Technologies for synthetic environments
Subtitle: hardware-in-the-loop testing X : 29-30 March, 2005, Orlando, Florida, USA
By: Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Ball Aerospace & Technologies Corporation (USA) ... [et al.].
Contributors: Murrer, Robert Lee.; Society of Photo-optical Instrumentation Engineers.; Ball Aerospace & Technologies Corporation (USA)
Series: Proceedings of SPIE,; v. 5785; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5785.
Publisher: SPIE
Published: 2005
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 268
Subjects: Guided missiles -- Testing -- Congresses.; Infrared detectors -- Congresses.; Guidance systems (Flight) -- Congresses.
Genres: Congresses.
Other titles: Hardware-in-the-loop testing X
Notes: Includes bibliographical references and author index.