Physical measurement and analysis of thin films
By: edited by E. M. Murt and W. G. Guldner.
Contributors: Murt, E. M., ed.; Guldner, W. G.
Series: Progress in analytical chemistry v. 2
Publisher: Plenum Press
Published: 1969
Place of publication: New York
Language: eng
Number of pages: 194
Subjects: Thin films -- Addresses, essays, lectures
Notes: Includes bibliographies.