HISTORY: HAROLD HAMILTON Harold Hamilton founded Micro Control Company in 1972 as a manufacturer of test equipment for the electronics industry. The microprocessor-controlled test system produced in 1973 was the first in the industry. Today, the tradition continues with Micro Control Company’s high-power burn-in and test systems which are being shipped to customers throughout the world. Along with high-power burn-in systems for logic and memory applications, Micro Control Company designs and builds burn-in boards and other burn-in accessories for use during reliability or production burn-in applications. WHY MICRO CONTROL COMPANY? QUALITY In the nearly 50 years since Micro Control Company was established, a commitment to high quality products has always remained a top priority. We strive to exceed our customers needs by creating an environment focused on excellence. Each and every employee is committed to innovation and improvement. Every system and burn-in board is made from the highest quality components and is rigorously tested prior to shipment. CUSTOMER SERVICE Here at Micro Control Company, we place a premium on customer service; helping you achieve your goals allows us to achieve ours. From your first sales inquiry to post-install, our team seeks to help you understand and get the most out of your burn-in with test system. FOCUS ON ENGINEERING Unique solutions through innovative designs allows Micro Control Company to continue to meet the challenges of the semiconductor industry. At the center of our operations, a talented team of engineers provide the knowledge and experience to meet customer-specific application requirements. By working together, we will find the right burn-in solution to meet your needs. INDUSTRY FIRST Micro Control Company prides itself on leading the industry in providing unique solutions to test and burn-in with test challenges. Over the years, Micro Control Company has been the first to bring these innovative designs to market, carving a niche for itself as the test with burn-in company. DISCOVER OUR HISTORY 1973 First microprocessor-controlled test system is created by Micro Control Company founder, Harold Hamilton. 1974 First single-range programmable clock edges. 1976 First memory burn-in test system with algorithmic pattern generation. 1977 First system able to test for alpha particle sensitivity. 1981 First large-scale 10-MHz memory burn-in test system (6,912 devices). 1984 First parallel memory burn-in test system (1,728 devices tested simultaneously). 1986 First 15-MHz environmental test system. 1989 First 256-pin I/O burn-in test system for VLSI devices. 1991 First logic burn-in system using ASIC technology. 1992 First burn-in system using weighted random patterns. 1994 First memory burn-in and test systems using ASICs. 1997 First large-scale high-power burn-in system. 1997 First massively parallel memory test system used in manufacturing for batch testing. 1998 First 200 MHz memory test system. 1999 First burn-in test system for 200-watt devices with individual temperature control provided to each device. 2001 First air-cooled burn-in with test system for 75-watt devices with individual temperature control for each device. 2001 First burn-in with test system capable of full testing of logic and memory devices. 2004 First burn-in with test system for 600-watt devices with individual temperature control. 2005 First air-cooled burn-in with test system for 150-watt devices with individual temperature control for each device and an individual pattern zone per burn-in board. 2008 First low cost burn-in system with individual temperature control. 2012 125 Amp regulators 2013 HPB-4 High Force trays 2014 +- 150 Volt regulators 2016 1,000 Volt LC2 applications 2020 HPB-5C+ system is released. 2020 First fully automatic system is released; the LC-2 Automation system. May 2021 LC-2+ system is released. INVEST IN QUALITY CONTACT US 7956 Main Street NE Minneapolis, MN 55432, USA Burn-In with Test Systems +1 763-786-8750 +1 800-328-9923 Privacy Policy © Micro Control Company 2021