The physics of a single-event upset in integrated circuits
Subtitle: a review and critique of analytical models for charge collection
By: Oldwig von Roos, John Zoutendyk.
Contributors: Zoutendyk, John.; Jet Propulsion Laboratory (U.S.)
Series: JPL publication -- 83-79.; NASA-CR -- 173471.; NASA contractor report -- NASA CR-173471.
Publisher: National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology
Published: 1983
Place of publication: Pasadena, Calif
Language: eng
Format: Microform
Subjects: Integrated circuits -- Effect of radiation on.; Galileo project.; Holes (electron deficiencies); Jupiter (planet); Plasma physics.; Radiation belts.
Notes: Microfiche. [Washington, D.C. : National Aeronautics and Space Administration], 1984. 1 microfiche.