Proceedings, International Test Conference 1999
Contributors: IEEE Computer Society.
Publisher: International Test Conference; IEEE Service Center
Published: 1999
Place of publication: Washington, D.C; Piscataway, NJ
Language: eng
Number of pages: 1163
Subjects: Integrated circuits -- Testing -- Congresses.; Electronic digital computers -- Circuits -- Testing -- Congresses.; Embedded computer systems -- Testing -- Congresses.; Microprocessors -- Testing -- Congresses.
Genres: Congresses.
Other titles: Proceedings :; 1999 IEEE International Test Conference; IEEE International Test Conference; International Test Conference 1999; International Test Conference
Notes: Includes bibliographical references and index.
Proceedings of the 30th ITC Conference held Sept. 28-30, 1999 in Atlantic City, N.J., sponsored by IEEE Computer Society.
"IEEE Catalog Number 99CH37034"--T.p. verso.