Trap parameter extraction of deep defects in semiconductors using noise measurements
By: by Sheng-Lyang Jang
Published: 1989
Language: eng
Number of pages: 155
Subjects: Electronic noise; Solids; Noise; Defects; Gold; Measurement; Semiconductors
Notes: Typescript.

Vita.

Thesis (Ph. D.)--University of Florida, 1989.

Includes bibliographical references (leaves 151-154)