IEEE standard for digital test interchange format (DTIF)
By: sponsor, IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.
Contributors: IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems.; IEEE-SA Standards Board.
Series: IEEE Std -- 1445-1998.; IEEE std -- 1445-1998.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1999
Place of publication: New York
Language: eng
Number of pages: 99
Subjects: Digital electronics -- Standards; Automatic test equipment
Notes: "IEEE Std 1445-1998."

"Approved 8 December 1998, IEEE-SA Standards Board."

"10 March 1999"--Cover.