Fault classes and error detection in specification based testing
By: D. Richard Kuhn.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NISTIR -- 6140.
Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
Published: 1998
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 23
Subjects: Computer software -- Testing; Debugging in computer science
Notes: Shipping list no.: 98-0864-M.

"February 1998."

Includes bibliographical references (p. 18-20).

Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998] 1 microfiche : negative.