Papers presented at the3rd International Workshop on Beam Injection Assessment of Defects in Semiconductors,(BIADS '93), August 30 - September 2, 1993, Bologna, Italy
By: guest editors: A. Cavallini, C. Donolato and S. Pizzini.
Contributors: Cavallini, A.; Donolato, C.; Pizzini, S.
Series: Materials science & engineering B -- vol.B24 (1-3)
Publisher: Elsevier Sequoia
Published: 1994
Place of publication: Lausanne
Language: eng