16th IEEE VLSI Test Symposium
Subtitle: proceedings : April 26-30, 1998, Monterey, California
By: sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institution of Electrical and Electronics Engineers. Philadelphia Section .
Publisher: IEEE Computer Society Press
Published: 1998
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 472
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Congresses.
Other titles: VLSI Test Symposium
Notes: "IEEE Computer Society Order Number PR08436--T.p. verso.

"IEEE Order Plan Catalog Number 98TB100231"--T.p. verso.

Includes bibliographical references and index.