Risk methodologies for technological legacies
By: edited by Dennis C. Bley, James G. Droppo, and Vitaly A. Eremenko.
Contributors: Bley, Dennis C.; Droppo, J. G.; Eremenko, V. A.
Series: NATO science series -- v. 18.
Publisher: Kluwer Academic Publishers
Published: 2003
Place of publication: Dordrecht; Boston
Language: eng
Number of pages: 366
Subjects: Radioactive waste disposal -- Risk assessment -- Congresses.; Hazardous wastes -- Risk assessment -- Congresses.
Genres: Congresses.
Notes: English-Russian cross-culture terminology guide (p. 325-361).

Includes bibliographical references and index.