Semiconductor measurement technology
Subtitle: reliablity technology for cardiac pacemakers II, a workshop report
By: Harry A Schafft, editor ; Electronic Technology Division
Contributors: Schafft, Harry A., editor; Institute for Applied Technology (U.S.). Electronic Technology Division
Series: Semiconductor measurement technology; NBS special publication ; 400-42; NBS special publication -- 400-42
Publisher: Dept. of Commerce, National Bureau of Standards, Institute for Applied Technology, Electronic Technology Division : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 39
Subjects: Cardiac pacemakers -- Reliability -- Congresses
Notes: CODEN: XNBSAV

Issued August 1977

Includes bibliographical references