Osnovy analiza poverhnosti i tonkih plenok
By: L. Feldman, D. Majer ; per. s angl. V. A. Arkad'eva i L. I. Ogneva ; pod red. V. V. Belošickogo
Contributors: Mayer, James W. (1930- ).; Belošickij, V. V. Red
Publisher: "Mir"
Published: 1989
Place of publication: Moskva
Language: rus
Number of pages: 342
ISBN-13: 9785030010175
Subjects: Powierzchnie (technologia); Warstwy cienkie (fizyka); Analiza
Other titles: Fundamentals of surface and thin film analysis