2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology
Subtitle: IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings
By: supported by the Ministry of Higher Education ... [et al.] ; sponsored by ATMEL, Mentor Graphics, ST Microelectronics ;  [edited by Patrick Girard ... et al.].
Contributors: Girard, Patrick, Ph. D.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2006
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 447
Subjects: Integrated circuits; Congresses; Design and construction; Testing; Nanotechnology; Microelectronics; Design
Other titles: 2006 International Conference on Design and Test of Integrated Systems in Nanoscale Technology; DTIS 2006
Notes: "IEEE Catalog Number: 06EX1441"--P. [i].

Includes bibliographical references and index.