Seismic imaging and inversion
Subtitle: application of linear inverse theory
By: Robert H. Stol and, Arthur B. Weglein
Contributors: Weglein, Arthur B.
Publisher: Cambridge University Press
Published: 2012
Place of publication: Cambridge; New York
Language: eng
ISBN-13: 9781107014909
Subjects: Linear operators; Generalized inverses; Scattering (Mathematics); Seismic reflection method; TECHNOLOGY & ENGINEERING / Petroleum
Description: "Extracting information from seismic data requires knowledge of seismic wave propagation and reflection. The commonly used method involves solving linearly for a reflectivity at every point within the Earth, but this book follows an alternative approach which invokes inverse scattering theory. By developing the theory of seismic imaging from basic principles, the authors relate the different models of seismic propagation, reflection and imaging - thus providing links to reflectivity-based imaging on the one hand and to nonlinear seismic inversion on the other. The comprehensive and physically complete linear imaging foundation developed presents new results at the leading edge of seismic processing for target location and identification. This book serves as a fundamental guide to seismic imaging principles and algorithms and their foundation in inverse scattering theory and is a valuable resource for working geoscientists, scientific programmers and theoretical physicists"--

"Extracting information from seismic data requires knowledge of seismic wave propagation and reflection. The commonly used method involves solving linearly for a reflectivity at every point within the Earth. The resulting reflectivity, however,is not an intrinsic Earth property, and cannot easily be extended to nonlinear processes which might provide a deeper understanding and a more accurate image of the subsurface"--
Notes: Includes bibliographical references and index.
Table of contents: title: Machine generated contents note: 1. Introduction: modeling, migration, imaging, and inversion; 2. Basic migration concepts; 3. Prestack migration; 4. Migration limitations; 5. Models for wave propagation and reflection; 6. Green's functions; 7. The scattering potential; 8. Reflectivity; 9. Synthesizing reflection data; 10. f-k migration; 11. Asymptotic modeling and migration; 12. Residual asymptotic migration; 13. Asymptotic data mapping and continuation; 14. Least-squares asymptotic migration; Appendix A. Conventions and glossary of terms; Appendix B. Coordinates, vectors, and identities; Appendix C. Fourier and radon transforms; Appendix D. Surface and pointwise reflectivity; Appendix E. Useful filters; Appendix F. The phase integral and the stationary phase approximation; Appendix G. The diffraction integral; Appendix H. Wave-based, ray-based and reflector-based coordinates.