Proceedings
Subtitle: International Test Conference 1994 (International Test Conference//Proceedings)
Publisher: Ieee
Published: October 1994
Language: eng
Format: Hardcover
Number of pages: 1033
ISBN-13: 9780780321038
Subjects: Electronics & Communications Engineering; Instruments & instrumentation engineering; Reference; Electronic Engineering (Specific Aspects); Engineering Instruments; Testing; Congresses; Circuits; Electronic digital computers; Integrated circuits