Designing, testing, and diagnostics--join them: International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
Publisher: Can be ordered from IEEE Service Center
Published: 1993
Language: eng
Format: Unknown Binding
Number of pages: 1065
ISBN-13: 9780780314290
Subjects: Automatic checkout equipment; Congresses; Integrated circuits; Testing