Defect analysis in electron microscopy
By: M. H. Loretto and R. E. Smallman.
Contributors: Smallman, R. E., joint author.
Publisher: Chapman and Hall; Wiley : distributed by Halstead Press
Published: 1975
Place of publication: London; New York
Language: eng
Number of pages: 134
Subjects: Crystals -- Defects.; Electron microscopy.
Notes: Bibliography: p. 131.
"A Halsted Press book."
Includes index.