Electron probe microanalysis and scanning electron microscopy
Contributors: United States. National Bureau of Standards; National Measurement Laboratory (U.S.). Office of Standard Reference Materials
Series: Standard reference materials
Published: 1981
Place of publication: [Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards
Language: eng
Subjects: Electron probe microanalysis; Electron microscopy
Notes: "Office of Standard Reference Materials."