Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
By: edited by Thomas J. Shaffner, Dieter K. Schroder.
Contributors: Shaffner, Thomas J.; Schroder, Dieter K.; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectrics and Insulation Division.
Series: Proceedings ;; v. 88-20; Proceedings (Electrochemical Society) ;; v. 88-20.
Publisher: Electrochemical Society
Published: 1988
Place of publication: Pennington, NJ (10 S. Main St., Pennington 08534-2896)
Language: eng
Number of pages: 289
Subjects: Semiconductors -- Testing -- Congresses.
Notes: Includes bibliographies and indexes.
Sponsored by the Electronics and Dielectrics and Insulation Divisions.