Reception Products » Info & Events Service / Support Contact Log in Products Optical Equipment Electronic EDS Integrated for SEM and MET Jeol EDS SDD for SEM EDS Integrated MEB / MET Optical Electronic Equipment Innovative and efficient solutions perfectly adapted to our equipment. EDS SDD for MEB EDS SDD for MET Centurio EDS 1sr EDS SDD for MEB PRESENTATION CHARACTERISTICS GALLERY RESOURCES Integrated analytical solution with: - SDD detector for light elements - High counting rate - Resolution 129 eV - Detectable elements Be to U - Elemental mapping - Spectral simulation - Interactive drift correction - Particle analysis Optical Electronic Equipment Scanning Electronic Microscopes Transmission Electronic Microscopes Double column FIB and MEB-FIB Surface Analysis (Auger, EPMA microprobes) EDS Integrated for MEB and MET Jeol Preparation of samples Plasma cleaner Ion slicer Ionic polisher - CP Carbon evaporator metallizer Semiconductor equipment Electron beam lithography Wafer inspection by MEB Precision process inspection Analytical spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Room Environment Control Room temperature control Magnetic field compensator Anti-vibration devices Medical equipments AminoTac BioMajesty Terms of use | Confidentiality declaration Copyright 2014 JEOL

Reception Products » Info & Events Service / Support Contact Log in Products Optical Equipment Electronic FIB and SEM-FIB with double column Double column FIB and MEB-FIB JEOL uses FIB technology both in the form of a single beam of focused ions, and in the form of a double beam which combines an SEM column (LaB6 or FEG) with an ionic column. JEOL EQUIPMENT RANGE Focused Ion Beam System The JIB -4000 probe is a focused ion beam observation and sample preparation system . Double column MEB-FIB The ion source is combined with a LaB6 gun for the JIB-4501, or a field emission gun for the JIB-4601F. Optical Electronic Equipment Scanning Electronic Microscopes Transmission Electronic Microscopes Double column FIB and MEB-FIB Surface Analysis (Auger, EPMA microprobes) EDS Integrated for MEB and MET Jeol Preparation of samples Plasma cleaner Ion slicer Ionic polisher - CP Carbon evaporator metallizer Semiconductor equipment Electron beam lithography Wafer inspection by MEB Precision process inspection Analytical spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Room Environment Control Room temperature control Magnetic field compensator Anti-vibration devices Medical equipments AminoTac BioMajesty Terms of use | Confidentiality declaration Copyright 2014 JEOL