BIOS integrity measurements guidelines (draft)
Subtitle: recommendations of the National Institute of Standards and Technology
By: Andrew Regenscheid, Karen Scarfone
Contributors: Kent, Karen (Karen Ann); National Institute of Standards and Technology (U.S.)
Edition: Draft.
Series: NIST special publication -- 800-155 -- Computer security; NIST special publication -- 800-155; NIST special publication
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 2011
Place of publication: Gaithersburg, MD
Language: eng
Format: [electronic resource] :
Number of pages: 40
Subjects: Computer architecture; Security measures; Standards; Computer security
Other titles: Basic Input/Output System integrity measurements guidelines (draft)
Notes: Title from PDF title screen (viewed Sept. 27, 2012).

"December 2011."

Includes bibliographical references.