Digest of papers 1973 Symposium on Semiconductor Memory Testing, October 2 and 3, 1973, Rickshaw Inn, Cherry Hill, N.J.
By: sponsored by the IEEE Computer Society Mideastern Area Committee and the Philadelphia Chapter of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: Institute of Electrical and Electronics Engineers. Computer Society. Mideastern Area Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Chapter.
Publisher: I.E.E.E.
Published: 1973
Place of publication: New York
Language: eng