Advances in x-ray analysis.
Contributors: Russ, John C.; University of Denver. Research Institute.; University of Denver. Department of Chemistry.
Publisher: Plenum Press
Published: 1982
Place of publication: New York
Language: eng
Number of pages: 398
Notes: Proceedings of the 30th Annual Conference on Applications of X-Ray Analysisheld in Denver, Colorado, August 3-7, 1981.