A versatile high-voltage bias supply for extended range MIS C(V) and G(V) measurements
By: Paul Kuczer, Harvey O. Hook, and Alvin M. Goodman.
Contributors: Hook, Harvey O., joint author.; Goodman, Alvin M., joint author.
Series: Semiconductor measurement technology; NBS special publication ; 400-41; NBS special publication ;; 400-41.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1977
Place of publication: Washington
Language: eng
Number of pages: 61
Subjects: Metal insulator semiconductors -- Testing.; Electric meters -- Power supply.; Electric capacity.; Electric conductivity.; High voltages.
Notes: Bibliography: p. 61.