Atomic resolution microscopy of surfaces and interfaces
Subtitle: symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A.
By: editor, David J. Smith.
Contributors: Smith, David J., 1948-
Series: Materials Research Society symposium proceedings,; v. 466; Materials Research Society symposia proceedings ;; v. 466.
Publisher: Materials Research Society
Published: 1997
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 282
Subjects: Materials -- Microscopy -- Congresses.; Atom-probe field ion microscopy -- Congresses.
Notes: Includes bibliographical references and indexes.