ICMTS 1996
Subtitle: 1996 International Conference on Microelectronic Test Structures, March 25-28, 1996, Trento, Italy
By: sponsored by the IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE; IEEE Service Center [distributor]
Published: 1996
Place of publication: [New York]; Piscataway, NJ
Language: eng
Number of pages: 313
Subjects: Integrated circuits -- Testing -- Congresses.; Miniature electronic equipment -- Testing -- Congresses.; Semiconductors -- Testing -- Congresses.; Transistors -- Testing -- Congresses.
Other titles: 1996 International Conference on Microelectronic Test Structures; 1996 IEEE International Conference on Microelectronic Test structures; ICMTS nineteen ninety-six
Notes: "IEEE catalog number 96CH35832"--t. p. verso.

"96CB35832".

Includes bibliographical references and index.