Designing, testing, and diagnostics--join them
Subtitle: International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA
By: sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: The Conference; Can be ordered from IEEE Service Center
Published: 1993
Place of publication: Altoona, PA; Piscataway, NJ
Language: eng
Number of pages: 1065
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.
Cover title.
"IEEE catalog number 93CH3356-3"--P. ii.
"IEEE Computer Society Press order number 4192-02"--P. ii.