Anomalous X-ray diffraction from semiconductor nanostructure
By: Tobias U. Schüllig.
Series: Schriften der Johannes-Kepler-Universität Linz. Reihe C, Technik und Naturwissenschaften -- 40
Publisher: Trauner
Published: 2003
Place of publication: Linz
Language: eng
Number of pages: 144
Subjects: X-rays -- Diffraction.; Semiconductor nanocrystals.
Notes: Originally presented as the author's thesis (doctoral)--Johannes-Kepler-Universität Linz, 2003.

Includes bibliographical references (p. 134-139).

Abstract also in German.