Applied scanning probe methods
By: Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].
Contributors: Bhushan, Bharat, 1949-; Fuchs, H.; Hosaka, Sumio.
Series: Nanoscience and technology
Publisher: Springer
Published: 2004
Place of publication: Berlin; New York
Language: eng
Number of pages: 496
Subjects: Materials -- Microscopy.; Scanning probe microscopy.
Notes: Includes bibliographical references and index.