Optical metrology
Subtitle: proceedings of a conference held 18-19 July, 1999, Denver, Colorado
By: Ghanim A. Al-Jumaily, editor ; sponsored by SPIE - The International Society for Optical Engineering.
Contributors: Al-Jumaily, Ghanim A.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology ;; v. CR72
Publisher: SPIE Optical Engineering Press
Published: 1999
Place of publication: Bellingham, WA
Language: eng
Number of pages: 276
Subjects: Optical measurements -- Congresses.
Notes: Includes bibliographical references.