Scanning microscopy 2010
Subtitle: 17-19 May 2010, Monterey, California, United States
By: Michael T. Postek ... [et al.], editors ; sponsored by SPIE ; technical cosponsor, NIST--National Institute of Standards and Technology (United States)
Contributors: SPIE (Society); National Institute of Standards and Technology (U.S.)
Series: Proceedings of SPIE -- v. 7729; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7729.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819482174
Subjects: Congresses; Scanning electron microscopes
Notes: Includes bibliographical references and author index.