New frontiers in testing
Subtitle: September 12, 13, 14, 1988 Sheraton Washington Hotel, Washington, DC
By: sponsored by The Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society.
Publisher: IEEE Computer Society Press
Published: 1988
Place of publication: Washington, D.C
Language: eng
Number of pages: 1005
Subjects: Integrated circuits -- Testing -- Congresses; Semiconductors -- Testing -- Congresses
Other titles: 1988 IEEE International Test Conference.
Notes: "88CH261-4"

Includes bibliographic references.