Integrated circuit defect-sensitivity
Subtitle: theory and computational models
By: by José Pineda de Gyvez.
Series: The Kluwer internatioanl series in engineering and computer science ;; SECS 208.; Microelectronics manufacturing; Kluwer international series in engineering and computer science ;; SECS 208.; Kluwer international series in engineering and computer science.
Publisher: Kluwer Academic Publishers; Springer
Published: 1993
Place of publication: Boston
Language: eng
Number of pages: 167
Subjects: Integrated circuits -- Very large scale integration -- Computer-aided design.; Integrated circuits -- Very large scale integration -- Defects -- Mathematical models.
Notes: Includes bibliographical references (p. 138-146) and index.