Title: 15th IEEE VLSI Test Symposium
First published: 1997
Subjects: Very large scale integration, Testing, Congresses, Integrated circuits, Circuits & components, Very-Large-Scale Integration (Vlsi), Technology & Engineering, Technology & Industrial Arts, Science/Mathematics, Electricity, Engineering - Electrical & Electronic, Electronics - Circuits - VLSI
LC classification: TK7874 .I26 1997