X-ray diffraction and ellipsometric studies of zinc sulfide thin films grown by atomic layer epitaxy
By: Markku Oikkonen
Contributors: Teknillinen korkeakoulu
Series: Acta polytechnica Scandinavica -- no. 161
Publisher: Finnish Academy of Technology
Published: 1988
Place of publication: Helsinki
Language: eng
Number of pages: 46
ISBN-13: 9789516662643
Notes: Thesis (doctoral)--Helsinki University of Technology, 1988.