Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99
Subtitle: 5-9 July, 1999, Orchard Hotel, Singapore]
By: edited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].
Contributors: Chim, Wai Kin.; Radhakrishnan, M. K.; Thong, John.; IEEE Reliability/CPMT/ED Singapore Chapter.
Publisher: IEEE
Published: 1999
Place of publication: Piscataway, New Jersey
Language: eng
Number of pages: 209
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
Genres: Congresses.
Other titles: IPFA '99 proceedings; Physical & failure analysis of integrated circuites; 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits; IPFA '99
Notes: "IEEE Catalog Number 99TH8394"--verso of T.p.

Includes bibliographical references and author index.