 牧本利夫「Cubic結晶における弾性表面波のエネルギー伝搬特性(技術談話室)」『電子通信学会論文誌. B』第59巻第12号、電子通信学会、1976年12月、595-596頁、doi:10.11501/2289966、ISSN 03736105、NAID 40002552933。
H.Shirasaki and T.Makimoto,"Energy propergation properties of piezoelectric surface waves on cubic crystals," J.Appl.Phys., Vol.49(2), pp.658-660 (1978).
H.Shirasaki and T.Makimoto,"Asymptotic expression for piezoelectric surface waves excited by the buried mechanical and electrical point sources," J.Appl.Phys., Vol.49(2), pp.661-666 (1978).
Shirasaki, Hirokimi; Makimoto, Toshio (1979). “Gaussian curvature of the slowness surface for piezoelectric surface waves on a cubic crystal”. Journal of Applied Physics (American Institute of Physics) 50 (4):  2795-2798. doi:10.1063/1.326244. https://doi.org/10.1063/1.326244.
H.Shirasaki and F.Ishihara,"Reflection Coefficient of ExponentialTapered Cutoff Waveguide Filters", 9-th Int. Conf. on IR and MM Wave, T-9-3(1984-10)
白崎博公 , 石原藤夫,"直線テーパ導波管形カットオフフィルタの特性", 電子情報通信学会論文誌B vol.J69-B No.7,(1986-07-20)
白崎博公 , 石原藤夫,"n 乗コサインテーパ導波管形カットオフフィルタの特性", 電子情報通信学会論文誌B vol.J70-B No.4, (1987-04-20)
白﨑博公 ,"高さを変化させた特性インピーダンスｎ乗コサイン形カットオフフィルタの特性", 電子情報通信学会論文誌C vol.J74-C-1 No.1, (1991-01-25)
白崎博公、"直線およびn乗コサインテーパ形マイクロストリップ線路の導波管モデルによる階段近似解析”、電子情報通信学会論文誌, C1, Vol.J79-C-1, 8, pp.303-309(平08-8-25).
H. Shirasaki,"Steps approximate analysis and design charts of raised cosine impedance tapered microstrip lines by waveguide model", 1997 6th Internal Symposium on Recent Advances in Microwave Technology Proceedings, pp.187-190(1997-08-06).
H.Shirasaki :"Optimum design by waveguide model and mode matching technique of microstrip line taper shapes for satellite broadcast planar antenna," 1999 IEEE AP-S International symposium and USNC/URSI national radio science meeting, AP-16-065,Vol.1,pp.238-241(1999-7).
H.Shirasaki :"Steps approximate analysis by waveguide models of Klopfenstein and Hecken type microstrip line tapers," International union of radio science(URSI), XXVI General assembly, B1.P.7,p.45(1999-8). --at University of Toront , Toronto, Canada.
H.Shirasaki :"Design charts by waveguide model and mode matching techniques of microstrip line taper shapes for satellite broadcast planar antenna," 2000 IEEE AP-S International symposium and USNC/URSI national radio science meeting, P-88-1,Vol.1,pp.2000-2003(2000-7-20).
H.Shirasaki :``The design charts by waveguide model and mode matching techniques of microstrip line taper shapes for Klopfenstein and Hecken type microstripline tapers, 2000 Asia Pacific microwave conference, P-158, pp.1253-1256(2000-12-5).
H.Shirasaki, N Kondo, A. Abematsu, "Delay Properties of Optical Wave in Semiconductor Trench for Depth Measurement Using Interferencd Spectroscopy ," Jpn. J. Appl. Phys., Vol 32. Part 1, No. 8, pp.3502-3506(1993-8).
H.Shirasaki, "Shape Measurement Simulation for the Silicon Trench Array by Scattering Properties and Continuous Wavelet Analysis with Interference Spectroscopy,"SPIE's 27th annual symposium on microlithography, 4689-75, pp.1-8 (2002-3-4).
