Electron microscopy and multiscale modeling
Subtitle: proceedings of the EMMM-2007 international conference, Moscow, Russia, 3-7 September 2007
By: editors Anatoly S. Avilov, Sergei L. Dudarev, Laurence D. Marks.
Contributors: Avilov, Anatoly S.; Dudarev, S. L.; Marks, Laurence D.
Series: AIP conference proceedings -- 999; AIP conference proceedings -- no. 999.
Publisher: American Institute of Physics
Published: 2008
Place of publication: [Melville, N.Y.]
Language: eng
Number of pages: 300
ISBN-13: 9780735405196
Subjects: Materials -- Microscopy -- Congresses; Electron microscopy -- Congresses; Crystallography -- Congresses; Materials -- Mechanical properties -- Mathematical models -- Congresses; Deformations (Mechanics) -- Mathematical models -- Congresses
Genres: Congresses.
Other titles: Proceedings of the EMMM-2007 international conference
Notes: "First conference on "Electronic Microscopy and Multi-Scale Modelling" (EMMM-2007)"--Pref.

Includes bibliographical references and index.