Winning test solutions for the '90s
Subtitle: ATE & Instrumentation Conference proceedings
By: ATE & Instrumentation Conference East ; June 19-22, 1989, World Trade Center, Boston, MA ; sponsored by Electronics test, Circuits manufacturing, and EOS/ESD technology magazines ; endorsed by the American Society of Test Engineers.
Contributors: American Society of Test Engineers.
Publisher: MG Expositions Group
Published: 1989
Place of publication: Boston, MA
Language: eng
Number of pages: 561
Subjects: Automatic test equipment -- Congresses.; Electronic instruments -- Congresses.; Electronic apparatus and appliances -- Testing -- Congresses.
Genres: Congresses.
Other titles: Electronics test.; Circuits manufacturing.; EOS/ESD technology.; Test 1989.
Notes: Includes bibliographical references and index.
At head of title: Test 1989.