Search query: Light emitting diodes reliability review

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abstract: The increasing demand for light emitting diodes (LEDs) has been driven by a number of application categories, including display backlighting, communications, medical services, signage, and general illumination. The construction of LEDs is somewhat similar to microelectronics, but there are functional requirements, materials, and interfaces in LEDs that make their failure modes and mechanisms unique. This paper presents a comprehensive review for industry and academic research on LED failure mechanisms and reliability to help LED developers and end product manufacturers focus resources in an effective manner. The focus is on the reliability of LEDs at the die and package levels. The reliability information provided by the LED manufacturers is not at a mature enough stage to be useful to most consumers and end product manufacturers. This paper provides the groundwork for an understanding of the reliability issues of LEDs across the supply chain. We provide an introduction to LEDs and present the key industries that use LEDs and LED applications. The construction details and fabrication steps of LEDs as they relate to failure mechanisms and reliability are discussed next. We then categorize LED failures into thirteen different groups related to semiconductor, interconnect, and package reliability issues. We then identify the relationships between failure causes and their associated mechanisms, issues in thermal standardization, and critical areas of investigation and development in LED technology and reliability.
author_names: Moon-Hwan Chang

Diganta Das

P V Varde

Michael G Pecht
title: Light emitting diodes reliability review
venue: Microelectron. Reliab.
year: 2012

abstract: Abstract This paper reviews the rapid progress being made in the developments of organic/inorganic blue light emitting diodes (LEDs) Blue LEDs exhibits outstanding electrical and optical properties such as low forward driving voltage, high light output power, high brightness and high internal quantum efficiency (IQE) This article highlights the rapid advancements being made in the developments of organic/inorganic blue LEDs over the last five decades, efficiency enhancement techniques, efficiency droop in blue LEDs and the techniques to alleviate efficiency droop, recent developments in flexible blue LEDs, degradation mechanisms and reliability issues in blue LEDs, challenges in fabrication and packaging of blue LEDs and it also throw light on the applications of blue LEDs. Their uniqueness in terms of low forward driving voltage, high light output power and brightness and large modulation bandwidth has fuelled the incorporation of blue LEDs in a wide variety of applications such as visible light communication (VLC) solid state lighting (SSL) cellular phone displays, liquid crystal display backlights, flexible flat panel displays, outdoor full colour displays, indicators, smart TVs, projection displays and implantable biomedical devices.
author_names: Maidhily Manikandan

D Nirmal

J Ajayan

P MohanKumar

P Prajoon

L Arivazhagan
title: A review of blue light emitting diodes for future solid state lighting and visible light communication applications
year: 2019

abstract: This chapter presents an extensive review of the literature on the degradation processes of GaN based UV A, UV B, and UV C LEDs. For the state of the art devices, the main open issue is the increase in Shockley Read Hall non radiative recombination inside the quantum well, originating from local generation of defects or from diffusion processes of dopant atoms or foreign impurities. Temperature acts as a significant acceleration factor, especially in lower wavelength devices, affected by a higher turn on voltage. Changes in the chemical structure of the package and of the encapsulant, induced by the high energy of the photons, may lead to a lower reflectivity and transmittance, thus limiting the overall reliability of the devices.
author_names: Carlo De Santi

Desiree Monti

Pradip Dalapati

Matteo Meneghini

Gaudenzio Meneghesso

Enrico Zanoni
title: Reliability of Ultraviolet Light Emitting Diodes
year: 2019

abstract: Abstract Currently, the major commercial white light emitting diode is the phosphor converted LED made of blue emitting chip and Y 3 Al 5 O 12 :Ce 3+ yellow phosphor dispersed in organic silicone. However, the organic binder in high power device ages easily and turns yellow due to accumulated heat emitted from chip, which adversely affects the device properties such as luminous efficacy and color coordination, and therefore reduces its long term reliability as well as lifetime. In this mini review article, we provide an overview of recent progresses in developing transparent inorganic glass ceramics phosphors excitable by blue chip, as an alternative to conventional polymer based phosphor converter, for construction of high power white light emitting diodes. Two kinds of synthesis routes, glass crystallization and low temperature co sintering, are discussed in detail. Afterwards, the materials design, structure/property optimization as well as glass ceramic based WLED devices construction are summarized. Finally, challenges and future advances for the realization of transparent glass ceramics in commercial applications will be presented.
author_names: Daqin Chen

Weidong Xiang

Xiaojuan Liang

Jiasong Zhong

Hua Yu

Mingye Ding

Hongwei Lu

Zhen-guo Ji
title: Advances in Transparent Glass Ceramic Phosphors for White Light Emitting Diodes A Review
year: 2015

