Scanning electron microscopy/1984
Subtitle: Parts I-IV : an international journal of scanning electron microscopy, related techniques, and applications
By: guest editor R.P. Becker
Contributors: Scanning Electron Microscopy
Publisher: Scanning Electron Microscopy
Published: 1984
Language: eng
Subjects: Electron microscopes; Scanning electron microscopes
Notes: Part I pp 1-482; pt II pp 483-1010; pt III pp 1011-1460; pt IV pp 1461-2075.