Terrestrial neutron-induced soft errors in advanced memory devices
By: Takashi Nakamura ... [et al.].
Contributors: Nakamura, Takashi, 1939-
Publisher: World Scientific
Published: 2008
Place of publication: Hackensack, NJ
Language: eng
Number of pages: 343
ISBN-13: 9789812778819
Subjects: Semiconductor storage devices; Neutron irradiation; Radiation dosimetry; Nuclear physics
Notes: Includes bibliographical references (p. 291-315) and index.
Table of contents: title: Introduction; title: Terrestrial neutron spectrometry and dosimetry; title: Irradiation testing in the terrestrial field; title: Neutron irradiation test facilities; title: Review and discussion of experimental data; title: Monte Carlo simulation methods; title: Simulation results and their implications; title: International standardization of the neutron test method; title: Summary and challenges.