High performance memory testing
Subtitle: design principles, fault modeling, and self-test
By: R. Dean Adams.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic
Published: 2003
Place of publication: Boston
Language: eng
Number of pages: 246
Subjects: Semiconductor storage devices -- Testing.; Computer storage devices -- Testing.
Description: "High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test is Written for the professional and the researcher to help them understand the memories that are being tested."--Jacket.
Notes: Includes bibliographical references (p. [229]-239) and index.