Scientific detection of fakery in art II
Subtitle: 20-21 September 1999, Boston, Massachusetts
By: Duane R. Chartier, Walter McCrone, Richard J. Weiss, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Chartier, Duane R.; McCrone, Walter C.; Weiss, Richard J. 1923-; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series,; v. 3851; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3851.
Publisher: The Society
Published: 2000
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 82
Subjects: Art -- Forgeries -- Congresses.; Art -- Expertising -- Congresses.; Art and science -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.