Unified methods for VLSI simulation and test generation
By: by Kwang-Ting Cheng and Vishwani D. Agrawal.
Contributors: Agrawal, Vishwani D., 1943-
Series: The Kluwer international series in engineering and computer science ;; #SECS 73
Publisher: Kluwer Academic Publishers
Published: 1989
Place of publication: Boston
Language: eng
Number of pages: 148
Subjects: Integrated circuits -- Very large scale integration -- Computer-aided design.; Integrated circuits -- Very large scale integration -- Testing.; Integrated circuits -- Very large scale integration -- Computer simulation.
Notes: Bibliography: p. [113]-143.
At head of title: AT&T.
Includes index.