Scanning microscopy technologies and applications
By: E. Clayton Teague, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating sponsor, American Society for Precision Engineering.
Contributors: Teague, E. C. 1941-; Society of Photo-optical Instrumentation Engineers.; American Society for Precision Engineering.
Series: Proceedings of SPIE--the International Society for Optical Engineering ;; v. 897
Publisher: SPIE
Published: 1988
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 218
Subjects: Scanning electron microscopy -- Congresses.
Notes: Includes bibliographies and index.
"13-15 January 1988, Los Angeles, California."