Noise in complex systems and stochastic dynamics
Subtitle: 2-4 June 2003, Santa Fe, New Mexico, USA
By: Lutz Schimansky-Geier ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Schimansky-Geier, Lutz, 1950-; Society of Photo-optical Instrumentation Engineers
Series: SPIE proceedings series ;; v. 5114; Proceedings of SPIE--the International Society for Optical Engineering.; v. 5114.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 534
Subjects: Electronic noise -- Congresses.; Nonlinear systems -- Noise -- Congresses.; Stochastic processes. -- Congresses.; System analysis. -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.