Title: Analysis and modeling of stress related effects in scaled silicon technology
Description: <a href="http://uf.catalog.fcla.edu/uf.jsp?st=UF002116935&ix=nu&I=0&V=D&pm=1" rel="nofollow">http://uf.catalog.fcla.edu/uf.jsp?st=UF002116935&ix=nu&I=0&V=D&pm=1</a>