Proceedings
Subtitle: 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China
By: [sponsored by IEEE Computer Society Test Technology Council]
Contributors: IEEE Computer Society. Technical Council on Test Technology
Publisher: IEEE Computer Society
Published: 2010
Place of publication: Los Alamitos, Calif
Language: eng
Number of pages: 453
ISBN-13: 9780769542485
Subjects: Electronic digital computers; Congresses; Circuits; Electronic circuits; Testing; Fault-tolerant computing
Other titles: 19th Asian Test Symposium; Asian Test Symposium; ATS 2010
Notes: "IEEE Computer Society Order Number P4248"--T.p. verso.

Includes bibliographical references and author index.