High-temperature deformation and microstructural analysis for Si₃N₄-Sc₂O₃
By: Deock-Soo Cheong and William A. Sanders.
Contributors: Sanders, William A.; United States. National Aeronautics and Space Administration.
Series: NASA technical memorandum -- 103239.
Publisher: National Aeronautics and Space Administration; National Technical Information Service, distributor
Published: 1990
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Subjects: Deformation.; Doped crystals.; Grain boundaries.; High temperature.; Microstructure.; Temperature effects.
Other titles: High temperature deformation and microstructural analysis.
Notes: Distributed to depository libraries in microfiche.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1990] 1 microfiche.