Laser diodes and LEDs in industrial, measurement, imaging, and sensors applications II
Subtitle: Testing, packaging, and reliability of semiconductor lasers V : 26-26[sic], January, 2000, San Jose, California
By: Geoffrey T. Burnham ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
Contributors: Burnham, Geoffrey T.; Society of Photo-optical Instrumentation Engineers.
Series: SPIE proceedings series ;; v. 3945; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 3945.
Publisher: SPIE
Published: 2000
Place of publication: Bellingham, Washington
Language: eng
Number of pages: 320
Subjects: Semiconductor lasers -- Congresses.; Diodes, Semiconductor -- Congresses.; Semiconductor lasers -- Industrial applications -- Congresses.
Genres: Congresses.
Other titles: Testing, packaging, and reliability of semiconductor lasers V
Notes: Includes bibliographic references and author index.