Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
By: by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
Contributors: Tan, Sheldon X. D.; Yu, Hao; SpringerLink (Online service)
Publisher: Springer US
Published: 2012
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
ISBN-13: 9781461407881
Subjects: Systems engineering; Computer-Aided Engineering (CAD, CAE) and Design; Engineering; Nanotechnology and Microengineering; Computer-aided design; Circuits and Systems