Beam effects, surface topography, and depth profiling in surface analysis
By: edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
Contributors: Czanderna, Alvin Warren, 1930-; Madey, Theodore E.; Powell, C. J.
Series: Methods of surface characterization ;; v. 5
Publisher: Plenum Press
Published: 1998
Place of publication: New York
Language: eng
Number of pages: 430
Subjects: Surfaces (Technology) -- Analysis; Materials -- Effect of radiation on
Notes: Includes bibliographical references and index.