Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 (Institute of Physics Conference Series)
Publisher: Taylor & Francis
Published: October 1, 1987
Language: eng
Format: Loose leaf
Number of pages: 820
ISBN-13: 9780854981786
Subjects: Technology; Semiconductors; Science; Science/Mathematics; Solid State Physics; Electronics - Semiconductors; Technology / Material Science; Material Science; Congresses; Electron microscopy