Advances in imaging and electron physics
By: edited by Peter W. Hawkes
Series: Advances in imaging and electron physics -- 117
Publisher: Academic Press
Published: 2001
Place of publication: San Diego; London
Language: eng
Format: [electronic resource] /
ISBN-13: 9780080525457; 9780120147599
Subjects: Electricity; SCIENCE; Electron microscopes; Microscopy; Physics; Electrons; Image processing; Electromagnetism
Description: Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Notes: Title from PDF title page (viewed Oct. 18, 2007).

Includes bibliographical references and index.
Table of contents: title: Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Contributors; Preface; Future Contributions; Chapter 1. Optimal and Adaptive Design of Logical Granulometric Filters; Chapter 2. Dyadic Warped Wavelets; Chapter 3. Recent Developments in Stack Filtering and Smoothing; Chapter 4. Resolution ReconsideredN Con ventional Approaches and an Alternative; Index.