2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Subtitle: proceedings : 24-26 October, 2001, San Francisco, California
By: sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee.
Contributors: IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: IEEE Computer Society Press
Published: 2001
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 468
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: International Symposium on Defect and Fault Tolerance in VLSI Systems.; Defect and fault tolerance in VLSI systems.; DFT 2001.
Notes: "IEEE Computer Society Order Number PR01203"--T.p. verso.

Includes bibliographical references and author index.

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