Title: OWLEYE: ZERO-SHOT LEARNER FOR CROSSDOMAIN GRAPH DATA ANOMALY DETECTION
Primary area: learning on graphs and other geometries & topologies
Keywords: anomaly detection, zero-shot, Multi-domain

Abstract: Graph structured data is commonly used to represent complex relationships such as transactions between accounts, communications between devices, and dependencies among machines or processes. Correspondingly, graph anomaly detection (GAD) plays a critical role in identifying anomalies across various domains, including finance, cybersecurity, manufacturing, etc. Facing the large-volume and multi-domain graph data, recent efforts aim to develop foundational generalist models capable of detecting anomalies in unseen graphs without retraining. To the best of our knowledge, the different feature semantics and dimensions of cross-domain graph structured data heavily hinders the development of graph foundation model, and leaves the further in-depth continual learning and inference capabilities in the evolving setting a quite nascent problem. To address these above challenges, we propose OWLEYE, a novel zero-shot GAD framework that learns transferable patterns of normal behavior from multiple graphs. Systematically, OWLEYE first introduces a cross-domain feature alignment module to harmonize feature distributions, which preserves domain-specific semantics during aligning more than the simple but widely-used Principle Component Analysis. Second, with aligned features, to enable method with continuous and scaling-up learning and inference capabilities, OWLEYE designs the multi-domain pattern dictionary learning to encode shared structural and attribute-based patterns. Third, for achieving the in-context learning ability, OWLEYE presents a truncated attention-based reconstruction module to robustly detect anomalies without requiring labeled data for unseen graph structured data. Extensive experiments on real-world datasets demonstrate that OWLEYE achieves superior performance and generalizability compared to state-of-the-art baselines, establishing a strong foundation for scalable and label-efficient anomaly detection.