Drift mobility of amorphous semiconductors measured by the traveling-wave technique
By: by Robert Eric Johanson.
Published: 1991
Language: eng
Format: Microform
Number of pages: 4112
Notes: Microfilm. Chicago, Ill. : University of Chicago, Joseph Regenstein Library, Dept. of Photoduplication, 1992. 1 microfilm reel ; 35 mm.
Thesis (Ph. D.)--University of Chicago, 1991.
Offprint from: Physical review B, 45, No. 8 (February 1992-II).