EN News Applications Product Portfolio Webinars About us Distributors Contacts TESCAN FIB-SEM Solutions HOME PRODUCT PORTFOLIO TESCAN FIB-SEM SOLUTIONS The configuration in FIB-SEM systems is such that the electron and ion beam focal points coincide, which results in the optimisation of many applications. Such a feature enables simultaneous SEM imaging during FIB milling tasks – a significant leap in terms of performance and throughput in all those FIB operations which demand ultimate levels of precision. TESCAN offers two different ion species as source for FIBs: Gallium ions and Xenon ion plasma. Ga ion source FIB is for all those applications that need ultimate precision in fabrication and nanopatterning. On the other hand, Xe plasma FIBs enable high ion beam currents that make it possible to remove large volumes of material in times frames that can be up to 50 × shorter compared to Ga-FIBs. In terms of precision, our high-resolution Xe plasma FIBs can achieve resolution of < 15 nm for all those delicate tasks that need power and precision combined. Our wide range of FIB-SEM systems are aimed to satisfy from basic industrial routine applications to the most advanced and challenging technological applications that demand the highest standards in imaging and micro/nanomachining for their complex workflows. TESCAN FIB-SEM Solutions for Materials Science TESCAN FIB-SEM Solutions for Life Sciences TESCAN FIB-SEM Solutions for Semiconductors Do you have questions or are you interested in our solutions? Contacts APPLICATIONS Materials Science Semiconductors Earth Sciences Life Sciences PRODUCT PORTFOLIO TESCAN SEM Solutions TESCAN FIB-SEM Solutions TESCAN micro-CT Solutions ABOUT TESCAN News Events Distributors About us Contacts Privacy policy Whistleblowing Tenders Quality Policy and Environmental Subscribe to our newsletter You will recieve news and events invitations. We don’t send spam. Your personal information will be processed according to privacy policy. Subscribe CONTACTS +420 530 353 211 info@tescan.com support@tescan.com All Contacts © 2021 TESCAN ORSAY HOLDING, a.s. Terms & Conditions : EN version / CZ version Follow us: TESCAN Cookies Policy By clicking “Accept All Cookies”, you agree to the storing of cookies on your device to enhance site navigation, analyze site usage, and assist in our marketing efforts. You can find out more information atTESCAN Privacy Policy Accept All Cookies Cookies Settings