Advances in X-Ray Analysis
Contributors: John V. Gilfrich (Editor); Ting C. Huang (Editor); C.R. Hubbard (Editor); M.R. James (Editor); Ron Jenkins (Editor); G.R. Lachance (Editor); Deane K. Smith (Editor)
Edition: 1 edition
Publisher: Springer
Published: July 31, 1993
Language: eng
Format: Hardcover
Number of pages: 710
ISBN-13: 9780306445712
Subjects: Chemical spectroscopy, spectrochemistry; Mechanical Properties Of Materials; Structural Properties Of Materials; Science; Medical / Nursing; Science/Mathematics; General; Material Science; Science / Chemistry / Analytic; Chemistry - Analytic