VLSI test principles and architectures
Subtitle: design for testability
By: edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Contributors: Wang, Laung-Terng; Wu, Cheng-Wen, EE Ph. D; Wen, Xiaoqing
Series: The Morgan Kaufmann series in systems on silicon
Publisher: Elsevier Morgan Kaufmann Publishers; Morgan Kaufmann
Published: 2006
Place of publication: Amsterdam; Boston
Language: eng
Number of pages: 777
Subjects: Integrated circuits -- Very large scale integration -- Testing; Integrated circuits -- Very large scale integration -- Design and construction
Notes: Includes bibliographical references and index