Radiation effects in electronics.
Contributors: American Nuclear Society. Niagara Finger Lakes Section.; ASTM Committee E-10 on Radioisotopes and Radiation Effects.
Series: ASTM special technical publication; no. 384
Publisher: American Society for Testing and Materials
Published: 1965
Place of publication: Philadelphia
Language: eng
Number of pages: 236
Subjects: Semiconductors -- Effect of radiation on.; Electronic apparatus and appliances -- Effect of radiation on.
Notes: Includes bibliographical references.
Consists of the major portion of the transactions of the joint meeting of ASTM Committee E-10 on Radioisotopes and Radiation Effects, and the Niagara-Finger Lakes Section of the American Nuclear Society held in Syracuse, N.Y., Oct. 5-7, 1964.