X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
By: Martin Schmidbauer.
Series: Springer tracts in modern physics,; v. 199; Springer tracts in modern physics ;; 199.
Publisher: Springer
Published: 2003
Place of publication: Berlin; New York
Language: eng
Number of pages: 202
Subjects: X-rays -- Scattering; Mesoscopic phenomena (Physics); Self-organizing systems; Semiconductors -- Surfaces
Description: This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.
Notes: Includes bibliographical references and index.