Title: Scanning probe microscopies
Description: Materials science, especially electronics, continues its miniaturization trend from the scale of microns to nanometers-- thanks to scanning tunneling microscopy (STM) technology, which integrates measurement and fabrication in a single step. The authors, for whom no affiliation is listed, overview the history, physical basis, applications, and impact on next-generation electronics of STM and related microscopies. This concise volume includes instrument photos and images. Lacks an index. c. Book News Inc.
Subjects: Scanning probe microscopy, SCANNING TUNNELING MICROSCOPY, ELECTROCHEMISTRY, SURFACES, PHYSICS