Development of a testing methodology to predict optical disk life expectancy values
By: Fernando L. Podio.
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST special publication ;; 500-200.; Computer systems technology; NIST special publication ;; 500-200.; NIST special publication.
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology; For sale by the Supt. of Docs., U.S. G.P.O.
Published: 1991
Place of publication: Gaithersburg, MD; Washington, DC
Language: eng
Number of pages: 84
Subjects: Optical disks -- Testing.; Service life (Engineering)
Notes: Includes bibliographical references (p. 83-84).
"December 1991."