Advances in X-Ray Analysis
Subtitle: Volume 31
By: edited by Charles S. Barrett, John V. Gilfrich, Ron Jenkins, John C. Russ, James W. Richardson, Paul K. Predecki
Contributors: Gilfrich, John V.; Jenkins, Ron; Russ, John C.; Richardson, James W.; Predecki, Paul K.
Publisher: Springer US
Published: 1988
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] :
Number of pages: 542
ISBN-13: 9781461310358
Subjects: Physics