Title: 1996 International Integrated Reliability Workshop final report
First published: 1996
Subjects: Congresses, Reliability, Integrated circuits, Wafer scale integration, Electronic devices & materials, Reliability Engineering, Technology, Microelectronics, Education / Teaching, Science/Mathematics, Electronics - Circuits - General, General, Electronics - Microelectronics, Wafer-scale integration
LC classification: TK7874 .I4735 1996