Stress-Induced Phenomena in Metallization
Subtitle: Seventh International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / AIP ... Phenomena Metallizat.)
Contributors: Paul S. Ho (Editor); Shefford P. Baker (Editor); Tomoji Nakamura (Editor); Cynthia A. Volkert (Editor)
Edition: 1 edition
Publisher: American Institute of Physics
Published: December 14, 2004
Language: eng
Format: Hardcover
Number of pages: 272
ISBN-13: 9780735402256
Subjects: Electrical engineering; Electronics engineering; Mathematics and Science; Science/Mathematics; Electronics - Semiconductors; Technology; Technology & Industrial Arts; Engineering - Electrical & Electronic; Material Science; Science / Physics