Scanning electron microscopy and x-ray microanalysis
By: Robert Edward Lee.
Publisher: PTR Prentice Hall
Published: 1993
Place of publication: Englewood Cliffs, N.J
Language: eng
Number of pages: 458
Subjects: Scanning electron microscopy.; X-ray microanalysis.; Electron Probe Microanalysis.; Microscopy, Electron, Scanning.
Notes: Includes bibliographical references (p. 439-441) and index.