Reliability of nanoscale circuits and systems
Subtitle: methodologies and circuit architectures
By: Milos Stanisavljevic, Alexandre Schmid, Yusuf Leblebici
Contributors: Schmid, Alexandre; Leblebici, Yusuf
Publisher: Springer
Published: 2011
Place of publication: New York
Language: eng
Number of pages: 195
ISBN-13: 9781441962164
Subjects: Nanoelectromechanical systems; Nanoelectronics; Reliability
Notes: Includes bibliographical references (p. 177-190) and index.