X-ray Diffraction at Elevated Temperatures
Subtitle: A Method for In Situ Process Analysis
Publisher: Wiley
Published: February 26, 1993
Language: eng
Format: Hardcover
Number of pages: 268
ISBN-13: 9780471187264
Subjects: Atomic & molecular physics; X-Ray Spectroscopy; Science; Science/Mathematics; Chemistry - Analytic; Science / Chemistry / Analytic; Diffraction; Industrial applications; X-rays