Microanalysis of extended-test xenon hollow cathodes
By: Timothy R. Verhey and Michael J. Patterson.
Contributors: Patterson, Michael J., 1955-; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 104532.
Publisher: National Aeronautics and Space Administration; For sale by the National Technical Information Service
Published: 1991
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Xenon.; Cathodes.
Other titles: Microanalysis of extended test xenon ....
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-453-M.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1991. 1 microfiche.