ITC
Subtitle: International Test Conference 1999 proceedings : September 28-30, 1999, New Atlantic City Convention Center, Atlantic City, NJ, USA
By: sponsored by IEEE Computer Society Test Technology Technical Committee, and IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: International Test Conference; IEEE
Published: 1999
Place of publication: Washington, DC; Piscataway New Jersey
Language: eng
Number of pages: 1163
Subjects: Integrated circuits -- Testing -- Congresses; Electronic digital computers -- Circuits -- Testing -- Congresses; Telecommunication -- Congresses; Radio frequency -- Congresses; Embedded computer systems -- Testing -- Congresses; Microprocessors -- Testing -- Congresses
Genres: Congresses.
Other titles: 1999 IEEE International Test Conference; Proceedings International Test Conference 1999
Notes: Cover title.

"IEEE Catalog Number 99CH37034"--verso of T.p.

Includes bibliographical references and author index.