In-Situ Microscopy in Materials Research
Subtitle: Leading International Research in Electron and Scanning Probe Microscopies
Edition: 1 edition
Publisher: Springer
Published: September 30, 1997
Language: eng
Format: Hardcover
Number of pages: 360
ISBN-13: 9780792399896
Subjects: Electrical engineering; Microscopy; Scanning probe microscopy; Testing Of Materials; Technology; Science; Science/Mathematics; Engineering - General; Material Science; Nanostructures; Technology / Material Science; Electron Microscopy; Materials