Physical and Failure Analysis of Integrated Circuits, 2001 8th International Symposium on the (IEEE Conference Proceedings)
Edition: Cdr edition
Publisher: Ieee
Published: September 2001
Language: eng
Format: Hardcover
Number of pages: 200
ISBN-13: 9780780366763
Subjects: Circuits & components; Electronics - Circuits - Integrated; Technology & Engineering; Science/Mathematics