Optical testing and metrology II
Subtitle: 27-30 June 1988, Dearborn, Michigan
By: C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering and ESD--the Engineering Society.
Contributors: Grover, C. P.; Society of Photo-optical Instrumentation Engineers.; Engineering Society of Detroit.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 954
Publisher: SPIE
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 725
Subjects: Mensuration -- Congresses; Optical measurements -- Congresses
Notes: Includes bibliographies and index.