Power-Constrained Testing of Vlsi Circuits
Subtitle: A Guide To The Ieee 1149.4 Test Standard
Publisher: Springer
Published: Dec 09, 2010
Format: paperback
Number of pages: 192
ISBN-13: 9781441953155
Notes: Source title: Power-Constrained Testing of Vlsi Circuits: A Guide To The Ieee 1149.4 Test Standard (Frontiers in Electronic Testing)