Scanning electron microscopy/1982/IV
Subtitle: an international journal of scanning electron microscopy, related techniques, and applications. .
By: Guest editors, R.M. Albrecht, J.D. Shelburne, J.D. Meakin
Publisher: Scanning Electron Microscopy
Published: 1982
Place of publication: Chicago, Ill
Language: eng
Number of pages: 1815
ISBN-13: 9780931288265
Subjects: Scanning electron microscopes
Other titles: International journal of scanning electron microscopy, related techniques, and applications
Notes: Includes bibliographical references and indexes.