Defect recognition and image processing in III-V compounds, III
Subtitle: proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP III), Tokyo, Japan, 22-25 September 1989
By: edited by T. Ogawa.
Contributors: Ogawa, T.
Series: Journal of crystal growth -- v. 103, no. 1/4 (June II 1990); Journal of crystal growth -- v. 103.
Publisher: North Holland
Published: 1990
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 474
Subjects: Semiconductors -- Defects -- Congresses.; Gallium arsenide -- Congresses.; Image processing -- Congresses.
Other titles: Proceedings of the Third International Symposium on Defect Recognition and Image Processing in III-V Compounds (DRIP III)
Notes: Includes bibliographical references and index.