Reliability in a random environment
By: Edward B. Rockower
Contributors: Naval Postgraduate School (U.S.). Dept. of Operations Research
Publisher: Naval Postgraduate School; Available from National Technical Information Service
Published: 1986
Place of publication: Monterey, Calif; Springfield, Va
Language: eng
Number of pages: 24
Subjects: RELIABILITY; OPERATIONS RESEARCH
Other titles: NPS-55-86-018.
Description: Correlations in the failures of subsystems or components may arise when they share a      common, random environment. It is shown that a natural tool for calculating the reliability of      such systems is the characteristic functional of the random hazard rate, h(t). Some general      results for the reliability of series and parallel systems in terms of the characteristic functional      of the hazard rate are derived and applied to a number of models of random environments.      The applications include random hazard functions arising from 1) non-fatal shocks of random      amplitudes, 2) a Markovian, Gamma-marginal stochastic process, 3) system stress related to      unrepaired damage from incoming rounds, and 4) impulsive and accumulated heat stresses      from a laser battle.
Notes: Cover title.

"NPS-55-86-018."

"October 1986."

"Technical report."

AD A174 320.

Includes bibliographical references.

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