Hirokimi Shirasaki,Kunio Ueta, Noriyuki Kondou,"Resist and Silicon Trench Array Linewidth Measurement Simulations for the Next-Generation Semiconductor Circuits by Optical Scattering Properties Using the FDTD Method",Proc. of SPIE, Metrology, Inspection, and Process Control for Microlithography XVII,5038, pp.748-756(2003)
Hirokimi Shirasaki,Kunio Ueta,"Linewidth measurement simulations for semiconductor circuits by scatterometry using the FDTD and the time shortening calculation method",Proc. of SPIE, Metrology, Inspection, and Process Control for Microlithography XVIII, 5375, pp.1331-1338(2004)
Hirokimi Shirasaki,"Arbitrary 3D linewidth forms measurement simulations for the next-generation semiconductor circuits by scatterometry using the FDTD method",Proc. of SPIE, Metrology, Inspection, and Process Control for Microlithography XVIII, 5375,pp.1339-1345(2004)
Hirokimi Shirasaki,"Arbitrary Cross Sections and Stack Forms Measurement Simulations for Semiconductor Circuits by Scatterometry ",Proc. of SPIE, Metrology, Inspection, and Process Control for Microlithography XIX, 5752,pp.790-797(2005)
Hirokimi Shirasaki,"3D Isolated and Periodic Grooves Measurement Simulations for the Semiconductor Circuits by Scatterometry Using the FDTD Methods and the Time Shortening Calculation Method.", Proceedings of SPIE, Microlithography 2006,6152, pp.61523O1-61523O8(2006)
Hirokimi Shirasaki,“ 3D anisotropic semiconductor grooves measurement simulations (scatterometry) using FDTD Methods.”,Proceedings of SPIE, 65184D 1-8 (2007)
Hirokimi Shirasaki,“3D Semiconductor Grooves Measurement Simulations (Scatterometry) using Nonstandard FDTD Methods”,Proceedings of SPIE, 6922, 69223T 1-9(2008)
Hirokimi Shirasaki,“Scatterometry simulator for multi-core CPU”, Proceedings of SPIE, 7638, 7638V 1-6(2010)
白﨑博公,“スキャトロメトリにおけるナノ形状センシング”,光波センシングのための偏光技術の進展シンポジウム・2011年春季 第58回 応用物理学関係連合講演会 講演予稿集 2011 26p-BJ-7(2011)（招待講演）
H. Shirasaki, "Scatterometry simulator using GPU and Evolutionary Algorithm," Proc. SPIE, 7971, 79711T1-79711T7 (2011).
Hirokimi Shirasaki,"Scatterometry simulator development with GPU, real-coded GA and RCWA" Proc. SPIE 8681, Metrology, Inspection, and Process Control for Microlithography XXVII, 86811B1-86811B7 (April 10, 2013)
Hirokimi Shirasaki,"Isolation mounts scatterometry with RCWA and PML",Proc. SPIE 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII, 90502K (April 2, 2014)
Hirokimi Shirasaki,“ 3D isolation mounts scatterometry with RCWA and PML”, *Hirokimi Shirasaki, Proceedings of SPIE, 9424, 9424211-9424217 (2015).
白崎博公、"分光エリプソメーターによる形状計測",O plus E, Vol.27, No.3, pp.294-299(2005-2-25)
白崎博公、「光CD計測の計測原理と関連技術」『精密工学会誌』 2012年 78巻 2号 p.127-131, doi:10.2493/jjspe.78.127
白﨑博公、"GPUを用いた並列共用スーパーコンピュータの構築”、玉川大学工学部紀要、48、43-49 (2013).
H.Shirasaki,(Co-author),Editor:S. G. Pandalai,"Recent reserch developments in electronics & communications:Taper shape design charts for Klopfenstein and Hecken type microstripline tapers by mode matching and FDTD techniques" ISBN 81-7895-055-3,pp.149-158, Transworld research network,Vol.1,Part II,(2002)
白﨑博公他、”Q&A付き 光学実務資料集 ～各種応用展開を見据えて～”、第10章 光学シミュレーション編 （株）情報機構(2006)