High-resolution imaging and spectrometry of materials
By: F. Ernst, M. Rühle (eds.).
Contributors: Rühle, Manfred.; Ernst, F. 1938-
Series: Springer series in materials science -- 50; Springer series in materials science -- v. 50.
Publisher: Springer
Published: 2003
Place of publication: Berlin; New York
Language: eng
Number of pages: 440
Subjects: Materials -- Microscopy.; Transmission electron microscopy.
Notes: Includes bibliographical references and index.