Trap level spectroscopy in amorphous semiconductors
By: Viktor I. Mikla and Victor V. Mikla
Contributors: Mikla, Victor V.
Edition: 1st ed.
Series: Elsevier insights; Elsevier insights
Publisher: Elsevier
Published: 2010
Place of publication: London; Burlington, MA
Language: eng
Number of pages: 120
ISBN-13: 9780123847157
Subjects: Amorphous semiconductors; Spectra; Defects; Analysis; Deep level transient spectroscopy
Notes: Includes bibliographical references.
Table of contents: title: Defect states spectroscopy in amorphous semiconductors; title: Thermally stimulated depolarziation currents in amorphous chalcogenides; title: Carrier transport processs in amorphous solids; title: Time-of-flight experiments in amorphous chalcogenide semicondutors; title: Xerographic spectroscopy of state in mobility gap; title: Photoinduced effects on states in the mobility gap; title: Spectroscopic studies of gap states and laser-induced structural transformations in Se-based As-free amorphous semiconductors.