Measurements and design of high power devices and systems
Subtitle: 16 June 2006, Renaissance Parc 55, San Francisco, CA
By: ARFTG Microwave Measurements Conference, general chair, Ken Wong ; technical program chair, Mohamed Sayed
Contributors: Wong, Ken (Kenneth H.); Institute of Electrical and Electronics Engineers
Publisher: IEEE
Published: 2006
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 266
ISBN-13: 9780780395299
Subjects: Microwave measurements; Congresses; Microwave circuits; Millimeter waves; Millimeter wave devices; Wireless communication systems; Design and construction
Other titles: 2006 67th ARFTG Conference; 67th ARFTG Microwave Measurements Conference
Notes: "IEEE catalog number: CFP06ARF-PRT"--T.p. verso

Includes bibliographical references.