Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
By: editors, P. Rai-Choudhury ... [et al.].
Contributors: Rai-Choudhury, P.; Electrochemical Society. Electronics Division.
Series: ECS proceedings ;; v. 97-12; SPIE ;; v. 3322; Proceedings (Electrochemical Society) ;; v. 97-12.; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3322.
Publisher: Electrochemical Society
Published: 1997
Place of publication: Pennington, NJ
Language: eng
Number of pages: 478
Subjects: Semiconductors -- Testing -- Congresses.
Other titles: Diagnostic techniques for semiconductor materials and devices
Notes: Includes bibliographical references and indexes.
"Sponsored by the Electrochemical Society, Inc., Electronics Division ... published in cooperation with: the International Society for Optical Engineering."