An automated photovoltaic system for the measurement of resistivity variations in high-resistivity circular silicon slices.
Contributors: United States. Department of Energy. Division of Electric Energy Systems.
Series: Semiconductor measurement technology; Special publication -- 400-52.
Publisher: National Bureau of Standards
Published: 1979
Place of publication: Washington, D.C
Language: eng
Notes: 'This activity was supported by The Department ofEnergy, Division of Electric, Energy Systems, Washington, D.C.'.