Spatially Resolved Characterization of Local Phenomena in Materials and Nanostructures
Subtitle: Symposium Held December 2-6, 2002, Boston, Massachusetts, U.S.A ... Society Symposia Proceedings, V. 738.)
Contributors: Javier Piqueras (Editor); Materials Research Society (Corporate Author); A. P. Shreve (Editor); F. Zypman (Editor); Dawn A. Bonnell (Editor)
Publisher: Materials Research Society
Published: July 2003
Language: eng
Format: Hardcover
Number of pages: 425
ISBN-13: 9781558996755
Subjects: Nanostructured materials; Semiconductors; Congresses; Characterization; Technology & Industrial Arts; Science/Mathematics; Scanning probe microscopy; Engineering - General