1996 IEEE International Reliability Physics proceedings
Subtitle: 34th annual, Dallas, Texas, April 30, May 1, 2, 1996
By: sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.
Publisher: Institute of Electrical and Electronics Engineers; IEEE Service Center
Published: 1996
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 396
Subjects: Electronic apparatus and appliances -- Reliability -- Congresses
Genres: Congresses.
Other titles: 1996 IEEE Annual International Reliability Physics.; IEEE International Reliability Physics proceedings.; Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International.
Notes: "IEEE catalog no. 96CH35825."

Includes bibliographical references.

Also available via the World Wide Web with additional title: Reliability Physics Symposium, 1996, 34th annual proceedings, IEEE International.