Development of Test-Analysis Models (TAM) for correlation of dynamic test and analysis results
By: Filippo Angelucci, Mehzad Javeed, and Paul McGowan.
Contributors: Javeed, Mehzad.; McGowan, Paul E.; Langley Research Center.
Series: NASA technical memorandum -- 104228
Publisher: National Aeronautics and Space Administration, Langley Research Center
Published: 1992
Place of publication: Hampton, Va
Language: eng
Format: Microform
Subjects: Testing -- Data processing.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 91-1811-M.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1992. 2 microfiches.