Tenth International Conference on Quality Control by Artificial Vision
Subtitle: 28-30 June 2011, Saint-Etienne, France
By: Jean-Charles Pinoli ... [et al.], editors ; organized by LPMG CNRS Saint-Etienne (France) ; sponsored by Ecole Nationale Supérieure des Mines de Saint-Etienne (France) ... [et al.] ; cooperating organization and publisher SPIE
Contributors: Pinoli, Jean-Charles; SPIE (Society); Centre national de la recherche scientifique (France). LPMG; Ecole nationale supérieure des mines de Saint-Etienne
Series: Proceedings of SPIE -- v. 8000; Proceedings of SPIE--the International Society for Optical Engineering -- v. 8000.
Publisher: SPIE
Published: 2011
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819485731
Subjects: Pattern recognition systems; Industrial applications; Optical methods; Computer vision; Quality control; Congresses; Imaging systems; Optical detectors
Other titles: 10th International Conference on Quality Control by Artificial Vision; International Conference on Quality Control by Artificial Vision; Quality control by artificial vision
Notes: Includes bibliographical references and author index.