Large area spectral yield model for wheat
By: [prepared by Pat Ashburn]
Contributors: United States. Foreign Crop Condition Assessment Division
Series: Technical memorandum -- no. 14; Technical memorandum (United States. Foreign Crop Condition Assessment Division) -- no. 14.
Publisher: U.S. Dept. of Agriculture, Foreign Agricultural Service, Foreign Crop Condition Assessment Division
Published: 1982
Place of publication: Houston, Tex
Language: eng
Subjects: Wheat; Yields; Mathematical models
Notes: Cover title.

Includes bibliographical references.