Identification and characterization of performance limiting regions in poly-Si wafers used for PV cells
Subtitle: preprint
By: Harvey Guthrey, Brian Gorman, Mowafak Al-Jassim
Contributors: Gorman, Brian; Al-Jassim, Mowafak; Colorado School of Mines; National Renewable Energy Laboratory (U.S.); IEEE Photovoltaic Specialists Conference (37th : 2011 : Seattle, Wash.)
Series: NREL/CP -- 5200-50645; Conference paper (National Renewable Energy Laboratory (U.S.)) -- NREL/CP-5200-50645.
Publisher: National Renewable Energy Laboratory
Published: 2011
Place of publication: Golden, Colo.]
Language: eng
Format: [electronic resource] :
Subjects: Solar cells; Design and construction; Photovoltaic cells; Research
Description: This study demonstrates the usefulness of combining multiple techniques to analyze performance-limiting regions in the poly-Si wafers that are used for photovoltaic (PV) cells. This is done by first identifying performance-limiting regions using macroscale techniques including photoluminescence (PL) imaging, microwave photoconductive decay, and reflectometry), then using smaller-scale techniques such as scanning electron microscopy (SEM), electron backscattered diffraction (EBSD), laser ablation inductively coupled mass spectrometry (LA-ICP-MS), cathodoluminescence (CL), and transmission electron microscopy (TEM) to understand the nature of such regions. This analysis shows that structural defects as well as metallic impurities are present in performance limiting regions, which together act to decrease conversion efficiencies in poly-Si PV cells.
Notes: Title from title screen (viewed August 1, 2011).

"July 2011."

"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011."

Includes bibliographical references (p. 4).

DE-AC36-08GO28308

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