TXYZ, a program for semiconductor IC thermal analysis
By: John Albers.
Contributors: United States. National Bureau of Standards.
Series: Semiconductor measurement technology; NBS special publication ;; 400-76
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1984
Place of publication: Washington, D.C
Language: eng
Number of pages: 61
Subjects: Semiconductors -- Thermal properties.; Thermal analysis -- Data processing.; Integrated circuits.
Notes: Includes bibliographical references.
Final.
Distributed to depository libraries in microfiche.
"Issued April 1984."
Item 247 (microfiche)