Infrared imaging systems
Subtitle: design, analysis, modeling, and testing XXI : 6-8 April 2010, Orlando Florida, United States
By: Gerald C. Holst, Keith A. Krapels, editors ; sponsored ... by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7662; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7662.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819481269
Subjects: Congresses; Infrared imaging
Notes: Includes bibliographical references and author index.