Neural Models and Algorithms for Digital Testing
By: by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushneil
Contributors: Agrawal, Vishwani D.; Bushneil, Michael L.
Series: The Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 140; Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 140.
Publisher: Springer US
Published: 1991
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 184
ISBN-13: 9781461367673; 9781461539582
Subjects: Computer engineering; Computer-aided design; Computer science
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