Nonlinear-optical diagnostics of semiconductor film crystal structures
By: V.V. Balaniuk ... [et al.]
Series: Preprint / Akademii͡a nauk SSSR, Sibirskoe otdelenie, Institut avtomatiki i ėlektrometrii -- no 457; Preprint (Institut avtomatiki i ėlektrometrii (Akademii͡a nauk SSSR)) -- no 457
Publisher: In-t avtomatiki i ėlektrometrii SO AN SSSR
Published: 1990
Place of publication: Novosibirsk
Language: eng
Subjects: Nonlinear optics; Semiconductor films
Notes: Includes bibliographical references (p. [9])