Advanced characterization techniques for optics, semiconductors, and nanotechnologies
Subtitle: 3-5 August 2003, San Diego, California, USA
By: Angela Duparr, Bhanwar Singh, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, WA
Language: eng
Number of pages: 402