Proceedings of the International Congress on X-Ray Optics & Microanalysis, 8th
Contributors: Donald R. Beaman (Editor); Robert E. Ogilvie (Editor); David D. Wittry (Editor)
Publisher: Pendell Publishing Company
Published: February 1987
Language: eng
Format: Hardcover
Number of pages: 665
ISBN-13: 9780878121809
Subjects: Radiation; Science