Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon (Computational Microelectronics)
Edition: 1 edition
Publisher: Springer
Published: July 20, 2004
Language: eng
Format: Hardcover
Number of pages: 554
ISBN-13: 9783211206874
Subjects: Materials science; Science/Mathematics; Engineering - General; Technology; Technology & Industrial Arts; Semiconductors; Engineering - Electrical & Electronic; Optics; Physics; Technology / Electronics / Microelectronics; Defects; Diffusion; Silicon crystals