Title: Ellipsometry of Functional Organic Surfaces and Films
Description: Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Subjects: Thin films, Physical and theoretical Chemistry, Physics, Surfaces (Physics), Physical organic chemistry, Thin Films Surface and Interface Science, Thin Films Surfaces and Interfaces, Optics, Optoelectronics, Plasmonics and Optical Devices, Characterization and Evaluation of Materials