Transmission Electron Microscopy and Diffractometry of Materials
By: by Brent Fultz, James Howe
Contributors: Howe, James; SpringerLink (Online service)
Edition: 4th ed. 2013.
Series: Graduate Texts in Physics
Publisher: Springer Berlin Heidelberg; Imprint: Springer
Published: 2013
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
Number of pages: 761
ISBN-13: 9783642297618
Subjects: Characterization and Evaluation of Materials; Spectrum analysis; Surfaces (Physics); Thin Films Surfaces and Interfaces; Spectroscopy and Microscopy; Spectroscopy/Spectrometry; Physics; Thin Films Surface and Interface Science
Description: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. <br><br>
Table of contents: title: <p>Diffraction and X-Ray Powder Diffractometer Problems; title: TEM and its Optics Problems; title: Neutron Scattering Problems; title: Scattering Problems; title: Inelastic Electron Scattering and Spectroscopy Problems; title: Diffraction from Crystals Sphere Problems; title: Electron Diffraction and Crystallography Problems; title: Diffraction Contrast in TEM Images Problems; title: Diffraction Lineshapes Problems; title: Patterson Functions and Diffuse Scattering Problems; title: High-Resolution TEM Imaging Problems; title: High-Resolution STEM and Related Imaging Techniques Problems; title: Dynamical Theory Problems.</p>.