Proceedings
Subtitle: 1999 IEEE International Symposium on Defect and  Fault Tolerance in VLSI Systems :  November 1-3, 1999, Albuquerque, New Mexico
By: sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council.
Contributors: IEEE Computer Society.; IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Technical Council on Test Technology.
Publisher: IEEE Computer Society Press
Published: 1999
Place of publication: Los Alamitos, California
Language: eng
Number of pages: 405
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems; Defect and fault tolerance in VLSI systems; DFT'99
Notes: "IEEE Computer Society Press Order Number PR00325"-verso of T.p.

Includes bibliographical references and author index.