Title: Spectroscopic ellipsometry and reflectometry
First published: 1999
Subjects: Optical properties, Reflectometer, Materials, Surfaces (Technology), Ellipsometry, Thin films, Reflectance spectroscopy, Phase transformations (statistical physics), Surfaces (technologie), Ellipsométrie, Réflectomètres, Matériaux, Propriétés optiques, Couches minces, Espectrometria, Propriedades óticas, Filmes finos, Materiais, Dünne Schicht, Ellipsometrie, Oberflächeneigenschaft, Reflektometrie, Werkstoff
LC classification: QC443 .T63 1999