Nanophotonics, nanostructure, and nanometrology
Subtitle: 8-10 November 2004, Beijing, China
By: Xing Zhu, Stephen Y. Chou, Yasuhiko Arakawa, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, COS--Chinese Optical Society ; cooperating organizations, Australian Optical Society ... [et al.] ; supporting organizations, National Natural Science Foundation of China ... [et al.].
Contributors: Zhu, Xing, 1950-; Chou, Stephen Yu.; Arakawa, Yasuhiko.; Society of Photo-optical Instrumentation Engineers.; Zhongguo guang xue xue hui.; Australian Optical Society.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Series: Proceedings of SPIE,; v. 5635; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5635.
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 514
Subjects: Nanostructured materials -- Optical properties -- Congresses.; Nanotechnology -- Congresses.; Photonics -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.