X-ray microscopy
Subtitle: proceedings of the sixth international conference, Berkeley, CA, 2-6 August 1999
By: editors, Werner Meyer-Ilse, Tony Warwick, David Attwood.
Contributors: Meyer-Ilse, Werner, 1955-1999.; Warwick, Tony.; Attwood, David T.
Series: AIP conference proceedings -- 507.; AIP conference proceedings -- no. 507.
Publisher: American Institute of Physics
Published: 2000
Place of publication: Melville, N.Y
Language: eng
Number of pages: 748
Subjects: X-ray microscopy -- Congresses.
Genres: Congresses.
Notes: Includes bibliographical references and author index.