A limited in-flight evaluation of the constant current loop strain measurement method
By: Candida D. Olney and Joseph V. Collura.
Contributors: Collura, Joseph V.; Dryden Flight Research Facility.
Series: NASA technical memorandum -- 104331.
Publisher: National Aeronautics and Space Administration, Dryden Flight Research Center; National Technical Information Service, distributor]
Published: 1997
Place of publication: Edwards, Calif; [Springfield, Va
Language: eng
Format: Microform
Subjects: Strain measurement.; Strain gages.; Wheatstone bridges.; Electrical measurement.; Electrical resistance.
Other titles: Limited in flight evaluation of the constant current loop strain measurement method.
Notes: Shipping list no.: 98-0799-M.

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1997] 1 microfiche.