Microscopic Identification of Electronic Defects in Semiconductors
Subtitle: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)
Publisher: Materials Research Society
Published: September 1985
Language: eng
Format: Hardcover
Number of pages: 604
ISBN-13: 9780931837111
Subjects: Congresses; Defects; Microscopy; Semiconductors