EOS/ESD technology abstracts, Winter 80-81
By: prepared by Eugene Kraeger, Wayne Grimaldi.
Contributors: Grimaldi, Wayne.
Series: Technical reliability studies ;; TRS-3; Technical reliability study ;; TRS-3.
Publisher: Reliability Analysis Center
Published: 1981
Place of publication: Griffiss Air Force Base, NY
Language: eng
Number of pages: 145
Subjects: Electronic apparatus and appliances -- Effect of radiation on -- Abstracts.; Electric discharges -- Abstracts.; Electromagnetic pulse -- Abstracts.
Other titles: E.O.S./E.S.D. technology abstracts, Winter 80-81.
Notes: Includes indexes.