2001 IEEE International Reliability Physics Symposium Proceedings
Subtitle: 39th Annual Orlando, Florida; April 30 - May 3, 2001 (International Reliability Physics Symposium Proceedings)
Publisher: Ieee
Published: June 2001
Language: eng
Format: Paperback
Number of pages: 474
ISBN-13: 9780780365872
Subjects: Electronics engineering; Electronics - Circuits - Integrated; Electronics - General; Quality Control; Electronic Apparatus And Devices; Reliability Engineering; Technology; Science/Mathematics