Dielectric measurements using a reentrant cavity
Subtitle: mode-matching analysis
By: James Baker-Jarvis, Bill F. Riddle
Series: NIST technical note -- 1384
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1996
Place of publication: Boulder, Colo
Language: eng
Format: [microform] :
Number of pages: 13
Subjects: Dielectric measurements
Notes: Shipping list no.: 98-0938-M.

Paper version no longer available for sale by the Supt. of Docs.

"November 1996."

Includes bibliographical references (p. 12-13).