Transmission electron microscopy
Subtitle: physics of image formation and microanalysis
By: Ludwig Reimer.
Edition: 2nd ed.
Series: Springer series in optical sciences ;; v. 36
Publisher: Springer-Verlag
Published: 1989
Place of publication: Berlin; New York
Language: eng
Number of pages: 547
Subjects: Transmission electron microscopy.
Notes: Bibliography: p. [465]-536.
Includes index.