Title: Introduction to X-ray powder diffractometry
First published: 1996
Description: Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation of the state-of-the-art techniques involved in characterizing materials. It covers the latest instruments and methods, with an emphasis on the fundamentals of the diffractometer, its components, alignment, calibration, and automation.

While the material is presented in an orderly progression, beginning with basic concepts and moving on to more complex material, each chapter stands on its own and can be studied independently or used as a professional reference. More than 230 illustrations and tables demonstrate techniques and clarify complex material.
Subjects: Optical properties, X-rays, Measurement, X-ray diffractometer, Technique, Diffraction, Powders, X-rays, diffraction
LC classification: QC482.D5 J46 1996