Risk Methodologies for Technological Legacies (Nato Science Series: IV: Earth and Environmental Sciences)
Contributors: James G. Droppo (Adapter); Dennis Bley (Editor); Vitaly A. Eremenko (Editor)
Edition: 1 edition
Publisher: Springer
Published: April 1, 2003
Language: eng
Format: Hardcover
Number of pages: 400
ISBN-13: 9781402012570
Subjects: Risk assessment; Risk assessment & analysis for business; The Environment; Science/Mathematics; Hazardous wastes; Engineering - Industrial; Technology; Environmental Studies; Radioactive waste disposal; History; Environmental Science; Life Sciences - Ecology - Recycling; Science / Environmental Science; Congresses