Title: Quantitative x-ray photoelectron spectroscopic methods and their application to lead ion-selective electrode surface studies
Description: <a href="http://uf.catalog.fcla.edu/uf.jsp?st=UF001114623&ix=nu&I=0&V=D" rel="nofollow">http://uf.catalog.fcla.edu/uf.jsp?st=UF001114623&ix=nu&I=0&V=D</a>
Subjects: Surface roughness--Measurement--Data processing, X-ray spectroscopy, Photoelectron spectroscopy, Electrodes, Ion selective.