Leakage in Nanometer CMOS Technologies (Series on Integrated Circuits and Systems)
Contributors: Siva G. Narendra (Editor); Anantha Chandrakasan (Editor)
Publisher: Springer
Published: November 17, 2005
Language: eng
Number of pages: 317
ISBN-13: 9780387257372
First sentence: Benefits of CMOS technology scaling in the nanometer regime comes with the disruptive consequence of increasing MOS transistor leakages.