Transmission Electron Microscopy and Diffractometry of Materials
By: by Brent Fultz, James M. Howe
Contributors: Howe, James M., author; SpringerLink (Online service)
Edition: Second Edition.
Published: 2002
Language: eng
Format: [electronic resource] /
Number of pages: 748
ISBN-13: 9783662049013
Subjects: Materials science; Solid state physics; Crystallography; Thin Films Surfaces and Interfaces; Spectroscopy and Microscopy; Surfaces (Physics); Characterization and Evaluation of Materials
Description: This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD.
Table of contents: title: Contens; title: 1 Diffraction and the X-Ray Powder Diffractometer; title: 2 The TEM and its Optics; title: 3 Scattering; title: 4 Inelastic Electron Scattering and Spectroscopy; title: 5 Diffraction from Crystals; title: 6 Electron Diffraction and Crystallography; title: 7 Diffraction Contrast in TEM Images; title: 8 Diffraction Lineshapes; title: 9 Patterson Functions and Diffuse Scattering; title: 10 High-Resolution TEM Imaging; title: 11 Dynamical Theory; title: Further Reading; title: References and Figures; title: A Appendix; title: A.1 Indexed Powder Diffraction Patterns; title: A.3 Atomic Form Factors for X-Rays; title: A.4 X-Ray Dispersion Corrections for Anomalous Scattering; title: A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages; title: A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp; title: A.7 Stereographic Projections; title: A.8 Examples of Fourier Transforms; title: A.10 Numerical Approximation for the Voigt Function; title: A.11 Debye—Waller Factor from Wave Amplitude; title: A.12 Review of Dislocations; title: A.13 TEM Laboratory Exercises; title: A.13.1 Preliminary — JEOL 2000FX Daily Operation.; title: A.13.2 Preliminary — Philips 400T Daily Operation; title: A.13.6 Laboratory 4 — Contrast Analysis of Defects; title: A.14 Fundamental and Derived Constants.