Advances in Research and Development: Optical Characterization of Real Surfaces and Films, Volume 19
Subtitle: Optical Characterization of Real Surfaces and Films (Thin Films)
Contributors: Maurice H. Francombe (Series Editor); John L. Vossen (Series Editor); K. Vedam (Series Editor)
Publisher: Academic Press
Published: November 18, 1994
Language: eng
Format: Hardcover
Number of pages: 328
ISBN-13: 9780125330190
Subjects: Condensed matter physics (liquids & solids); Electronics & Communications Engineering; Materials science; Thin Films Physics; Science; Technology & Industrial Arts; Science/Mathematics; Chemistry - Industrial & Technical; Optics; Physics; Technology / Optics
First sentence: The measurement of surface anisotropy of semiconductors under normal incidence has recently emerged as a very attractive technique.