Environmental monitoring and remediation III
Subtitle: 28-30 October 2003, Providence, Rhode Island, USA
By: Tuan Vo-Dinh ... [et al.], chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Vo-Dinh, Tuan.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 5270; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5270.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 224
Subjects: Environmental monitoring -- Congresses.; Detectors -- Industrial applications -- Congresses.; Pollution -- Measurement -- Congresses.; Hazardous wastes -- Measurement -- Congresses.; Hazardous waste site remediation -- Congresses.; Green technology -- Congresses.
Genres: Congresses.
Other titles: Environmental monitoring and remediation 3; Environmental monitoring and remediation three; Environmental monitoring and remediation technologies.
Notes: Includes bibliographical references and author index.
Previous conference entitled: Environmental monitoring and remediation technologies.