Symposium on X-Ray and Electron Probe Analysis
Subtitle: [papers].
Contributors: American Society for Testing and Materials. Committee E-2 on Emission Spectroscopy; American Society for Testing and Materials. Committee E-4 on Electron Metallography
Series: ASTM special technical publication no. 349
Publisher: American Society for Testing and Materials
Published: 1964
Place of publication: Philadelphia
Language: eng
Number of pages: 209
Subjects: Probes (Electronic instruments) -- Congresses; X-ray spectroscopy -- Congresses