2000 GaAs Reliability Workshop
Subtitle: proceedings : November 5, 2000, Seattle, Washington
By: sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
Contributors: JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards.; IEEE Electron Devices Society.
Publisher: IEEE
Published: 2000
Place of publication: Piscataway, N.J
Language: eng
Number of pages: 224
Subjects: Gallium arsenide semiconductors -- Congresses.; Semiconductors -- Reliability -- Congresses.; Semiconductors -- Materials -- Congresses.
Genres: Congresses.
Notes: Also available via the World Wide Web with additional title: GaAs Reliability Workshop, 2000, proceedings.
Includes bibliographical references.
"IEEE Catalog Number: 00TH8513"--T.p. verso.