DFT 2007
Subtitle: 22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems :  proceedings : 26-28 September, 2007, Rome, Italy
By: edited by Cristiana Bolchini  ... [et al.] ;  IEEE Computer Society.
Contributors: Bolchini, Cristiana.; IEEE Computer Society.
Publisher: IEEE Computer Society Press
Published: 2007
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 537
ISBN-13: 9780769528854
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: International Symposium on Defect and Fault Tolerance in VLSI Systems; Defect and fault tolerance in VLSI systems
Notes: "IEEE Computer Society Order Number P2885"--T.p. verso.

Includes bibliographical references and author index.