Digest of papers
Subtitle: 1996 IEEE International Workshop on IDDQ Testing, October 24-25, 1996, Washington, D.C.
By: edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology.
Contributors: Tong, Carol.; Jayasumana, Anura P.; IEEE Computer Society. Technical Committee on Test Technology.
Publisher: IEEE Computer Society Press
Published: 1996
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 105
Subjects: Iddq testing -- Congresses.; Metal oxide semiconductors, Complementary -- Testing -- Congresses.
Other titles: 1996 IEEE International Workshop on IDDQ Testing; IEEE International Workshop on IDDQ Testing; IDDQ 96
Notes: Includes bibliographical references.
"IEEE Computer Society Press order number PR07655"--T.p. verso.
"IEEE order plan catalog number 96TB100067"--T.p. verso.