18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Subtitle: proceedings : 3-5 November, 2003, Boston, Massachusetts
By: edited by [C. Bolchini] ... [et al.] ; sponsored by IEEE Computer Society Technology Technical Committee on Fault-Tolerant Computing (TCFTC) [and the] IEEE Computer Society Test Technology Technical Council (TTTC).
Contributors: Bolchini, C.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: IEEE Computer Society Press
Published: 2003
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 607
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Fault-tolerant computing -- Congresses.
Genres: Congresses.
Other titles: International Symposium on Defect and Fault Tolerance in VLSI Systems; Defect and fault tolerance in VLSI systems; DFT 2003
Notes: Includes bibliographical references and author index.
"IEEE Computer Society Order Number PR02042"--T.p. verso.
Also available via the World Wide Web.