Fundamentals of modern VLSI devices
By: Yuan Taur, Tak H. Ning.
Contributors: Ning, Tak H., 1943-
Edition: 2nd ed.
Publisher: Cambridge University Press
Published: 2009
Place of publication: Cambridge; New York
Language: eng
Number of pages: 656
ISBN-13: 9780521832946
Subjects: Metal oxide semiconductors, Complementary; Bipolar transistors; Integrated circuits -- Very large scale integration