SERVICES PROJECTS PRODUCTS PUBLICATIONS CONTACT User Area Screening Electronic Components | EEE Parts In Alter Technology we specialize in designing tests and screening procedures for electronic components used in the aerospace, defense, and industrial electronics industries. Tests, inspections or combination thereof, imposed on 100% of parts to remove unsatisfactory items or those likely to exhibit early failures. Using stress testing, defects are weeded out in a product where the root causes cannot be eliminated. Removing all the defective parts (infant mortality) brings the lot to the constant failure rate (working life) phase. The screening does not increase the reliability of the components but removes those showing weakness or defects. European and international space programs use parts which are typically screened according to escc and mil specifications. SERVICES & CAPABILITIES BURN-IN TEST, ELECTRONIC COMPONENTS | EEE PARTS ANTONIO AMIGO Burn-in test is an electrical stress test that employs voltage and temperature to accelerate the electrical failure of a device. READ MORE HIGHLY-ACCELERATED TEMPERATURE AND HUMIDITY STRESS TEST – EEE PARTS ÁLVARO RICCA SOAJE is performed to evaluate the reliability of non-hermetic packaged solid-state devices that are likely to encounter humid environments during normal (ambient) operation. Also known as Pressur... READ MORE TEMPERATURE HUMIDITY TEST ELECTRONIC COMPONENTS | EEE PARTS FRANCISCO JAVIER APARICIO REBOLLO Under certain conditions and in accordance with the ECSS-Q-ST-60-13C standard on the use of commercial EEE parts in space applications, this test may be replaced by the Highly Accelerated St... READ MORE VIBRATION TESTS ELECTRONIC PARTS MARÍA TERESA RODRÍGUEZ The purpose of vibration tests is to evaluate the effect caused on component parts by vibration in a specified frequency range. The samples are subjected to testing under different condition... READ MORE PIND TEST – PARTICLE IMPACT NOISE DETECTION | EEE PARTS ADRIÁN CEMBRANO PÉREZ PIND ( Particle Impact Noise Detection Test ) testing is performed in order to detect the presence of loose particles inside a device cavity. Loose particle contamination is often caused... READ MORE RADIOGRAPHIC INSPECTION 3D X RAY – 2D | HI REL ELECTRONICS PARTS JOSÉ CÁNDIDO VÁZQUEZ CÁRDENO The purpose of radiographic inspection is to detect internal physical defects which are not otherwise visible in electronic components. The radiographic techniques reveal such flaws as pres... READ MORE EXTERNAL VISUAL INSPECTION ELECTRONIC COMPONENTS | EEE PARTS DAVID RAMIREZ - CRUZADO The aim of this process is to verify the conformity of the exterior of electrical, electronic and electromechanical components (EEE parts) with the acquisition document. The following aspect... READ MORE LEAD INTEGRITY TEST ELECTRONIC COMPONENTS | EEE PARTS JESÚS ENRIQUE BARBERO MUÑOZ Lead integrity test is performed to determine the integrity of the device leads (terminals), welds and seals. During the execution of this test, the DUT is subjected to various stresses incl... READ MORE MATERIAL ANALYSIS EEE ELECTRONIC COMPONENTS FRANCISCO JAVIER APARICIO REBOLLO Material Analysis is performed to detect and identify the materials used in the manufacturing of semiconductors and microelectronic parts and packages. One particular use of this analysis is... READ MORE THICKNESS VERIFICATION – HI REL ELECTRONICS PARTS MEDIA ATN The thickness of metallic coatings is routinely determined by X-ray fluorescence spectrometry. This provides a basis for assessing the quality of coated materials and therefore influences de... READ MORE SEAL TEST, FINE & GROSS LEAK ELECTRONIC COMPONENTS | EEE PARTS FRANCISCO JAVIER APARICIO REBOLLO The purpose of the seal test is to determine the effectiveness of the sealing of components with internal cavities, i.e. to determine their hermeticity. Defective sealing may permit the entr... READ MORE SCANNING ACOUSTIC MICROSCOPY CSAM | EEE PARTS MEDIA ATN Scanning Acoustic Microscopy (SAM) is an inspection that uses focused sound to investigate, measure, or obtain an internal image of an object. It is commonly used in failure analysis and non... READ MORE Corporative Site Updates Deimos Space and Alter Technology working together in the Neptune Structural Model Adopted measure by Alter Technology due to Coronavirus Seville New Space Forum 2019 Alter Technology at ESCCON 2019 Microsection study will be present at the EMPS Follow Us facebook twitter linkedin googleplus youtube vimeo Copyright © 2019. ALTER TECHNOLOGY TÜV NORD S.A.U Contact Privacy Policy and Legal Notice Cookies English Español