Title: Advances in scanning probe microscopy
Description: This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
Subjects: Scanning probe microscopy, Rastersondenmikroskopie, Scanning tunneling microscopy