Impact of device level faults in a digital avionic processor
By: Suk Ho Kim.
Contributors: United States. National Aeronautics and Space Administration.
Series: NASA-CR -- 184783.; NASA contractor report -- NASA CR-184783.
Publisher: Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign
Published: 1989
Place of publication: Urbana, Ill
Language: eng
Format: Microform
Subjects: Flight control.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C.? : National Aeronautics and Space Administration], 1989. 1 microfiche.