Reliability prediction techniques
By: by John B. de Mercado.
Published: 1967
Language: eng
Format: Microform
Number of pages: 81
Subjects: Reliability (Engineering)
Notes: Thesis (M.Sc.)--University of Ottawa.

Includes bibliographical references.

Microfilm. Ottawa. Cenral Microfilm Unit, Public Archives of Canada, 1969. -- 1 reel.