Evaluation of Advanced Semiconductor Materials by Electron Microscopy
Edition: 1 edition
Publisher: Springer
Published: January 1, 1990
Language: eng
Format: Hardcover
Number of pages: 412
ISBN-13: 9780306433627
Subjects: Condensed matter physics (liquids & solids); Semiconductor Physics; Science; Science/Mathematics; Solid State Physics; Science / Biology; Life Sciences - Biology - General; Congresses; Diffraction; Electron microscopy; Electrons; Semiconductors; Surfaces; Technique
Notes: NATO Science Series: B: