2010 25th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2010
Subtitle: proceedings, 6-8 October 2010, Kyoto, Kyoto, Japan
By: sponsored by The IEEE Computer Society Technical Committee on Fault Tolerant Computing, The IEEE Computer Society Test Technology Technical Council ; edited by Glenn Chapman ... [et al.].
Contributors: Chapman, Glenn; IEEE Computer Society. Test Technology Technical Committee; IEEE Computer Society. Fault-Tolerant Computing Technical Committee; IEEE Computer Society
Publisher: IEEE Computer Society Press
Published: 2010
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 449
ISBN-13: 9780769542430
Subjects: Very large scale integration; Design and construction; Congresses; Integrated circuits; Fault-tolerant computing
Other titles: Defect and fault tolerance in VLSI systems; 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; DFT 2010
Notes: "IEEE Computer Society Press Order Number P4243 "-- t.p. verso.

Includes bibliographical references and author index.