High-resolution imaging and spectrometry of materials
By: F. Ernst, M. Rühle (eds.).
Contributors: Rühle, Manfred.; Ernst, F. 1938-
Series: Springer series in materials science -- 50.; Springer series in materials science -- v. 50.
Publisher: Springer
Published: 2003
Place of publication: Berlin; New York
Language: eng
Number of pages: 440
Subjects: Materials -- Microscopy; Transmission electron microscopy
Description: "This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students."--BOOK JACKET.
Notes: Includes bibliographical references and index.