Delay fault testing for VLSI circuits
By: Angela Krstić, Kwang-Ting (Tim) Cheng.
Contributors: Cheng, Kwang-Ting, 1961-
Series: Frontiers in electronic testing
Publisher: Kluwer Academic Publishers
Published: 1998
Place of publication: Boston
Language: eng
Number of pages: 191
Subjects: Integrated circuits -- Very large scale integration -- Testing; Delay faults (Semiconductors)
Notes: Includes bibliographical references (p. [173]-188) and index.