Laser beam profile measurements using spatial sampling, Fourier optics, and holography
By: Eric G. Johnson, Jr., Electromagnetic Technology Division, National Engineering Laboratory, National Bureau of Standards
Contributors: National Engineering Laboratory (U.S.). Electromagnetic Technology Division
Series: NBS technical note ; 1009; NBS technical note -- 1009
Publisher: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1979
Place of publication: [Washington]
Language: eng
Number of pages: 86
Subjects: Laser beams -- Measurement; Holography
Notes: Issued Jan. 1979

Includes biblographical references