Presentation abstracts
By: Seventh Annual Reliability Physics Symposium, Washington, D.C., December 2, 3, 4, 1968 ; co-sponsored by the Electron Devices and Reliability groups of the Institute of Electrical and Electronics Engineers.
Contributors: Institute of Electrical and Electronics Engineers. Electron Devices Group.; IEEE Reliability Group.
Publisher: The Institute
Published: 1968
Place of publication: New York, N.Y
Language: eng
Number of pages: 64
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses -- Abstracts; Electronic apparatus and appliances -- Testing -- Congresses -- Abstracts; Integrated circuits -- Reliability -- Congresses -- Abstracts; Integrated circuits -- Testing -- Congresses -- Abstracts
Notes: Includes bibliographical references.
Cover title.
"Addendum" laid in.