Semiconductor Device Reliability
By: edited by A. Christou, B.A. Unger
Contributors: Unger, B. A.
Series: NATO ASI Series, Series E: Applied Sciences, 0168-132X -- 175; NATO ASI series -- 175.
Publisher: Springer Netherlands
Published: 1989
Place of publication: Dordrecht
Language: eng
Format: [electronic resource] /
Number of pages: 592
ISBN-13: 9789400924826
Other titles: Proceedings of the NATO Advanced Research Workshop, Heraklion, Crete, Greece, June 4-9, 1989