About Us Case Studies Blog Contact search Services Capabilities Expertise Industries Served Quality Contamination Analysis We have the experience, equipment, and expertise to provide the contamination analysis solutions you require. Back to all Services PRINT EMAIL About Contamination Analysis Contamination in products can cause a variety of problems which can include failure of a product, undesirable aesthetics, or failure of quality control. Each of these consequences can cause a manufacturer to not only lose money on a single part, but to also take losses for entire batches and lots of products. Therefore, performing the proper contamination analysis, with the required equipment and expertise is critical. Approaches Fourier Transform Infrared Spectroscopy (FTIR) is a powerful technique which can identify an array of contaminants, usually consisting of organic material. The contaminants can be in virtually any form (solid, liquid, or gas) and can be comparably small. A contaminant is tested and compared to our impressive and extensive database of known compounds Scanning Electron Microscopy with Energy Dispersive Spectroscopy (SEM-EDS) is another fundamental technique in the identification of contaminants. In contrast to the FTIR, inorganic contaminants and defects are most applicable to this technique. The SEM can analyze a defect by shape and size pinpoint key locations where a contaminant is located. The EDS can further analyze the contaminant and give the elemental composition of the defect. Optical Microscopy (OM) is particularly important to use when contaminants and defects are identified by color. It is also an essential tool when scanning a sample for contaminants for subsequent contamination analysis, such as FTIR and SEM/EDS. X-Ray photoelectron Spectroscopy (XPS) is used for contaminants that are extremely thin and found on coatings and surfaces. The very shallow penetration depth of this method, makes this technique particularly useful when analyzing samples for surface oxidation, and other characteristics unique to the sample surface. Gas Chromatography with Mass-Spectroscopy (GC-MS) is particularly useful when identifying volatile and semi-volatile contaminants found on the surface of a product. The product is swabbed and then tested with chromatogram and spectrum is generated. The results from the spectra and compared to our advanced GC-MS library to give an accurate identification of the contaminant. Sample Considerations The sample requirements will vary based on the testing plan needed for your project. Contact us to talk through your specfic sample considerations for your contaminant analysis needs. The above picture was taken by our scientists using our SEM/EDS as part of a contamination analysis investigation. The photo depicts the contaminant area of the sample magnified 50,000x! Experience Work We've Done: Analysis on embedded particles Surface Oxidation Micro contamination Residue on pipe surfaces Particles on fracture surfaces Polymer Degradation Film Defects Rusty or corroded parts Machinery residue Many, many more… Products We’ve Tested: Syringes and other medical devices Painted products Wood and decks Plastic and metal pipes O-rings and gaskets Powders Blades Strange liquid residues Mattress and other foam defects Many consumer and industrial products Thermoset or thermoplastic materials Injection molded plastic parts Cross-sectioned bullets Questions? Ask Us Name Company Country Email Telephone Request a Quote & Submit Samples SGS Polymer Solutions is ready for your materials testing challenge. To get the process started it is as simple as requesting a quote. Once you are ready to submit samples please make sure to include a completed Sample Submission Form. Email Us or call us at (877) 961-4341 Connect with SGS PSI: © 2019 SGS Polymer Solutions Incorporated - All rights reserved. 135 Technology Drive, Christiansburg, VA 24073 Client Confidentiality Terms & Conditions ISO-17025. cGMP Compliant. FDA Registered. DEA Licensed.