Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA
By: edited by R. Rajsuman and T. Wik ; sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology, in cooperation with the IEEE Solid-State Circuits Society.
Contributors: Rajsuman, Rochit.; Wik, T.; IEEE Computer Society. Technical Committee on VLSI.; IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society.; IEEE Solid-State Circuits Society.
Publisher: IEEE Computer Society Press
Published: 1999
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 131
Subjects: Random access memory -- Congresses.; Semiconductor storage devices -- Testing -- Congresses.
Genres: Congresses.
Other titles: 1999 IEEE International Workshop on Memory Technology, Design, and Testing; Memory technology, design and testing
Notes: "IEEE Computer Society order number PR00259"--T.p. verso.

Includes bibliographical references and index.