Yield modelling and defect tolerance in VLSI
Subtitle: papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987
By: edited by Will Moore, Wojciech Maly, and Andrzej Strojwas.
Contributors: Moore, Will.; Maly, W.; Strojwas, Andrzej J.
Publisher: A. Hilger
Published: 1988
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 282
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.