Applications of finite element methods for reliability studies on ULSI interconnections
By: Cher Ming Tan ... [et al.].
Series: Springer series in reliability engineering; Springer series in reliability engineering
Publisher: Springer
Published: 2011
Place of publication: London; New York
Language: eng
Number of pages: 150
ISBN-13: 9780857293091; 9780857293107
Subjects: Reliability (Engineering); Integrated circuits; Ultra large scale integration; Finite element method
Notes: Includes bibliographical references and index.