Spatially resolved characterization of local phenomena in materials and nanostructures
Subtitle: symposium held December 2-6, 2002, Boston, Massachusetts
By: editors, Javier Piqueras ... [et al.].
Contributors: Piqueras, Javier.; Materials Research Society. Meeting Symposium G.
Series: Materials Research Society symposium proceedings -- v. 738; Materials Research Society symposia proceedings -- v. 738.
Publisher: Materials Research Society
Published: 2003
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 425
Subjects: Nanotechnology -- Congresses.; Nanostructured materials -- Congresses.; Semiconductors -- Characterization -- Technique -- Congresses.; Scanning probe microscopy -- Congresses.
Genres: Congresses.
Notes: "Symposium G, "Spatially Resolved Characterization of Local Phenomena in Materials and Devices," was held December 2-6 at the 2002 MRS Fall Meeting in Boston, Massachusetts."--P. xiii.

Includes bibliographical references and indexes.