10th Asian Test Symposium
Subtitle: proceedings : 19-21 November, 2001, Kyoto, Japan
By: sponsored by the IEEE Computer Society Test Technology Technical Council ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.].
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Denshi Jōhō Tsūshin Gakkai (Japan). Technical Group on Fault-Tolerant Systems.
Publisher: IEEE Computer Society
Published: 2001
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 473
Subjects: Electronic digital computers -- Circuits -- Testing -- Congresses; Electronic circuits -- Testing -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: ATS 2001.; Asian Test Symposium, 2001, proceedings, 10th.
Notes: "IEEE Computer Society Order Number PR01378"--T.p. verso.

Includes bibliographical references and author index.

Also available via the World Wide Web with additional title: Asian Test Symposium, 2001, proceedings, 10th.