The NIST X-ray photoelectron spectroscopy (XPS) database
By: Charles D. Wagner
Contributors: National Institute of Standards and Technology (U.S.)
Series: NIST technical note -- 1289; NIST technical note -- 1289
Publisher: U.S. Dept. of Commerce, National Institute of Standards and Technology
Published: 1991
Place of publication: Gaithersburg, MD
Language: eng
Format: Microform
Number of pages: 65
Subjects: National Institute of Standards and Technology (U.S.) -- Databases; X-ray spectroscopy -- Databases; Photoelectron spectroscopy -- Databases
Notes: Paper version no longer for sale by the Supt. of Docs

Distributed to depository libraries in microfiche

Shipping list no.: 92-2029-M

"October 1991."

Includes bibliographical references

Final

Microfiche. [Washington, D.C.?] : Supt. of Docs., U.S. G.P.O., [1992] 1 microfiche : negative