Machine vision and three-dimensional imaging systems for inspection and metrology
Subtitle: 6-8 November 2001 [i.e. 2000], Boston, USA
By: Kevin G. Harding, John W.V. Miller, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Contributors: Harding, Kevin G.; Miller, John W. V.; Batchelor, Bruce G.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 4189; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4189.
Publisher: SPIE
Published: 2001
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 296
Subjects: Computer vision -- Congresses.; Computer vision -- Industrial applications -- Congresses.; Three-dimensional display systems -- Congresses.; Quality control -- Optical methods -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.