Techniques for measuring the integrity of passivation overcoats on integrated circuits
By: Werner Kern and Robert B. Comizzoli.
Contributors: Comizzoli, Robert B., joint author.
Series: Semiconductor measurement technology; National Bureau of Standards special publication ; 400-31; NBS special publication ;; 400-31.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 105
Subjects: Integrated circuits -- Passivation.; Protective coatings -- Testing.; Microelectronics -- Quality control.
Notes: Includes bibliographical references.