Secondary ion mass spectrometry
Subtitle: SIMS VI: proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry, Palais des Congrès, Versailles, Paris, France, September 13-18th, 1987
By: editors A. Benninghove, A.M. Huber, H.W. Werner.
Contributors: Benninghoven, A.; Huber, Alfred, 1918-; Werner, H. W.
Publisher: Wiley
Published: 1988
Place of publication: Chichester
Language: eng
Number of pages: 1078
Subjects: Secondary ion mass spectrometry -- Congresses
Notes: Includes bibliographies and index.