Is your Smart Card secure enough? SuperFlash® technology can meet your stringent endurance requirements, power budgets and space constraints Home Applications Secure Smart Cards Secure Smart Cards Used in a variety of identification and/or secure authentication applications, NFC based smart cards have very stringent space and power constraints. They typically include a microcontroller (MCU) that acts as the secure element, but they also require Flash memory to perform key functions to implement security. SuperFlash® memory not only meets the low power budgets and super-small size requirements of smart cards, but it is also qualified for up to 500K program/erase endurance cycles for superior performance, data retention and reliability in security applications. Key Features Very high endurance Fast erase and programming times Cost-effective, low-power solution Reliable data storage Sitemap Contact Us Privacy Policy Cookie Policy Career Opportunities ©Copyright 1998-2021 Microchip Technology Inc. All rights reserved. This website uses cookies for analytics, personalization, and other purposes. Click to learn more. By continuing to browse, you agree to our use of cookies as described in our Cookies Statement. LEARN MORE OK, ACCEPT NO, LEAVE OUR SITE

Home Products and Services SuperFlash® Technology Products SuperFlash® Technology Products SuperFlash® technology is based on a proprietary split-gate Flash memory cell that provides a cost-effective and high-performance programmable System-on-Chip (SoC) solution. Delivering a robust solution since 1992,the SuperFlash split-gate memory cell reliably maintains its fundamental structures and operating conditions within its simple array architecture. SuperFlash technology offers these benefits: Simplified design Low-power and high-performance standard silicon CMOS compatibility Good scalability from 1 µm technology node to 110 nm technology node High endurance to rewrite cycling Excellent data retention with extremely low failure rate Good performance at high temperature Immunity to Stress-induced Leakage Current (SILC) PROCESS LICENSE DESIGN LICENSE DESIGN SERVICES Sitemap Contact Us Privacy Policy Cookie Policy Career Opportunities ©Copyright 1998-2021 Microchip Technology Inc. All rights reserved. This website uses cookies for analytics, personalization, and other purposes. Click to learn more. By continuing to browse, you agree to our use of cookies as described in our Cookies Statement. LEARN MORE OK, ACCEPT NO, LEAVE OUR SITE