Electrothermal analysis of VLSI systems
By: Yi-Kan Cheng ... [et al.].
Publisher: Kluwer Academic Publishers
Published: 2002
Place of publication: New York
Language: eng
Format: [electronic resource] /
Number of pages: 210
Subjects: Very large scale integration; Semiconductors; Thermal properties; Complementary Metal oxide semiconductors; Data processing; Mathematical models; Thermal analysis; Metal oxide semiconductors; Integrated circuits
Other titles: EBSCO eBook collection.
Notes: Includes bibliographical references and index.

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