Charged semiconductor defects
Subtitle: structure, thermodynamics and diffusion
By: Edmund G. Seebauer, Meredith C. Kratzer.
Contributors: Kratzer, Meredith C.
Series: Engineering materials and processes; Engineering materials and processes
Publisher: Springer
Published: 2009
Place of publication: London
Language: eng
Number of pages: 294
ISBN-13: 9781848820586; 9781848820593
Subjects: Semiconductors -- Defects
Notes: Includes bibliographical references and index.