RF and microwave modeling and measurement techniques for compound field effect transistors
By: Jianjun Gao.
Publisher: SciTech Pub.
Published: 2009
Place of publication: Raleigh, NC
Language: eng
ISBN-13: 9781891121890
Subjects: Field-effect transistors -- Testing; Compound semiconductors -- Testing; Field-effect transistors -- Mathematical models; Compound semiconductors -- Mathematical models; Microwave measurements; Radio measurements
Notes: Includes bibliographical references and index.