Developments in materials characterization technologies
Subtitle: symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA
By: edited by George F. Vander Voort, John J. Friel.
Contributors: Vander Voort, George F.; Friel, John J.; International Metallographic Society. Technical Meeting
Publisher: International Metallographic Society; ASM International
Published: 1996
Place of publication: Columbus, Ohio; Materials Park, Ohio
Language: eng
Number of pages: 125
Subjects: Materials -- Testing -- Congresses.; Nondestructive testing -- Congresses.; Materials -- Microscopy -- Congresses.; Metallography -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.