Proceedings of the Veterans Administration Second Electron Microscopy Conference, May 13-14, 1975, Chicago, Ill.
By: sponsored by The Pathology Service, Veterans Administration
Contributors: United States. Veterans Administration
Series: IB ; 11-53
Publisher: U.S. Veterans Administration, Pathology Service
Published: 1976
Place of publication: Washington
Language: eng
Number of pages: 87
Subjects: Electron microscopy -- United States -- Congresses
Notes: Cover title

This program is cosponsored by the American Society of Clinical Pathologist