IEEE Symposium on Visual Analytics Science and Technology, 2008
Subtitle: proceedings, Columbus, Ohio, USA, October 21-October 23, 2008
By: edited by David Ebert, Thomas Ertl
Contributors: Ebert, David; Ertl, Thomas, 1957-; IEEE Computer Society. Technical Committee on Visualization and Graphics; SIGGRAPH
Publisher: IEEE
Published: 2008
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 222
ISBN-13: 9781424429356
Subjects: Congresses; Digital computer simulation; Computer graphics; Visual analytics; Information visualization
Notes: "Held co-jointly with VisWeek 2008, October 19-24."

"Sponsored by IEEE Computer Society Visualization and Graphics Technical Committee in cooperation with ACM SIGGRAPH."

"VAST08"--Cover.

Includes bibliographical references and index.