Automation in electronic test equipment
By: Edited by David M. Goodman
Contributors: New York University. School of Engineering and Science. Research Division; New York University. Bureau of Conferences and Institutes
Publisher: Distributed by New York University Press
Published: 1966
Place of publication: New York]
Language: eng
Subjects: Automatic test equipment; Airplanes; Testing; Guided missiles
Notes: "Originally prepared for two successive design courses given in summers of 1960 and 1961 by the Research Division, College of Engineering and the Bureau of Conferences and Institutes, New York University."