Beam injection assessment of defects in semiconductors
Subtitle: international workshop, Meudon-Bellevue, France, 18-19-20 July 1988.
Series: Colloque de physique -- 1989, C6; Revue de physique appliquée -- fasc. 6
Publisher: Editions de physique
Published: 1989
Place of publication: Les Ulis Cedex, France
Language: eng
Number of pages: 192
Subjects: Semiconductors -- Defects -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: B.I.A.D.S. 88.; BIADS 88.
Notes: Abstracts in English and French.

Title from spine: B.I.A.D.S. 88.

Includes bibliographical references.