An overview of reliability growth models and their potential use for NASA applications
By: V.S. Taneja, F.M. Safie.
Contributors: Safie, F. M.; United States. National Aeronautics and Space Administration. Scientific and Technical Information Program.
Series: NASA technical paper -- 3309.; NASA technical paper -- 3309.
Publisher: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program; For sale by the National Technical Information Service]
Published: 1992
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Number of pages: 23
Subjects: Reliability (Engineering)
Notes: Shipping list no.: 93-0444-M.

Includes bibliographical references (p. 17-23).

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche ; 11 x 15 cm.