Meeting the tests of time
Subtitle: International Test Conference 1989 proceedings : August 29-31, 1989 : Sheraton Washington Hotel, Washington, DC
By: sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.
Contributors: IEEE Computer Society. Test Technology Technical Committee.; IEEE Computer Society. Philadelphia Chapter.
Publisher: IEEE Computer Society Press
Published: 1989
Place of publication: Washington
Language: eng
Number of pages: 959
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"IEEE catalog number 89CH2742-5"--T.p. verso.