Wei dian zi ji shu de ke kao xing
Subtitle: hu lian , qi jian ji xi tong = Reliability of Microtechnology : Interconnects, Devices and Systems
By: Johan Liu (Liu Jianying), Olli Salmela Jussi Särkkä and three others zhu ; Guo Fu, Ma Limin yi..
Edition: Di yi ban
Publisher: Ke xue chu ban she
Published: 2013
Place of publication: Beijing
Language: chi
Number of pages: 179
ISBN-13: 9787030376060
Subjects: Microtechnology; Reliability; Microelectromechanical systems; Nanotechnology
Work titles: Reliability of Microtechnology : Interconnects, Devices and Systems. Chinese
Notes: Translation of: Reliability of Microtechnology : Interconnects, Devices and Systems

Includes bibliographical references.