Title: Defect recognition and image processing in semiconductors 1997
First published: 1998
Subjects: Congresses, Semiconductors, Image processing, Defects, Condensed matter physics (liquids & solids), Materials science, Semi-conductors & super-conductors, Technology, Reliability Engineering, Science, Solid State Physics, Science/Mathematics, Science / Solid State Physics, Electronics - Semiconductors
LC classification: TK7871.85 .I575 1997