Proceedings
By: IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society [and] Test Technology Committee.
Contributors: IEEE Computer Society.; IEEE Computer Society. Test Technology Committee.
Publisher: IEEE Computer Society Press; Order from IEEE Computer Society
Published: 1986
Place of publication: Washington, D.C; Los Angeles, CA
Language: eng
Number of pages: 179
Subjects: Integrated circuits -- Testing -- Congresses.; Automatic test equipment -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies and index.
"IEEE Computer Society order number 732."
"IEEE catalog number 86CH2296-2."