X-Ray Radiation of Highly Charged Ions
By: by Heinrich F. Beyer, H.-Jürgen Kluge, Viatcheslav P. Shevelko
Contributors: Kluge, H.-Jürgen; Shevelko, Viatcheslav P.
Series: Springer Series on Atoms+Plasmas -- 19; Springer Series on Atoms+Plasmas -- 19
Publisher: Springer Berlin Heidelberg
Published: 1997
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 235
ISBN-13: 9783642083235; 9783662034958
Subjects: Physics
Description: X-Ray Radiation of Highly Charged Ions is a comprehensive collection of atomic characteristics of highly charged ion (HCI) sources and elementary processes related to X-ray radiation: energy levels, wavelengths, transition probabilities, cross sections, and rate coefficients. The material covers a broad range of elementary processes occuring in hot laboratory and astrophysical plasmas: radiative and dielectronic recombination, radiative electron capture, radiation transfer and excitation, and others. The book comprises a large amount of figures, tables, simple formulas, and if possible scaling laws for radiative and collisional characteristics of HCI. The data presented is useful for specialists who deal with X-ray spectroscopy, physics of HCI, heavy-particle collisions, and thermonuclear fusion.
Notes: Online full text is restricted to subscribers.

Also available in print.

Mode of access: World Wide Web.
Table of contents: title: Introduction; title: Techniques; title: Atomic Structure and Spectra; title: Transition Probabilities; title: Radiative Processes; title: Collisional Processes; title: Appendices; title: References; title: Subject Index.