Login Printed Electronics Home Optical Systems Areas of application Printed electronics Downloads Measurement and production technology for printed electronics In the fast-growing market of printed electronics, with its photonic sintering systems Polytec is offering forward-looking technology for production and laboratory environments for the continuous and flexible sintering of printed circuits. The printing of electronic components and circuits is a new technology, the potential of which is far from being fully exploited. Initial applications are found in the areas of displays, OLEDs, sensor systems and RFIDs. The technologies used must adapt to the growing and changing requirements in this regard. Polytec, with its wide range of measurement and production technologies, offers outstanding expertise in both fields. As the European test centre for photonic sintering for the US partner company Xenon Corp., Polytec offers the technical prerequisites for testing photonic sintering. To the test center ... Solutions for Production: UV Curing Systems Conductive Path Generation Adhesive Technology Solutions for Quality Assurance: Resistance Measurement Surface Measurement Contacts Polytec Locations Stay informed Polytec Magazine Follow us © 2021 Polytec GmbH. Legal notice Privacy policy General business terms Login

Login Technology Basics of optical surface metrology Principle of the white-light interferometry White-light interferometry Modern white-light interferometers use the interference effects that occur when the light reflected from the sample is superimposed with the light reflected by a high-precision reference mirror. The measurement method is based on the principle of Michelson interferometry, where the optical configuration contains a light source with a coherence length in the μm range. Learn more Scheme of the chromatic-confocal measurement principle Chromatic confocal technology Chromatic confocal technology for the optical measurement of distance, roughness line profiling and thickness has been established as one of the mature methods available to industry and research. Chromatic confocal sensors from Polytec base on a measurement principle explained in the following. Learn more Surface parameters Evaluating form parameters like flatness, parallelism and waviness and characterizing a surface structure based on its texture, roughness profile and more are the fundamental values prodvided by surface metrology for a reliable quality control in the lab and in production environments. See some examples of what TopMap surface metrology can measure for you. Learn more Your PolyXpert in Surface-Metrology Contacts Polytec Locations Stay informed Polytec Magazine Follow us © 2021 Polytec GmbH. Legal notice Privacy policy General business terms Login