Internal standardization and calibration architectures for chemical sensors
Subtitle: 20-22 September, 1999, Boston, Massachusetts
By: Ronald E. Schaffer, Radislav A. Potyrailo, chairs/editors ; sponsored by SPIE--The International Society for Optical Engineering ; cooperating organization, Air and Waste Management Association, Optical Sciences Division.
Contributors: Shaffer, Ronald E.; Potyrailo, Radislav A.; Society of Photo-optical Instrumentation Engineers.; Air & Waste Management Association. Optical Sciences Division.
Series: SPIE proceedings series,; v. 3856; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3856.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 330
Subjects: Chemical detectors -- Congresses.; Chemical detectors -- Calibration -- Congresses.; Microchemistry -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and author index.