Reflection, scattering, and diffraction from surfaces II
Subtitle: 2-4 August 2010, San Diego, California, United States
By: Zu-Han Gu, Leonard M. Hanssen, editors ; sponsored ... by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7792; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7792.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819482884
Subjects: Congresses; Metrology; Scattering (Physics); Measurement; Surface roughness; Optical measurements; Diffractive scattering
Notes: Includes bibliographical references.