Standards for electronic imaging technologies, devices, and systems
Subtitle: proceedings of a conference held 1-2 February 1996, San Jose, California
By: Michael C. Nier, editor ; sponsored by IS&T--The Society for Imaging Science and Technology, SPIE--The International Society for Optical Engineering.
Contributors: Nier, Michael.; IS & T--the Society for Imaging Science and Technology.; Society of Photo-optical Instrumentation Engineers.
Series: Critical reviews of optical science and technology ;; v. CR61
Publisher: SPIE Optical Engineering Press
Published: 1996
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 276
Subjects: Imaging systems -- Standards -- Congresses.
Notes: Includes bibliographical references.