Test and measurement applications of optoelectronic devices
Subtitle: 21-22 January, 2002, San Jose, USA
By: Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Chin, Aland K.
Series: SPIE proceedings series,; v. 4648; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4648.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 180
Subjects: Optoelectronic devices -- Testing -- Congresses.; Optoelectronic devices -- Reliability -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.