Title: Bringing scanning probe microscopy up to speed
Description: "Bringing Scanning Probe Microscopy up to Speed introduces the principles of scanning probe systems with particular emphasis on techniques for increasing speed. The authors include useful information on the characteristics and limitations of current state-of-the-art machines as well as the properties of the systems that will follow in the future. The basic approach is two-fold.

First, last scanning systems for single probes are treated and, second, systems with multiple probes operating in parallel are presented."--BOOK JACKET.
Subjects: Scanning probe microscopy, Scanning electron microscopy, Scanning electron microscopes