Advanced materials and devices for sensing and imaging
Subtitle: 17-18 October 2002, Shanghai, China
By: Jianquan Yao, Yukihiro Ishii, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] COS--Chinese Optical Society ; cooperating organizations, Shanghai Jiaotong University (China) ... [et al.] ; supported by National Natural Science Foundation of China ... [et al.].
Contributors: Yao, Jianquan.; Ishii, Yukihiro.; Society of Photo-optical Instrumentation Engineers.; Zhongguo guang xue xue hui.; Shanghai jiao tong da xue.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Series: SPIE proceedings series,; v. 4919; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 4919.
Publisher: SPIE
Published: 2002
Place of publication: Bellingham, Wash., USA
Language: eng
Number of pages: 548
Subjects: Optical fiber detectors -- Materials -- Congresses.; Detectors -- Materials -- Congresses.; Optoelectronic devices -- Materials -- Congresses.; Photonics -- Congresses.; Metrology -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.