Free poster on SARS-CoV-2 variants Download now › Search All Home›Materials Science MATERIALS SCIENCE Materials Science Advanced materials characterization with electron microscopy and spectroscopy. Contact us Applications Techniques Samples Products Contact Us Advances in materials science Innovative materials play essential roles in safety, clean energy, transportation, human health, and industrial productivity. To fuel continued innovation, researchers want to deepen their understanding of the physical and chemical properties of materials (morphological, structural, magnetic, thermal, and mechanical) from the macro- to nanoscale. Whether discovering new materials, solving analytical problems, improving processes, or assuring product quality, electron microscopy is capable of providing insight at all scales and modalities. The discoveries resulting from materials science research help enhance researchers’ ability to successfully correlate structural properties with functional performance. In turn, this insight helps commercial enterprises innovate products and processes to gain important time-to-market and cost advantages. Materials characterization Analytical solutions, including electron microscopy and spectroscopy, from Thermo Fisher Scientific can help you address your most pressing challenges, including; Developing new functional materials that meet the demands of today’s unique social and economic challenges Supporting the discovery of new materials with reproducible data from complementary techniques Solving materials and method development challenges to improve processes and investigate product defects Publishing groundbreaking discoveries, writing winning grant proposals, or patenting novel materials Assuring defects are rejected before they reach customers Taking your ideas to market quickly and keeping your company competitive Play Video Play Mute Current Time 0:00 / Duration 0:39 Loaded: Share Fullscreen Defect analysis of a lithium ion battery cathode. Serial sectioning and imaging with Plasma FIB DualBeam followed by digital 3D reconstruction using Avizo software provides a highly detailed model of the sample. Phenom Pharos G2 Desktop FEG-SEM Bring field emission SEM to your tabletop. The Phenom Pharos G2 FEG-SEM will outperform many floor-standing SEMs in terms of image quality, while offering a vastly better user experience. Learn more Industrial manufacturing product selector The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application: Surface analysis learning center The chemistry of the surface of a material, or at the interfaces of layers, determines how a material behaves. Our surface analysis references and resources can help you engineer desired properties or better understand materials when they do not perform as expected. Explore electron microscopy Advancing Materials blog Electron microscopy Electron microscopy learning center Electron microscopy NanoPorts Applications Process control using electron microscopy Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement. Quality control and failure analysis Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement. Fundamental Materials Research Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale. Technical Cleanliness More than ever, modern manufacturing necessitates reliable, quality components. With scanning electron microscopy, parts cleanliness analysis can be brought inhouse, providing you with a broad range of analytical data and shortening your production cycle. Techniques S/TEM Sample Preparation 3D Materials Characterization Nanoprototyping EDS EDS Elemental Analysis 3D EDS Tomography Atomic-scale EDS Imaging using HRSTEM Imaging using DPC Imaging Hot Samples XPS Technology Multi-technique surface analysis workflow ESEM EELS APT Sample Preparation Cross-sectioning In-situ experimentation Particle analysis Cathodoluminescence SIMS Multi-scale analysis ColorSEM Automated Particle Workflow (S)TEM Sample Preparation DualBeam microscopes enable the preparation of high-quality, ultra-thin samples for (S)TEM analysis. Thanks to advanced automation, users with any experience level can obtain expert-level results for a wide range of materials. Learn more › Samples Battery Research Battery development is enabled by multi-scale analysis with microCT, SEM and TEM, Raman spectroscopy, XPS, and digital 3D visualization and analysis. Learn how this approach provides the structural and chemical information needed to build better batteries. Learn more › Metals Research Effective production of metals requires precise control of inclusions and precipitates. Our automated tools can perform a variety of tasks critical for metal