Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2001
By: edited by Wilson TAN ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Device Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore [and] Institute of Microelectronics, Singapore.
Contributors: Tan, Wilson.; IEEE Reliability/CPMT/ED Singapore Chapter.
Publisher: Institute of Electrical and Electronics Engineers
Published: 2001
Place of publication: Piscataway, NJ
Language: eng
Number of pages: 262
Subjects: Integrated circuits -- Defects -- Congresses; Integrated circuits -- Testing -- Congresses
Genres: Congresses.
Other titles: IPFA 2001 proceedings.
Notes: "IEEE catalog number 01TH8548"--Verso t.p.

Includes bibliographical references and index.

Also available via the World Wide Web with additional title: Physical and Failure Analysis of Integrated Circuits, 2001, IPFA 2001, proceedings of the 2001 8th International Symposium on the.