Scanning Probe Microscopy
Subtitle: Atomic Force Microscopy and Scanning Tunneling Microscopy
Publisher: Springer
Published: Nov 18, 2016
Format: paperback
Number of pages: 400
ISBN-13: 9783662505571
Notes: Source title: Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy (NanoScience and Technology)