Istfa '99
Subtitle: Proceedings of the 25th International Symposium for Testing and Failure Analysis 14-18 November 1999 Westin Hotel Santa Clara, California
Edition: Pap/Cdr edition
Publisher: ASM International
Published: September 1999
Language: eng
Format: Hardcover
Number of pages: 486
ISBN-13: 9780871706461
Subjects: Circuits & components; Electricity; Electronics - Microelectronics; Engineering - Electrical & Electronic; Quality Control; Technology; Technology & Industrial Arts; Science/Mathematics