Yuan zi li xian wei jing  chuan li di tu ji fen xi
Subtitle: Patent analysis of of atomic force microscope
By: zuo zhe Wang Daojun ... [et al.].
Contributors: Wang, Daojun.
Edition: Di 1 ban
Series: Nai mi ke ji zhuan li yan jiu xi lie -- 8
Publisher: Xing zheng yuan Guo jia ke xue wei yuan hui ke xue ji shu zi liao zhong xin
Published: 2004
Place of publication: Taibei Shi
Language: chi
Number of pages: 125
ISBN-13: 9789576191176
Subjects: Atomic force microscopy -- Patents.; Microscopes -- Patents.
Other titles: Patent analysis of of atomic force microscope
Notes: Includes bibliographical references (p. 63).