Low temperature testing of a radiation hardened CMOS 8-bit flash analog-to-digital (A/D) converter
By: Scott S. Gerber ... [et al.].
Contributors: Gerber, Scott S.; NASA Glenn Research Center.
Series: [NASA technical memorandum] -- NASA/TM-2001-211074.; NASA technical memorandum -- 211074.
Publisher: National Aeronautics and Space Administration, Glenn Research Center; Available from NASA Center for Aerospace Information
Published: 2001
Place of publication: [Cleveland, Ohio]; Hanover, MD
Language: eng
Format: Microform
Subjects: Cryogenics.; CMOS.; Analog to digital converters.; Thermal cycling tests.; Low temperature tests.; Temperature dependence.; Digital electronics.; Radiation hardening.
Notes: Shipping list no.: 2002-0336-M.

Also available via Internet from the NASA web site. Address as of 10/18/02: http://gltrs.grc.nasa.gov/reports/2001/TM-2001-211074.pdf ; current access is available via PURL.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 2002?] 1 microfiche.