Metallographic specimen preparation: optical and electron microscopy.
By: Edited by James L. McCall and William M. Mueller.
Contributors: McCall, James L., ed.; Mueller, William M., ed.; International Metallographic Society.; American Society for Metals.
Publisher: Plenum Press
Published: 1974
Place of publication: New York
Language: eng
Number of pages: 358
Subjects: Metallographic specimens -- Congresses.; Electron metallography -- Congresses.
Notes: Includes bibliographical references.
Proceedings of a conference sponsored by the International Metallographic Society and the American Society for Metals and held in Beverly Hills, Calif., Sept. 23-24, 1973.