Electron microscopy and analysis 1999
Subtitle: proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999
By: edited by C.J. Kiely.
Contributors: Kiely, C. J.; Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Series: Institute of Physics conference series -- no. 161
Publisher: Institute of Physics Pub.; CRC Press
Published: 1999
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 632
Subjects: Electron microscopy -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and indexes.