On-Line Testing for VLSI
By: edited by Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan
Contributors: Zorian, Yervan; Pradan, Dhiraj K.
Series: Frontiers in Electronic Testing -- 11; Frontiers in electronic testing -- 11.
Publisher: Springer US
Published: 1998
Place of publication: Boston, MA
Language: eng
Format: [electronic resource] /
Number of pages: 161
ISBN-13: 9781441950338; 9781475760699
Subjects: Systems engineering; Engineering; Computer-aided design; Computer engineering
Description: Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
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