Energy and electric field dependence of SiSiO₂ interface state parameters by optically-activated admittance measurements
By: Tommy Chut-Yu Poon
Published: 1980
Language: eng
Number of pages: 152
Subjects: Semiconductors; Silicon; Silicon oxide
Other titles: Energy and electric field dependence of Si-SiO₂ interface state parameters.
Notes: Typescript (photocopy)

Published in microform: Ann Arbor, Mich. : University Microfilms International, 1980. -- 1 microfilm reel ; 35 mm. -- ([Publication] / University Microfilms International ; 81-5090)

Thesis (Ph.D.)--Columbia University, 1980.

Includes bibliographical references.