Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Publisher: Guido Groeseneken Jacopo Franco Ben Kaczer; Springer
Published: Aug 23, 2016
Format: paperback
Number of pages: 208
ISBN-13: 9789402402056
Notes: Source title: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)