6th International Symposium on Quality Electronic Design
Subtitle: proceedings : March 21-23, 2005, San Jose, California
By: sponsored by IEEE Electron Devices Society (EDS) ... [et al.].
Contributors: IEEE Electron Devices Society.
Publisher: IEEE Computer Society
Published: 2005
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 710
Subjects: Integrated circuits -- Very large scale integration -- Reliability -- Congresses.; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.; Integrated circuits -- Very large scale integration -- Computer-aided design -- Congresses.; Integrated circuits -- Very large scale integration -- Testing -- Quality control -- Congresses.
Genres: Congresses.
Other titles: ISQED 2005; Quality of Electronic Design, 2005, ISQED 2005, Sixth International Symposium on.
Notes: Includes bibliographical references and author index.
On cover: ISQED 2005.
"IEEE Computer Society Order Number P2301"--T.p. verso.
Also issued online with additional title: Quality of Electronic Design, 2005, ISQED 2005, Sixth International Symposium on.