Image pattern recognition
Subtitle: synthesis and analysis in biometrics
By: editors, Svetlana N. Yanushkevich ... [et al.] ; consulting editor, Mark S. Nixon.
Contributors: Yanushkevich, Svetlana N.; Nixon, Mark S.
Series: Series in machine perception and artificial intelligence -- v. 67
Publisher: World Scientific
Published: 2007
Place of publication: Singapore; Hackensack, NJ
Language: eng
Number of pages: 430
ISBN-13: 9789812569080
Subjects: Biometric identification -- Congresses.; Pattern recognition systems -- Congresses.; Pattern recognition systems -- Mathematical models -- Congresses.; Artificial intelligence -- Congresses.; Identification -- Automation -- Congresses.
Genres: Congresses.
Notes: "Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."--P. vi.

Includes bibliographical references and indexes.