Scanning electron microscopy, 1979
Subtitle: an international review of advances in techniques and applications of the scanning electron microscope
By: edited by Om Johari, Robert P. Becker.
Contributors: Becker, Robert P.; Johari, Om.
Publisher: SEM
Published: 1979
Place of publication: AMF O'Hare, Il
Language: eng
Subjects: Scanning electron microscopes -- Congresses.; Microscopes -- Congresses.
Genres: Congresses.
Notes: "Most of the papers included ... were presented at the Scanning Electron Microscopy / 1979 meetings which took place at the Sheraton Park Hotel in Washington, D.C., from April 16 to 20, 1979."

"A major subject index has been included in parts II and III. Additionally, a major subject index of SEM/1978/I and SEM/1978/II has been included in SEM/1979/II and SEM/1979/III respectively."

Bibliogr.

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