From contamination to defects, faults, and yield loss
Subtitle: simulation and applications
By: by Jitendra B. Khare, Wojciech Maly.
Contributors: Maly, W.
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1996
Place of publication: Boston
Language: eng
Number of pages: 150
Subjects: Integrated circuits -- Very large scale integration -- Testing; Integrated circuits -- Very large scale integration -- Defects; Integrated circuits -- Very large scale integration -- Computer simulation; Computer-aided design
Notes: Includes bibliographical references and index.