Ultrafast x-ray sources and detectors
Subtitle: 26-27  August,  2007, San Diego, California, USA
By: Zenghu Chang, George A. Kyrala, Jean-Claude Kieffer  ; sponsored and published by SPIE
Contributors: Society of Photo-optical Instrumentation Engineers
Series: Proceedings of SPIE -- v. 6703; Proceedings of SPIE--the International Society for Optical Engineering -- v. 6703.
Publisher: SPIE
Published: 2007
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819468512
Notes: Includes bibliographical references and author index.