The changing philosophy of test
Subtitle: International Test Conference 1990 : proceedings, September 10-14, 1990, Sheraton Washington Hotel, Washington, D.C.
By: sponsored by the IEEE Computer Society, Test Technology Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press
Published: 1990
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 1083
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Other titles: 1990 IEEE International Test Conference.
Notes: "IEEE Catalog No. 90CH2910-8."

"Computer Society Press No. 2064."

On cover and spine: 1990 IEEE International Test Conference.