Materials reliability issues in microelectronics
Subtitle: symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
By: editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.
Contributors: Lloyd, J. R.; Yost, Frederick G.; Ho, P. S.; Materials Research Society.; MRS Symposium on Materials Reliability Issues in Microelectronics. (1st : 1991 : Anaheim, Calif.)
Series: Materials Research Society symposium proceedings -- v. 225; Materials Research Society symposia proceedings -- v. 225.
Publisher: Materials Research Society
Published: 1991
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 358
Subjects: Microelectronics -- Reliability -- Congresses.; Microelectronics -- Materials -- Testing -- Congresses.; Electrodiffusion -- Congresses.; Microstructure -- Congresses.
Notes: Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics.

Includes bibliographical references and index.