Fault-sensitivity and wear-out analysis of VLSI sensitivity
By: Gwan Seung Choi.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA contractor report -- NASA CR-196474.
Publisher: Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign; National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1994
Place of publication: [Urbana, IL]; [Washington, DC; Springfield, Va
Language: eng
Format: Microform
Subjects: Chips (Electronics); Failure analysis.; Monte Carlo method.; Statistical analysis.; Switching circuits.; Very large scale integration.
Other titles: Fault sensitivity and wear out analysis of VLSI sensitivity.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 95-0062-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 2 microfiches.