Symposium on X-ray and Electron Probe Analysis
Subtitle: presented at thesixty-sixth Annual Meeting, American Society for Testing and Materials, Atlantic City, 1963.
Contributors: American Society forTesting and Materials. Meeting,; American Society for Testing and Materials. Committee E-2 on Emission Spectroscopy.; American Society for Testing and Materials. Committee E-4 on Metallography.
Series: ASTM Special technical publication -- 349
Publisher: American Society for Testing and Materials
Published: 1964
Place of publication: Philadelphia
Language: eng