Characterization of a high frequency probe assembly for integrated circuit measurement
By: R.L. Jesch [and] C.A. Hoer
Series: NBS Technical Note -- 663
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1975
Place of publication: [Washington]
Language: eng
Number of pages: 51
Subjects: Integrated circuits -- Measurement; Probes (Electronic instruments)
Notes: Includes bibliographical references (p. 40)