analysis including; nanoparticle counting, EDS chemical analysis and TEM sample preparation. Learn more › Polymers Research Polymer microstructure dictates the material’s bulk characteristics and performance. Electron microscopy enables comprehensive microscale analysis of polymer morphology and composition for R&D and quality control applications. Learn more › Geological Research Geoscience relies on consistent and accurate multi-scale observation of features within rock samples. SEM-EDS, combined with automation software, enables direct, large-scale analysis of texture and mineral composition for petrology and mineralogy research. Learn more › Oil and Gas As the demand for oil and gas continues, there is an ongoing need for efficient and effective extraction of hydrocarbons. Thermo Fisher Scientific offers a range of microscopy and spectroscopy solutions for a variety of petroleum science applications. Learn more › Nanoparticles Materials have fundamentally different properties at the nanoscale than at the macroscale. To study them, S/TEM instrumentation can be combined with energy dispersive X-ray spectroscopy to obtain nanometer, or even sub-nanometer, resolution data. Learn more › Forensics Micro-traces of crime scene evidence can be analyzed and compared using electron microscopy as part of a forensic investigation. Compatible samples include glass and paint fragments, tool marks, drugs, explosives, and GSR (gunshot residue). Learn more › Catalysis Research Catalysts are critical for a majority of modern industrial processes. Their efficiency depends on the microscopic composition and morphology of the catalytic particles; EM with EDS is ideally suited for studying these properties. Learn more › Fibers and Filters The diameter, morphology and density of synthetic fibers are key parameters that determine the lifetime and functionality of a filter. Scanning electron microscopy (SEM) is the ideal technique for quickly and easily investigating these features. Learn more › 2D Materials Novel materials research is increasingly interested in the structure of low-dimensional materials. Scanning transmission electron microscopy with probe correction and monochromation allows for high-resolution two-dimensional materials imaging. Learn more › Automotive Materials Testing Every component in a modern vehicle is designed for safety, efficiency, and performance. Detailed characterization of automotive materials with electron microscopy and spectroscopy informs critical process decisions, product improvements, and new materials. Learn more › Surface Analysis Learning Center The chemistry of the surface of a material, or at the interfaces of layers, determines how a material behaves. Our surface analysis references and resources can help you engineer desired properties or better understand materials when they do not perform as expected. XPS Learning center Products Helios 5 Laser PFIB System Fast, millimeter-scale cross sections Statistically relevant deep subsurface and 3D data analysis Shares all capabilities of the Helios 5 PFIB platform View product Download datasheet Helios Hydra DualBeam 4 fast switchable ion species (Xe, Ar, O, N) for optimized PFIB processing of a widest range of materials Ga-free TEM sample preparation Extreme high resolution SEM imaging View product Download datasheet Helios 5 DualBeam Fully automated, high-quality, ultra-thin TEM sample preparation High throughput, high resolution subsurface and 3D characterization Rapid nanoprototyping capabilities View product Download datasheet Helios 5 PFIB DualBeam Gallium-free STEM and TEM sample preparation Multi-modal subsurface and 3D information Next-generation 2.5 μA xenon plasma FIB column View product Download datasheet Spectra Ultra New imaging and spectroscopy capabilities on the most beam sensitive materials A leap forward in EDX detection with Ultra-X Column designed to maintain sample integrity. View product Download datasheet Spectra 200 High-resolution and contrast imaging for accelerating voltages from 30-200 kV Symmetric S-TWIN/X-TWIN objective lens with wide-gap pole piece design of 5.4 mm Sub-Angstrom STEM imaging resolution from 60 kV-200 kV View product Download datasheet Spectra 300 Highest-resolution structural and chemical information at the atomic level Flexible high-tension range from 30-300 kV Three lens condenser system View product Download datasheet Talos F200i TEM High-quality S/TEM images and accurate EDS Available with dual EDS technology Best all-round in situ capabilities Large field-of-view imaging at high speed View product Download datasheet Talos F200S TEM Precise chemical composition data High-performance