Long Duration Exposure Facility post-flight thermal analysis.
By: William M. Berrios and Thomas R. Sampair.
Contributors: Langley Research Center.
Series: NASA technical memorandum -- 104208, pt.1.; NASA technical memorandum -- 104208.
Publisher: National Aeronautics and Space Administration, Langley Research Center; For sale by the National Technical Information Service
Published: 1992
Place of publication: Hampton, Va; [Springfield, Va
Language: eng
Format: Microform
Subjects: Thermal analysis.
Other titles: Long Duration Exposure Facility post flight thermal analysis.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-1649-M.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1992. 6 microfiches.