Proceedings
Subtitle: 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November, 2002, Vancouver, BC, Canada
By: [sponsored by the IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on Fault-Tolerant Computing].
Contributors: IEEE Computer Society. Fault-Tolerant Computing Technical Committee.; IEEE Computer Society. Test Technology Technical Committee.
Publisher: IEEE Computer Society Press
Published: 2002
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 441
Subjects: Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Fault-tolerant computing -- Congresses
Genres: Congresses.
Other titles: DFT 2002; 2002 proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Notes: "IEEE Computer Society Order Number PR01831"--Verso of t.p.

Includes bibliographic references and author index.

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