A review of U.S. participation in the International Organization for Standardization (ISO) and the International Electrotechnical Commission (IEC)
By: Christine R. DeVaux.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6492.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology; National Technical Information Service, distributor
Published: 2000
Place of publication: Gaithersburg, MD; [Springfield, Va
Language: eng
Format: Microform
Number of pages: 70
Subjects: International Organization for Standardization; International Electrotechnical Commission; Standardization -- International cooperation; Trade regulation
Notes: "February 2000."

Shipping list no.: 2000-0762-M.

Includes bibliographical references (p. 69-70).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., 2000 1 microfiche : negative.