Advanced photon and particle techniques for the characterization of defects in solids
Subtitle: symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A.
By: editors, J.B. Roberto, R.W. Carpenter, M.C. Wittels.
Contributors: Roberto, J. B.; Carpenter, R. W.; Wittels, M. C.
Series: Materials Research Society symposia proceedings,; v. 41
Publisher: Materials Research Society
Published: 1985
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 390
Subjects: Crystals -- Defects -- Congresses.; Electron microscopy -- Congresses.; Proton beams -- Congresses.; Particle beams -- Congresses.
Notes: Includes bibliographies and indexes.