About Us Practices Professionals Results News & Events Publications Careers Contact Us PTAB Blog Biosimilars Blog Privacy Blog RF EMerge Blog In the News Insightful. Precise. Skilled. IAM Global Leaders Guide Includes Three Rothwell Figg Attorneys Among World’s Foremost Private Practice Patent Experts November 22, 2021 The 2022 edition of IAM Global Leaders Guide includes E. Anthony Figg, Steven Lieberman, and R. Danny Huntington among the world’s foremost private practice patent experts. The esteemed group recognized are included in the Guide not only because of their expertise and experience related to creating, protecting, managing, transacting, and enforcing critical patent rights, but also for their ability to innovate, inspire, and go above and beyond to deliver value for their clients. To qualify for inclusion, individuals must be ranked in the gold tier of the IAM Patent 1000: The World’s Leading Patent Professionals - the market-leading annual directory that identifies the top law and attorney firms and individuals in the world’s most important patent jurisdictions. IAM Patent 1000 ranking are compiled through an exhaustive process. Researchers gather hundreds of written submissions from firms detailing their recent activities, conduct hundreds of face-to-face and telephone interviews, and correspond, over a four-month period, with patent lawyers, attorneys, and their clients. The 2022 edition of the IAM Patent 1000 rankings include Tony as a Luminary in the DC metro area; Steve ranked in litigation in the DC metro area and for post-grant proceedings nationally; and Danny ranked in prosecution in the DC metro area and for post-grant proceedings nationally. To see the full list of the third edition of IAM Global Leaders, please click here. To learn more about Rothwell Figg and firm attorneys in the 2021 IAM Patent 1000 rankings, please click here. Professionals E. Anthony Figg Member R. Danny Huntington Member Steven Lieberman Member © 2021 Rothwell, Figg, Ernst & Manbeck, P.C. All Rights Reserved Disclaimer Privacy Policy Site Map X We use cookies to enhance your user experience. By continuing to use this site you are giving your consent for us to use cookies. AGREE For more information, please see our Privacy Policy.