Title: IWSM
First published: 1998
Subjects: Semiconductors, Congresses, Statistical methods, Characterization, Measurement, Engineering measurement & calibration, Mathematics for scientists & engineers, Technology & Industrial Arts, Engineering Statistics, Very-Large-Scale Integration (Vlsi), Technology, Science/Mathematics, Electronics - Semiconductors, Mensuration, Reference
LC classification: TK7871.85 .I5844 1998