Advances in Imaging and Electron Physics, Volume 132 (Advances in Imaging and Electron Physics)
Edition: New Ed edition
Publisher: Academic Press
Published: August 16, 2004
Language: eng
Format: Hardcover
Number of pages: 400
ISBN-13: 9780120147748
Subjects: Applied optics; Science; Science/Mathematics; Electron Microscopes & Microscopy; Engineering - Electrical & Electronic; Mathematical Physics; Science / Electron Microscopes & Microscopy
First sentence: Radiation emitted by a localized source of atomic dimensions is usually observed in the far field with a macroscopic detector such as a photomultiplier tube.