Thin Film and Depth Profile Analysis
By: edited by Hans Oechsner
Series: Topics in Current Physics -- 37; Topics in current physics -- 37.
Publisher: Springer Berlin Heidelberg
Published: 1984
Place of publication: Berlin, Heidelberg
Language: eng
Format: [electronic resource] /
ISBN-13: 9783642464997
Subjects: Physical organic chemistry; Surfaces (Physics)
Other titles: With contributions by numerous experts