Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
Publisher: Taylor & Francis
Published: November 21, 2000
Language: eng
Format: Hardcover
Number of pages: 224
ISBN-13: 9780750307482
Subjects: Materials science; Microscopy; Technology; Microscopes & Microscopy; Electron Microscopy; Physical Properties Of Materials; Transmission electron microsco; Technology & Industrial Arts; Science/Mathematics; Research & Methodology; Material Science; Science / Physics; Electron Microscopes & Microscopy; Transmission electron microscopy; Effect of radiation on; Materials
First sentence: Transmission electron microscopy (TEM) is probably the most important and widely used method of characterization in materials science.