Diagnostika mikroėlektronnykh struktur
By: otvetstvennyĭ redaktor A.M. Afanasʹev.
Contributors: Afanasʹev, A. M.
Series: Trudy FTIAN,; t. 5
Publisher: "Nauka"
Published: 1993
Place of publication: Moskva
Language: rus
Number of pages: 110
Subjects: Integrated circuits -- Testing.
Notes: Includes bibliographical references.
At head of title: Rossiĭskai͡a︡ akademii͡a︡ nauk. Fiziko-tekhnologicheskiĭ institut.
Summary in English.