imaging and precise compositional analysis for dynamic microscopy Features Velox Software for fast and easy acquisition and analysis of multimodal data View product Download datasheet Talos F200X TEM High resolution/throughput in STEM imaging and chemical analysis Add in situ sample holders for dynamic experiments Features Velox Software for fast and easy acquisition and analysis of multimodal data View product Download datasheet Talos F200C TEM Flexible EDS analysis reveals chemical information High-contrast, high-quality TEM and STEM imaging Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed View product Download datasheet Scios 2 DualBeam Full support of magnetic and non-conductive samples High throughput subsurface and 3D characterization Advanced ease of use and automation capabilities View product Download datasheet Talos L120C TEM Increased stability 4k × 4K Ceta CMOS camera TEM magnification range from 25–650 kX Flexible EDS analysis reveals chemical information View product Download datasheet Axia ChemiSEM Live quantitative elemental mapping High fidelity scanning electron microscopy imaging Flexible and easy to use, even for novice users Easy maintenance View product Download datasheet Themis ETEM Precise control and knowledge of sample temperature Improved sample stability, navigation, and assisted sample drift correction in x, y, and z axes Advancing high-quality imaging and movie acquisition functions View product Download datasheet Verios 5 XHR SEM Monochromated SEM for sub-nanometer resolution over the full 1 keV to 30 keV energy range Easy access to beam landing energies as low as 20 eV Excellent stability with piezo stage as standard View product Download datasheet Quattro ESEM Ultra-versatile high-resolution FEG SEM with unique environmental capability (ESEM) Observe all information from all samples with simultaneous SE and BSE imaging in every mode of operation View product Download datasheet Prisma E SEM Entry-level SEM with excellent image quality Easy and quick sample loading and navigation for multiple samples Compatible with a wide range of materials thanks to dedicated vacuum modes View product Download datasheet VolumeScope 2 SEM Isotropic 3D data from large volumes High contrast and resolution in high and low vacuum modes Simple switch between normal SEM use and serial block-face imaging View product Download datasheet Apreo 2 SEM High-performance SEM for all-round nanometer or sub-nanometer resolution In-column T1 backscatter detector for sensitive, TV-rate materials contrast Excellent performance at long working distance (10 mm) View product Download datasheet Phenom XL G2 Desktop SEM For large samples (100x100 mm) and ideal for automation <10 nm resolution and up to 200,000x magnification; 4.8 kV up to 20 kV acceleration voltage Optional fully integrated EDS and BSE detector View product Download datasheet Phenom Pro G6 Desktop SEM High performance desktop SEM Resolution <6 nm (SE) and <8 nm (BSE); magnification up to 350,000x Optional SE detector View product Download datasheet Phenom ProX G6 Desktop SEM High performance desktop SEM with integrated EDS detector Resolution <6 nm (SE) and <8 nm (BSE); magnification up to 350,000x Optional SE detector View product Download datasheet Phenom Pure G6 Desktop SEM Entry level desktop SEM Resolution <15 nm; magnification up to 175,000x Longlife CeB6 source View product Download datasheet Phenom ParticleX Steel Desktop SEM SEM and EDS integrated Ease of use Sub-micrometer inclusions View product Download datasheet Phenom ParticleX TC Desktop SEM Versatile desktop SEM with automation software for Technical Cleanliness Resolution <10 nm; magnification up to 200,000x Optional SE detector View product Download datasheet Phenom Perception GSR Desktop SEM Dedicated automated GSR desktop SEM Resolution <10 nm; magnification up to 200,000x Longlife CeB6 source View product Download datasheet Phenom ParticleX AM Desktop SEM Versatile desktop SEM with automation software for Additive Manufacturing Resolution <10 nm; magnification up to 200,000x Optional SE detector View product Download datasheet Phenom Programming Interface Customize your SEM to fit your workflow Increase efficiency and save time with automated processes Control imaging settings and stage navigation View product Download datasheet Phenom Pharos G2 Desktop FEG-SEM FEG source with 1 – 20 kV acceleration voltage range <2.0 nm (SE) and 3.0 nm (BSE) resolution @ 20 kV Optional fully integrated EDS and SE detector View product Download datasheet K-Alpha XPS High resolution XPS Fast, efficient, automated workflow Ion source for depth profiling View product Download brochure