Characterization and behavior of interfaces
Subtitle: proceedings of Research Symposium on Characterization and Behavior of Interfaces, 21 September 2008, Atlanta, Georgia, USA
By: edited by J. David Frost
Contributors: Frost, J. David; Georgia Institute of Technology
Publisher: IOS Press
Published: 2010
Place of publication: Amsterdam; Fairfax, VA
Language: eng
Number of pages: 155
ISBN-13: 9781607504900
Subjects: Congresses; Engineering geology; Surfaces (Technology)
Notes: "The Georgia Institute of Technology hosted a one-day Research Symposium on Characterization and Behavior of Interfaces (CBI) that was held in conjunction with the Fourth International Symposium on Deformation Characteristics of Geomaterials (IS Atlanta 2008). The CBI research symposium was held on September 21, 2008."--P. vii.

Includes bibliographical references and indexes.