1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis
Subtitle: [proceedings].
Contributors: IEEE Computer Society. Test Technology Committee.; University of Minnesota. Microelectronic and Information Sciences Center.
Publisher: IEEE Computer Society Press; Order from IEEE Computer Society
Published: 1984
Place of publication: Silver Spring, MD; Los Angeles, CA
Language: eng
Number of pages: 65
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Automatic test equipment.
Genres: Congresses.
Notes: Includes bibliographies and index.
At head of title: IEEE Computer Society Test Technology Committee.
"Computer Society order number 609."