Direct profiling of III/V semiconductor nanostructures at the atomic level by cross-sectional scanning tunneling microscopy
By: Dominique Maria Bruls
Contributors: Technische Universiteit Eindhoven
Published: 2003
Language: eng
Number of pages: 119
Notes: Includes abstract and afterward in Dutch.

Thesis (doctoral)--Technische Universiteit Eindhoven, 2003.

In English; summaries in English or Dutch.