Advances in X-Ray Analysis
Subtitle: Volume 39
By: edited by John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki
Contributors: Jenkins, Ron; Snyder, Robert L.; Zaitz, Mary Ann; Noyan, I. Cev; Huang, Ting C.; Smith, Deane K.; Predecki, Paul K.
Publisher: Springer US
Published: 1998
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 926
ISBN-13: 9781461553779
Other titles: Proceedings of the Forty-fourth Annual Conference on Applications of X-Ray Analysis held in Colorado, Springs, Colorado, July 31-August 4, 1995