Reduction of JFET parameter drift in IC operational amplifiers using statistical process characterization
By: Arvid C. Carlson, Sam L. Sundaram.
Contributors: Sundaram, Sam L.
Publisher: Addison-Wesley
Published: 1993
Place of publication: Reading, Mass
Language: eng
Number of pages: 24
Subjects: Operational amplifiers -- Design and construction -- Quality control.; Quality control -- Statistical methods.
Notes: Includes bibliographical references (p. 20-21)  and index.