1995 IEEE International Reliability Physics Proceedings
Subtitle: 33rd Annual Las Vegas, Nevada, April 4, 5, 6, 1995 (International Reliability Physics Symposium Proceedings)
Publisher: Institute of Electrical & Electronics Enginee
Published: December 1995
Language: eng
Format: Paperback
Number of pages: 405
ISBN-13: 9780780320314
Subjects: Circuits & components; Electronic devices & materials; Engineering (General); Electronic Apparatus And Devices; Reliability Engineering; Technology & Industrial Arts; Computer Books: General