VLSI Design for Manufacturing: Yield Enhancement
By: by Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas
Contributors: Maly, Wojciech; Strojwas, Andrzej J.
Series: The Kluwer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 86; Kluwer international series in engineering and computer science -- 86.
Publisher: Springer US
Published: 1990
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 308
ISBN-13: 9781461288169; 9781461315216
Subjects: Systems engineering; Engineering; Computer engineering
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