NDCS 2008
Subtitle: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : proceedings, 29-30 September 2008, Cambridge, Massachusetts
By: sponsored by IEEE Computer Society, IEEE Test Technology Technical Council
Contributors: IEEE Computer Society; IEEE Computer Society. Technical Council on Test Technology
Publisher: IEEE Computer Society
Published: 2008
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 85
ISBN-13: 9780769533797
Other titles: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems; Design and Test of Nano Devices, Circuits and Systems
Notes: "IEEE Computer Society Order Number P3379" --T.p. verso.

Includes bibliographical references and index.