Three-dimensional imaging, optical metrology, and inspection IV
Subtitle: 2-3 November, 1998, Boston, Massachusetts
By: Kevin G. Harding, ... [et al.], chairs/editors ; sponsored by, SPIE--the International Society for Optical Engineering ; endorsed by SME--the Society of Manufacturing Engineers.
Contributors: Harding, Kevin G.; Society of Manufacturing Engineers.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 3520; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3520.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 304
Subjects: Three-dimensional display systems -- Congresses; Optical measurements -- Congresses; Lasers -- Congresses; Mensuration -- Congresses; Triangulation -- Congresses; Engineering inspection -- Congresses
Genres: Congresses.
Notes: Includes bibliographic references and author index.