Optical diagnostics
Subtitle: 3-4 August, 2005, San Diego, California, USA
By: Leonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Farrell, Patrick V.; Hanssen, Leonard Matheus, 1953-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- v. 5880; Proceedings of SPIE--the International Society for Optical Engineering -- v. 5880.
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, Wash
Language: eng
Subjects: Materials -- Testing -- Congresses; Materials -- Optical properties -- Congresses; Optical measurements -- Congresses; Reflectance -- Congresses; Refractive index -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.