International Symposium on Electron Microscopy, Beijing, China October 22-23, 1990
Subtitle: [proceedings]
By: editors, Kehsin Kuo and Junen Yao.
Contributors: Kuo, Kʻo-hsin.; Yao, Chün-en.
Publisher: World Scientific
Published: 1991
Place of publication: Singapore; Teaneck, N.J
Language: eng
Number of pages: 478
Subjects: Electron microscopy -- Congresses.; Electron microscopy -- Technique -- Congresses.; Electron microscopy -- China -- Congresses.
Other titles: Electron microscopy
Notes: Includes bibliographical references.