Polarization: measurement, analysis, and remote sensing IX
Subtitle: 7-8 April 2010, Orlando, Florida, USA
By: David B. Chenault, Dennis H. Goldstein, editors ; sponsored and published by SPIE
Contributors: SPIE (Society)
Series: Proceedings of SPIE -- v. 7672; Proceedings of SPIE--the International Society for Optical Engineering -- v. 7672.
Publisher: SPIE
Published: 2010
Place of publication: Bellingham, Wash
Language: eng
ISBN-13: 9780819481368
Subjects: Polarimetry; Congresses; Polarization (Light); Measurement; Optical instruments; Design and construction
Notes: Includes bibliographical references.