Logic & memory experiments using TTL integrated circuits
By: by Peter R. Rony.
Edition: 1st ed.
Series: E & L technibook series -- technibook 1-2
Publisher: H.W. Sams
Published: 1982
Place of publication: Indianapolis, Ind
Language: eng
Subjects: Digital electronics -- Experiments.; Logic circuits -- Experiments.; Computer storage devices -- Experiments.; Integrated circuits -- Experiments.
Other titles: Bugbook I.; Bugbook II.
Notes: "Formerly printed as Bugbook I [and] II."

Includes bibliographies and indexes.