Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
Subtitle: 8-11 October 1996 Enschede, the Netherlands
Contributors: Guido Groeseneken (Editor); Herman E. Maes (Editor); Anton J. Mouthaan (Editor); Jan F. Verweij (Editor)
Publisher: Ieee
Published: November 1996
Language: eng
Format: Paperback
ISBN-13: 9789997718242
Subjects: Electronics - General; Electronic Apparatus And Devices; Reliability Engineering; Technology; Science/Mathematics