Title: Effects of nonuniformity on the modeling of resistivity in polycrystalline silicon thin films
Description: <a href="http://uf.catalog.fcla.edu/uf.jsp?st=UF029409912&ix=pm&I=0&V=D&pm=1" rel="nofollow">http://uf.catalog.fcla.edu/uf.jsp?st=UF029409912&ix=pm&I=0&V=D&pm=1</a>
Subjects: Thin films--Electric properties, Electric resistors, Film, Semiconductor films.