Cryogenic measurements of aerojet GaAs n-JFETs
By: John H. Goebel and Theodore T. Weber.
Contributors: Weber, Theodore T.; Ames Research Center.
Series: NASA technical memorandum -- 103972.
Publisher: National Aeronautics and Space Administration, Ames Research Center; National Technical Information Service, distributor
Published: 1993
Place of publication: Moffett Field, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Gallium arsenide semiconductors.; Low temperature research.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 94-0069-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1993] 1 microfiche.