| Electron Microscopy Solutions Materials Science Semiconductors Life Sciences Oil and Gas A Message from Thermo Fisher Scientific and Gatan On June 28, 2018, Thermo Fisher Scientific and Roper Technologies announced that they entered into a definitive agreement under which Thermo Fisher will acquire Gatan, Inc., a wholly owned subsidiary of Roper. LEARN MORE Materials Science Semiconductors Oil and Gas Life Sciences Our Products Community | Service and Support | Careers © 2018 Thermo Fisher Scientific. All rights reserved. Terms of Use Privacy Policy Sitemap Sign in

| Electron Microscopy Solutions Materials Science Semiconductors Life Sciences Oil and Gas Home / Semiconductors / Semiconductors Semiconductors A revolution in high productivity TEM imaging, analysis and metrology Consumer demand is driving the electronics market to produce faster, smaller, cheaper, more power efficient portable devices. Device manufacturers must place a high premium on both time-to-market and device performance . On an operational level, this means working with shrinking geometries, new materials and novel architectures. At this level of innovation, critical dimensions are simply too small to see or characterize with existing tools. New, high productivity, increasingly TEM-centric workflows are required to perform this work. Learn more about Semiconductors in: Pathfinding / Device Development Process Development & Ramp High Volume Manufacturing Electrical Failure Analysis Highest throughput, highest resolution large area deprocessing, sample preparation and characterization of 10nm devices The Helios G4 PFIB HXe DualBeam™ System provides unique capabilities to enable damage-free delayering of 10nm semiconductor devices and advanced failure analysis of 3D packages, in addition to a wide range of other large area FIB processing applications. Learn more Meet our newest innovative products Our latest next-generation products focus on advanced analytical capabilities for failure analysis and process control. These solutions are designed to help increase productivity in semiconductor fabs and labs by improving quality control and yield in the manufacture of 3D NAND, logic, DRAM, analog and display devices. LEARN MORE Featured Document High Volume and Fast Turnaround Automated Inline TEM Sample Preparation Throughput and turnaround of current TEM sample preparation methods in the lab are limited due to the level of difficulty and process time required for producing TEM lamellae. To improve TEM sample preparation time, the plan view sampling techniques as well as cross sectional whole wafer TEM sample preparation by a DualBeam (FIB/SEM) system were introduced into the manufacturing environment. Download document Our Products Community | Service and Support | Careers © 2018 Thermo Fisher Scientific. All rights reserved. Terms of Use Privacy Policy Sitemap Sign in Back to Top