Semiconductor microelectronics and nanoelectronics programs
By: edited by Stephen Knight, Joaquin V. Martinez de Pinillos, and Michele Buckley
Contributors: Knight, Stephen; Pinillos, Joaquin V. Martinez de; Buckley, Michele; National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 7010
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 2003
Place of publication: [Gaithersburg, MD]
Language: eng
Format: Microform
Number of pages: 168
Subjects: National Institute of Standards and Technology (U.S.); Semiconductors -- Measurement; Nanotechnology -- Research; Molecular electronics -- Research; Microelectronics -- Research
Notes: "July 2003."

Shipping list no.: 2004-0094-M

Includes bibliographical references

Also available via Internet from the NIST web site. Address as of 1/22/04: http://www.eeel.nist.gov/omp/Portfolio%202003/F%5Fomp.pdf; current access is available via PURL

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2003 2 microfiches : negative