Hierarchical test generation for digital circuits represented by decision diagrams
By: Jaan Raik
Publisher: Tallinn Technical University
Published: 2001
Place of publication: Tallinn
Language: eng
Number of pages: 108
Subjects: Digital integrated circuits; Charts, diagrams; Testing; Flow charts; Decision trees
Notes: Originally presented as author's thesis (doctoral)--Tallinn Technical University, 2001.

Includes bibliographical references.