Title: Kelvin Probe Force Microscopy Measuring And Compensating Electrostatic Forces
Subjects: Thermodynamics, Engineering, Surfaces (Physics), Microscopy, Rasterkraftmikroskopie, Kraftmikroskopie, Electrostatics, Kelvin-Sonde, Measurement, Atomic force microscopy, Heat and Mass Transfer Engineering Thermodynamics, Thin Films Surfaces and Interfaces, Materials science