Home Products " Announcements Assistance / Jobs Contacts Applications Connexion Login Products Electronic Optics Instruments Scanning Electron Microscopes (SEM) Scanning Electron Microscopes (SEM) JEOL has played a fundamental role in the evolution of scanning electron microscopy since the early 1960s. JEOL offers application support, training and tailor-made assistance without equal. RANGE OF JEOL TOOLS Benchtop SEM with EDS Extremely simple and compact SEM, magnification up to x60 000, High Vacuum and Variable Pressure (SED, BED) modes, integrated EDS chemical analysis. SEM Tungsten or LaB 6 Low Vacuum Ideal for failure analysis, inspection, characterization, imaging and elemental chemical analysis of wet, non-conductive, unprepared samples . SEM FEG Ultra high resolution image and chemical analysis on all types of samples. Also available in Variable Pressure. SEM Atmospheric The Clairescope is the only SEM in the world at atmospheric pressure, which allows optical and electronic analysis at the same time. DEDICATED SOLUTIONS AND JEOL PARTNERS Development of multiple unique creations Sample holders for different applications Navigation system Cells blindée, protection biologique Chambre environnementale, etc ... Solutions proposed in collaboration with our partners Omniprobe - Gas assisted lithography Protochips - Heated sample holders for variable temperature experiments Gatan - Cryo transfer systems, cathodoluminescence (CL) Kleindiek - Nanomanipulators Electronic Optics Instruments Scanning Electron Microscopes Transmission Electron Microscopes FIB and Dual Beam Surface Analysis (Auger, EPMA Microprobes) Integrated EDS for SEM and TEM JEOL Preparation of the samples Plasma Cleaner Ion Slicer Cross Section Polisher Metallizers Semiconductor Tools Lithograph with Electronic Beam Inspection of wafers by SEM Precision Process Inspection Analytical Spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Optimization of the Environment Temperature Control Magnetic Field Compensators Anti-vibration devices IT'S X-RAY SPEKTROMETRIE SXES X-ray fluorescence Terms of Use | Privacy Copyright 2018 JEOL