Universal first-order reliability concept applied to semistatic structures
By: V. Verderaime.
Contributors: George C. Marshall Space Flight Center.
Series: NASA technical paper -- 3499.
Publisher: National Aeronautics and Space Administration, Marshall Space Flight Center; National Technical Information Service, distributor
Published: 1994
Place of publication: MSFC, Ala; [Springfield, Va
Language: eng
Format: Microform
Other titles: Universal first order reliability concept applied to semistatic structures.
Notes: Distributed to depository libraries in microfiche.

Shipping list no.: 95-0074-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1994] 1 microfiche.