Fringe pattern analysis
Subtitle: 8-9 August 1989, San Diego, California
By: Graeme T. Reid, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University.
Contributors: Reid, Graeme T.; Society of Photo-optical Instrumentation Engineers.; SPIE Conference on Fringe Pattern Analysis (1st : 1989 : San Diego, Calif.)
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 1163; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 1163.
Publisher: SPIE
Published: 1989
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 260
Subjects: Diffraction patterns -- Congresses.; Interferometry -- Congresses.; Image processing -- Congresses.
Notes: Includes bibliographical references and index.
"Papers presented at the First SPIE Conference on Fringe Pattern Analysis"--Introd.