Assessing Fault Model and Test Quality
By: by Kenneth M. Butler, M. Ray Mercer
Contributors: Mercer, M. Ray
Series: The Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 157; Springer International Series in Engineering and Computer Science, VLSI, Computer Architecture and Digital Signal Processing -- 157.
Publisher: Springer US
Published: 1992
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 132
ISBN-13: 9781461366027; 9781461536062
Subjects: Computer engineering; Computer-aided design; Computer science
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