Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
Subtitle: 28-29 August 2007, San Diego, California, USA
By: Angela Duparré, Bhanwar Singh, Zu-Han Gu, editors ; sponsored and published by SPIE
Contributors: Society of Photo-optical Instrumentation Engineers
Series: Proceedings of SPIE -- v. 6672; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6672.
Publisher: SPIE
Published: 2007
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819468208
Subjects: Optical properties; Characterization; Semiconductors; Optoelectronics; Thin films; Optoelectronic devices; Congresses; Optical measurements; Nanotechnology
Notes: Includes bibliographical references and index.