Proceedings from the Second Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor Systems
By: editor, A. Reisman ; sponsored by the Microelectronics Center of North Carolina, North Carolina State University, and the University of North Carolina at Charlotte, in cooperation with the Semiconductor Research Corporation and the Electron Devices Society of the Institute of Electrical and Electronics Engineers.
Contributors: Reisman, A.; Microelectronics Center of North Carolina.; North Carolina State University.; University of North Carolina at Charlotte.
Publisher: MCNC
Published: 1989
Place of publication: Research Triangle Park, NC
Language: eng
Number of pages: 333
Subjects: Integrated circuits -- Effect of radiation on -- Congresses.; Semiconductors -- Defects -- Congresses.; Semiconductors -- Effect of radiation on -- Congresses.
Notes: Includes bibliographical references.
"Held at the MCNC September 10-13, 1989"--Pref.