Characterization of Crystal Growth Defects by X-Ray Methods
By: edited by Brian K. Tanner, D. Keith Bowen
Contributors: Bowen, D. Keith
Series: Nato Advanced Study Institutes Series, Series B. Physics -- 63; NATO advanced study institutes series -- 63.
Publisher: Springer US
Published: 1980
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 589
ISBN-13: 9781475711288; 9781475711264
Subjects: Physics
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