Materials reliability in microelectronics VII
Subtitle: symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.
By: editors, J. Joseph Clement ... [et al.].
Contributors: Clement, J. Joseph.
Series: Materials Research Society symposium proceedings -- v. 473
Publisher: Materials Research Society
Published: 1997
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 457
Subjects: Microelectronics -- Reliability -- Congresses.; Microelectronics -- Materials -- Testing -- Congresses.; Microstructure -- Congresses.; Metallizing -- Congresses.
Other titles: Materials reliability in microelectronics seven; Materials reliability in microelectronics 7
Notes: Includes bibliographical references and indexes.