Home Products " Info and Events Assistance / Jobs » Contacts Login Products Electronic Optics Instruments Surface Analysis (Auger, EPMA Microprobes) Surface Analysis (Auger, EPMA microprobes) Our surface analysis division offers two different families of instruments: Auger Nano probes, Microprobes (EPMA). RANGE OF JEOL TOOLS Auger nano-probe Auger nano-probes with field emission source , Schottky In-Lens. Electron Probe Micro Analyzer JXA-8230 Superprobe: Microprobe with Tungsten (W) or LaB 6 (EPMA) filament source . JXA-8530F Hyperprobe: Microprobe with field emission source (EPMA). The Auger JAMP-9500F nanoprobe has excellent lateral resolution. This tool allows to determine the distribution and the chemical nature of the elements present in the most superficial layers (a few nanometers). The "Auger" phenomenon was discovered by the French scientist P. Auger. The microprobe (EPMA) scatters the X photons using a moving crystal mounted on a spectrometer. The qualitative and quantitative analyzes that can be obtained with this instrument provide information on the chemical nature of the materials analyzed with excellent precision (in the order of ppm). Electronic Optics Instruments Scanning Electron Microscopes Transmission Electron Microscopes FIB and Dual Beam Surface Analysis (Auger, EPMA Microprobes) Integrated EDS for SEM and TEM JEOL Preparation of the samples Plasma Cleaner Ion Slicer Cross Section Polisher Metallizers Semiconductor Tools Lithograph with Electronic Beam Inspection of wafers by SEM Precision Process Inspection Analytical Spectroscopy Mass spectrometers Nuclear Magnetic Resonance Electronic Paramagnetic Resonance Optimization of the Environment Temperature Control Magnetic Field Compensators Anti-vibration devices Medical Instrumentation AminoTac BioMajesty Terms of Use | Privacy Copyright 2015 JEOL