Question on the measurement of the metal work function in an electron spectrometer by the secondary-electron emission threshold method
By: Alov, N.V., Dadayan, K.A.
Contributors: Dadayan, K. A.; United States. National Aeronautics and Space Administration.
Series: NASA technical translation -- NASA TT-20190.; NASA technical translation -- 20190.
Publisher: National Aeronautics and Space Administration
Published: 1988
Place of publication: Washington D.C
Language: eng
Format: Microform
Subjects: Electron spectroscopy.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1988. 1 microfiche.