Diagnostic measurements in LSI/VLSI integrated circuits production
By: Andrzej Jakubowski, Wiesław Marciniak, Henryk M. Przewłocki.
Contributors: Marciniak, Wiesław.; Przewłocki, Henryk M.
Series: Advanced series in electrical and computer engineering ;; vol. 7
Publisher: World Scientific
Published: 1991
Place of publication: Singapore; Teaneck, NJ
Language: eng
Number of pages: 356
Subjects: Integrated circuits -- Very large scale integration -- Design and construction.; Integrated circuits -- Very large scale integration -- Testing.
Notes: Includes bibliographical references.