Electronics reliability and measurement technology
Subtitle: proceedings of a conference ... held at Langley Research Center, Hampton, Virginia, June 3-5, 1986
By: edited by Joseph S. Heyman
Contributors: Heyman, Joseph S; United States. National Aeronautics and Space Administration. Scientific and Technical Information Program
Series: NASA conference publication -- 2472
Publisher: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program; National Technical Information Service, distributor
Published: 1987
Place of publication: [Washington, DC]; [Springfield, Va
Language: eng
Format: Microform
Notes: Distributed to depository libraries in microfiche

Microfiche. [Washington, D.C. : National Aeronautics and Space Administration, 1987] 2 microfiches