Exploring the relationship between item exposure rate and test overlap rate in computerized adaptive testing
By: Shu-Ying Chen, Robert D. Ankenmann, Judith A. Spray
Contributors: Ankenmann, Robert D; Spray, Judith A; American College Testing Program
Series: ACT research report series -- 99-5
Publisher: ACT, Inc.
Published: 1999
Place of publication: Iowa City, Iowa
Language: eng
Number of pages: 27
Subjects: Computer adaptive testing; Examinations -- Design and construction
Notes: "September 1999"--Cover

Includes bibliographical references (p. 17-18)