ESCALAB QXi XPS High spectral resolution Multi-technique surface analysis Extensive sample preparation and expansion options View product Download brochure Nexsa G2 XPS Micro-focus X-ray sources Unique multi-technique options Dual-mode ion source for monoatomic & cluster ion depth profiling View product Download datasheet HeliScan microCT Advanced helical scanning and iterative reconstruction technology High resolution x-ray source (below 400 nm) Process, analyze, and visualize samples View product Download datasheet Athena Software Imaging Data Management Ensure traceability of images, data, metadata and experimental workflows Simplify your imaging workflow Improve collaboration Secure and manage data access View product Download brochure Avizo Software Materials Science Support for multi-data/multi-view, multi-channel, time series, very large data Advanced multi-mode 2D/3D automatic registration Artifact reduction algorithms View product Download brochure AsbestoMetric Automated tool for image acquisition, fiber detection and reporting Assisted EDS analysis with fiber revisiting ISO standard report on asbestos analysis View product Download datasheet AutoTEM 5 Fully automated in situ S/TEM sample preparation Support of top-down, planar and inverted geometry Highly configurable workflow Easy to use, intuitive user interface View product Download datasheet AutoScript 4 improved reproducibility and accuracy Unattended, high throughput imaging and patterning Supported by Python 3.5-based scripting environment View product Download datasheet Velox An experiments panel on the left side of the processing window. Live quantitative mapping Interactive detector layout interface for reproducible experiment control and setup View product Download datasheet Inspect 3D Software Image processing tools and filters for cross-correlation Feature tracking for image alignment Algebraic reconstruction technique for iterative projection comparison View product Learn more Maps Software Acquire high-resolution images over large areas Easily find regions of interest Automate image acquisition process Correlate data from different sources View product Download datasheet Nanobuilder CAD-based prototyping Fully automated job execution, stage navigation, milling, and deposition Automated alignment and drift control View product Download datasheet ProSuite Automated collection of images Real-time remote control Standard applications included: Automated Image Mapping + Remote User Interface View product Download Datasheet PoroMetric Correlate pore features such as area, aspect ratio, major and minor axis Acquire images directly from the Desktop SEM Statistical data with high-quality images View product Download Datasheet ParticleMetric Integrated software in ProSuite for online and offline analysis Correlating particle features such as diameter, circularity, aspect ratio and convexity Creating image datasets with Automated Image Mapping View product Download Datasheet Elemental Mapping Fast and reliable information on the distribution of elements within the sample or the selected line Easily exported and reported results View product Download datasheet 3D Reconstruction Intuitive user interface, maximum employability Intuitive fully automated user interface Based on 'shape from shading' technology, no stage tilt required View product Download datasheet FiberMetric Save time by automated measurements Fast and automated collection of all statistical data View and measure micro and nano fibers with unmatched accuracy View product Download datasheet EM Services for DualBeam (FIB SEM) Microscope Become an expert on all aspects of your workflow Receive enhanced visibility to product performance Enjoy comprehensive maintenance and committed uptime View service Download brochure Auto Slice and View 4.0 Software Automated serial sectioning for DualBeam Multi-modal data acquisition (SEM, EDS, EBSD) On-the-fly editing capabilities Edge based cut placement View product Download datasheet Quartz PCI/CFR SEM imaging traceability compliant with 21 CFR Part 11 Compatible with the Phenom XL and Phenom Pro desktop SEMs Windows 10 64-bit operating system support View product Download datasheet Industrial Manufacturing Product Selector The product selector is here to assist you in choosing the most suitable Scanning Electron Microscope (SEM) system and software for your research. Find out in a few minutes which SEM best suits your research application: Find your ideal Desktop SEM Contact us Electron microscopy services for the materials science To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts. 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