The 10th International Conference on X-ray Microscopy, Chicago, Illinois, USA, 15-20 August 2010
By: editors, Ian McNulty, Catherine Eyberger, Barry Lai
Contributors: McNulty, Ian; Eyberger, Catherine E.; Lai, Barry
Series: AIP conference proceedings -- 1365.; AIP conference proceedings -- no. 1365.
Publisher: American Institute of Physics
Published: 2011
Place of publication: Mellville, N.Y
Language: eng
Number of pages: 473
ISBN-13: 9780735409255
Subjects: X-ray microscopy; Congresses
Other titles: Tenth International Conference on X-Ray Microscopy
Notes: Includes bibliographical references and index.