Testing and reliable design of CMOS circuits
By: by Niraj K. Jha. and Sandip Kundu.
Contributors: Kundu, Sandip.
Series: Kluwer international series in engineering and computer science ;; SECS 88.
Publisher: Kluwer Academic Publishers
Published: 1990
Place of publication: Boston
Language: eng
Number of pages: 231
Subjects: Metal oxide semiconductors, Complementary -- Testing.; Metal oxide semiconductors, Complementary -- Reliability.; Integrated circuits -- Very large scale integration -- Design and construction.
Notes: Includes bibliographical references.