Laser testing and reliability
Subtitle: 7 November 1991, San Jose, California
By: David L. Begley, S.C. Wang, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Begley, David L.; Wang, S. C. 1934-; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1620; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1620.
Publisher: SPIE
Published: 1992
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 104
Subjects: Semiconductor lasers -- Reliability -- Congresses.; Semiconductor lasers -- Testing -- Congresses.
Notes: Includes bibliographical references and index.