The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages
By: George G. Harman ; sponsored by Naval Avionics Center.
Contributors: Naval Avionics Center (U.S.); United States. National Bureau of Standards.
Series: NBS special publication ;; 400-70; Semiconductor measurement technology
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; National Technical Information Service, distributor]
Published: 1982
Place of publication: Washington, D.C; [Springfield, VA
Language: eng
Number of pages: 73
Subjects: Integrated circuits -- Testing.; Acoustic emission testing.
Notes: Includes bibliographical references.
"Issued May 1982."
Item 247 (microfiche)