Secondary ion mass spectrometry, SIMS XI
Subtitle: proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997
By: editors, G. Gillen ... [et al.].
Contributors: Gillen, G.
Publisher: Wiley
Published: 1998
Place of publication: Chichester; Toronto
Language: eng
Number of pages: 1118
Subjects: Secondary ion mass spectrometry -- Congresses.
Other titles: SIMS XI; Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry; SIMS Eleventh
Notes: Includes bibliographical references.