2001 GaAs Reliability Workshop
Subtitle: proceedings : October 21, 2001, Baltimore, Maryland
By: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: JEDEC; IEEE
Published: 2001
Place of publication: Arlington, Va; Piscataway, N.J
Language: eng
Number of pages: 222
Subjects: Gallium arsenide semiconductors -- Congresses; Semiconductors -- Reliability -- Congresses; Semiconductors -- Materials -- Congresses
Genres: Congresses.
Other titles: GaAs Reliability Workshop, 2001, proceedings.
Notes: "IEEE Catalog Number: 01TH8602"--T.p. verso.

Includes bibliographical references.

Also available via the World Wide Web with additional title: GaAs Reliability Workshop, 2001, proceedings.