Machine vision applications in industrial inspection XI
Subtitle: 22-24 January, 2003, Santa Clara, California, USA
By: Martin A. Hunt, Jeffery R. Price, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
Contributors: Hunt, Martin A. 1963-; Price, Jeffery R.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 5011; Proceedings, Electronic Imaging Science and Technology; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5011.
Publisher: SPIE
Published: 2003
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 324
Subjects: Engineering inspection -- Automation -- Congresses; Computer vision -- Industrial applications -- Congresses; Quality control -- Optical methods -- Automation -- Congresses; Mensuration -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and author index.