Three-dimensional imaging and laser-based systems for metrology and inspection II
Subtitle: 20-21 November, 1996, Boston, Massachusetts
By: Kevin G. Harding, Donald J. Svetkoff, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Harding, Kevin G.; Svetkoff, Donald J.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2909; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2909.
Publisher: SPIE
Published: 1996
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 262
Subjects: Three-dimensional imaging -- Congresses.; Lasers -- Congresses.; Optical measurements -- Congresses.; Moire topography -- Congresses.; Engineering inspection -- Congresses.
Genres: Congresses.
Notes: Includes bibliographic references and index.