Advanced data storage materials and characterization techniques
Subtitle: symposia held December 1-4, 2003, Boston, Massachusetts, U.S.A.
By: editors, Symposium GG, Joachim W. Ahner, Jeremy Levy ; Symposium HH, Lambertus Hesselink, Andrei Mijiritskii.
Contributors: Ahner, Joachim W.; Materials Research Society. Meeting; Symposium on Advanced Characterization Techniques for Data Storage Materials (2003 : Boston, Mass.); Symposium on Phase Change and Nonmagnetic Materials for Data Storage (2003 : Boston, Mass.)
Series: Materials Research Society symposium proceedings ;; v. 803; Materials Research Society symposia proceedings ;; v. 803.
Publisher: Materials Research Society; Cambridge University Press
Published: 2004
Place of publication: Warrendale, Pa
Language: eng
Number of pages: 280
Subjects: Computer storage devices -- Congresses.; Information storage and retrieval systems -- Congresses.
Genres: Congresses.
Other titles: Advanced characterization techniques for data storage materials; Phase change and nonmagnetic materials for data storage
Notes: Includes bibliographical references and indexes.
"This book contains selected papers that have been presented within the framework of two MRS symposia, Symposium GG, 'Advanced Characterization Techniques for Data Storage Materials,' and Symposium HH, 'Phase Change and Nonmagnetic Materials for Data Storage,' held December 1-4 at the 2003 MRS Fall Meeting in Boston, Massachusetts"--P. xi.