Advances in x-ray analysis.
By: edited by John V. Gilfrich ... (et al.).
Contributors: Gilfrich, John V.; Conference on Applications of X-Ray Analysis, (42nd : 1993 : Denver, Colo.)
Publisher: Plenum Press
Published: 1994
Place of publication: New York; London
Language: eng
Number of pages: 756
Subjects: X-ray spectroscopy -- Congresses.; X-rays -- Industrial applications -- Congresses.
Notes: Proceedings of the forty-second annual Conference on Applications of X-Ray Analysis, held August 2-6, 1993, in Denver, Colorado - t.p.v.