Free poster on SARS-CoV-2 variants Download now › Search All Home›Electron Microscopy›Electron Microscopes›Scanning Electron Microscopes ELECTRON MICROSCOPY Scanning Electron Microscopes Scanning electron microscopes for a wide range of surface analysis needs. Contact us Scanning electron microscopes Since the introduction of electron microscopes in the 1930s, scanning electron microscopy (SEM) has developed into a critical tool within numerous different research fields, spanning everything from materials science, to forensics, to industrial manufacturing, and even to the life sciences. As soon as microscopic information about the surface or near-surface region of a specimen is needed, SEM becomes a necessary tool. For that reason, the method finds applications in nearly every branch of science, technology and industry. Floor model SEMs offer the flexibility and versatility to meet a wide range of academic and industrial needs: support for large and heavy samples, a very wide range of accessories, excellent imaging quality for the most challenging materials or the smallest details, and dynamic experimentation. Thermo Fisher Scientific is dedicated to producing analytical SEMs that are ideally suited for your specific needs. We offer a range of versatile tools, everything from our easy-to-use Thermo Scientific Phenom Desktop SEMs to powerhouse instruments capable of unparalleled resolution and contrast like the Thermo Scientific Verios SEM. Quick comparison of floor-model scanning electron microscopes High-resolutions scanning electron microscopes Entry-level and environmental floor-model scanning electron microscopes Desktop scanning electron microscopes Technology SEM Desktop SEM TEM DualBeam EFA Systems Circuit Edit XPS Instruments microCT Sample Vitrification Software Accessories Industry Applications Techniques Axia ChemiSEM Live quantitative elemental mapping High fidelity scanning electron microscopy imaging Flexible and easy to use, even for novice users Easy maintenance View product Download datasheet Verios 5 XHR SEM Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range Easy access to beam landing energies as low as 20 eV Excellent stability with piezo stage as standard View product Download datasheet Quattro ESEM Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM) Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation View product Download datasheet Prisma E SEM Entry-level SEM with excellent image quality Easy and quick sample loading and navigation for multiple samples Compatible with a wide range of materials thanks to dedicated vacuum modes View product Download datasheet Apreo 2 SEM High-performance SEM for all-round nanometer or sub-nanometer resolution In-column T1 backscatter detector for sensitive, TV-rate materials contrast Excellent performance at long working distance (10 mm) View product Download datasheet VolumeScope 2 SEM Isotropic 3D data from large volumes High contrast and resolution in high and low vacuum modes Simple switch between normal SEM use and serial block-face imaging View product Download datasheet Resources Images Documents The Quattro SEM is capable of imaging insulating samples without sample coating. On this glass specimen, a high-quality artifact-free image is obtained thanks to the instrument’s low vacuum mode. Horizontal field width ~127 μm. Sample courtesy of Stazione Sperimentale del Vetro, Murano, Venezia. SEM image of CaCu₃Ti₄O₁₂ (CCTO), a compound with an extraordinarily high dielectric constant. A high-quality SEM image was obtained thanks to the instrument’s low vacuum mode. Sample courtesy of Ensi Caen, CRISMAT laboratory – Guillaume Riquet, Sylvain Marinel, Yohann Breard. Corroded solder specimen colorized with ColorSEM Technology. The ability to directly see which materials the sample consists of, as well as their distribution, saves time in a variety of applications, such as failure analysis. Horizontal field width ~64 μm. Contact us Electron microscopy services To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts. Learn more › Electron microscopy support and resources Accelerating Microscopy blog › Software updates › Service request › Service contracts › Parts inquiry › Shopping Tool Product Selection Guides Quick Order Redeem a Quote New Products Promotions Mobile & Desktop Apps Shared Lists Check order status eSolutions eProcurement Supply Center Instrument Management Support Training Webinars Blog Social Media Contact Us Report a Site Issue Thermo Fisher Scientific About Us Careers Investors News Responsibility Trademarks UK Modern Slavery Statement Belgium Terms & Conditions Privacy Information Center Price & Freight Policy