Shumovye i degradashchi︠u︡nnye [i.e. degradat︠s︡ionnye] prot︠s︡essy v poluprovodnikovykh priborakh
Subtitle: metrologii︠a︡, diagnostika, tekhnologii︠a︡, uchebnyĭ prot︠s︡ess : materialy dokladov mezhdunarodnogo nauchno-metodicheskogo seminara : Moskva, 3-6 dekabri︠a︡ 2002 g.
By: predislovie A.M. Guli︠a︡eva, V.N. Khirina = Noise and degradation processes in semiconductor devices : metrology, diagnostics, technology, curriculum
Publisher: Moskovskiĭ ėnerg. in-t (tekhn. universitet)
Published: 2003
Place of publication: Moskva
Language: rus
Number of pages: 308
Other titles: Shumovye i degradashchi︠u︡nnye prot︠s︡essy v poluprovodnikovykh priborakh; Shumovye i degradat︠s︡ionnye prot︠s︡essy v poluprovodnikovykh priborakh; Noise and degradation processes in semiconductor devices
Notes: Abstracts in English.