Electrostatic discharge susceptibility data
By: prepared by Reliability Analysis Center.
Contributors: Crowell, William H.; Reliability Analysis Center (U.S.)
Publisher: The Center
Published: 1991
Place of publication: Rome, NY (PO Box 4700, Rome 13440-8200)
Language: eng
Subjects: Electronic circuits -- Testing.; Electric discharges.; Electrostatics.; Electronic apparatus and appliances -- Protection.
Notes: Includes bibliographical references and indexes.
Updated ed. of: Electrostatic discharge susceptibility data / William H. Crowell.
"Under contract to Rome Air Development Center."
"Ordering no.: VZAP-91."