2006 IEEE International Integrated Reliability Workshop final report
Subtitle: Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society; IEEE Reliability Society.
Publisher: Electron Devices Society; Reliability Society of the Institute of Electrical and Electronics Engineers
Published: 2006
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 230
Subjects: Integrated circuits -- Reliability -- Congresses; Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
Genres: Congresses.
Notes: "IEEE Catalog No.: 06TH8877"--T.p. verso.

Includes bibliographical references and index.