Transmission electron microscopy and diffractometry of materials
By: Brent Fultz, James Howe.
Contributors: Howe, James M., 1955-
Edition: 2nd ed.
Publisher: Springer
Published: 2002
Place of publication: Berlin; New York
Language: eng
Number of pages: 748
Subjects: Materials -- Microscopy; Transmission electron microscopy; X-ray diffractometer
Notes: Includes bibliographical references and index.