Ellipsometric study of YBa₂Cu₃O₇₋x laser ablated and co-evaporated films
By: S.A. Alterovitz ... [et al.] ; prepared for the International Conference on Electronic Materials 1990, sponsored by the Materials Research Society, Newark, New Jersey, September 17-19, 1990.
Contributors: Alterovitz, Samuel A.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 103223.
Publisher: NASA; For sale by the National Technical Information Service
Published: 1990
Place of publication: [Washington, D.C.]; [Springfield, Va
Language: eng
Format: Microform
Subjects: High temperature superconductors.; Ellipsometry.; Ablation.; Annealing.; Barium oxides.; Copper oxides.; Dielectric properties.; Ellipsometers.; Evaporation.; Film thickness.; Laser applications.; Optical properties.; Superconducting films.; Ytterbium compounds.
Notes: Cover title.

Distributed to depository libraries in microfiche.

Includes bibliographical references (p. 6).

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration, 1990] 1 microfiche : negative.

505-44-2C.