Materials reliability in microelectronics V
Subtitle: symposium held April 17-21, 1995, San Francisco, California, U.S.A.
By: editors, Anthony S. Oates... [et al.].
Contributors: Oates, Anthony S.
Series: Materials Research Society symposium proceedings -- v. 391.; Materials Research Society symposia proceedings -- v. 391.
Publisher: Materials Research Society
Published: 1995
Place of publication: Pittsburgh, Penn
Language: eng
Number of pages: 523
Subjects: Microelectronics -- Reliability -- Congresses.; Microelectronics -- Materials -- Testing -- Congresses.; Electrodiffusion -- Congresses.; Microstructure -- Congresses.
Other titles: Materials reliability in microelectronics 5.; Materials reliability in microelectronics five.
Notes: Includes bibliographical references.