Advances in Imaging and Electron Physics
Publisher: Elsevier
Published: 2005
Place of publication: Burlington
Language: eng
Format: [electronic resource]
Number of pages: 290
ISBN-13: 9780080458403
Subjects: Electrical engineering; Engineering
Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Notes: Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Circulant Matrix Representation of Feature Masks and Its Applications; Phase Problem and Reference-Beam Diffraction; Fractal Encoding; Morphologically Debiased Classifier Fusion: A Tomography-Theoretic Approach; index.

Description based on print version record.
Table of contents: title: Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Circulant Matrix Representation of Feature Masks and Its Applications; Phase Problem and Reference-Beam Diffraction; Fractal Encoding; Morphologically Debiased Classifier Fusion: A Tomography-Theoretic Approach; index.