Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
By: edited by R. Rajsuman ; sponsored by IEEE Computer Society, Technical Committee on Test Technology.
Contributors: Rajsuman, Rochit.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: IEEE Computer Society Press
Published: 1993
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 143
Subjects: Semiconductor storage devices -- Testing -- Congresses.; Random access memory -- Congresses.
Notes: Includes bibliographical references and index.
"IEEE catalog number 93TH0554-6"--T.p. verso.