Investigative image processing
Subtitle: 19-20 November 1996, Boston, Massachusetts
By: Leonid I. Rudin, Simon K. Bramble, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.].
Contributors: Rudin, Leonid I.; Bramble, Simon K.; National Institute of Standards and Technology (U.S.); National Institute of Justice (U.S.); Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2942; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2942.
Publisher: SPIE
Published: 1997
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 184
Subjects: Law enforcement -- Optical equipment -- Congresses.; Law enforcement -- Technological innovations -- Congresses.; Electronics in criminal investigation -- Congresses.; Criminals -- Identification -- Technological innovations -- Congresses.; Electronic security systems -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographic references and author index.