Proceedings of the Second Symposium on Defects in Silicon
Subtitle: defects in silicon II
By: edited by W. Murray Bullis, Ulrich Gösele, Fumio Shimura ; assistant editors, W. Bergholz ... [et al.].
Contributors: Bullis, W. Murray, 1930-; Gösele, U.; Shimura, Fumio.; Electrochemical Society. Electronics Division.; Electrochemical Society. Dielectric Science and Technology Division.
Series: Proceedings / Electrochemical Society ;; v. 91-9; Proceedings (Electrochemical Society) ;; v. 91-9.
Publisher: Electrochemical Society
Published: 1991
Place of publication: Pennington, NJ (10 S. Main St., Pennington 08534-2896)
Language: eng
Number of pages: 692
Subjects: Silicon -- Defects -- Congresses.; Semiconductors -- Defects -- Congresses.
Other titles: Defects in silicon II.
Notes: Includes bibliographical references and index.
"Held at the Washington, D.C. meeting of the Electrochemical Society, May 5-10, 1991 ... cosponsored by the Electronics and Dielectric Science & Technology divisions"--Pref..