Physical principles of electron microscopy
Subtitle: an introduction to TEM, SEM, and AEM
By: Ray F. Egerton.
Publisher: Springer Science+Business Media
Published: 2005
Place of publication: New York
Language: eng
Number of pages: 202
ISBN-13: 9780387258003; 9780387258000
Subjects: Electron microscopy
Description: "Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy, for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy."--BOOK JACKET
Notes: Includes bibliographical references (p. [195]-196) and index.