IEEE standard for terminology and test methods for analog-to-digital converters
By: sponsor, Waveform Measurement and Analysis Technical Committee (TC-10) of the IEEE Instrumentation and Measurement Society.
Contributors: IEEE Instrumentation and Measurement Society. Waveform Measurement and Analysis Technical Committee.; Institute of Electrical and Electronics Engineers.; IEEE Standards Board.; IEEE Standards Association.
Series: IEEE Std -- 1241-2001.; IEEE std -- 1241-2001.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2001
Place of publication: New York
Language: eng
Number of pages: 92
Subjects: Analog-to-digital converters -- Standards; Analog-to-digital converters -- Testing -- Standards
Other titles: Standard for terminology and test methods for analog-to-digital converters.; IEEE Std 1241-2001.
Description: IEEE Std 1241-2001 identifies analog-to-digital converter (ADC) error sources and provides test methods with which to perform the required error measurements. The information in this standard is useful both to manufactures and to users of ADCs in that it provides a basis for evaluating and comparing existing devices, as well as providing a template for writing specifications for the procurement of new ones. In some applications, the information provided by the tests described in this standard can be used to correct ADC errors, e.g., correction for gain and offset errors. This standard also presents terminology and definitions to aid the user in defining and testing ADCs.
Notes: "IEEE Std 1241-2001."

"Approved 7 December 2000, IEEE-SA Standards Board."

Includes bibliographical references.