Machine vision systems for inspection and metrology VII
Subtitle: 4-5 November, 1998, Boston, Massachusetts
By: Bruce G. Batchelor, John W.V. Miller, Susan Snell Soloman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; endorsed by MVA/SME--Machine Vision Association of the Society of Manufacturing Engineers.
Contributors: Batchelor, Bruce G.; Miller, John W. V.; Solomon, Susan Snell.; Society of Photo-optical Instrumentation Engineers.; Machine Vision Association of SME.
Series: Proceedings of SPIE,; v. 3521; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3521.
Publisher: SPIE
Published: 1998
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 386
Subjects: Computer vision -- Congresses.; Engineering inspection -- Automation -- Congresses.; Optical measurements -- Congresses.; Computer vision -- Industrial applications -- Congresses.
Notes: Includes bibliographical references and index.