Statistical approach to VLSI
By: [edited by] S.W. Director, W. Maly.
Contributors: Director, Stephen W.; Maly, W.
Series: Advances in CAD for VLSI ;; v. 8
Publisher: North-Holland
Published: 1994
Place of publication: Amsterdam; New York
Language: eng
Number of pages: 391
Subjects: Integrated circuits -- Very large scale integration -- Defects.; Integrated circuits -- Very large scale integration -- Design and construction -- Statistical methods.; Mathematical optimization.
Notes: Includes bibliographical references and index.