The NIST X-ray photoelectron spectroscopy (XPS) database
By: Charles D. Wagner.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1289; NIST technical note -- 1289.
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 1991
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 65
Subjects: National Institute of Standards and Technology (U.S.) -- Databases.; X-ray spectroscopy -- Databases.; Photoelectron spectroscopy -- Databases.
Genres: Databases.
Notes: Paper version no longer for sale by the Supt. of Docs.

Distributed to depository libraries in microfiche.

Shipping list no.: 92-2029-M.

"October 1991."

Includes bibliographical references.

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.