Reliability and radiation effects in compound semiconductors
By: Allan Johnston
Publisher: World Scientific
Published: 2010
Place of publication: Hackensack, NJ; London
Language: eng
Number of pages: 363
ISBN-13: 9789814277105
Subjects: Reliability; Effect of radiation on; Compound semiconductors
Notes: Includes bibliographical references and index.
Table of contents: title: Semiconductor fundamentals; title: Transistor technologies; title: Optoelectronics; title: Reliability fundamentals; title: Compound semiconductor reliability; title: Optoelectronic device reliability; title: Radiation environments; title: Interactions of radiation with semiconductors; title: Displacement damage in compound semiconductors; title: Displacement damage in optoelectronic devices; title: Radiation damage in optocouplers; title: Effects from single particles.