DESIGN TEST PRODUCTION LAB e-SHOP SUPPORT Boundary Scan Technology CPLD/FPGA Programming CPU Emulation Flash Programming FPGA Control Test Functional Test High Speed I/O IJTAG Intel® IBIST JTAG JTAG Boundary Scan Test Microprocessor Test P1687 Software Debug Software Trace Structural Test System Level Test The Test Portal TEST: The Boundary Scan Technology | High Density Boards | BGA packaging | System Level Test | Flash | CPLD/FPGA | Tutorial | Books | Training The Boundary Scan Technology What is boundary scan? Boundary scan layout on a board Boundary scan is a method for testing interconnects (thin wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. The Joint Test Action Group (JTAG) developed a specification for boundary scan testing that was standardized in 1990 as the IEEE Std. 1149.1-1990. In 1994, a supplement that contains a description of the Boundary Scan Description Language (BSDL) was added which describes the boundary-scan logic content of IEEE Std 1149.1 compliant devices. Since then, this standard has been adopted by electronic device companies all over the world. Boundary scan is nowadays mostly synonymous with JTAG. the PROBLEM JTAG or boundary scan was developed to address the "loss of physical access" problems that occur as a result of implementing new packaging technologies. Since its standardization (IEEE 1149.1) boundary scan usage (also known as JTAG) has expanded and evolved into something more like a communications protocol running within an electronic system. In this way, it is similar to the Internet -- which allows you to access all kinds of information. Boundary scan allows you to access all kinds of design and test structures. Those structures help you to: Debug and test boards Program devices Diagnose hardware problems SOLUTIONS JTAG boundary-scan tools help solve interconnect test problems, and enable CPLD/FPGA Programming and Flash Programming. Boundary scan delivers this functionality because it can be used to access the "internals" of a: * Device -- to run Built-In Self-Test (BIST) * Board -- to verify proper assembly * System -- to help configure a system So boundary scan/JTAG gives you the ability to test a: Device and access internal scan Board and program devices System and verify assembly of boards to daughter cards, multichip modules (MCMs) and to other boards on the backplane [2015-08-13] Full advantage of Intel Trace Hub [2015-07-28] In-System Flash Programming 1,000x Faster [2015-05-27] Trace debug cuts through complexity of SoC [2014-03-31] Press Release | Sarokal RBS Test [2015-11-10] Productronica 2015 [2015-11-24] Nordic Test Forum 2015 [2016-02-23] Embedded World 2016 [2016-04-25] IEEE VLSI Test Symposium 2016 [2016-11-08] Electronica 2016 ABOUT US | CONTACT | SUPPORT ISS Group Box 14049 SE-167 14 Bromma SWEDEN Tel +46 (0)8 506 181 00