Proceedings of the First International Symposium On Analytical Methods In Philately
By: edited by Thomas Lera, John H. Barwis, and David L. Herendeen
Contributors: Lera, Thomas M.; Barwis, John H.; Herendeen, David L., -2013
Series: Smithsonian contributions to history and technology -- number 57
Publisher: Smithsonian Institution Scholarly Press
Published: 2013
Place of publication: Washington, D.C
Language: eng
Number of pages: 121
Subjects: Stamp collecting; Congresses; Postage stamps; Expertising; Forgeries
Notes: "This publication contains papers presented at the First International Symposium on Analytical Methods in Philately, hosted by the National Postal Museum in November 2012."

Includes bibliographical references.