Advances in X-Ray Analysis
Subtitle: Volume 38
By: edited by Paul K. Predecki, D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan, Deane K. Smith
Contributors: Bowen, D. Keith; Gilfrich, John V.; Goldsmith, Charles C.; Huang, Ting C.; Jenkins, Ron; Noyan, I. Cev; Smith, Deane K.
Publisher: Springer US
Published: 1995
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 814
ISBN-13: 9781461517979