VLSI Design and Test
Subtitle: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Publisher: Springer Berlin / Heidelberg
Published: 2013
Language: eng
Number of pages: 388
ISBN-13: 9783642420238
Subjects: Integrated circuits, very large scale integration
Description: This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.