Structural, syntactic, and statistical pattern recognition
Subtitle: joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings
By: Dit-Yan Yeung ... [et al.] (eds.).
Contributors: Yeung, Dit-Yan, 1960-; International Association for Pattern Recognition.; International Workshop on Statistical Techniques in Pattern Recognition (6th : 2006 : Hong Kong, China)
Series: Lecture notes in computer science -- 4109.
Publisher: Springer
Published: 2006
Place of publication: Berlin; New York
Language: eng
Number of pages: 939
Subjects: Pattern recognition systems -- Congresses
Genres: Congresses.
Other titles: SSPR 2006.; SPR 2006.; S+SSPR 2006.
Notes: SSPR 2006 was the 11th in a series of conferences; SPR was the 6th in a series of conferences.

Includes bibliographical references and index.