Optical and x-ray studies of critical phenomena in thin liquid crystal films
By: by Suzanne Marie Amador
Published: 1989
Language: eng
Number of pages: 292
Subjects: Liquid crystals; Liquid films; Thin films; Light; Scattering; X-rays; Ellipsometry
Notes: Thesis (Ph. D.)--Harvard University, 1989.

Includes bibliographical references.