Carrier lifetime measurement by the photoconductive decay method
By: Richard L. Mattis and A. James Baroody, Jr
Contributors: Baroody, A. James; United States. National Bureau of Standards
Series: NBS technical note -- 736
Publisher: U.S. Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1972
Place of publication: Washington, D.C
Language: eng
Number of pages: 40
Subjects: Photoconductivity; Photoelectric cells; Semiconductors
Notes: "Issued September 1972."

"A United States Department of Commerce publication."--Cover

"Carried out as part of the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices."

Sponsored by the National Bureau of Standards and others

Bibliography: p. 36-39