Materials reliability in microelectronics VI
Subtitle: symposium held April 8-12, 1996, San Francisco, California, U.S.A.
By: editors, William F. Filter ... [et al.].
Contributors: Filter, William F.
Series: Materials Research Society symposium proceedings -- v. 428; Materials Research Society symposia proceedings -- v. 428.
Publisher: Materials Research Society
Published: 1996
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 583
Subjects: Microelectronics -- Reliability -- Congresses.; Microelectronics -- Materials -- Testing -- Congresses.; Microstructure -- Congresses.; Metallizing -- Congresses.
Other titles: Materials reliability in microelectronics six; Materials reliability in microelectronics 6
Notes: Includes bibliographical references and indexes.