Introduction to ID̳D̳Q̳ testing
By: by Sreejit Chakravarty and Paul J. Thadikaran.
Contributors: Thadikaran, Paul J.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1997
Place of publication: Boston
Language: eng
Number of pages: 322
Subjects: Iddq testing; Digital integrated circuits -- Testing; Integrated circuits -- Very large scale integration -- Testing
Notes: Includes bibliographical references (p. 287-315) and index.
On t.p. "D̳D̳Q̳" is subscript.