Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS
Subtitle: Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988
By: sponsored by IEEE Electron Devices Society.
Contributors: IEEE Electron Devices Society.
Publisher: IEEE
Published: 1988
Place of publication: [Silver Spring?, Md.]
Language: eng
Number of pages: 206
Subjects: Miniature electronic equipment -- Testing.; Electronic apparatus and appliances -- Testing.; Reliability (Engineering)
Other titles: Microelectronic test structures.; ICMTS.
Notes: "88CH2560-01"

Running title: 1988 IEEE Proceedings on Microelectronic Test Structures, vol.1,no.1 Feb 1988.