Our company Products and services Contact us more options You are here: Home - Raman spectroscopy - Raman-AFM system Raman spectroscopy Raman Spectroscopy applications inVia Raman microscope News and Newsletter Raman-AFM system SEM-Raman system RA100 Raman analyser Custom Raman solutions Exhibitions, conferences and training Sales and support Tell us what you think about our website Raman-AFM system Combined Raman-AFM instruments enable improved sample analysis by investigating chemical and structural properties of materials at sub-micrometer scales. Extend your understanding of the nanoscale The Renishaw inVia Raman microscope is a highly flexible instrument that can be directly coupled to a wide range of AFMs and SPMs, including those made by Bruker Nano Surfaces, Nanonics Imaging Ltd, NT-MDT, JPK and Park. This enables you to choose an AFM suitable for the specific needs of your application area. As well as providing co-localised Raman AFM measurements these combined systems can be used to collect Tip Enhanced Raman Spectroscopy (TERS) and to conduct near-field measurements (SNOM, NSOM). Combined Raman AFM measurements allow the investigating and characterisation of chemical and structural properties of materials at sub-micrometer scales. Nanotechnology visualisation and analysis systems for research and industry Measure physical properties at molecular resolution and conduct chemical analysis on the sub-micrometer scale. Simultaneous Raman and AFM guarantee correlation between images. One platform solution provides confidence, reliability, and ease of use. Simultaneously collected AFM and Raman images of a 60 nm diameter silicon nano-wire (Sample courtesy of M Kuball, University of Bristol, England, and J Redwing, Penn State University, USA). Maximise productivity Renishaw offers fully integrated solutions with the Bruker Nano Surfaces Innova, the Bruker Nano Surfaces Bioscope Catalyst, the Nanonics MV series and the NT-MDT Ntegra. Fully integrated Raman-AFM systems from Renishaw deliver the following: More time for you with integrated systems - the mechanical and software integration is complete, allowing you to focus on data collection and analysis. Faster data collection - direct coupling between the sample and the Raman spectrometer gives optimum efficiency in all configurations. Trust the experts - pioneering advances were performed using Renishaw Raman systems: The first Raman-AFM/NSOM measurements "Development of a scanning near-field optical probe for localised Raman spectroscopy" A. Smith et al. Ultramicroscopy 61, pp. 247 – 252 (1995) . The first TERS measurements on a semiconductor device "A practical nanoscopic Raman imaging technique realized by near-field enhancement" Sun et al. Mater. Phys. Mech. 4, pp. 17-21 (2001) You choose - Renishaw has the experience and expertise to integrate to your choice of AFM system, or to recommend a system based on your specific requirements. Renishaw inVia Raman microscope integrated with a Bruker Nano Surfaces Innova. Renishaw inVia Raman microscope integrated with a Bruker Nano Surfaces Bioscope Catalyst (Image courtesy of Prof. Aleksander Balter, Physics Department, UMK, Torun, Poland). Renishaw inVia Raman microscope integrated with a Nanonics MV2000. Renishaw inVia Raman microscope integrated with a NT-MDT Ntegra AFM. What can a Renishaw Raman-AFM system do for you? Raman with AFM Raman data can be recorded and correlated with high spatial resolution topographic, electrical, thermal and near-field optical data provided by the AFM. Raman analysis of a graphene sample identified five distinct graphene thicknesses, including monolayer and bilayer regions. The Raman data was used to guide AFM experiments, enabling topographical, capacitance and conduction measurements in the regions of interest. Tip Enhanced Raman Spectroscopy (TERS) The spatial resolution of Raman spectroscopy is diffraction-limited to approximately half the wavelength of the incident laser light, because both the illuminating laser light and the Raman scattered light are collected in the optical far field. One way to achieve higher spatial resolution is to use a near field technique such as TERS. This technique involves using a plasmonic tip with a small apex to enhance the Raman signal at a very localised area of the sample. The Raman information from this small area can then be separated from the far field data potentially achieving resolutions better than 15 nm. The Renishaw inVia Raman microscope has been used to collect TERS data in conjunction with a wide range of 3rd party instruments. TERS and far-field spectra of malachite green on gold. The TERS spectrum is more than 10× stronger than the far-field spectra. TERS spectrum and far-field spectrum of a thin silicon layer on SiGe. The superior surface sensitivity offered by TERS generates a significantly more intense silicon Raman band (at a lower Raman frequency than the SiGe Raman band from the bulk). Further information To discover how this technology can extend your understanding of the nanoscale, or to learn more about integrating any SPM model with the inVia Raman microscope, please complete the online request form, or contact your local Renishaw Raman representative. Documents for download Integrated Raman-AFM from Renishaw and NT-MDT Flyer illustrating the benefits of a fully integrated Raman-SPM/AFM from Renishaw and NT-MDT. [593kB] Combined scanning probe microscopy and Raman spectroscopy: a new nanotechnology tool Flyer illustrating the use of SPM and Raman spectroscopy for studying nanotechnology devices. Examples are given of Raman-AFM and TERS (tip-enhanced-Raman-scattering). [267kB] Combining scanning probe microscopy and Raman microscopy Application note on combining NSOM with Raman using Nanonics NSOM/AFM 100 Confocal [168kB] Tell us what you think about our website Please help us improve our website by taking our short website survey. Next steps Contact us online if you require more information or you have a pricing query, or alternatively you may like to speak directly to your local Renishaw office. Documents and downloads Raman Spectroscopyall | more options Contact Renishaw Worldwide offices Online form Pricing query More information Technical support Connect LinkedIn Twitter Facebook YouTube Contact us | Legal notice | Accessibility | Sitemap Copyright © 2001-2014 Renishaw plc