Rational fault analysis
By: edited by Richard Saeks, Stanley R. Liberty.
Contributors: Saeks, Richard, 1941-; Liberty, Stanley R., 1942-; United States. Office of Naval Research.; United States. Army Research Office.
Series: Electrical engineering and electronics ;; 1
Publisher: M. Dekker
Published: 1977
Place of publication: New York
Language: eng
Number of pages: 241
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Electronic apparatus and appliances -- Reliability -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
Co-sponsored by the Office of Naval Research and the Army Research Office.