Comprehensive functional verification the complete industry cycle
By: Bruce Wile, John C. Goss, Wolfgang Roesner.
Contributors: Goss, John C.; Roesner, W.
Publisher: Elsevier/Morgan Kaufmann
Published: 2005
Place of publication: Amsterdam; Boston
Language: eng
Number of pages: 676
Subjects: Integrated circuits -- Verification.; Computer engineering.
Notes: Includes bibliographical references (p. 657-662) and index.