International Test Conference 1989: Meeting the Tests of Time : August 29-31, 1989, Sheraton Washington Hotel, Washington Dc 
Subtitle: Proceedings (International Test Conference//Proceedings)
Publisher: Ieee Computer Society
Published: August 1989
Language: eng
Format: Hardcover
Number of pages: 994
ISBN-13: 9780818689628
Subjects: Nanotechnology; Testing of materials; Electronic Engineering (Specific Aspects); Automatic test equipment; Congresses; Integrated circuits; Testing; Science/Mathematics