Recent advances in metrology, characterization, and standards for optical digital data disks
Subtitle: 21-22 July 1999, Denver, Colorado
By: sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].
Contributors: Podio, Fernando L.; Society of Photo-optical Instrumentation Engineers.; International Disk Drive Equipment and Materials Association.; Information Technology Laboratory (National Institute of Standards and Technology)
Series: SPIE proceedings series ;; v. 3806; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3806.
Publisher: SPIE
Published: 1999
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 182
Subjects: Optical storage devices -- Testing -- Congresses.; Optical disks -- Standards -- Congresses.; Optical disks -- Testing -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.