Fundamentals of Bias Temperature Instability in MOS Transistors
Subtitle: Characterization Methods, Process and Materials Impact, DC and AC Modeling
Publisher: Springer
Published: Oct 23, 2016
Format: paperback
Number of pages: 288
ISBN-13: 9788132234241
Notes: Source title: Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (Springer Series in Advanced Microelectronics)