Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Subtitle: SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003
By: IEEE Components, Packaging, and Manufacturing Technology Society.
Contributors: IEEE Components, Hybrids, and Manufacturing Technology Society.
Publisher: IEEE
Published: 2003
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 404
Subjects: Semiconductors -- Thermal properties -- Congresses.; Semiconductors -- Cooling -- Congresses.
Genres: Congresses.
Other titles: Semiconductor Thermal Measurement and Management Symposium; SEMI-THERM proceedings 2003; Semiconductor Thermal Measurement and Management Symposium, 2003, Ninteenth Annual IEEE.
Notes: Includes bibliographical references.
Cover title.
"IEEE Catalog Number 02CH37437 Softbound Edition ; 02CD37437C CD-ROM Edition"--verso of T.p. verso.
Also available via the World Wide Web with additional title: Semiconductor Thermal Measurement and Management Symposium, 2003, Ninteenth Annual IEEE.