Thermal testing of integrated circuits
By: by Josep Altet and Antonio Rubio.
Contributors: Rubio, Antonio, 1954-
Publisher: Kluwer Academic Publishers; Springer
Published: 2002
Place of publication: Boston
Language: eng
Number of pages: 204
Subjects: Integrated circuits -- Testing; Integrated circuits -- Thermal properties; Temperature measurements
Notes: Includes bibliographical references and index.