Title: Charge loss modeling for EPROMs with ONO interpoly dielectric
First published: 1994
Description: "The investigations presented in this work identify the origin of intrinsic long term charge loss in EPROMs with ONO interploy dielectric and model the charge transport through the ONO dielectric as a function of electric field and temperature"--Abstract.
Subjects: Computer storage devices, Charge transfer, Microelectronics, Dielectric loss
LC classification: QC585.7.L6 H47 1994