Gettering and defect engineerig in semiconductor technology XII
Subtitle: Gadest 2007 : proceedings of the 12th International Autumn Meeting, EMFCSC, Erice, Italy, October 14-19, 2007
By: edited by A. Cavallini ... [et al.].
Contributors: Cavallini, A.
Series: Diffusion and defect data. Pt. B, Solid state phenomena -- v. 131-133
Publisher: Trans Tech Publications
Published: 2008
Place of publication: Stafa-Zurich, Switzerland; Enfield, NH, USA
Language: eng
Number of pages: 642
ISBN-13: 9783908451433
Subjects: Semiconductors -- Congresses; Getters -- Congresses; Silicon crystals -- Defects -- Congresses; Electric engineering -- Materials -- Congresses
Genres: Congresses.
Notes: Includes bibliographical references and index.