future of test
Subtitle: International Test Conference, 1985 proceedings, November 19, 20, 21, 1985
By: sponsored by the IEEE Computer Society, IEEE Philadelphia Section.
Contributors: IEEE Computer Society.; Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publisher: IEEE Computer Society Press; Order from IEEE Computer Society
Published: 1985
Place of publication: Washington, D.C; Los Angeles, CA
Language: eng
Number of pages: 988
Subjects: Integrated circuits -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.
Notes: Includes bibliographies and index.
"IEEE catalog no. 85CH2230-1."
"Computer Society order no. 641."