IEEE Standard Test Interface Language (STIL) for digital test vector data
By: sponsor, Test Technology Standards Committee of the IEEE Computer Society.
Contributors: IEEE Computer Society. Test Technology Standards Committee.; Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.
Series: IEEE Std -- 1450-1999.; IEEE std -- 1450-1999.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1999
Place of publication: New York, N.Y
Language: eng
Number of pages: 132
Subjects: Integrated circuits -- Testing -- Standards
Other titles: Standard Test Interface Language (STIL) for digital test vector data.
Description: Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Notes: "Approved 18 March 1999, IEEE-SA Standards Board."

"27 August 1999"--Cover.

"SH94734"--Cover.

Includes bibliographical references (p. 4).