Advances in X-Ray Analysis
Subtitle: Volume 39 (Advances in X-Ray Analysis)
Contributors: John V. Gilfrich (Editor); I. Cev Noyan (Editor); Ron Jenkins (Editor); Ting C. Huang (Editor); Robert L. Snyder (Editor); Deane K. Smith (Editor); Mary Ann Zaitz (Editor); Paul K. Predecki (Editor)
Edition: 1 edition
Publisher: Springer
Published: January 31, 1998
Language: eng
Format: Hardcover
Number of pages: 926
ISBN-13: 9780306458033
Subjects: Chemical spectroscopy, spectrochemistry; Materials science; Mechanical Properties Of Materials; Structural Properties Of Materials; Technology; Technology & Industrial Arts; Science/Mathematics; Chemistry - Physical & Theoretical; Material Science; Technology / Material Science; General
First sentence: Wilhelm Conrad Rontgen was born on 27-03-1845, 150 years ago, in Lennep-Remscheid in Westphalen, Germany, from a German father and a Dutch mother.