Optical measurement systems for industrial inspection VI
Subtitle: 15-18 June 2009, Munich, Germany
By: Peter H. Lehmann, editor ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)
Contributors: SPIE Europe; European Optical Society; Wissenschaftliche Gesellschaft Lasertechnik; SPIE (Society)
Series: Proceedings of SPIE -- v. 7389; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7389.
Publisher: SPIE
Published: 2009
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819476722
Subjects: Optical methods; Quality control; Congresses; Optical detectors; Optical instruments; Industrial applications
Notes: Includes bibliographical references and author index.