Proceedings of the 1997 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '97
Subtitle: 21-25 July, 1997, Raffles City Convention Centre, Singapore]
By: edited by M.K. Radhakrishnan, Philip Ho, Chim Wai Kin ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].
Contributors: Radhakrishnan, M. K.; Ho, Philip.; Chim, Wai Kin.; IEEE Singapore Section. Reliability/CPMT/EDA Chapter.
Publisher: Institute of Electrical and Electronics Engineers
Published: 1997
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 301
Subjects: Integrated circuits -- Defects -- Congresses.; Integrated circuits -- Testing -- Congresses.
Other titles: 6th International Symposium on the Physical & Failure Analysis of Integrated Circuites; 6th International Symposium on the Physical & Failure Analysis of Integrated Circuits; IPFA '97
Notes: Includes bibliographic references and author index.
"IPFA '97 proceedings"--Cover.
"IEEE catalog no. 97TH8289"--Cover.