ISTFA 2004
Subtitle: proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts
By: sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASM International.
Contributors: ASM International.; Electronic Device Failure Analysis Society.
Publisher: ASM International
Published: 2004
Place of publication: Materials Park, Ohio
Language: eng
Number of pages: 697
Subjects: Electronics -- Materials -- Testing -- Congresses; Electronic apparatus and appliances -- Testing -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and index.