High-level test synthesis of digital VLSI circuits
By: Mike Tien-Chien Lee.
Series: The Artech House solid-state technology library
Publisher: Artech House
Published: 1997
Place of publication: Boston
Language: eng
Number of pages: 220
Subjects: Integrated circuits -- Very large scale integration -- Computer-aided design.; Integrated circuits -- Very large scale integration -- Testing -- Data processing; Digital integrated circuits -- Testing -- Data processing.
Notes: Includes bibliographical references (p. 199-214) and index.