Gamma-spektrometricheskiĭ analiz v kamere nizkogo fona
By: V. A. Bobrov, F. P. Krendelev, A. M. Gofman ; otv. redaktor F. P. Krendelev
Contributors: Gofman, A. M. (Abram Moiseevich), joint author; Krendelev, Fedor Petrovich, joint author
Series: Trudy Instituta geologii i geofiziki, Akademii͡a nauk SSSR, Sibirskoe otdelenie ; vyp. 329
Publisher: Nauka
Published: 1975
Place of publication: Novosibirsk
Language: rus
Number of pages: 58
Subjects: Gamma ray spectrometry
Other titles: Gamma-spectrometric analysis in low-background chamber.
Notes: Added t. p.: Gamma-spectrometric analysis in low-background chamber.

Table of contents also in English.

Bibliography: p. 56-58.