VLSI fault modeling and testing techniques
By: edited by George W. Zobrist.
Contributors: Zobrist, George W. 1934-
Series: VLSI design automation series
Publisher: Ablex Pub. Corp.
Published: 1993
Place of publication: Norwood, NJ
Language: eng
Number of pages: 199
Subjects: Integrated circuits -- Very large scale integration -- Testing -- Data processing.; Electric fault location.
Notes: Includes bibliographical references and indexes.