Digital evaluation and failure analysis data
By: prepared by David B. Nicholls, under contract to Rome Air Development Center.
Contributors: Rome Air Development Center.; Reliability Analysis Center (U.S.)
Series: Microcircuit device reliability ;; MDR-15
Publisher: Reliability Analysis Center
Published: 1980
Place of publication: Griffiss Air Force Base, NY
Language: eng
Subjects: Digital integrated circuits -- Reliability -- Tables.; Digital integrated circuits -- Testing.
Notes: "Summer 1980."
Errata slip inserted.