1996 International Integrated Reliability Workshop Final Report
Subtitle: Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
Publisher: Institute of Electrical & Electronics Enginee
Published: April 1997
Language: eng
Format: Paperback
Number of pages: 175
ISBN-13: 9780780335981
Subjects: Electronic devices & materials; Reliability Engineering; Technology; Integrated circuits; Microelectronics; Education / Teaching; Science/Mathematics; Electronics - Circuits - General; General; Wafer scale integration; Electronics - Microelectronics; Congresses; Reliability