Test structure implementation document
Subtitle: DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)
By: C.E. Schuster ; sponsored by Defense Advanced Research Projects Agency and U.S. Air Force Wright Laboratory.
Contributors: United States. Defense Advanced Research Projects Agency.; Wright Laboratory (Wright-Patterson Air Force Base, Ohio)
Series: NIST special publication ;; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1995
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Number of pages: 88
Subjects: Microwave integrated circuits -- Design -- Data processing.; Gallium arsenide semiconductors -- Design -- Data processing.; Computer-aided design.
Notes: Includes bibliographical references (p. 14).
"September 1995."