X-ray measurements of stresses and defects in EFG and large grained polycrystalline silicon ribbons
Contributors: Wagner, C. N. J; United States. Dept. of Energy
Series: DOE/JPL ; 954851-1
Publisher: Dept. of Energy; for sale by the National Technical Information Service
Published: 1978
Place of publication: [Washington]; Springfield, Va
Language: eng
Subjects: Silicon -- Defects -- Measurement; Residual stresses
Notes: Author: C. N. J. Wagner

Contract no. NAS-7-100-954851
Table of contents: First quarterly report