Accuracy in trace analysis
Subtitle: sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974
By: Philip D. LaFleur, editor.
Contributors: LaFleur, Philip D.
Series: NBS special publication ;; 422
Publisher: U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Published: 1976
Place of publication: Washington
Language: eng
Subjects: Trace analysis -- Congresses.; Chemistry, Analytical -- Congresses.; Trace elements -- Congresses.
Notes: Includes bibliographical references.