ToF-SIMS
Subtitle: surface analysis by mass spectrometry
By: edited by John C. Vickerman and David Briggs.
Contributors: Vickerman, J. C.; Briggs, D. 1948-; SurfaceSpectra Limited.
Publisher: IM Pub.; SurfaceSpectra
Published: 2001
Place of publication: Chichester
Language: eng
Number of pages: 789
Subjects: Surfaces (Technology) -- Analysis.; Mass spectrometry.
Notes: Includes bibliographical references and index.