Local electrode atom probe tomography
Subtitle: a user's guide
By: David J. Larson [and four others] ; foreword by Professor Sir Colin J. Humphreys, CBE, FRS, FREng
Publisher: Springer
Published: 2013
Place of publication: New York
Language: eng
Number of pages: 318
ISBN-13: 9781461487203; 9781461487210
Copyright date: 2013
Subjects: Atom-probe field ion microscopy; Nanochemistry; Nanotechnology; Surfaces (Physics)
Description: This book is the first single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.--
Notes: Includes bibliographical references and index.
Table of contents: title: History of APT and LEAP --; title: Specimen preparation --; title: Design and instrumentation --; title: Data collection --; title: Data processing and reconstruction --; title: Selected analysis topics --; title: Applications of the local electrode atom probe.