Proceedings ATFA-78
Subtitle: advanced techniques in failure analysis : 6-9 November, 1978/Airport Marriot Hotel, Los Angeles, California USA
By: [sponsored by Institute of Electrical and Electronics Engineers, inc. ... et al.].
Contributors: Institute of Electrical and Electronics Engineers.
Publisher: IEEE
Published: 1978
Place of publication: [New York]
Language: eng
Number of pages: 200
Subjects: Electronic apparatus and appliances -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: Advanced techniques in failure analysis.; ATFA-78
Notes: Includes bibliographical references and index.