Scanning electron microscopy
Subtitle: physics of image formation and microanalysis
By: Ludwig Reimer.
Edition: 2nd completely rev. and updated ed.
Series: Springer series in optical sciences ;; v. 45
Publisher: Springer
Published: 1998
Place of publication: Berlin; New York
Language: eng
Number of pages: 527
Subjects: Scanning electron microscopy
Notes: Includes bibliographical references and index.