On Line-Testing for VLSI
Contributors: Michael Nicolaidis (Editor); Yervant Zorian (Editor); Dhiraj K. Pradhan (Editor)
Edition: 1st edition
Publisher: Springer
Published: April 30, 1998
Language: eng
Format: Hardcover
Number of pages: 164
ISBN-13: 9780792381327
Subjects: Electronic devices & materials; General Theory of Computing; Technology & Industrial Arts; Electronics - Circuits - VLSI; Electronic circuit design; Technology; Science/Mathematics; Engineering - Electrical & Electronic; Technology / Electronics / Circuits / General; Technology / Electronics / Circuits / VLSI; Technology : Engineering - Electrical & Electronic; Testing; Data processing; Electronics - Circuits - General; Electronic circuits; Online data processing
First sentence: Concurrent checking verifies circuits during their normal operation.