Dosimetry for high dose applications
By: Jimmy C. Humphreys, Dene Hocken, William L. McLaughlin.
Contributors: Hocken, Dene.; McLaughlin, William L.; National Institute of Standards and Technology (U.S.)
Series: NBS measurement services; NBS special publication -- 250-11.
Publisher: U.S. Dept. of Commerce, National Bureau of Standards
Published: 1988
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 31
Subjects: Ionizing radiation -- Measurement -- Standards.; Dosimeters -- Standards.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 92-1419-M.

Paper version no longer for sale by the Supt. of Docs.

"Issued March 1988."

"Coden: XNBSAV"--T.p. verso.

Includes bibliographical references (p. 30-31).

Final.

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative.