Scanning electron microscopy / 1983
Subtitle: an international journal of scanning electron microscopy related techniques and applications
By: guest editors: Albrecht, R.M., Roomans, G.M.
Contributors: Scanning Electron Microscopy, Inc
Publisher: Scanning Electron Microscopy
Published: 1983
Place of publication: Chicago, Ill
Language: eng
Number of pages: 2045
Subjects: Scanning electron microscopes; Microscopes électroniques à balayage
Notes: Sur la couverture: SEM 1983.