Noise and information in nanoelectronics, sensors, and standards II
Subtitle: 26-28 May, 2004, Maspalomas, Gran Canaria, Spain
By: Janusz M. Smulko ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organization, SEDO--Sociedad Española de Óptica (Spain).
Contributors: Smulko, Janusz M.; Society of Photo-optical Instrumentation Engineers.; Sociedad Española de Optica.
Series: SPIE proceedings series ;; v. 5472; Proceedings of SPIE--the International Society for Optical Engineering ;; v. 5472.
Publisher: SPIE
Published: 2004
Place of publication: Bellingham, Wash
Language: eng
Number of pages: 442
Subjects: Electronic noise -- Congresses.; Electronic nois -- Standards -- Congresses.; Nanotechnology -- Congresses.; Information technology -- Congresses.; Detectors -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and index.