Imaging and illumination for metrology and inspection
Subtitle: 2-4 November 1994, Boston, Massachusetts
By: Donald J. Svetkoff, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Svetkoff, Donald J.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2348; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2348.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 276
Subjects: Computer vision -- Congresses.; Optical detectors -- Congresses.; Interferometry -- Congresses.; Three-dimensional imaging -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.