Data dependency on measurement uncertainties in speaker recognition evaluation
By: Jin Chu Wu ... [et al.].
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 7810; NISTIR -- 7810.
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 2011
Place of publication: Gaithersburg, MD
Language: eng
Format: [electronic resource] /
Number of pages: 18
Subjects: Automatic speech recognition; Biometric identification
Notes: Title from title screen (viewed on Dec. 22, 2011).

"October 2011."

Includes bibliographical references (p. 18).