Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Edition: 1 edition
Publisher: Springer
Published: February 28, 2003
Language: eng
Format: Hardcover
Number of pages: 180
ISBN-13: 9781402072352
Subjects: Electronic devices & materials; Semiconductors; Integrated circuits, Very larg; Testing; Electronics - Circuits - VLSI; Technology; Computers - General Information; Science/Mathematics; Protection; Integrated circuits, Very large scale integration; Engineering - Electrical & Electronic; General; Logic Design; Technology / Electronics / Circuits / General; Thermal properties
First sentence: The topic of this book is power-constrained testing of very large scale integrated (VLSI) circuits.