Scanning and transmission electron microscopy
Subtitle: an introduction
By: Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens.
Contributors: Heckman, John William.; Klomparens, Karen L.
Publisher: W.H. Freeman
Published: 1993
Place of publication: New York
Language: eng
Number of pages: 225
Subjects: Scanning electron microscopy; Transmission electron microscopy
Notes: Includes bibliographical references and index.