International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers : April 26-28, 2006 : Hsinchu, Taiwan.
Contributors: Gong ye ji shu yan jiu yuan.; Institute of Electrical and Electronics Engineers.
Publisher: Industrial Technology Research Group; IEEE
Published: 2006
Place of publication: Hsinchu, Taiwan; Piscataway, N.J
Language: eng
Number of pages: 303
Subjects: Integrated circuits -- Very large scale integration -- Congresses
Genres: Congresses
Other titles: VLSI-DAT
Notes: "IEEE catalog number: 06TH8869."

Includes bibliographical references and index.