| Electron Microscopy Solutions Materials Science Semiconductors Life Sciences Oil and Gas Home / Products / TEM / Talos / Talos F200i for Materials Science Transmission Electron Microscopes Talos F200i for Materials Science More productivity, more flexibility—more materials science. The Thermo Scientific™ Talos™ F200i S/TEM is a 20-200 kV field emission (scanning) transmission electron microscope uniquely designed for performance and productivity across a wide range of Materials Science samples and applications. Its standard X-Twin pole piece gap—giving the highest flexibility in applications—combined with a reproducibly performing electron column opens opportunities for high-resolution 2D and 3D characterization, in situ dynamic observations, and diffraction applications. Need more information? CONTACT A SALES OR SERVICE REPRESENTATIVE HAADF HRSTEM image of Potassium Tungsten Niobate [001] showing the stability of the Talos F200i. More Materials Science on one flexible tool Designed for multi-user and multi-discipline environments, the Talos F200i S/TEM is also ideal for novice users. It is equipped with the Thermo Scientific Velox™ user interface, which is immediately familiar since it is shared across all Thermo Scientific TEM platforms. All TEM daily tunings have been automated to provide the best and most reproducible setup. This automation eases the learning curve for novice operators, reduces tensions in a multi-user environment, and improves time-to-data for the experienced operator. A side-entry retractable Energy Dispersive X-ray Spectroscopy (EDS) detector can be added to the configuration to enable chemical analysis. Compact design The smaller footprint and dimensions of the Talos F200i facilitate accommodation of this tool in more challenging spaces. In addition, this compact design eases access for service needs while also reducing infrastructure and support costs. Featured Video Introducing the Talos F200i S/TEM Introducing the new, highly configurable Thermo Scientific™ Talos™ F200i S/TEM. Watch our webcast and learn how our newest 20–200 kV high-performance, compact scanning transmission electron microscope (S/TEM) makes high-resolution imaging and associated analytical performance accessible to a wider range of labs across a broader range of materials. Watch on-demand. Productivity for all users To further enhance productivity, especially in multi-user, multi-material environments, the constant-power objective lenses, low-hysteresis design, and remote operation with SmartCam allow for straightforward reproducible mode and high-tension switches. The Talos F200i S/TEM also features educational online help. Simply pressing F1 with the mouse hovering over a control panel quickly opens relevant information. CBED pattern on Silicon [011] showing Talos F200i flexibility and superior dynamic range of the Ceta 16M camera. Featured Document Talos F200i Datasheet Download the datasheet to explore the specifications that make the Talos™ F200i S/TEM the 20-200 kV field emission (scanning) transmission electron microscope of choice for performance and productivity across a wide range of Materials Science samples and applications. Download document Publication list for Talos F200i for Materials Science Title: Multifunctionality of silver closo-boranes Authors: Mark Paskevicius, Bjarne R. S. Hansen, Mathias Jørgensen, Bo Richter & Torben R. Jensen References: Nature Communications 8, (2017) DOI: 10.1038/ncomms15136 Date: April 2017 Abstract Title: An efficient catalyst of manganese supported on diatomite for toluene oxidation: Manganese species, catalytic performance, and structure-activity relationship Authors: Peng Liu, Hongping He, Gaoling Wei, Dong Liu, Xiaoliang Liang, Tianhu Chen, Jianxi Zhu, Runliang Zhu References: Microporous and Mesoporous Materials, Volume 239, February 2017, Pages 101–110 DOI: 10.1016/j.micromeso.2016.09.053 Date: February 2017 Abstract Title: ZnO/ZnGaNO heterostructure with enhanced photocatalytic properties prepared from a LDH precursor using a coprecipitation method Authors: Yan-Ling Hu, Zhi Wu, Xianting Zheng, Nan Lin, Youhuang Yang, Jifu Zuo, Dongya Sun, Chunhai Jiang, Lan Sun, Changjian Lin, Yougsheng Fu References: Journal of Alloys and Compounds - February 2017 DOI: 10.1016/j.jallcom.2017.02.124 Date: February 2017 Abstract Title: Nanocharacterization of Strontium Titanate Thin Films and Oxide-Electrode Interfaces in Resistive Switching Devices Authors: William J. Bowman, Eva Sediva, Peter Crozier, Jennifer L.M. Rupp References: Microsc. Microanal. 22 (Suppl 3), 2016 DOI: 10.1017/S1431927616008680 Date: January 2017 Abstract VIEW ALL PUBLICATIONS Need more information? CONTACT A SALES OR SERVICE REPRESENTATIVE Our Products Community | Service and Support | Careers © 2019 Thermo Fisher Scientific. All rights reserved. Terms of Use Privacy Policy Cookie Preferences Sitemap Sign in Back to Top