Surface and Interface Characterization by Electron Optical Methods
By: edited by A. Howie, U. Valdrè
Contributors: Valdrè, U.
Series: NATO ASI Series, Series B: Physics -- 16; NATO ASI series -- 16.
Publisher: Springer US
Published: 1989
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
ISBN-13: 9781461595373
Subjects: Physics