Description of a CMOS test chip, NBS-39
By: T.J. Russell.
Contributors: United States. National Bureau of Standards.
Series: NBSIR -- 83-2683.; NBSIR -- 2683.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1983
Place of publication: Washington, DC
Language: eng
Number of pages: 32
Subjects: Integrated circuits.; Microelectronics.
Other titles: Description of a C.M.O.S. test chip, NBS-39.
Notes: "April 1983."

Includes bibliographical references.