Non-Intrusive Inspection Technologies
Subtitle: 17-18 April, 2006, Kissimmee, Florida USA (Proceedings of SPIE)
Contributors: G. Vourvopoulos (Editor); F. Patrick Doty (Editor)
Publisher: Society of Photo Optical
Published: May 30, 2006
Language: eng
Format: Paperback
ISBN-13: 9780819462695
Subjects: Industrial quality control; Reliability engineering; Electronics - Optoelectronics; Industries - Transportation; Business & Economics; Business/Economics