Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Subtitle: Application to Rough and Natural Surfaces (NanoScience and Technology)
Edition: 1 edition
Publisher: Springer
Published: September 15, 2006
Language: eng
Format: Hardcover
Number of pages: 292
ISBN-13: 9783540284055
Subjects: Microscopy; Technology & Industrial Arts; Nanotechnology; Science; Science/Mathematics; Biochemistry; Chemistry - Physical & Theoretical; Nanoindentation; Nanoscratching; Rough natural surfaces; Scanning nearfield optical microscopy; Technology / Nanotechnology; Atomic force microscopy; Near-field microscopy
First sentence: Atomic force microscopy (AFM) is also known as scanning force microscopy (SFM).