Shumovye i degradat︠s︡ionnye prot︠s︡essy v poluprovodnikovykh priborakh
Subtitle: metrologii︠a︡, diagnostika, tekhnologii︠a︡, uchebnyĭ prot︠s︡ess : materialy dokladov Mezhdunarodnogo nauchno-metodicheskogo seminara, Moskva, 1-5 dekabri︠a︡ 2003 g. = Noise and degradation processes in semiconductor devices : metrology, diagnostic, technology, cirriculum [i.e., curriculum]
By: predislovie A.M. Guli︠a︡eva
Contributors: Moskovskoe nauchno-tekhnicheskoe obshchestvo radiotekhniki, ėlektroniki i svi︠a︡zi im. A.S. Popova
Publisher: Moskovskiĭ ėnerg. in-t (tekhn. universitet)
Published: 2004
Place of publication: Moskva
Language: rus
Number of pages: 335
Subjects: Semiconductors; Congresses; Reliability; Failures; Electronic noise; Mathematical models
Other titles: Noise and degradation processes in semiconductor devices, metrology, diagnostic, technology, cirriculum [i.e., curriculum]
Notes: Includes bibliographical references.

Articles in Russian, with abstracts in English.