Worst case circuit analysis application guidelines
By: prepared by Reliability Analysis Center ; [authors, Brian Johanson, David Russell, William Swavely].
Contributors: Russell, David.; Swavely, William.; Reliability Analysis Center (U.S.)
Series: Concurrent engineering series
Publisher: The Center
Published: 1993
Place of publication: Rome, NY (P.O. Box 4700, Rome 13442-4700)
Language: eng
Number of pages: 88
Subjects: Electronic circuits -- Testing.; Tolerance (Engineering); Electric circuit analysis.
Notes: "Ordering no. CRTA-WCCA."