Microbeam analysis 2000
Subtitle: proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000
By: edited by David B Williams and Ryuichi Shimizu ; edited by David B Williams and Ryuichi Shimizu.
Contributors: Williams, David B. 1949-; Shimizu, R. 1937-
Series: Institute of Physics conference series ;; no. 165
Publisher: Institute of Physics Publishing
Published: 2000
Place of publication: Bristol; Philadelphia
Language: eng
Number of pages: 498
Subjects: Electron probe microanalysis -- Congresses.; Microprobe analysis -- Congresses.; Micrurgy -- Congresses.; Spectrum analysis -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.