میکروسکوپ پراب پویشی
منابع

↑  G. Binnig and H. Rohrer, “Scanning tunneling microscopy”, Helv. Phys. Acta 55,726-735,1982
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↑  G. Binnig, H. Rohrer, C. Gerber, E. Weibel, “Surface studies by scanningtunneling microscopy”, Phys. Rev. Lett. 49, 57–61 1982
↑  Binnig, G.; Quate, C. F.; Gerber, Ch. (1986-03-03). "Atomic Force Microscope". Physical Review Letters (به انگلیسی). 56 (9): 930–933. doi:10.1103/PhysRevLett.56.930. ISSN 0031-9007.
↑  Zhang, L.; Sakai, T.; Sakuma, N.; Ono, T.; Nakayama, K. (1999-11-29). "Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy". Applied Physics Letters (به انگلیسی). 75 (22): 3527–3529. doi:10.1063/1.125377. ISSN 0003-6951.
↑  Weaver, J. M. R. (1991-05). "High resolution atomic force microscopy potentiometry". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9 (3): 1559. doi:10.1116/1.585423. {{cite journal}}: Check date values in: |date= (help)
↑  Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K. (1991-06-24). "Kelvin probe force microscopy". Applied Physics Letters (به انگلیسی). 58 (25): 2921–2923. doi:10.1063/1.105227. ISSN 0003-6951.
↑  Hartmann, U. (1988-08). "Magnetic force microscopy: Some remarks from the micromagnetic point of view". Journal of Applied Physics (به انگلیسی). 64 (3): 1561–1564. doi:10.1063/1.341836. ISSN 0021-8979. {{cite journal}}: Check date values in: |date= (help)
↑  Roelofs, A.; Böttger, U.; Waser, R.; Schlaphof, F.; Trogisch, S.; Eng, L. M. (2000-11-20). "Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy". Applied Physics Letters (به انگلیسی). 77 (21): 3444–3446. doi:10.1063/1.1328049. ISSN 0003-6951.
↑  Matey, J. R.; Blanc, J. (1985-03). "Scanning capacitance microscopy". Journal of Applied Physics (به انگلیسی). 57 (5): 1437–1444. doi:10.1063/1.334506. ISSN 0021-8979. {{cite journal}}: Check date values in: |date= (help)
↑  Eriksson, M. A.; Beck, R. G.; Topinka, M.; Katine, J. A.; Westervelt, R. M.; Campman, K. L.; Gossard, A. C. (1996-07-29). "Cryogenic scanning probe characterization of semiconductor nanostructures". Applied Physics Letters (به انگلیسی). 69 (5): 671–673. doi:10.1063/1.117801. ISSN 0003-6951.
↑  Trenkler, T. (1998-01). "Nanopotentiometry: Local potential measurements in complementary metal–oxide–semiconductor transistors using atomic force microscopy". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 16 (1): 367. doi:10.1116/1.589812. {{cite journal}}: Check date values in: |date= (help)
↑  Fritz, M. (1994-05). "Visualization and identification of intracellular structures by force modulation microscopy and drug induced degradation". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12 (3): 1526. doi:10.1116/1.587278. {{cite journal}}: Check date values in: |date= (help)
↑  Ultralarge atomically flat template-stripped Au surfaces for scanning probe microscopy (به انگلیسی).
↑  Bottomley, Lawrence A. (1998-06). "Scanning Probe Microscopy". Analytical Chemistry (به انگلیسی). 70 (12): 425–476. doi:10.1021/a1980011o. ISSN 0003-2700. {{cite journal}}: Check date values in: |date= (help)
↑  Akamine, S.; Barrett, R. C.; Quate, C. F. (1990-07-16). "Improved atomic force microscope images using microcantilevers with sharp tips". Applied Physics Letters (به انگلیسی). 57 (3): 316–318. doi:10.1063/1.103677. ISSN 0003-6951.
R. Wisendanger, Scanning probe microscopy and spectroscopy: Methods and applications, Cambridge University Press, Cambridge, 1994.