Near-field optics
Subtitle: 9-10 July, 1995, San Diego, California
By: Michael A. Paesler, Patrick J. Moyer, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Paesler, Michael A.; Moyer, Patrick J.; Society of Photo-optical Instrumentation Engineers.
Series: Proceedings / SPIE--the International Society for Optical Engineering ;; v. 2535; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 2535.
Publisher: SPIE
Published: 1995
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 162
Subjects: Scanning probe microscopy -- Congresses.
Notes: Includes bibliographical references and index.