21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Subtitle: proceedings : Arlington, Virginia, USA, October 4-6, 2006
By: [edited by Nohpill Park ... [et al.]] ; sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing.
Contributors: Park, Nohpill.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee
Publisher: IEEE Computer Society Press
Published: 2006
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 583
Subjects: Integrated circuits -- Very large scale integration -- Design and construction. -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: International Symposium on Defect and Fault Tolerance in VLSI Systems; Defect and fault tolerance in VLSI systems; DFT'06
Notes: "IEEE Computer Society Order Number P2706"--T.p. verso.

Includes bibliographical references and author index.