A unified approach for timing verification and delay fault testing
By: Mukund Sivaraman and Andrzej J. Strojwas.
Contributors: Strojwas, Andrzej J.
Publisher: Kluwer Academic
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 155
Subjects: Digital integrated circuits -- Design and construction -- Data processing; Digital integrated circuits -- Testing; Delay faults (Semiconductors); Integrated circuits -- Verification
Description: A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation.

A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method to identify the primitive PDFs in a general multilevel logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented.

The Primitive PDF Identification based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously reported floating mode timing analyzers.

A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in USLI circuits. The book should also be of interest to digital designers and others interested in knowing the state-of-the-art in timing verification and delay fault testing.
Notes: Includes bibliographical references (p. [139]-152) and index.