Free poster on SARS-CoV-2 variants Download now › Search All Home›Materials Science›SEM in Geology MATERIALS SCIENCE SEM in Geology SEM EDS is a vital part of multi-modal, multi-scale analysis of rocks and minerals. Contact us Applications Techniques Products Resources Contact Us SEM mineral identification Few disciplines rely as heavily on consistent, multi-scale observation and interpretation of features as the earth sciences. Everything from deep earth flow processes to more efficient methods of resource extraction are dependent on accurate sample characterization. Thermo Fisher Scientific has built a family of imaging platforms and software solutions to facilitate data collection, visualization and analysis during complicated multi-modal, multi-scale characterization routines. Petrology and mineralogy Accurate textural analysis and the associated distribution of minerals within the rock texture are key to accurately describing the physical and chemical aspects of a rock system. Automated determination of mineralogy, based on scanning electron microscopy coupled with energy-dispersive X-ray spectroscopy (SEM-EDS), has established itself as a popular method for acquiring high-resolution images and chemical maps in the mining and mineral processing industries. Thermo Fisher Scientific has a 30-year history of delivering market-leading SEM-EDS technology. Here are just a few of the advantages afforded by our petrology and mineralogy solutions; Expand the number of samples that can be processed with routine petrologic and mineralogic analysis Build a strong statistical repository of mineral content based on automated analysis Automatically obtain accurate mineralogical identification Create a digital inventory of your thin sections and associated mineral assemblages Combine EDS elemental analysis, mineralogy and high-resolution imagery for advanced sample interpretation Analyze more samples for more robust statistics Multi-scale analysis with geoscience software While context is vital for textural analysis, it is especially important for geological or structural interpretation. Electron imaging captures a large number of modalities in a single acquisition, allowing for direct interpretation of composition and texture. However, simply observing a single frame, or even a series of images, out of context reduces the power of this analysis. We provide a suite of automation software developed with the express purpose of preserving context. Thermo Scientific Maps Software is the cross-platform automation engine for our full line of electron microscopy imaging platforms. Maps Software takes the pain out of acquiring larger image mosaics within an easy to use and intuitive software environment. Preserve context with large, automatically acquired, high-resolution datasets Utilize system time efficiently Share observations with context for more collaborative data interpretation Resources Images Chemical zonation in a plagioclase feldspar sample. Albite is shown in dark blue, labradorite is shown in light blue. Multi-scale analysis of a sandstone sample. The left image is a slice from a microCT dataset, the right 3 images are from subsequent SEM analysis that interrogated the clay mineralogy present in the pores. Cross-section overview of the major rock types, revealing varied mineral and structural distribution. Surface analysis of a rock cross-section. A single mineralogical dataset from SEM-EDS analysis is uniquely capable of telling a rich story on texture and composition. Multi-scale analysis of a core plug with X-ray microtomography (microCT) and SEM. The initial sample, plus the extracted mini plug, were imaged with HeliScan microCT. A cross-section of the mini plug was then imaged with SEM. The SEM data has been correlated and segmented with Avizo Software. Applications Fundamental Materials Research Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale. Techniques 3D Materials Characterization EDS Elemental Analysis 3D EDS Tomography Cross-sectioning Multi-scale analysis 3D Materials Characterization Development of materials often requires multi-scale 3D characterization. DualBeam instruments enable serial sectioning of large volumes and subsequent SEM imaging at nanometer scale, which can be processed into high-quality 3D reconstructions of the sample. Learn more › Products Talos F200i TEM High-quality S/TEM images and accurate EDS Available with dual EDS technology Best all-round in situ capabilities Large field-of-view imaging at high speed View product Download datasheet Talos F200S TEM Precise chemical composition data High-performance imaging and precise compositional analysis for dynamic microscopy Features Velox Software for fast and easy acquisition and analysis of multimodal data View product Download datasheet Talos F200X TEM High resolution/throughput in STEM imaging and chemical analysis Add in situ sample holders for dynamic experiments Features Velox Software for fast and easy acquisition and analysis of multimodal data View product Download datasheet Talos F200C TEM Flexible EDS analysis reveals chemical information High-contrast, high-quality TEM and STEM imaging Ceta 16 Mpixel CMOS camera provides large field of view and high read-out speed View product Download datasheet Helios 5 DualBeam Fully automated, high-quality, ultra-thin TEM sample preparation High throughput, high resolution subsurface and 3D characterization Rapid nanoprototyping capabilities View product Download datasheet Helios 5 PFIB DualBeam Gallium-free STEM and TEM sample preparation Multi-modal subsurface and 3D information Next-generation 2.5 μA xenon plasma FIB column View product Download datasheet Scios 2 DualBeam Full support of magnetic and non-conductive samples High throughput subsurface and 3D characterization Advanced ease of use and automation capabilities View product Download datasheet HeliScan microCT Advanced helical scanning and iterative reconstruction technology High resolution x-ray source (below 400 nm) Process, analyze, and visualize samples View product Download datasheet Nexsa G2 XPS Micro-focus X-ray sources Unique multi-technique options Dual-mode ion source for monoatomic & cluster ion depth profiling View product Download datasheet K-Alpha XPS High resolution XPS Fast, efficient, automated workflow Ion source for depth profiling View product Download brochure ESCALAB QXi XPS High spectral resolution Multi-technique surface analysis Extensive sample preparation and expansion options View product Download brochure Maps Software Acquire high-resolution images over large areas Easily find regions of interest Automate image acquisition process Correlate data from different sources View product Download datasheet Athena Software Imaging Data Management Ensure traceability of images, data, metadata and experimental workflows Simplify your imaging workflow Improve collaboration Secure and manage data access View product Download brochure Contact us Electron microscopy services for the materials science To ensure optimal system performance, we provide you access to a world-class network of field service experts, technical support, and certified spare parts. 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