Istfa '92
Subtitle: Proceedings of the 18th International Symposium for Testing and Failure Analysis 19-23 October 1992 Los Angeles, California
Publisher: Univ Microfilms Intl
Published: December 1992
Language: eng
Format: Paperback
Number of pages: 350
ISBN-13: 9780871704566
Subjects: Circuits & components; Materials science; Electronics - General; Structural Defects Of Materials; Testing Of Materials; Technology & Industrial Arts; Congresses; Electronic appartus and applia; Electronic appartus and appliances; Electronics; Materials; Testing; Science/Mathematics