Careers +33 (0)456 526 800 Company Mission & Vision Technologies Network Markets Through Silicon Vias Fan-Out Wafer Level Packaging Power Semiconductors MEMS Products Inspection 4See Series Metrology NST Series TMap Series Services News Events Contact Click for Menu Company Mission & Vision Markets Technologies News Events Products Inspection Metrology NST Series TMap Series Contact Power Semiconductors Post Backside Wafer Thinning and Metallization Inspection NST Series A Game Changer in Nanotopography 4See Series Multiple orders for Power Semiconductors UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in semiconductor metrology and inspection for heterogeneous integration combining advanced technologies to enable higher yields and faster time to market. Next event: October 9, 2017 - October 12, 2017 IMAPS 2017 Raleigh, NC UnitySC will be exhibiting on booth #421 and delivering a talk entitled “In line Advanced Process Control Solution for the Fabrication of Micro-bumps”. Come to meet with us. To pre-arrange a meeting, send us a message. Latest Press Release: May 9, 2017 UNITYSC RECEIVES MULTIPLE ORDERS FOR WAFER THINNING INSPECTION SYSTEMS Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications Grenoble, France, May 9, 2017 – UnitySC, a leader in advanced inspection and metrology solutions, today announced multiple orders from a leading integrated device manufacturer (IDM) for its modular 4See Series automated defect inspection platform. The systems were selected because they deliver optimal wafer backside surface and edge defect inspection post thinning and metallization. The 4See Series will be used for automotive applications by a market leader in power semiconductor manufacturing to improve the reliability and performance of its products. Read More Twitter feeds RT @XFAB_FOUNDRY: Today, MEMS&Sensors Summit @MEMSGroup, Volker Herbig talks about: From sampling to ramping: the long way towards high vol… 21 September 2017 First full conference day of @SEMIEurope #Memssensor is starting ! pic.twitter.com/pWZWrkKC1X 21 September 2017 RT @asegroup_global: An inspired SEMI #CEO and inspiring SEMI #Europe President set the stage for an exciting #MEMS Summit ahead. ASE thril… 20 September 2017 RT @Jan_TechSearch: TechSearch International celebrates our 30th Anniversary! So many changes in our industry in the last 30 years!!! 20 September 2017 UnitySC delivers visionary technologies that foster progress for people. We are recognized as a key player in inspection and metrology combining advanced technologies to enable higher yields and faster time to market. +33 (0)456 526 800 Recent Posts Overcoming thin-wafer inspection challenges for high-volume manufacturing Advanced Process Control Solutions for Fan-Out Wafer Level Packaging Heterogeneous Integration Versus Dimensional Scaling; One Year In (Part 2) SEMICON Europa 2017 IWLPC Navigation Inspection Metrology Network Careers Contact Legal statement ©2017 Unity Semiconductor SAS