Process control and inspection for industry
Subtitle: 8-10 November 2000, Beijing, China
By: Shulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.
Contributors: Zhang, Shulian.; Gao, Wei, Ph. D.; China Optics & Optoelectronic Manufacturers Association.; Zhongguo wu li xue hui.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4222; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4222.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 434
Subjects: Process control -- Automation -- Congresses.; Manufacturing processes -- Automation -- Congresses.; Detectors -- Industrial applications -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.