Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF'99) (Volume 39, Numbers 6-7)
Publisher: Pergamon Press Inc
Published: October 1, 1999
Language: eng
Format: Paperback
Number of pages: 492
ISBN-13: 9780080434193
Subjects: Electronics engineering; Electricity; Engineering - Electrical & Electronic; Technology & Industrial Arts; Science/Mathematics