Testing and failure analysis to improve screening techniques for hermetically sealed metallized film capacitors for low energy applications
Subtitle: final report
Contributors: United States. National Aeronautics and Space Administration; Union Carbide Corporation. Electronics Division. Components Dept
Series: NASA-CR -- 162071; NASA contractor report -- 162071
Publisher: National Aeronautics and Space Administration
Published: 1982
Place of publication: [Washington, D.C.?
Language: eng
Format: Microform
Subjects: Dielectric films; Capacitors -- Testing
Notes: "Union Carbide Corporation, Electronics Division, Components Department."

"July, 1982."

"Contract number NAS 8-33957."

"N84-29088"--Microfiche header

Includes bibliographical references

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration, 1984]. 1 microfiche ; 11 x 15 cm