Semiconductor memories
Subtitle: technology, testing, and reliability
By: Ashok K. Sharma.
Contributors: IEEE Solid-State Circuits Council.
Publisher: IEEE, the Institute of Electrical and Electronics Engineers; Wiley-Interscience
Published: 1997
Place of publication: New York; Hoboken, N.J
Language: eng
Number of pages: 462
Subjects: Semiconductor storage devices
Notes: Includes bibliographical references and index.
"IEEE Solid-State Circuits Council, sponsor."