Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
By: Michael L. Bushnell, Vishwani D. Agrawal.
Contributors: Agrawal, Vishwani D., 1943-
Series: Frontiers in electronic testing
Publisher: Kluwer Academic; Springer
Published: 2000
Place of publication: Boston
Language: eng
Number of pages: 690
Subjects: Integrated circuits -- Very large scale integration -- Testing; Digital integrated circuits -- Testing; Mixed signal circuits -- Testing; Semiconductor storage devices -- Testing
Notes: Includes bibliographical references (p. [631]-670) and index.