Hot-carrier reliability of MOS VLSI circuits
By: by Yusuf Leblebici, Sung-Mo (Steve) Kang.
Contributors: Leblebici, Yusuf.; Kang, Sung-Mo, 1945-
Series: The Kluwer international series in engineering and computer science ;; SECS 227.; VLSI, computer architecture, and digital signal processing; Kluwer international series in engineering and computer science ;; SECS 227.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic
Published: 1993
Place of publication: Boston
Language: eng
Number of pages: 212
Subjects: Integrated circuits -- Very large scale integration -- Defects -- Mathematical models; Metal oxide semiconductors -- Reliability -- Mathematical models; Hot carriers -- Reliability -- Mathematical models
Notes: Includes bibliographical references and index.