Conference proceedings
By: ESREF 92, 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Schwäbisch Gmünd, Germany, 5-8 October 1992 ; conference organizers, ITG, Informationstechnische Gesellschaft im VDE in cooperation with GME, VDE-VDI-Gesellschaft Mikroelektronik ... [et al.].
Contributors: Informationstechnische Gesellschaft im VDE.
Publisher: VDE-Verlag
Published: 1992
Place of publication: Berlin
Language: eng
Number of pages: 528
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.; Integrated circuits -- Reliability -- Congresses.; Integrated circuits -- Testing -- Congresses.
Notes: Includes bibliographical references.