Measurement techniques for thin films.
By: Edited by Bertram Schwartz and Newton Schwartz.
Contributors: Schwartz, Bertram, ed.; Schwartz, Newton, ed.; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectrics and Insulation Division.
Publisher: Electronics Division and Dielectrics and Insulation Division, Electrochemical Society
Published: 1967
Place of publication: New York
Language: eng
Number of pages: 364
Subjects: Metallic films.; Thin films.
Notes: Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society.