Materials reliability in microelectronics IV
Subtitle: symposium held April 5-8, 1994, San Francisco, California, U.S.A.
By: editors, Peter Børgesen ... [et al.].
Contributors: Børgesen, Peter.; Materials Research Society. Meeting.
Series: Materials Research Society symposium proceedings -- v. 338; Materials Research Society symposia proceedings -- v. 338.
Publisher: Materials Research Society
Published: 1994
Place of publication: Pittsburgh, Pa
Language: eng
Number of pages: 630
Subjects: Microelectronics -- Reliability -- Congresses.; Microelectronics -- Materials -- Testing -- Congresses.; Electrodiffusion -- Congresses.
Notes: Includes bibliographical references and indexes.