Integration of test with design and manufacturing
Subtitle: International Test Conference, 1987, proceedings, September 1, 2, 3, 1987
By: sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section
Publisher: IEEE Computer Society Press
Published: 1987
Place of publication: Washington, D.C
Language: eng
Format: Microform
Number of pages: 1151
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Genres: Congresses.
Notes: "IEEE catalog no. 87CM2347-2."

Includes bibliographies and index.