Proceedings
By: International Test Conference 1995.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Conference
Published: 1995
Place of publication: Altoona, PA
Language: eng
Number of pages: 1011
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Telecommunication -- Equipment and supplies -- Testing -- Congresses.
Other titles: Driving down the cost of test
Notes: Includes bibliographical references and index.
"October 21-25, 1995 ... Washington, D.C., USA"--Cover.
Sponsored by IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section"--Cover.
"IEEE catalog number 95CH35858"--T.p. verso.