Design for at-speed test, diagnosis, and measurement
By: edited by Benoit Nadeau-Dostie.
Contributors: Nadeau-Dostie, Benoit.
Publisher: Kluwer Academic
Published: 2000
Place of publication: Boston
Language: eng
Number of pages: 239
Subjects: Integrated circuits -- Testing; Electronic apparatus and appliances -- Testing
Notes: Includes bibliographical references and index.