Testability analysis
Subtitle: a survey on methods and applications
By: Roberto Téllez-Girón López, Klaus Ergang.
Contributors: Ergang, Klaus.
Series: Applied data processing
Publisher: Verlag TÜV Rheinland
Published: 1987
Place of publication: Köln
Language: eng
Number of pages: 199
Subjects: Integrated circuits -- Testing.; Electronic digital computers -- Circuits -- Testing.
Notes: Bibliography: p. 175-194.
Includes index.