Title: Nondestructive tests used to insure the integrity of semiconductor devices, with emphasis on acoustic emission techniques
First published: 1979
Subjects: Acoustic emission testing, Semiconductor industry, Nondestructive testing, Semiconductors, Testing, Quality control, Acoustic emission
LC classification: QC100 .U57 no. 400-59, TK7871.85 .U57 no. 400-59