Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits
Subtitle: IPFA 2002
By: edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.
Contributors: Thong, John.; IEEE Reliability/CPMT/ED Singapore Chapter.; IEEE Electron Devices Society.; IEEE Reliability Society.; National University of Singapore. Centre for IC Failure Analysis & Reliability.
Publisher: IEEE
Published: 2002
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 264
Subjects: Integrated circuits -- Defects -- Congresses; Integrated circuits -- Testing -- Congresses
Genres: Congresses.
Other titles: IPFA 2002.; Physical & failure analysis of integrated circuits.
Notes: "IEEE Catalog Number 02TH8614"--T.p. verso.

Includes bibliographical references and author index.

Also available via the World Wide Web.