Advances in pattern recognition
Subtitle: joint IAPR International Workshops SSPR'2000 and SPR 2000, Alicante, Spain, August/September 2000 : proceedings
By: Francesc J. Ferri ... [et al.] (eds.).
Contributors: Ferri, Francesc.; International Association for Pattern Recognition.; International Workshop on Statistical Techniques in Pattern Recognition (3rd : 2000 : Alicante, Spain)
Series: Lecture notes in computer science -- 1876
Publisher: Springer
Published: 2000
Place of publication: Berlin; New York
Language: eng
Number of pages: 901
Subjects: Pattern recognition systems -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.