Semiconductor material and device characterization
By: Dieter K. Schroder.
Edition: 2nd ed.
Publisher: Wiley
Published: 1998
Place of publication: New York
Language: eng
Number of pages: 760
Subjects: Semiconductors.; Semiconductors -- Testing.
Description: Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques.
Notes: Includes bibliographical references and index.
"A Wiley-Interscience publication."