Symposium on X-Ray and Electron Probe Analysis
Subtitle: [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.
Contributors: ASTM Committee E-2 on Emission Spectroscopy.; American Society for Testing and Materials. Committee E-4 on Metallography.
Series: ASTM special technical publication; no. 349
Publisher: American Society for Testing and Materials
Published: 1964
Place of publication: Philadelphia
Language: eng
Number of pages: 209
Subjects: X-ray spectroscopy -- Congresses.; Probes (Electronic instruments) -- Congresses.
Genres: Congresses.
Notes: Includes bibliographies.
Sponsored jointly by ASTM Committees E-2 on Emission Spectroscopy and E-4 on Electron Metallography.