Imaging techniques for testing and inspection
Subtitle: seminar-in-depth, February, 1972, Los Angeles, California.
By: Editors: John C. Urbach, Harold Berger [and] Robert Aprahamian.
Contributors: Urbach, John C., ed.; Berger, Harold, ed.; Aprahamian, R., ed.; Society of Photo-optical Instrumentation Engineers.; American Society for Nondestructive Testing.; American Society for Testing and Materials.
Series: Proceedings of the Society of Photo-optical Instrumentation Engineers, v. 29; Proceedings of the Society of Photo-optical Instrumentation Engineers ;; v. 29.
Publisher: Society of Photo-optical Instrumentation Engineers
Published: 1972
Place of publication: [Redondo Beach, Calif
Language: eng
Number of pages: 150
Subjects: Nondestructive testing -- Congresses.; Imaging systems -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references.
"SPIE co-sponsors: The American Society fo Nondestructive Testing, The American Society for Testing and Materials."