International Conference on Automatic Inspection and Measurement
Contributors: Michael J. W. Chen (Editor)
Publisher: Society of Photo Optical
Published: December 1985
Language: eng
Format: Paperback
Number of pages: 176
ISBN-13: 9780892525928
Subjects: Automation; Quality control; Congresses; Optical Engineering; Engineering inspection; Optical methods
Notes: Proceedings of S P I E