Refractometry
Subtitle: 16-20 May 1994, Warsaw, Poland
By: Maksymilian Pluta, Mariusz Szyjer, chairs/editors ; organized by SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland).
Contributors: Pluta, Maksymilian.; Szyjer, Mariusz.; Society of Photo-optical Instrumentation Engineers. Poland Chapter.; Institute of Applied Optics (Poland); Society of Photo-optical Instrumentation Engineers.; Komitet Badań Naukowych (Poland)
Series: SPIE proceedings series ;; v. 2208; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2208.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 228
Subjects: Refraction -- Congresses.; Refraction, Double -- Congresses.
Notes: Includes bibliographical references and index.