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author_names: Yun Li

Kun Cao

Rong Chen
title: Thin film encapsulation for the organic light emitting diodes display via atomic layer deposition
venue: Journal of Materials Research
year: 2019

abstract: Organic light emitting diode (LED) technology has reached a point where performance levels are adequate for a number of applications. This review examines the key scientific issues that underlie the operation of such LEDs. The most advanced LEDs are multilayer devices, with the different layers possessing specialized carrier transport/optical properties. A combination of these materials results in the highly efficient devices that have now been reported by several laboratories. The important issue of reliability and some possible applications for organic LEDs are surveyed.
author_names: Ananth Dodabalapur
title: Organic light emitting diodes
year: 1997

abstract: A review is presented of the operation and characteristics of electroluminescent p n junctions which are specifically designed for incoherent emission in the visible region of the optical spectrum. Recombination mechanisms in direct and indirect bandgap semiconductors, optical losses and reliability, efficiency and brightness considerations, and material synthesis are treated in sufficient depth to understand their role in the over all performance of visible light emitting diodes (LEDs) The paper is concluded with a summary of the state of the art for each of the various types of LEDs presently under development or commercially available.
author_names: Charles J Nuese

Henry Kressel

Ivan Ladany
title: Light Emitting Diodes and Semiconductor Materials for Displays
year: 1973

abstract: Lead halide perovskites are a remarkable class of materials that have emerged over the past decade as being suitable for application in a broad range of devices, such as solar cells, light emitting diodes, lasers, transistors, and memory devices, among others. While they are often solution processed semiconductors deposited at low temperatures, perovskites exhibit properties one would only expect from highly pure inorganic crystals that are grown at high temperatures. This unique phenomenon has resulted in fast paced progress toward record device performance; unfortunately, the basic science behind the remarkable nature of these materials is still not well understood. This review assesses the current understanding of the photoluminescence (PL) properties of metal halide perovskite materials and highlights key areas that require further research. Furthermore, the need to standardize the methods for characterization of PL in order to improve comparability, reliability and reproducibility of results is emphasized.
author_names: Katelyn P Goetz

Alexander D Taylor

Fabian Paulus

Yana Vaynzof
title: Shining Light on the Photoluminescence Properties of Metal Halide Perovskites
year: 2020

abstract: Currently available reliability test standards (and specifications) for LED packages and systems have mainly been focused on the evaluation of lumen maintenance lifetimes. A brief review on these published standards is given in Sect. 4.1. Then some advanced methods for LED lumen maintenance lifetime estimation by taking into the statistical effects into account are discussed in Sect. 4.2. Afterward Sects. 4.3 and 4.4 in which part of the materials are excerpted from reference (Qian et al. Reliab. Eng. Syst. Saf. 147:84 92, 2016; Qian et al. Prediction of Lumen Depreciation and Color Shift for Phosphor converted White Light Emitting Diodes Based on a Spectral Power Distribution Analysis Method, IEEE Access, to Be Published, (n.d. present two of the hot topics in the reliability field. In Sect. 4.3, a temperature driven accelerated test method within 2000 h is proposed instead of the 6000 h test methods to qualify the LED luminaires and lamps with an expected lumen maintenance lifetime of 25,000 h. And in Sect. 4.4, a spectral power distribution (SPD) analysis based method is proposed to simultaneously predict the lumen depreciation and color shift of phosphor converted white LEDs (pc LEDs) In the end, concluding remarks of this chapter are summarized in Sect. 4.5.
author_names: Cheng Qian

J J Fan

Xuejun Fan

Guoqi Zhang
title: Advances in Reliability Testing and Standards Development for LED Packages and Systems
year: 2018

abstract: We review the failure modes and mechanisms of gallium nitride (GaN) based light emitting diodes (LEDs) A number of reliability tests are presented, and specific degradation mechanisms of state of the art LED structures are analyzed. In particular, we report recent results concerning the following issues: 1) the degradation of the active layer induced by direct current stress due to the increase in nonradiative recombination; 2) the degradation of LEDs submitted to reverse bias stress tests; 3) the catastrophic failure of advanced LED structures related to electrostatic discharge events; 4) the degradation of the ohmic contacts of GaN based LEDs; and 5) the degradation of the optical properties of the package/phosphors system of white LEDs. The presented results provide important information on the weaknesses of LED technology and on the design of procedures for reliability evaluation. Results are compared with literature data throughout the text.
author_names: Matteo Meneghini

Augusto Tazzoli

Giovanna Mura

Gaudenzio Meneghesso

Enrico Zanoni
title: A Review on the Physical Mechanisms That Limit the Reliability of GaN Based LEDs
venue: IEEE Transactions on Electron Devices
year: 2010