Electromagnetic material interrogation using conductive interfaces and acoustic wavefronts
By: H.T. Banks, M.W. Buksas, T. Lin.
Contributors: Buksas, M. W.; Lin, T.
Series: Frontiers in applied mathematics -- 21
Publisher: Society for Industrial and Applied Mathematics
Published: 2000
Place of publication: Philadelphia, PA
Language: eng
Number of pages: 146
Subjects: Acoustic emission testing.; Electromagnetic waves -- Scattering.; Surfaces (Physics)
Notes: Includes bibliographical references (p. 137-143) and index.