Title: Scaling effects on metal-oxide-semiconductor device characteristics
Description: <a href="http://uf.catalog.fcla.edu/uf.jsp?st=UF028638920&ix=pm&I=0&V=D&pm=1" rel="nofollow">http://uf.catalog.fcla.edu/uf.jsp?st=UF028638920&ix=pm&I=0&V=D&pm=1</a>
Subjects: Metal oxide semiconductors.