X-ray spectroscopy
Subtitle: an introduction
By: B.K. Agarwal.
Edition: 2nd ed.
Series: Springer series in optical sciences ;; v. 15
Publisher: Springer-Verlag
Published: 1991
Place of publication: Berlin; New York
Language: eng
Number of pages: 419
Subjects: X-ray spectroscopy.; Spectrum Analysis.; X-Rays.
Description: X-ray spectroscopy has emerged as a powerful tool in research and in industrial laboratories. It is used in the study of metals, semiconductors, amorphous solids, liquids and gases. This comprehensive presentation develops the subject from its basic principles and relates the theory to experimental observations. The new edition includes topics that have recently become important, for example, the X-ray laser, appearance potential spectroscopy, synchrotron radiation and EXAFS of high-Tc superconducting materials. A thorough introduction, up to research level, isprovided to EXAFS, which has seen rapid development in the past few years. This textbook conveniently presents the principles, applications and current techniques of X-ray spectroscopy, which makes it ideal for graduate students beginning research involving x-ray spectroscopy.
Notes: Includes bibliographical references (p. [373]-399) and indexes.