Optical fabrication, testing and metrology
Subtitle: 30 September-3 October 2003
By: Roland Geyl, David Rimmer, Lingli Wang, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, EOS--European Optical Society, GIFO--Groupement des Industries Française d'Optique (France), [and] SFO--Société Française d'Optique (France).
Contributors: Geyl, Roland.; Rimmer, David.; Wang, Lingli.; Society of Photo-optical Instrumentation Engineers.; European Optical Society.; Groupement des industries française d'optique.; Société française d'optique.
Series: SPIE proceedings series,; v. 5252; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5252.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 518
Subjects: Optical instruments -- Design and construction -- Congresses.; Optical instruments -- Testing -- Congresses.; Optical materials -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Other titles: Optical fabrication and testing.
Notes: Includes bibliographical references and author index.
Earlier conferences have title: Optical fabrication and testing.