Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
Subtitle: April 18-21, 2006, Prague, Czech Republic
By: sponsored by IEEE Computer Society Test Technology Technical Council ; in cooperation with Czech Technical University in Prague.
Contributors: IEEE Computer Society. Technical Council on Test Technology.; České vysoké učení technické v Praze.
Publisher: IEEE
Published: 2006
Place of publication: [Prague]; Piscataway, N.J
Language: eng
Number of pages: 291
Subjects: Integrated circuits -- Testing -- Congresses.; Integrated circuits -- Design -- Congresses.
Genres: Congresses.
Notes: "IEEE catalog number: 06EX1307"--T.p. verso.

Includes bibliographical references and index.