Stress-induced phenomena in metallization
Subtitle: second international workshop, Austin, TX, March 1993
By: editors, Paul S. Ho, Che-Yu Li, Paul Totta.
Contributors: Ho, P. S.; Li, Che-Yu.; Totta, Paul.
Series: AIP conference proceedings -- no. 305.
Publisher: American Institute of Physics
Published: 1994
Place of publication: New York
Language: eng
Number of pages: 302
Subjects: Semiconductors -- Defects -- Congresses.; Metallic films -- Congresses.; Thin film devices -- Defects -- Congresses.; Aluminum films -- Congresses.
Genres: Congresses.
Notes: "DOE CONF-9303142"--T.p. verso.

Includes bibliographical references and index.