Characterization methods for submicron MOSFETs
By: edited by Hisham Haddara.
Contributors: Haddara, Hisham.
Series: The Kluwer international series in engineering and computer science ;; SECS 352.; Analog circuits and signal processing; Kluwer international series in engineering and computer science ;; SECS 352.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers
Published: 1995
Place of publication: Boston
Language: eng
Number of pages: 232
Subjects: Metal oxide semiconductor field-effect transistors -- Mathematical models; Electronic circuit design
Notes: Includes bibliographical references and index.