Home Products " Info and Events Assistance / Jobs » Contacts Login Sample Preparation Products Preparation of the samples The ability to produce glossy and thin sections is the key to good analysis. JEOL sample preparation systems will allow you to use your samples to their full potential. RANGE OF JEOL TOOLS Plasma Cleaner This instrument allows the removal of contaminating hydrocarbons before the samples are analyzed under the electron microscope. Ion Slicer Innovative instrument for the preparation of thin lamellae of samples for SEM, TEM, STEM and Microprobe analysis . Cross Section Polisher- CP Instrument for the preparation of perfect sections of samples to be analyzed by SEM or Microprobe. Graphite metallizer Graphite evaporator for the metallization of samples, automatic and oil-free. JEOL produces high precision instrumentation, developed to optimally prepare samples for SEM, TEM or Microprobe analysis. From FIB systems for nanometric samples to cross section polisher for larger surfaces, we offer a selection of instruments specific to your needs, so as to allow simple, rapid and precise preparation of the sample, whatever its nature (semi-conductor, metals, ceramics, polymers, composite materials ...). For the metallization of non-conductive samples (for example for quantitative EDS analyzes), JEOL proposes a graphite evaporator (or any other type of metal) operating in ultra high vacuum. This optimal vacuum allows very thin layers to evaporate on the sample which remain invisible even at high magnifications. For the preparation of lamellae for TEM analysis, EBSD 3D etc. JEOL offers both bench systems such as the Ion Slicer, and more complete systems capable of allowing the simultaneous observation of the sample. These systems are available in the FIB and Dual Beam section . Electronic Optics Instruments Scanning Electron Microscopes Transmission Electron Microscopes FIB and Dual Beam Surface Analysis (Auger, EPMA Microprobes) Integrated EDS for SEM and TEM JEOL Preparation of the samples Plasma Cleaner Ion Slicer Cross Section Polisher Metallizers Semiconductor Tools Lithograph with Electronic Beam Inspection of wafers by SEM Precision Process Inspection Analytical Spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Optimization of the Environment Temperature Control Magnetic Field Compensators Anti-vibration devices Medical Instrumentation AminoTac BioMajesty Terms of Use | Privacy Copyright 2015 JEOL