Accuracy in powder diffraction II
Subtitle: proceedings of the international conference, May 26-29, 1992 / E. Prince and J.K. Stalick, editors ; organized by Commission on Powder Diffraction of the International Union of Crystallography ; sponsored by JCPDS--International Centre for Diffraction Data, International Union of Crystallography, National Institute of Standards and Technology.
Contributors: Prince, Edward.; Stalick, J. K.; International Union of Crystallography. Commission on Powder Diffraction.; JCPDS--International Centre for Diffraction Data.; National Institute of Standards and Technology (U.S.)
Series: NIST special publication ;; 846
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1992
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Number of pages: 234
Subjects: X-rays -- Diffraction -- Measurement -- Congresses.; Powders -- Optical properties -- Measurement -- Congresses.
Notes: Includes bibliographical references.
"October 1992."