Eighth IEEE European Test Workshop
Subtitle: proceedings : 25-28 May 2003, Maastricht, the Netherlands
By: sponsored by IEEE Computer Society Test Technology Technical Council (TTTC) ; organized by Philips Research
Contributors: IEEE Computer Society. Technical Council on Test Technology; IEEE Xplore (Online service)
Publisher: IEEE Computer Society
Published: 2003
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 161
Subjects: Integrated circuits; Congresses; Testing
Other titles: ETW 2003; IEEE European Test Workshop
Notes: "IEEE Computer Society Order Number PR01908"--T.p. verso.

Includes bibliographical references and index.