Atomic force microscopy/scanning tunneling microscopy
By: edited by Samuel H. Cohen, Mona T. Bray, and Marcia L. Lightbody.
Contributors: Cohen, Samuel H.; Bray, Mona T.; Lightbody, Marcia L.; U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium (1st : 1993 : Natick, Mass.)
Publisher: Plenum Press; Springer
Published: 1994
Place of publication: New York
Language: eng
Number of pages: 453
Subjects: Atomic force microscopy; Scanning tunneling microscopy
Notes: Includes bibliographical references and index.
"Proceedings of the First U.S. Army Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 8-10, 1993, in Natick, Massachusetts"--T.p. verso.