Home Products " Info and Events Assistance / Jobs » Contacts Login Home Welcome to the site of JEOL (ITALIA) SpA , the Italian branch of the Japanese multinational JEOL Ltd, world leader in the production of high-tech scientific instruments. JEOL manufactures and markets Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Sample Preparation Instruments, Mass Spectrometers (MS), NMR Spectrometers ... JEOL provides the best solutions to meet the needs of our customers, be it routine analysis or excellent performance for scientific research in the heads of biology and nanotechnology. Electronic Optics Instruments Scanning Electron Microscopes Transmission Electron Microscopes FIB and Dual Beam Surface Analysis (Auger, EPMA Microprobes) Integrated EDS for SEM and TEM JEOL Preparation of the samples Plasma Cleaner Ion Slicer Cross Section Polisher Metallizers Semiconductor Tools Lithograph with Electronic Beam Inspection of wafers by SEM Precision Process Inspection Analytical Spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Optimization of the Environment Temperature Control Magnetic Field Compensators Anti-vibration devices Medical Instrumentation AminoTac BioMajesty Terms of Use | Privacy Copyright 2014 JEOL

Home Products " Info and Events Assistance / Jobs » Contacts Login Prev Next 1 2 3 4 Home Welcome to the site of JEOL (ITALIA) SpA , the Italian branch of the Japanese multinational JEOL Ltd, world leader in the production of high-tech scientific instruments. JEOL manufactures and markets Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM), Sample Preparation Instruments, Mass Spectrometers (MS), NMR Spectrometers ... JEOL provides the best solutions to meet the needs of our customers, be it routine analysis or excellent performance for scientific research in the heads of biology and nanotechnology. Electronic Optics Instruments Scanning Electron Microscopes Transmission Electron Microscopes FIB and Dual Beam Surface Analysis (Auger, EPMA Microprobes) Integrated EDS for SEM and TEM JEOL Preparation of the samples Plasma Cleaner Ion Slicer Cross Section Polisher Metallizers Semiconductor Tools Lithograph with Electronic Beam Inspection of wafers by SEM Precision Process Inspection Analytical Spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Optimization of the Environment Temperature Control Magnetic Field Compensators Anti-vibration devices Medical Instrumentation AminoTac BioMajesty Terms of Use | Privacy Copyright 2014 JEOL