Scanning microscopies 2011
Subtitle: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States
By: Michael T. Postek ... [et al.] editors ; sponsored ... by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 8036
Publisher: SPIE
Published: 2011
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819486103
Subjects: Congresses; Scanning electron microscopes
Notes: Includes bibliographical references and index.