Optical pattern recognition with microlasers
By: Eung Gi Paek
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6017
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1998
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 23
Subjects: Optical pattern recognition -- Technological innovations
Notes: Shipping list no.: 98-0569-M

"January 1998."

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative