ICMTS 2001
Subtitle: proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 2001
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 271
Subjects: Integrated circuits -- Testing -- Congresses; Semiconductors -- Testing -- Congresses; Electronic apparatus and appliances -- Testing -- Congresses
Genres: Congresses.
Other titles: 2001 IEEE International Conference on Microelectronic Test Structures.; Microelectronic test structures.; Microelectronic Test Structures, 2001, ICMTS 2001, Proceedings of the 2001 International Conference on.
Notes: "IEEE Catalog Number: 01CH37153"--T.p. verso.

Includes bibliographical references and author index.

Also available via the World Wide Web: http://www.ee.ed.ac.uk./ICMTS.

Also available via the World Wide Web with additional title: Microelectronic Test Structures, 2001, ICMTS 2001, Proceedings of the 2001 International Conference on.