Search and retrieval index to IRPS proceedings, 1979 to 1984
By: prepared by Donald Rash, Richard Wanner.
Contributors: Wanner, Richard.; Reliability Analysis Center (U.S.); International Reliability Physics Symposium.
Series: Technical reliability studies ;; TRS-2A; Technical reliability study ;; TRS-2A.
Publisher: Reliability Analysis Center
Published: 1985
Place of publication: Griffiss Air Force Base, N.Y
Language: eng
Subjects: International Reliability Physics Symposium -- Indexes.; Electronic apparatus and appliances -- Reliability -- Congresses -- Indexes.; Electronic apparatus and appliances -- Testing -- Congresses -- Indexes.; Integrated circuits -- Reliability -- Congresses -- Indexes.; Integrated circuits -- Testing -- Congresses -- Indexes.