Failure mechanisms in semiconductor devices
By: E. Ajith Amerasekera, Farid N. Najm.
Contributors: Najm, Farid N.
Edition: 2nd ed.
Publisher: J. Wiley
Published: 1997
Place of publication: Chichester; New York
Language: eng
Number of pages: 345
Subjects: Semiconductors -- Failures.
Notes: Includes bibliographical references and indexes.