Optical measurement systems for industrial inspection V
Subtitle: 18-22 June 2007, Munich, Germany
By: Wolfgang Osten, Christophe Gorecki, Erik Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany).
Contributors: Osten, Wolfgang.; Gorecki, Christophe.; Novak, Erik.; SPIE Europe.; European Optical Society.; Wissenschaftliche Gesellschaft Lasertechnik.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings of SPIE -- v. 6616; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6616.
Publisher: SPIE
Published: 2007
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819467584
Subjects: Optical instruments -- Industrial applications -- Congresses; Quality control -- Optical methods -- Congresses; Optical detectors -- Industrial applications -- Congresses
Genres: Congresses
Notes: Includes bibliographical references and author index.