Scanning Tunneling Microscopy/Spectroscopy and Related Techniques
Subtitle: 12th International Conference, STM'03 (AIP Conference Proceedings)
Contributors: P.M. Koenraad (Editor); M. Kemerink (Editor)
Edition: 1 edition
Publisher: American Institute of Physics
Published: December 19, 2003
Language: eng
Format: Hardcover
Number of pages: 179
ISBN-13: 9780735401686
Subjects: Microscopy; Science/Mathematics; Physics; Science; Weights & Measures; Spectroscopy & Spectrum Analysis; Electron Microscopes & Microscopy; Science / Weights & Measures; Congresses; Scanning tunneling microscopy; Tunneling spectroscopy