Apparatus for electrical measurements of thin films from 77 to 1000 K
By: Lawrence G. Matus and Robert L. Summers.
Contributors: Summers, Robert L.; Lewis Research Center.
Series: NASA technical memorandum -- 87256.
Publisher: National Aeronautics and Space Administration, Lewis Research Center
Published: 1986
Place of publication: [Cleveland, Ohio
Language: eng
Format: Microform
Subjects: Thin films.; Electricity -- Measurement.; Electrical measurement.; Mounting.; Samples.; Test equipment.; Thin films.
Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1986. 1 microfiche.