changing philosophy of test
Subtitle: International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC
By: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Philadelphia Chapter.
Publisher: IEEE Computer Society Press
Published: 1990
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 1083
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.; Semiconductors -- Testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
"IEEE catalog number 90CH2910-6"--T.p. verso.