Enhanced accuracy time domain reflection and transmission measurements for IC interconnect characterization
By: by Dmitry A. Smolyansky.
Published: 1994
Language: eng
Number of pages: 70
Subjects: Time-domain reflectometry.; Integrated circuits -- Reliability -- Measurement.
Notes: Typescript (photocopy)

Thesis (M.S.)--Oregon State University, 1995.

Includes bibliographical references (leaves 49-53).