Secondary ion mass spectrometry
Subtitle: SIMS IV : proceedings of the fourth international conference, Osaka, Japan, November 13-19, 1983
By: editors: A. Benninghoven ... [et al.].
Contributors: Benninghoven, A.; Nihon Gakujutsu Shinkōkai.
Series: Springer series in chemical physics -- 36.; Springer series in chemical physics -- v. 36.
Publisher: Springer-Verlag
Published: 1984
Place of publication: Berlin; New York
Language: eng
Number of pages: 503
Subjects: Secondary ion mass spectrometry -- Congresses.
Notes: Includes bibliographies and index.