19th IEEE VLSI Test Symposium
Subtitle: proceedings : April 29-May 3, 2001, Marina Del Rey, California, USA
By: sponsored by the IEEE Computer Society Test Technology Technical Council.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Engineers.
Publisher: IEEE
Published: 2001
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 417
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses
Genres: Congresses.
Other titles: VLSI Test Symposium.; VTS 2001.; VLSI Test Symposium, 19th IEEE Proceedings on, VTS 2001.
Notes: "IEEE Computer Society Order Number PR001122"--T.p. verso.

Includes bibliographical references and author index.

Also available via the World Wide Web with additional title: VLSI Test Symposium, 19th IEEE Proceedings on, VTS 2001.